ClassID:

103462

C09G1/02 - page 7 - CPC Classification

Classification description:

Polishing compositions containing abrasives or grinding agents

Recent Application in this class:
#1801
20090215270
2009-08-27

Polishing liquid and polishing method

#1802
20090215269
2009-08-27

INTEGRATED CHEMICAL MECHANICAL POLISHING COMPOSITION AND PROCESS FOR SINGLE PLATEN PROCESSING

#1803
20090215268
2009-08-27

Polishing process for producing damage free surfaces on semi-insulating silicon carbide wafers

#1804
20090215266
2009-08-27

Polishing Copper-Containing patterned wafers

#1805
20090215265
2009-08-27

Low-stain polishing composition

#1806
20090214866
2009-08-27

Process for the production of metal oxide powders

#1807
20090211167
2009-08-27

SLURRY FOR WIRE SAW

#1808
20090209104
2009-08-20

Polishing slurry for CMP, and polishing method

#1809
20090209103
2009-08-20

BARRIER SLURRY COMPOSITIONS AND BARRIER CMP METHODS

#1810
20090206450
2009-08-20

METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE OBTAINED HEREWITH, AND SLURRY SUITABLE FOR USE IN SUCH A METHOD

#1811
20090203215
2009-08-13

METAL POLISHING SLURRY AND CHEMICAL MECHANICAL POLISHING METHOD

#1812
20090203213
2009-08-13

Slurry composition for chemical-mechanical polishing and method of chemical-mechanical polishing with the same

#1813
20090197415
2009-08-06

Polishing fluid composition

#1814
20090197414
2009-08-06

Polishing Composition and Polishing Method Using The Same

#1815
20090197413
2009-08-06

Polishing composition and polishing method using the same

#1816
20090197412
2009-08-06

Chemical mechanical polishing composition and process

#1817
20090194504
2009-08-06

METHOD FOR PRODUCING ABRASIVE COMPOSITION

#1818
20090193721
2009-08-06

Abrasive particles, method of manufacturing the abrasive particles, and method of manufacturing chemical mechanical polishing slurry

#1819
20090191710
2009-07-30

CMP method for improved oxide removal rate

#1820
20090188533
2009-07-30

Composition and method for road-film removal

#1821
20090184287
2009-07-23

Sarcosine compound used as corrosion inhibitor

#1822
20090181541
2009-07-16

Polishing process of a semiconductor substrate

#1823
20090181540
2009-07-16

CHEMICAL MECHANICAL POLISHING METHOD

#1824
20090181539
2009-07-16

POLISHING AGENT FOR SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, POLISHING METHOD, AND METHOD FOR MANUFACTURING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

#1825
20090179172
2009-07-16

POLISHING COMPOSITION

#1826
20090176685
2009-07-09

Corrosion inhibiting compositions

#1827
20090176373
2009-07-09

POLISHING AGENT FOR SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, POLISHING METHOD, AND METHOD FOR MANUFACTURING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

#1828
20090176372
2009-07-09

CHEMICAL MECHANICAL POLISHING SLURRY AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD

#1829
20090173910
2009-07-09

Polishing composition

#1830
20090173717
2009-07-09

Composition and method for polishing nickel-phosphorous-coated aluminum hard disks

#1831
20090173014
2009-07-09

Polycrystalline ultra-hard constructions with multiple support members

#1832
20090165395
2009-07-02

Chemical mechanical polishing aqueous dispersion, chemical mechanical polishing method, and kit for preparing chemical mechanical polishing aqueous dispersion

#1833
20090159845
2009-06-25

POLISHING SLURRY, METHOD OF TREATING SURFACE OF GAXIN1-XASYP1-Y CRYSTAL AND GAXIN1-XASYP1-Y CRYSTAL SUBSTRATE

#1834
20090156008
2009-06-18

Polishing Composition and Polishing Method Using The Same

#1835
20090156007
2009-06-18

Polishing slurry and polishing method

#1836
20090156006
2009-06-18

COMPOSITIONS AND METHODS FOR CMP OF SEMICONDUCTOR MATERIALS

#1837
20090156000
2009-06-18

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

#1838
20090152240
2009-06-18

Chemical-mechanical polishing composition and method for using the same

#1839
20090148606
2009-06-11

COMPOSITIONS AND METHODS FOR RESTORING PLASTIC COVERS AND LENSES

#1840
20090140199
2009-06-04

POLISHING COMPOUND AND POLISHING METHOD

#1841
20090140198
2009-06-04

Method of preparing metal oxide suspension

#1842
20090137124
2009-05-28

Polishing composition and method for high silicon nitride to silicon oxide removal rate ratios

