103462 ⎘
Polishing compositions containing abrasives or grinding agents
Polishing composition and method for producing polished article
#1202Chemical mechanical polishing composition and method for polishing tungsten
#1203Chemical-mechanical polishing compositions comprising one or more polymers selected from the group consisting of N-vinyl-homopolymers and N-vinyl copolymers
#1204POLISHING COMPOSITION, METHOD FOR PRODUCING POLISHING COMPOSITION AND METHOD FOR PRODUCING POLISHED ARTICLE
#1205Copper barrier chemical-mechanical polishing composition
#1206Tungsten chemical-mechanical polishing composition
#1207Colloidal silica chemical-mechanical polishing concentrate
#1208Methods for fabricating a chemical-mechanical polishing composition
#1209Colloidal silica chemical-mechanical polishing composition
#1210Colloidal silica chemical-mechanical polishing composition
#1211CMP SLURRY COMPOSITIONS AND METHODS FOR ALUMINUM POLISHING
#1212POLISHING AGENT AND METHOD FOR POLISHING SUBSTRATE USING THE POLISHING AGENT
#1213METHOD FOR POLISHING ALLOY MATERIAL AND METHOD FOR MANUFACTURING ALLOY MATERIAL
#1214Article comprising metal oxide-containing coating
#1215AQUEOUS DISPERSION FOR CHEMICAL MECHANICAL POLISHING, AND CHEMICAL MECHANICAL POLISHING METHOD
#1216Polishing composition
#1217Polycrystalline ultra-hard constructions with multiple support members
#1218Acid soluble abrasive material
#1219SLURRY FOR POLISHING PHASE-CHANGE MATERIALS AND METHOD FOR PRODUCING A PHASE-CHANGE DEVICE USING SAME
#1220POLISHING COMPOSITION
#1221Polishing slurry including zirconia particles and a method of using the polishing slurry
#1222POLISHING SLURRY FOR CMP AND POLISHING METHOD
#1223Polishing composition
#1224Polishing composition for edge roll-off improvement
#1225CMP slurry solution for hardened fluid material
#1226Polishing composition
#1227POLISHING COMPOSITION
#1228POLISHING COMPOSITION
#1229POLISHING COMPOSITION
#1230Polishing composition
#1231Polishing compositions and methods for selectively polishing silicon nitride over silicon oxide films
#1232Polishing slurry preventing agglomeration of charged colloids without loss of surface activity
#1233Slurry for chemical-mechanical polishing of metals and use thereof
#1234Mixed abrasive tungsten CMP composition
#1235Mixed abrasive tungsten CMP composition
#1236Composition for tungsten buffing
#1237COMPOSITIONS AND METHODS FOR CMP OF TUNGSTEN MATERIALS
#1238POLISHING COMPOSITION
#1239Composition for tungsten CMP
#1240Composition for tungsten CMP
#1241Composition for tungsten CMP
#1242Chemical mechanical polishing (CMP) composition for shallow trench isolation (STI) applications and methods of making thereof
#1243Polishing-Material Reclamation Method
#1244Polishing agent, polishing agent set and method for polishing base
#1245CMP method for suppression of titanium nitride and titanium/titanium nitride removal
#1246COMPOSITION AND METHOD FOR POLISHING MOLYBDENUM
#1247POLISHING COMPOSITION
#1248Polishing composition and method for producing substrate
#1249Polishing composition, method for manufacturing polishing composition, and method for manufacturing polishing composition liquid concentrate
#1250Polishing-Material Reclamation Method
#1251Composition and method for polishing memory hard disks
#1252Polishing composition and method utilizing abrasive particles treated with an aminosilane
#1253Polishing slurry and substrate polishing method using the same
#1254Cerium oxide based composite polishing powder and preparation method thereof
#1255Multi-selective polishing slurry composition and a semiconductor element production method using the same
#1256Abrasive particles and production method thereof
#1257Polishing agent, polishing method, and manufacturing method of semiconductor integrated circuit device
