ClassID:

103462

C09G1/02 - page 8 - CPC Classification

Classification description:

Polishing compositions containing abrasives or grinding agents

Recent Application in this class:
#2101
20070224822
2007-09-27

Halide anions for metal removal rate control

#2102
20070224806
2007-09-27

Metal polishing slurry

#2103
20070224760
2007-09-27

Method for manufacturing semiconductor device

#2104
20070224101
2007-09-27

Semiconductor Polishing Composition

#2105
20070221089
2007-09-27

Cleaning and polishing wax composition

#2106
20070220813
2007-09-27

Chemical mechanical polishing slurry composition for shallow trench isolation process of semiconductor

#2107
20070219104
2007-09-20

Oxidation-stabilized CMP compositions and methods

#2108
20070218811
2007-09-20

CMP POLISHING SLURRY AND METHOD OF POLISHING SUBSTRATE

#2109
20070218693
2007-09-20

HIGH SELECTIVITY SLURRY COMPOSITIONS FOR CHEMICAL MECHANICAL POLISHING

#2110
20070218692
2007-09-20

Copper-based metal polishing compositions and polishing processes

#2111
20070214728
2007-09-20

Polishing composition for a tungsten-containing substrate

#2112
20070210278
2007-09-13

Compositions for chemical mechanical polishing silicon dioxide and silicon nitride

#2113
20070209549
2007-09-13

Cleaning and polishing composition for metallic surfaces

#2114
20070209288
2007-09-13

Semiconductor Polishing Composition

#2115
20070209287
2007-09-13

Composition and method to polish silicon nitride

#2116
20070207617
2007-09-06

Polishing agent

#2117
20070205112
2007-09-06

Polishing apparatus and polishing method

#2118
20070204724
2007-09-06

Aerosol method and apparatus, particulate products, and electronic devices made therefrom

#2119
20070204519
2007-09-06

Process for producing CeOfine particles and polishing slurry containing such fine particles

#2120
20070202703
2007-08-30

Polishing composition and polishing method

#2121
20070202702
2007-08-30

Chemical mechanical polishing process

#2122
20070200089
2007-08-30

Polishing liquid for metals

#2123
20070196975
2007-08-23

Metal-Polishing Liquid And Polishing Method Using The Same

#2124
20070191244
2007-08-16

CMP slurry and method for polishing semiconductor wafer using the same

#2125
20070190910
2007-08-16

Slurry composition and method for polishing organic polymer-based ophthalmic substrates

#2126
20070190906
2007-08-16

POLISHING MEDIUM FOR CHEMICAL-MECHANICAL POLISHING, AND POLISHING METHOD

#2127
20070190789
2007-08-16

Compositions and methods for CMP of indium tin oxide surfaces

#2128
20070186486
2007-08-16

Polishing composition and rinse composition

#2129
20070186485
2007-08-16

POLISHING COMPOSITION AND RINSE COMPOSITION

#2130
20070186484
2007-08-16

Metal-polishing liquid and chemical mechanical polishing method using the same

#2131
20070184661
2007-08-09

Multi-component barrier polishing solution

#2132
20070181852
2007-08-09

PASSIVATIVE CHEMICAL MECHANICAL POLISHING COMPOSITION FOR COPPER FILM PLANARIZATION

#2133
20070181850
2007-08-09

Polishing liquid for barrier layer

#2134
20070181535
2007-08-09

Compositions and methods for CMP of semiconductor materials

#2135
20070180778
2007-08-09

CMP porous pad with component-filled pores

#2136
20070179238
2007-08-02

Method for improving mechanical properties of polymer particles and its applications

#2137
20070178700
2007-08-02

Compositions and methods for CMP of phase change alloys

#2138
20070176142
2007-08-02

Metal- polishing liquid and chemical-mechanical polishing method using the same

#2139
20070176141
2007-08-02

Compositions and methods for chemical mechanical polishing interlevel dielectric layers

#2140
20070176140
2007-08-02

Polishing composition and polishing method

#2141
20070175104
2007-08-02

Polishing slurry for silicon oxide, additive liquid and polishing method

#2142
20070169421
2007-07-26

CMP abrasive, method for polishing substrate and method for manufacturing semiconductor device using the same, and additive for CMP abrasive

#2143
20070167116
2007-07-19

POLISHING COMPOSITION

#2144
20070167017
2007-07-19

Materials for polishing liquid for metal, polishing liquid for metal, method for preparation thereof and polishing method using the same

#2145
20070167016
2007-07-19

Metal-polishing liquid and chemical-mechanical polishing method using the same

#2146
20070167015
2007-07-19

Polishing method

#2147
20070166221
2007-07-19

Nanocarbon fulerenes (ncf), method for producing ncf and use of ncf in the form of nanocarbons

#2148
20070166216
2007-07-19

Cerium salt, producing method thereof, cerium oxide and cerium based polishing slurry

#2149
20070163998
2007-07-19

Composition for polishing semiconductor layers

#2150
20070163677
2007-07-19

Copper CMP slurry composition

#2151
20070158309
2007-07-12

Slurry composition for chemical-mechanical polishing capable of compensating nanotopography effect and method for planarizing surface of semiconductor device using the same

#2152
20070157524
2007-07-12

Dispersion for the chemical-mechanical polishing of metal surfaces containing metal oxide particles and a cationic polymer

#2153
20070155178
2007-07-05

Slurry for chemical mechanical polishing process and method of manufacturing semiconductor device using the same