#1843
20090137123
2009-05-28

Polishing Composition and Polishing Method

#1844
20090137122
2009-05-28

Method of passivating chemical mechanical polishing compositions for copper film planarization processes

#1845
20090134122
2009-05-28

Copper-passivating CMP compositions and methods

#1846
20090133716
2009-05-28

METHODS OF POST CHEMICAL MECHANICAL POLISHING AND WAFER CLEANING USING AMIDOXIME COMPOSITIONS

#1847
20090133336
2009-05-28

Polishing slurry, method of producing same, and method of polishing substrate

#1848
20090130849
2009-05-21

CHEMICAL MECHANICAL POLISHING AND WAFER CLEANING COMPOSITION COMPRISING AMIDOXIME COMPOUNDS AND ASSOCIATED METHOD FOR USE

#1849
20090127501
2009-05-21

Polishing Composition for Silicon Wafer

#1850
20090127500
2009-05-21

POLISHING COMPOSITION

#1851
20090124173
2009-05-14

COMPOSITIONS AND METHODS FOR RUTHENIUM AND TANTALUM BARRIER CMP

#1852
20090124172
2009-05-14

AQUEOUS DISPERSION FOR CHEMICAL MECHANICAL POLISHING, CHEMICAL MECHANICAL POLISHING METHOD, KIT FOR CHEMICAL MECHANICAL POLISHING, AND KIT FOR PREPARING AQUEOUS DISPERSION FOR CHEMICAL MECHANICAL POLISHING

#1853
20090124082
2009-05-14

SLURRY FOR POLISHING RUTHENIUM AND METHOD FOR POLISHING USING THE SAME

#1854
20090124076
2009-05-14

Method of manufacturing semiconductor device

#1855
20090121178
2009-05-14

Polishing slurry

#1856
20090120012
2009-05-14

Method for preparing additive for chemical mechanical polishing slurry composition

#1857
20090117829
2009-05-07

Polishing slurry for metal, and polishing method

#1858
20090111359
2009-04-30

Polishing composition for hard disk substrate

#1859
20090104851
2009-04-23

Polishing of sapphire with composite slurries

#1860
20090104778
2009-04-23

Polishing Composition for CMP and device wafer producing method using the same

#1861
20090103993
2009-04-23

Method of polishing a tungsten carbide surface

#1862
20090101864
2009-04-23

Chemical Mechanical Polishing Paste for Tantalum Barrier Layer

#1863
20090100765
2009-04-23

POLISHING SLURRY, METHOD OF PRODUCING SAME, AND METHOD OF POLISHING SUBSTRATE

#1864
20090100764
2009-04-23

Composition for removing photoresist layer and method for using it

#1865
20090098807
2009-04-16

Composite slurries of nano silicon carbide and alumina

#1866
20090098806
2009-04-16

Compositions and methods for removing scratches from plastic surfaces

#1867
20090095939
2009-04-16

Slurry composition for chemical mechanical polishing of metal and polishing method using the same

#1868
20090094901
2009-04-16

CMP Polishing Liquid and Polishing Method

#1869
20090093118
2009-04-09

POLISHING COMPOSITION

#1870
20090090888
2009-04-09

Composition useful to chemical mechanical planarization of metal

#1871
20090090696
2009-04-09

SLURRIES FOR POLISHING OXIDE AND NITRIDE WITH HIGH REMOVAL RATES

#1872
20090087989
2009-04-02

POLISHING LIQUID AND POLISHING METHOD USING THE SAME

#1873
20090087988
2009-04-02

POLISHING LIQUID AND POLISHING METHOD

#1874
20090081927
2009-03-26

Polishing composition and method utilizing abrasive particles treated with an aminosilane