#1258MANUFACTURING METHOD OF POLISHING AGENT, POLISHING METHOD, AND MANUFACTURING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
#1259MANUFACTURING METHOD OF POLISHING AGENT, POLISHING METHOD, AND MANUFACTURING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
#1260Process for the manufacture of semiconductor devices comprising the chemical mechanical polishing (CMP) of III-V material in the presence of a CMP composition comprising a specific non-ionic surfactant
#1261POLISHING COMPOSITION AND SUBSTRATE FABRICATION METHOD USING SAME
#1262POLISHING COMPOSITION, MANUFACTURING PROCESS THEREFOR, UNDILUTED LIQUID, PROCESS FOR PRODUCING SILICON SUBSTRATE, AND SILICON SUBSTRATE
#1263Composition and method for chemical mechanical polishing
#1264Chemical mechanical polishing composition comprising polyvinyl phosphonic acid and its derivatives
#1265POLISHING AGENT AND POLISHING METHOD
#1266POLISHING COMPOSITION AND POLISHING METHOD
#1267POLISHING COMPOSITION AND POLISHING METHOD
#1268CMP compositions and methods for selective removal of silicon nitride
#1269Chemical mechanical planarization using nanodiamond
#1270Polishing composition
#1271CMP compositions and methods for polishing nickel phosphorous surfaces
#1272Slurry for chemical mechanical polishing and chemical mechanical polishing method
#1273Slurry, polishing-solution set, polishing solution, substrate polishing method, and substrate
#1274Slurry, polishing-solution set, polishing solution, substrate polishing method, and substrate
#1275Contact release capsule useful for chemical mechanical planarization slurry
#1276Composition for advanced node front-and-back-end of line chemical mechanical polishing
#1277Chemical mechanical polishing slurry compositions and method using the same for copper and through-silicon via applications
#1278Polishing composition, polishing method using same, and method for producing substrate
#1279Slurry, polishing-solution set, polishing solution, substrate polishing method, and substrate
#1280ABRASIVE GRAINS, SLURRY, POLISHING SOLUTION, AND MANUFACTURING METHODS THEREFOR
#1281Chemical mechanical polishing method using slurry composition containing N-oxide compound
#1282Polishing liquid composition for wafers
#1283Chemical mechanical polishing (CMP) composition comprising two types of corrosion inhibitors
#1284Polishing composition and method for nickel-phosphorous coated memory disks
#1285Abrasive Particles for Chemical Mechanical Polishing
#1286COMPOSITION FOR SILICON WAFER POLISHING LIQUID
#1287Polishing composition to be used to polish semiconductor substrate having silicon through electrode structure, and polishing method using polishing composition
#1288Barrier chemical mechanical planarization composition and method thereof
#1289BARRIER CHEMICAL MECHANICAL PLANARIZATION COMPOSITION AND METHOD THEREOF
#1290Mixed abrasive polishing compositions
#1291Wet-process ceria compositions for polishing substrates, and methods related thereto
#1292PROCESS FOR THE MANUFACTURE OF SEMICONDUCTOR DEVICES COMPRISING THE CHEMICAL MECHANICAL POLISHING (CMP) OF III-V MATERIAL IN THE PRESENCE OF A CMP COMPOSITION COMPRISING A COMPOUND CONTAINING AN N-HETEROCYCLE
#1293Slurry, polishing-solution set, polishing solution, substrate polishing method, and substrate
#1294ABRASIVE PARTICLES, SLURRY, POLISHING SOLUTION, AND MANUFACTURING METHODS THEREFOR
#1295Chemical mechanical polishing composition for polishing silicon wafers and related methods
#1296Polishing composition and polishing method using the same
#1297Chemical-mechanical planarization of polymer films
#1298Abrasive composition and method for producing semiconductor substrate
#1299Low defect chemical mechanical polishing composition
#1300POLISHING LIQUID AND POLISHING METHOD
