DANIEL KANDEL

City:

REHOVOT

Country:

Israel

Published Applications:

Last publication date:

2025-06-05

Top Assignees for applications by DANIEL KANDEL

The entities that hold a legal rights for patent applications filed by inventor KANDEL DANIEL:

DANIEL KANDEL from REHOVOT, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING

PRODUCTION SOLUTIONS FOR HIGH-THROUGHPUT/PRECISION XPS METROLOGY USING UNSUPERVISED MACHINE LEARNING

Metrology and process control for semiconductor manufacturing

EVALUATING X-RAY SIGNALS FROM A PERTURBED OBJECT

Metrology and process control for semiconductor manufacturing

Metrology and process control for semiconductor manufacturing

InventorID:

5085660 ⎘