#1875
20090081871
2009-03-26

Polishing composition and method utilizing abrasive particles treated with an aminosilane

#1876
20090078908
2009-03-26

Polishing liquid for semiconductor integrated circuit

#1877
20090075566
2009-03-19

Low pH barrier slurry based on titanium dioxide

#1878
20090068841
2009-03-12

Chemical mechanical polishing method of organic film and method of manufacturing semiconductor device

#1879
20090068840
2009-03-12

POLISHING LIQUID AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

#1880
20090068839
2009-03-12

Slurry, chemical mechanical polishing method using the slurry, and method of forming metal wiring using the slurry

#1881
20090064597
2009-03-12

Polishing slurry and polishing material using same

#1882
20090061630
2009-03-05

Method for Chemical Mechanical Planarization of A Metal-containing Substrate

#1883
20090057834
2009-03-05

Method for chemical mechanical planarization of chalcogenide materials

#1884
20090057661
2009-03-05

Method for chemical mechanical planarization of chalcogenide materials

#1885
20090056231
2009-03-05

Copper CMP composition containing ionic polyelectrolyte and method

#1886
20090053896
2009-02-26

Copper polishing slurry

#1887
20090047870
2009-02-19

Reverse Shallow Trench Isolation Process

#1888
20090047787
2009-02-19

Slurry containing multi-oxidizer and nano-abrasives for tungsten CMP

#1889
20090047786
2009-02-19

CMP abrasive slurry for polishing insulation film, polishing method, and semiconductor electronic part polished by the polishing method

#1890
20090045164
2009-02-19

"UNIVERSAL" BARRIER CMP SLURRY FOR USE WITH LOW DIELECTRIC CONSTANT INTERLAYER DIELECTRICS

#1891
20090042485
2009-02-12

Polishing composition

#1892
20090038504
2009-02-12

POLISHING SLURRY FOR IONIC MATERIALS

#1893
20090035942
2009-02-05

Ruthenium CMP compositions and methods

#1894
20090032765
2009-02-05

Selective barrier polishing slurry

#1895
20090032006
2009-02-05

Wire saw process

#1896
20090031636
2009-02-05

Polymeric barrier removal polishing slurry

#1897
20090029633
2009-01-29

Method of polishing a silicon-containing dielectric

#1898
20090029553
2009-01-29

Free radical-forming activator attached to solid and used to enhance CMP formulations

#1899
20090029552
2009-01-29

Method for polishing a substrate composed of semiconductor material

#1900
20090019781
2009-01-22

Mixture article for cleaning superficially-adhered substances

#1901
20090014683
2009-01-15

SELECTIVE POLISH FOR FABRICATING ELECTRONIC DEVICES

#1902
20090014415
2009-01-15

Compositions and methods for rapidly removing overfilled substrates

#1903
20090013609
2009-01-15

Polymeric microgels for chemical mechanical planarization (CMP) processing

#1904
20090011681
2009-01-08

Method of producing a glass substrate for a mask blank by polishing with an alkaline polishing liquid that contains colloidal silica abrasive grains

#1905
20090011599
2009-01-08

Slurry compositions for selectively polishing silicon nitride relative to silicon oxide, methods of polishing a silicon nitride layer and methods of manufacturing a semiconductor device using the same

#1906
20090008601
2009-01-08

Potassium monopersulfate solutions

#1907
20090008600
2009-01-08

METHOD AND COMPOSITION FOR POLISHING A SUBSTRATE

#1908
20090004863
2009-01-01

POLISHING LIQUID AND POLISHING METHOD USING THE SAME

#1909
20090001051
2009-01-01

Slurry compositions for polishing metal, methods of polishing a metal object and methods of forming a metal wiring using the same

#1910
20080318427
2008-12-25

Chemical mechanical polishing aqueous dispersion preparation set, method of preparing chemical mechanical polishing aqueous dispersion, chemical mechanical polishing aqueous dispersion, and chemical mechanical polishing method

#1911
20080318362
2008-12-25

Manufacturing Method of Semiconductor Integrated Circuit Device

#1912
20080314872
2008-12-25

Chemical-Mechanical Polishing Compositions Containing Aspartame And Methods Of Making And Using The Same