#1301Abrasive particle, polishing slurry, and method of manufacturing semiconductor device using the same
#1302Methods of manufacturing abrasive particle and polishing slurry
#1303Polishing composition
#1304POLISHING COMPOSITION
#1305Polishing composition, manufacturing process therefor, process for production of silicon substrate, and silicon substrate
#1306Polishing composition
#1307Chemical mechanical polishing composition for polishing a sapphire surface and methods of using same
#1308Lapping slurry having a cationic surfactant
#1309Polishing composition and method using said polishing composition to manufacture compound semiconductor substrate
#1310CMP slurry/method for polishing ruthenium and other films
#1311SiCN and SiN polishing slurries and polishing methods using the same
#1312Polishing method
#1313Liquid suspensions and powders of cerium oxide particles and preparation and polishing applications thereof
#1314Composition and method for polishing bulk silicon
#1315CMP method for forming smooth diamond surfaces
#1316Abrasive, abrasive set, and method for abrading substrate
#1317Compositions and methods for CMP of silicon oxide, silicon nitride, and polysilicon materials
#1318Polishing agent for synthetic quartz glass substrate
#1319Polishing agent, polishing agent set, and substrate polishing method
#1320Chemical mechanical polishing (CMP) composition comprising a protein
#1321POLISHING COMPOSITION AND METHOD FOR PRODUCING SEMICONDUCTOR SUBSTRATE
#1322Liquid cleaning and/or cleansing composition
#1323Oxidizing aqueous cleaner for the removal of post-etch residues
#1324Chemical mechanical polishing (CMP) composition for shallow trench isolation (STI) applications and methods of making thereof
#1325Polishing liquid for metal and polishing method
#1326Achieving greater planarity between upper surfaces of a layer and a conductive structure residing therein
#1327CMP polishing liquid and polishing method
#1328POLISHING COMPOSITION
#1329CMP compositions selective for oxide over polysilicon and nitride with high removal rate and low defectivity
#1330CMP compositions selective for oxide and nitride with high removal rate and low defectivity
#1331POLISHING COMPOSITION FOR MAGNETIC DISK SUBSTRATE
#1332Polishing composition
#1333Polishing composition
#1334POLISHING LIQUID COMPOSITION FOR MAGNETIC DISK SUBSTRATE
#1335Polishing composition, and polishing method and substrate production method using same
#1336Process for the manufacture of semiconductor devices comprising the chemical mechanical polishing of borophosphosilicate glass (BPSG) material in the presence of a CMP composition comprising anionic phosphate or phosphonate
#1337Polishing composition
#1338SEMICONDUCTOR WAFER POLISHING LIQUID COMPOSITION
#1339Metal Compound Coated Colloidal Particles Process for Making and Use Therefor
#1340Colloidal sol and method of making same
#1341ADDITIVE FOR POLISHING AGENT, AND POLISHING METHOD
#1342METHOD FOR POLISHING ALLOY MATERIAL AND METHOD FOR PRODUCING ALLOY MATERIAL
#1343ADDITIVE MIXTURE AND COMPOSITION AND METHOD FOR POLISHING GLASS SUBSTRATES
#1344POLISHING COMPOSITION
#1345Composition for polishing purposes, polishing method using same, and method for producing substrate
#1346Colloidal silica polishing composition and method for manufacturing synthetic quartz glass substrates using the same
#1347Glass substrate for a magnetic disk and magnetic disk
#1348Chemical Mechanical Planarization for Tungsten-Containing Substrates
#1349CMP compositions with low solids content and methods related thereto
#1350Methods of polishing sapphire surfaces
#1351POLISHING COMPOSITION AND POLISHING METHOD USING SAME, AND SUBSTRATE MANUFACTURING METHOD
#1352POLISHING COMPOSITION
#1353Composition and method for polishing glass