#1913
20080305718
2008-12-11

Polishing Composition and Polishing Method

#1914
20080293330
2008-11-27

Alumina-film-polishing composition and chemical mechanical polishing method using the same

#1915
20080290317
2008-11-27

Pyrogenically prepared silicon dioxide with a low thickening effect

#1916
20080289261
2008-11-27

POLISHING COMPOSITION AND POLISHING METHOD

#1917
20080287038
2008-11-20

Polishing composition for semiconductor wafer, method for production thereof and polishing method

#1918
20080283502
2008-11-20

Compositions, methods and systems for polishing aluminum oxide and aluminum oxynitride substrates

#1919
20080282778
2008-11-20

Method for testing a slurry used to form a semiconductor device

#1920
20080277667
2008-11-13

Method of producing III-nitride substrate

#1921
20080277378
2008-11-13

Method for Chemical-Mechanical Planarization of Copper

#1922
20080276543
2008-11-13

Alkaline barrier polishing slurry

#1923
20080274620
2008-11-06

CHEMICAL MECHANICAL POLISHING AGENT KIT AND CHEMICAL MECHANICAL POLISHING METHOD USING THE SAME

#1924
20080274619
2008-11-06

CMP compositions containing a soluble peroxometalate complex and methods of use thereof

#1925
20080274618
2008-11-06

POLISHING COMPOSITION AND METHOD FOR HIGH SELECTIVITY POLYSILICON CMP

#1926
20080272088
2008-11-06

POLISHING COMPOUND AND POLISHING METHOD

#1927
20080271383
2008-11-06

Abrasive, method of polishing target member and process for producing semiconductor device

#1928
20080265375
2008-10-30

Methods for the single-sided polishing of semiconductor wafers and semiconductor wafer having a relaxed Si1-x GEx Layer

#1929
20080265205
2008-10-30

Polishing Composition

#1930
20080263965
2008-10-30

Semiconductor Polishing Composition

#1931
20080261401
2008-10-23

Chemical-Mechanical Polishing of Sic Surfaces Using Hydrogen Peroxide or Ozonated Water Solutions in Combination with Colloidal Abrasive

#1932
20080261400
2008-10-23

POLISHING COMPOSITION, POLISHING METHOD, AND METHOD FOR FORMING COPPER WIRING FOR SEMICONDUCTOR INTEGRATED CIRCUIT

#1933
20080257862
2008-10-23

Method of chemical mechanical polishing of a copper structure using a slurry having a multifunctional activator

#1934
20080254717
2008-10-16

Cmp Polishing Slurry and Method of Polishing Substrate

#1935
20080254629
2008-10-16

Composition and method used for chemical mechanical planarization of metals

#1936
20080254628
2008-10-16

High throughput chemical mechanical polishing composition for metal film planarization

#1937
20080248727
2008-10-09

Polishing Slurry

#1938
20080242091
2008-10-02

METAL-POLISHING LIQUID AND POLISHING METHOD

#1939
20080242090
2008-10-02

Metal-polishing liquid and polishing method

#1940
20080237535
2008-10-02

Composition for polishing semiconductor wafer, and method of producing the same

#1941
20080236050
2008-10-02

Cerium oxide powder, method for preparing the same, and CMP slurry comprising the same

#1942
20080233836
2008-09-25

Polishing composition and polishing method

#1943
20080233422
2008-09-25

Coated nickel-containing powders

#1944
20080230741
2008-09-25

POLISHING INHIBITING LAYER FORMING ADDITIVE

#1945
20080227297
2008-09-18

CHEMICAL MECHANICAL POLISHING METHOD AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

#1946
20080227296
2008-09-18

Slurry compositions, methods of preparing slurry compositions, and methods of polishing an object using slurry compositions

#1947
20080220610
2008-09-11

Silicon oxide polishing method utilizing colloidal silica

#1948
20080219130
2008-09-11

Methods and Apparatus for Formatting and Tracking Information for Three-Dimensional Storage Medium

#1949
20080214093
2008-09-04

CMP polishing slurry and polishing method

#1950
20080214000
2008-09-04

POLISHING COMPOSITION AND POLISHING METHOD USING THE SAME

#1951
20080210665
2008-09-04

POLISHING COMPOSITION AND POLISHING METHOD

#1952
20080207091
2008-08-28

Slurry Composition For Color Filter Polishing

#1953
20080206995
2008-08-28

METAL-POLISHING LIQUID AND POLISHING METHOD THEREWITH

#1954
20080203354
2008-08-28

Polishing liquid

#1955
20080203059
2008-08-28

DILUTABLE CMP COMPOSITION CONTAINING A SURFACTANT

#1956
20080202037
2008-08-28

Auto-stopping slurries for chemical-mechanical polishing of topographic dielectric silicon dioxide

#1957
20080200098
2008-08-21

Polishing slurry for aluminum and aluminum alloys

#1958
20080200033
2008-08-21

POLISHING COMPOUND, METHOD FOR POLISHING SURFACE TO BE POLISHED, AND PROCESS FOR PRODUCING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

#1959
20080197456
2008-08-21

Substrate polishing method, semiconductor device and fabrication method therefor

#1960
20080197112
2008-08-21

Chemical assisted lapping and polishing of metals

#1961
20080194183
2008-08-14

Planarization polishing method and method for manufacturing semiconductor device

#1962
20080194182
2008-08-14

Mechano-chemical polishing method for GaAs wafer

#1963
20080190894
2008-08-14

Chemical mechanical polishing slurries, their applications and method of use thereof

#1964
20080190035
2008-08-14

Slurries and methods for polishing phase change materials

#1965
20080188079
2008-08-07

METAL-POLISHING COMPOSITION AND CHEMICAL MECHANICAL POLISHING METHOD BY USING THE SAME

#1966
20080187675
2008-08-07

Liposomal compositions and methods for use

#1967
20080182485
2008-07-31

Method for immobilizing ligands and organometallic compounds on silica surface, and their application in chemical mechanical planarization

#1968
20080176982
2008-07-24

Polishing slurry for chemical mechanical polishing and method for polishing substrate

#1969
20080176403
2008-07-24

Method of polishing a layer and method of manufacturing a semiconductor device using the same

#1970
20080176075
2008-07-24

CERAMIC PARTICULATE MATERIAL AND PROCESSES FOR FORMING SAME

#1971
20080173843
2008-07-24

Polishing composition and polishing method using the same

#1972
20080171441
2008-07-17

Polishing compound and method for producing semiconductor integrated circuit device

#1973
20080161220
2008-07-03

Three-phase liquid polishing and cleaning composition

#1974
20080160881
2008-07-03

Polishing composition

#1975
20080160880
2008-07-03

Chemical mechanical polishing slurry and chemical mechanical polishing apparatus and method

#1976
20080156774
2008-07-03

CMP method for gold-containing substrates

#1977
20080153396
2008-06-26

Methods for machine ceramics

#1978
20080153293
2008-06-26

SILICON CARBIDE POLISHING METHOD UTILIZING WATER-SOLUBLE OXIDIZERS

#1979
20080153292
2008-06-26

Silicon carbide polishing method utilizing water-soluble oxidizers

#1980
20080149884
2008-06-26

Method and slurry for tuning low-k versus copper removal rates during chemical mechanical polishing

#1981
20080149591
2008-06-26

Method and slurry for reducing corrosion on tungsten during chemical mechanical polishing

#1982
20080148652
2008-06-26

Compositions for chemical mechanical planarization of copper

#1983
20080148649
2008-06-26

Ruthenium-barrier polishing slurry

#1984
20080146122
2008-06-19

POLISHING COMPOSITIONS AND USE THEREOF

#1985
20080142375
2008-06-19

ELECTROLYTE FORMULATION FOR ELECTROCHEMICAL MECHANICAL PLANARIZATION

#1986
20080139089
2008-06-12

Method of polishing hard crystal substrate

#1987
20080138990
2008-06-12

Polishing composition and polishing method

#1988
20080134585
2008-06-12

Compositions for polishing aluminum/copper and titanium in damascene structures

#1989
20080132156
2008-06-05

POLISHING COMPOSITION AND POLISHING METHOD

#1990
20080132071
2008-06-05

Composition and method for enhancing pot life of hydrogen peroxide-containing CMP slurries