#1354COMPOSITION FOR POLISHING COMPOUND SEMICONDUCTOR
#1355POLISHING COMPOSITION
#1356Polishing slurry and polishing method
#1357Chemical mechanical polishing (CMP) composition comprising a glycoside
#1358Chemical-mechanical polishing composition containing zirconia and metal oxidizer
#1359Refurbished component, electronic device including the same, and method of refurbishing a component of an electronic device
#1360CHEMICAL MECHANICAL POLISHING PROCESS AND SLURRY CONTAINING SILICON NANOPARTICLES
#1361CMP COMPOSITIONS AND METHODS FOR SUPPRESSING POLYSILICON REMOVAL RATES
#1362COMPOSITION AND METHOD FOR POLISHING POLYSILICON
#1363POLISHING AGENT AND POLISHING METHOD
#1364Bag containing blasting material
#1365Process for the manufacture of semiconductor devices comprising the chemical mechanical polishing of elemental germanium and/or SiGematerial in the presence of a CMP composition comprising a specific organic compound
#1366METHOD FOR POLISHING SILICON WAFER AND POLISHING AGENT
#1367EROSION INHIBITOR FOR CHEMICAL MECHANICAL POLISHING, SLURRY FOR CHEMICAL MECHANICAL POLISHING, AND CHEMICAL MECHANICAL POLISHING METHOD
#1368Polishing composition, polishing method using same, and method for producing semiconductor device
#1369Smooth diamond surfaces and CMP method for forming
#1370Soft and conditionable chemical mechanical polishing pad
#1371Chemical mechanical polishing (CMP) composition for shallow trench isolation (STI) applications and methods of making thereof
#1372COMPOSITION AND METHOD FOR POLISHING ALUMINUM SEMICONDUCTOR SUBSTRATES
#1373Chemical mechanical polishing composition having chemical additives and methods for using same
#1374Polishing composition
#1375Polishing agent and polishing method
#1376Acid soluble abrasive material and method of use
#1377Polishing slurry for metal films and polishing method
#1378Methods of polishing sapphire surfaces
#1379COMPOSITIONS AND METHODS FOR SELECTIVE POLISHING OF PLATINUM AND RUTHENIUM MATERIALS
#1380CMP polishing fluid, method for manufacturing same, method for manufacturing composite particle, and method for polishing base material
#1381Process for preparing aqueous colloidal silica sols of high purity from alkali metal silicate solutions
#1382GST CMP slurries
#1383Magnetorheological fluid for ultrasmooth polishing
#1384Compositions and methods for selective polishing of silicon nitride materials
#1385High purity silica sol and its production method
#1386CHEMICAL MECHANICAL POLISHING (CMP) COMPOSITION COMPRISING A NON-IONIC SURFACTANT AND AN AROMATIC COMPOUND COMPRISING AT LEAST ONE ACID GROUP
#1387Chemical mechanical polishing (CMP) composition comprising a non-ionic surfactant and a carbonate salt
#1388CHEMICAL MECHANICAL POLISHING AQUEOUS DISPERSION AND CHEMICAL MECHANICAL POLISHING METHOD FOR SEMICONDUCTOR DEVICE
#1389CHEMICAL MECHANICAL POLISHING SLURRY
#1390Chemical mechanical polishing (CMP) composition comprising a polymeric polyamine
#1391POLISHING SLURRY AND POLISHING METHOD THEREOF
#1392Polishing composition, method for fabricating thereof and method of chemical mechanical polishing using the same
#1393Method for forming through-base wafer vias
#1394Ceramic composite for light conversion and method for manufacture thereof
#1395COMPOSITION AND METHOD FOR POLISHING MOLYBDENUM
#1396Polishing composition
#1397CMP composition containing zirconia particles and method of use
#1398Alkaline-earth metal oxide-polymeric polishing pad
#1399Hollow polymeric-alkaline earth metal oxide composite
#1400Forming alkaline-earth metal oxide polishing pad
#1401Methods for polishing phase change materials
#1402CMP SLURRY REGENERATION APPARATUS AND METHOD
#1403Polishing composition and polishing method using the same
#1404Combination, method, and composition for chemical mechanical planarization of a tungsten-containing substrate