#1991
20080131571
2008-06-05

Sol of spinous inorganic oxide particles, method of producing the sol, and polishing agent containing the sol

#1992
20080125018
2008-05-29

SOLUTION FOR FIXED ABRASIVE CHEMICAL MECHANICAL POLISHING PROCESS AND FIXED ABRASIVE CHEMICAL MECHANICAL POLISHING METHOD

#1993
20080125017
2008-05-29

POLISHING COMPOSITION AND POLISHING METHOD

#1994
20080125016
2008-05-29

Method for Producing Polishing Agent, Polishing Agent Produced Thereby and Method for Producing Silicon Wafer

#1995
20080124930
2008-05-29

METHODS OF RECYCLING A SUBSTRATE INCLUDING USING A CHEMICAL MECHANICAL POLISHING PROCESS

#1996
20080124913
2008-05-29

Slurry compositions and CMP methods using the same

#1997
20080121840
2008-05-29

Materials for polishing liquid for metal, polishing liquid for metal, method for preparation thereof and polishing method using the same

#1998
20080121839
2008-05-29

Slurry composition for chemical mechanical polishing and precursor composition thereof

#1999
20080120918
2008-05-29

POLISHING COMPOSITION AND POLISHING PROCESS

#2000
20080119052
2008-05-22

Selective barrier metal polishing method

#2001
20080119051
2008-05-22

Method for selective CMP of polysilicon

#2002
20080116172
2008-05-22

Method for one-to-one polishing of silicon nitride and silicon oxide

#2003
20080115423
2008-05-22

Polishing Composition For Silicon Wafer

#2004
20080115422
2008-05-22

Polishing composition

#2005
20080113257
2008-05-15

MEMBRANE ELECTRODE ASSEMBLIES FOR USE IN FUEL CELLS

#2006
20080111101
2008-05-15

Compositions and methods for CMP of low-k-dielectric materials

#2007
20080105652
2008-05-08

CMP of copper/ruthenium/tantalum substrates

#2008
20080105651
2008-05-08

Polishing Slurry for Cmp

#2009
20080104893
2008-05-08

POLISHING COMPOSITION AND POLISHING METHOD

#2010
20080102735
2008-05-01

Concentrated abrasive slurry compositions, methods of production, and methods of use thereof

#2011
20080096475
2008-04-24

Polishing Composition and Polishing Method

#2012
20080096470
2008-04-24

Chemical mechanical polishing slurry, its preparation method, and use for the same

#2013
20080096390
2008-04-24

Halide anions for metal removal rate control

#2014
20080096389
2008-04-24

Copper damascene chemical mechanical polishing (CMP) for thin film head writer fabrication

#2015
20080096388
2008-04-24

Planarization method using hybrid oxide and polysilicon CMP

#2016
20080096385
2008-04-24

SLURRY COMPOSITION FOR FORMING TUNGSTEN PATTERN AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME

#2017
20080090500
2008-04-17

PROCESS FOR REDUCING DISHING AND EROSION DURING CHEMICAL MECHANICAL PLANARIZATION

#2018
20080087644
2008-04-17

Polishing composition and polishing method

#2019
20080086951
2008-04-17

Spinous silica-based sol and method of producing the same

#2020
20080086950
2008-04-17

SEMICONDUCTOR POLISHING COMPOUND

#2021
20080085663
2008-04-10

Polishing compound for semiconductor integrated circuit device, polishing method and method for producing semiconductor integrated circuit device

#2022
20080085602
2008-04-10

Slurry composition for a chemical mechanical polishing process and method of manufacturing a semiconductor device using the slurry composition

#2023
20080081542
2008-04-03

Slurry compositions and methods of polishing a layer using the slurry compositions

#2024
20080076332
2008-03-27

Processing of a CMP slurry for improved planarization of integrated circuit wafers

#2025
20080076327
2008-03-27

Polishing slurry and polishing method using same

#2026
20080070412
2008-03-20

Polishing compound for semiconductor integrated circuit device, polishing method and method for producing semiconductor integrated circuit device

#2027
20080064211
2008-03-13

POLISHING COMPOUND FOR COPPER WIRINGS AND METHOD FOR POLISHING SURFACE OF SEMICONDUCTOR INTEGRATED CIRCUIT

#2028
20080060278
2008-03-13

Onium-containing CMP compositions and methods of use thereof

#2029
20080060277
2008-03-13

Polyoxometalate compositions and methods

#2030
20080057832
2008-03-06

Chemical-mechanical polishing composition and method for using the same

#2031
20080057716
2008-03-06

Metal-polishing composition and chemical-mechanical polishing method

#2032
20080057715
2008-03-06

CMP system utilizing halogen adduct

#2033
20080057713
2008-03-06

Silicon carbide polishing method utilizing water-soluble oxidizers

#2034
20080057608
2008-03-06

Manufacturing method of group III nitride substrate, group III nitride substrate, group III nitride substrate with epitaxial layer, manufacturing method of group III nitride substrate with epitaxial layer, and manufacturing method of group III nitride device

#2035
20080053002
2008-03-06

Solution for forming polishing slurry, polishing slurry and related methods

#2036
20080053001
2008-03-06

Polishing Composition and Polishing Method

#2037
20080051010
2008-02-28

Polishing composition and polishing method

#2038
20080045021
2008-02-21

DUAL REDUCED AGENTS FOR BARRIER REMOVAL IN CHEMICAL MECHANICAL POLISHING

#2039
20080045020
2008-02-21

Slurry Composition For a Chemical Mechanical Polishing Process, Method of Polishing an Object Layer and Method of Manufacturing a Semiconductor Memory Device Using the Slurry Composition

#2040
20080045018
2008-02-21

Method of chemical-mechanical polishing and method of forming isolation layer using the same

#2041
20080042100
2008-02-21

Slurry composition

#2042
20080042099
2008-02-21

Solution for forming polishing slurry, polishing slurry and related methods

#2043
20080038996
2008-02-14

POLISHING COMPOSITION FOR SEMICONDUCTOR WAFER, PRODUCTION METHOD THEREOF, AND POLISHING METHOD

#2044
20080038995
2008-02-14

Periodic acid compositions for polishing ruthenium/low K substrates

#2045
20080038883
2008-02-14

Method for manufacturing semiconductor device utilizing recrystallized semiconductor film formed on an insulating film

#2046
20080035882
2008-02-14

COMPOSITION FOR POLISHING A SUBSTRATE

#2047
20080032606
2008-02-07

METHOD FOR CONTROLLING THE DISHING PROBLEM ASSOCIATED WITH CHEMICAL-MECHANICAL PLANARIZATION (CMP) DURING MANUFACTURE OF COPPER MULTILAYER INTERCONNECTION STRUCTURES IN ULTRA LARGE-SCALE INTEGRATED CIRCUITS (ULSI)

#2048
20080032505
2008-02-07

Polishing composition and polishing process

#2049
20080029126
2008-02-07

Compositions and methods for improved planarization of copper utilizing inorganic oxide abrasive

#2050
20080026583
2008-01-31

Compositions and methods for modifying a surface suited for semiconductor fabrication

#2051
20080026525
2008-01-31

Semiconductor processing method and chemical mechanical polishing methods

#2052
20080026150
2008-01-31

Silica-Free Surface Abrasion Compositions and Their Uses

#2053
20080020680
2008-01-24

Rate-enhanced CMP compositions for dielectric films

#2054
20080020578
2008-01-24

Composition for Chemical-Mechanical Polishing (Cmp)

#2055
20080020577
2008-01-24

Gallium and chromium ions for oxide rate enhancement

#2056
20080016784
2008-01-24

Tantalum CMP compositions and methods

#2057
20080014838
2008-01-17

Additive composition, slurry composition including the same, and method of polishing an object using the slurry composition