#1405Method for producing polishing liquid composition
#1406Abrasive products and methods for fine polishing of ophthalmic lenses
#1407Contact release capsule useful for chemical mechanical planarization slurry
#1408Polishing slurry composition
#1409Composition for polishing and method of polishing semiconductor substrate using same
#1410Polishing liquid and method for polishing substrate using the polishing liquid
#1411Polishing agent and method for polishing substrate using the polishing agent
#1412Aqueous polishing composition and process for chemically mechanically polishing substrates containing silicon oxide dielectric and polysilicon films
#1413CMP compositions selective for oxide and nitride with high removal rate and low defectivity
#1414CMP compositions selective for oxide and nitride with high removal rate and low defectivity
#1415Low free formaldehyde phenolic resins for abrasive products
#1416CMP slurry composition for tungsten
#1417Polishing composition
#1418Manufacture of synthetic quartz glass substrate
#1419Polishing composition and polishing method
#1420Polishing composition
#1421Chemical mechanical polishing (CMP) composition comprising a specific heteropolyacid
#1422SLURRY FOR COBALT APPLICATIONS
#1423PROCESS FOR PRODUCING POLISHING LIQUID COMPOSITION
#1424Composition for polishing and composition for rinsing
#1425Surface treatment composition and surface treatment method using same
#1426Method and composition for chemical mechanical planarization of a metal
#1427Polishing slurry and chemical mechanical planarization method using the same
#1428CMP slurry composition and polishing method using the same
#1429AQUEOUS POLISHING COMPOSITION AND PROCESS FOR CHEMICALLY MECHANICALLY POLISHING SUBSTRATE MATERIALS FOR ELECTRICAL, MECHANICAL AND OPTICAL DEVICES
#1430Method for recovery of cerium oxide
#1431POLISHING COMPOSITION AND POLISHING METHOD USING SAME
#1432METHOD FOR PRODUCING ABRASIVE GRAINS, METHOD FOR PRODUCING SLURRY, AND METHOD FOR PRODUCING POLISHING LIQUID
#1433Slurry, polishing liquid set, polishing liquid, method for polishing substrate, and substrate
#1434Synthetic quartz glass substrate polishing slurry and manufacture of synthetic quartz glass substrate using the same
#1435Cerium oxide slurry, cerium oxide polishing slurry and method for polishing substrate using the same
#1436Rinsing agent, and method for production of hard disk substrate
#1437Slurry Composition For Polishing And Method Of Manufacturing Phase Change Memory Device Using The Same
#1438Polishing liquid composition
#1439Method of polishing using tunable polishing formulation
#1440CMP METHOD, CMP APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
#1441Slurry for chemical-mechanical polishing of copper and use thereof
#1442Manufacturing method of glass substrate for magnetic disk, magnetic disk, and magnetic recording / reproducing device
#1443Slurry for chemical-mechanical polishing of metals and use thereof
#1444CMP SLURRY AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
#1445Group III nitride crystal substrate
#1446Composition and method for polishing aluminum semiconductor substrates
#1447Methods of forming a cutting element for an earth-boring tool, a related cutting element, and an earth-boring tool including such a cutting element
#1448Homogeneous blending
#1449CMP POLISHING LIQUID, METHOD FOR POLISHING SUBSTRATE, AND ELECTRONIC COMPONENT
#1450Method for chemical mechanical polishing copper
#1451Method for chemical mechanical polishing tungsten
#1452Polishing composition and polishing method
#1453SAPPHIRE POLISHING SLURRY AND SAPPHIRE POLISHING METHOD
#1454POLISHING SLURRY, POLISHING METHOD AND MANUFACTURING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
#1455Method of producing glass substrate for information recording medium
#1456Polishing solution for copper polishing, and polishing method using same
#1457CERIUM SALT, PRODUCING METHOD THEREOF, SERIUM OXIDE AND CERIUM BASED POLISHING SLURRY
#1458POLISHING SLURRY AND POLISHING METHOD THEREFOR
#1459CHEMICAL MECHANICAL POLISHING AQUEOUS DISPERSION AND CHEMICAL MECHANICAL POLISHING METHOD USING SAME
#1460CHEMICAL-MECHANICAL PLANARIZATION OF SUBSTRATES CONTAINING COPPER, RUTHENIUM, AND TANTALUM LAYERS
#1461Abrasive Particles for Chemical Mechanical Polishing
#1462Slurry, polishing liquid set, polishing liquid, method for polishing substrate, and substrate
#1463Slurry, polishing liquid set, polishing liquid, method for polishing substrate, and substrate
#1464CMP slurry/method for polishing ruthenium and other films
#1465Method for producing abrasive grains, method for producing slurry, and method for producing polishing liquid
#1466Slurry, polishing fluid set, polishing fluid, and substrate polishing method using same
#1467Aqueous polishing agent and graft copolymers and their use in a process for polishing patterned and unstructured metal surfaces
#1468Method of polishing copper wiring surfaces in ultra large scale integrated circuits
#1469Polishing liquid for CMP and polishing method using the same
#1470Nano-diamond dispersion solution and method for preparing same
#1471CMP POLISHING LIQUID, METHOD FOR POLISHING SUBSTRATE, AND ELECTRONIC COMPONENT
#1472METHOD FOR RECLAIMING SEMICONDUCTOR WAFER AND POLISHING COMPOSITION
#1473METHOD FOR PLASTIC RESTORATION AND KIT THEREFOR
#1474Chemical mechanical polishing slurry compositions and polishing method using the same
#1475Compositions for polishing silicon-containing substrates
#1476Chemical mechanical polishing composition and method for polishing phase change alloys
#1477Chemical mechanical polishing composition and method for polishing germanium-antimony-tellurium alloys
#1478Polishing composition for nickel phosphorous memory disks
#1479Diatomaceous Earth-Containing Slurry Composition And Method For Polishing Organic Polymer-Based Ophthalmic Substrates Using The Same
#1480Chemical mechanical polishing slurry, its preparation method and use for the same
#1481Slurry for chemical mechanical polishing and polishing method for substrate using same
#1482Slurry composition for CMP, and polishing method
#1483Compositions and methods for selective polishing of silicon nitride materials
#1484CHEMICAL MECHANICAL POLISHING SLURRY, SYSTEM AND METHOD
#1485Stabilized chemical mechanical polishing composition and method of polishing a substrate
#1486Method of manufacturing semiconductor device
#1487POLISHING LIQUID AND POLISHING METHOD
#1488Chemical mechanical polishing of group III-nitride surfaces
#1489Method of manufacturing a glass substrate for a magnetic disk and method of manufacturing a magnetic disk
#1490UV protective coating composition and method
#1491POLISHING SLURRY FOR SILICON CARBIDE AND POLISHING METHOD THEREFOR
#1492ABRASIVE MATERIAL
#1493CMP polishing solution and polishing method
#1494Process for removing a bulk material layer from a substrate and a chemical mechanical polishing agent suitable for this process
#1495Process for removing a bulk material layer from a substrate and a chemical mechanical polishing agent suitable for this process
#1496Abrasive, method of polishing target member and process for producing semiconductor device
#1497CHEMICAL-MECHANICAL POLISHING LIQUID, AND SEMICONDUCTOR SUBSTRATE MANUFACTURING METHOD AND POLISHING METHOD USING SAID POLISHING LIQUID
#1498Chemical mechanical polishing (CMP) composition comprising inorganic particles and polymer particles
#1499Polishing composition and method using same
#1500Additive for polishing composition