#2058
20080011980
2008-01-17

POLISHING INHIBITING LAYER FORMING ADDITIVE, SLURRY AND CMP METHOD

#2059
20080009136
2008-01-10

Polishing method using chemical mechanical slurry composition

#2060
20080006057
2008-01-10

Polishing composition for glass substrate

#2061
20080003925
2008-01-03

Cmp polishing slurry and method of polishing substrate

#2062
20080003924
2008-01-03

Polishing slurry and polishing method

#2063
20080003829
2008-01-03

Chemical mechanical polishing slurry

#2064
20080000878
2008-01-03

Method of texturing

#2065
20070298612
2007-12-27

Compositions and methods for polishing silicon nitride materials

#2066
20070298611
2007-12-27

Selective barrier slurry for chemical mechanical polishing

#2067
20070295934
2007-12-27

Polishing slurry and polishing method

#2068
20070293049
2007-12-20

Slurry for CMP of Cu film, polishing method and method for manufacturing semiconductor device

#2069
20070293048
2007-12-20

Polishing slurry

#2070
20070287362
2007-12-13

POLISHING COMPOSITION AND METHOD OF POLISHING WITH THE SAME

#2071
20070281486
2007-12-06

Slurry composition, method of polishing an object layer and method of manufacturing a non-volatile memory device using the slurry composition

#2072
20070281484
2007-12-06

Surface treatment method for nitride crystal, nitride crystal substrate, nitride crystal substrate with epitaxial layer and semiconductor device, and method of manufacturing nitride crystal substrate with epitaxial layer and semiconductor device

#2073
20070281483
2007-12-06

Compositions for chemical mechanical polishing silica and silicon nitride having improved endpoint detection

#2074
20070278447
2007-12-06

Slurry for chemical-mechanical planarization of sapphire and method for manufacturing the same

#2075
20070278184
2007-12-06

Gold CMP composition and method

#2076
20070278182
2007-12-06

Potassium monopersulfate solutions

#2077
20070275260
2007-11-29

Palladium-containing particles, method and apparatus of manufacturing palladium-containing devices made therefrom

#2078
20070270085
2007-11-22

CHEMICAL MECHANICAL POLISHING SLURRY, CMP PROCESS AND ELECTRONIC DEVICE PROCESS

#2079
20070269987
2007-11-22

Polishing Liquid for Cmp Process and Polishing Method

#2080
20070269985
2007-11-22

Two-step chemical mechanical polishing process

#2081
20070266642
2007-11-22

Abrasive, method of polishing target member and process for producing semiconductor device

#2082
20070266641
2007-11-22

Method of polishing a tungsten-containing substrate

#2083
20070266640
2007-11-22

Semiconductor polishing composition

#2084
20070264829
2007-11-15

SLURRY AND METHOD FOR CHEMICAL MECHANICAL POLISHING

#2085
20070257388
2007-11-08

Aerosol method and apparatus, particulate products, and electronic devices made therefrom

#2086
20070256517
2007-11-08

Aerosol method and apparatus, particulate products, and electronic devices made therefrom

#2087
20070256368
2007-11-08

Polishing composition and polishing method using the same

#2088
20070254964
2007-11-01

Ultrapure colloidal silica for use in chemical mechanical polishing applications

#2089
20070254563
2007-11-01

Polishing composition for magnetic disk substrate

#2090
20070254485
2007-11-01

ABRASIVE COMPOSITION FOR ELECTROCHEMICAL MECHANICAL POLISHING

#2091
20070254484
2007-11-01

Substantially spherical composite ceria/titania particles

#2092
20070254401
2007-11-01

Method of processing a surface of group III nitride crystal and group III nitride crystal substrate

#2093
20070251156
2007-11-01

Fluoride-modified silica sols for chemical mechanical planarization

#2094
20070251155
2007-11-01

Polishing composition containing polyether amine

#2095
20070249167
2007-10-25

CMP method for copper-containing substrates

#2096
20070243710
2007-10-18

Adjuvant for CMP slurry

#2097
20070240366
2007-10-18

Composition for Polishing

#2098
20070232197
2007-10-04

Polishing slurry and polishing method

#2099
20070232068
2007-10-04

Slurry for touch-up CMP and method of manufacturing semiconductor device

#2100
20070224919
2007-09-27

Iodate-containing chemical-mechanical polishing compositions and methods