#2154
20070149097
2007-06-28

Polishing composition for hard disk substrate

#2155
20070148978
2007-06-28

Slurry compositions, methods of polishing polysilicon layers using the slurry compositions and methods of manufacturing semiconductor devices using the slurry compositions

#2156
20070145014
2007-06-28

Polishing composition for glass substrate

#2157
20070145012
2007-06-28

Slurry and method for chemical-mechanical polishing

#2158
20070144075
2007-06-28

Chemical mechanical polishing particles and slurry and method of producing the same

#2159
20070141957
2007-06-21

Polishing slurry for polishing aluminum film and polishing method for polishing aluminum film using the same

#2160
20070138438
2007-06-21

Security features incorporating photoluminescent phosphor powders and methods for making security features

#2161
20070135655
2007-06-14

Use of fluorinated additives in the etching or polishing of integrated circuits

#2162
20070132058
2007-06-14

Adjuvant for controlling polishing selectivity and chemical mechanical polishing slurry comprising the same

#2163
20070131899
2007-06-14

Composition for polishing semiconductor layers

#2164
20070130839
2007-06-14

ROLL-OFF REDUCING AGENT

#2165
20070128874
2007-06-07

CHEMICAL MECHANICAL POLISHING METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

#2166
20070128873
2007-06-07

Aqueous dispersion for CMP, polishing method and method for manufacturing semiconductor device

#2167
20070128872
2007-06-07

Polishing composition and polishing method

#2168
20070123153
2007-05-31

Texturing slurry and texturing method by using same

#2169
20070122549
2007-05-31

Coated silver-containing particles, method and apparatus of manufacture, and silver-containing devices made therefrom

#2170
20070122546
2007-05-31

Texturing pads and slurry for magnetic heads

#2171
20070120090
2007-05-31

System for the preferential removal of silicon oxide

#2172
20070119103
2007-05-31

SURFACE DEFECT TREATMENT COMPOSITIONS

#2173
20070117394
2007-05-24

Polishing slurry for CMP and polishing method

#2174
20070108067
2007-05-17

Polishing apparatus and method of polishing work

#2175
20070105485
2007-05-10

Method of producing III-nitride substrate

#2176
20070105376
2007-05-10

COPPER-BASED METAL POLISHING SOLUTION AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

#2177
20070104605
2007-05-10

Coated silver-containing particles, method and apparatus of manufacture, and silver-containing devices made therefrom

#2178
20070101659
2007-05-10

Chemical mechanical polishing slurry compositions, methods of preparing the same and methods of using the same

#2179
20070099427
2007-05-03

Method for preparing of cerium oxide powder for chemical mechanical polishing and method for preparing of chemical mechanical polishing slurry using the same

#2180
20070094936
2007-05-03

Abrasive slurry having high dispersion stability and manufacturing method for a substrate

#2181
20070093187
2007-04-26

Polishing liquid

#2182
20070093183
2007-04-26

CERIUM OXIDE SLURRY, CERIUM OXIDE POLISHING SLURRY AND METHOD FOR POLISHING SUBSTRATE USING THE SAME

#2183
20070093064
2007-04-26

Polishing method of Cu film and method for manufacturing semiconductor device

#2184
20070090094
2007-04-26

CMP of copper/ruthenium substrates

#2185
20070087667
2007-04-19

Polishing slurries

#2186
20070084828
2007-04-19

Polishing composition for a semiconductor substrate

#2187
20070082833
2007-04-12

LOW COST AND LOW DISHING SLURRY FOR POLYSILICON CMP

#2188
20070082456
2007-04-12

Polishing composition and polishing method

#2189
20070077868
2007-04-05

Cerium-based abrasive, abrasive slurry, and production of cerium-based abrasive

#2190
20070077865
2007-04-05

Method for controlling polysilicon removal

#2191
20070077764
2007-04-05

Polishing method, polishing composition and polishing composition kit

#2192
20070075292
2007-04-05

Ultrapure colloidal silica for use in chemical mechanical polishing applications

#2193
20070075291
2007-04-05

CMP slurry, preparation method thereof and method of polishing substrate using the same

#2194
20070075042
2007-04-05

Stabilizer-Fenton's reaction metal-vinyl pyridine polymer-surface-modified chemical mechanical planarization composition and associated method

#2195
20070075041
2007-04-05

Polishing slurry, method of treating surface of GaInAsPcrystal and GaInAsPcrystal substrate

#2196
20070075040
2007-04-05

Composition and method for planarizing surfaces

#2197
20070074457
2007-04-05

Polishing composition and polishing method

#2198
20070072427
2007-03-29

Method for fabricating semiconductor device and polishing method

#2199
20070069176
2007-03-29

Aqueous polishing liquid and chemical mechanical polishing method

#2200
20070068901
2007-03-29

Composition and method for enhancing pot life of hydrogen peroxide-containing CMP slurries

#2201
20070068087
2007-03-29

Metal cations for initiating polishing

#2202
20070068086
2007-03-29

Metal polishing liquid and polishing method using it

#2203
20070066066
2007-03-22

Polishing method for glass substrate, and glass substrate

#2204
20070066065
2007-03-22

Metal-polishing liquid and chemical-mechanical polishing method

#2205
20070059935
2007-03-15

Polishing method for semiconductor wafer

#2206
20070059450
2007-03-15

Ed's baby powder glaze polish

#2207
20070057225
2007-03-15

Conductive hydrocarbon fluid

#2208
20070056465
2007-03-15

Rapid generation of nanoparticles from bulk solids at room temperature

#2209
20070054495
2007-03-08

CMP composition of boron surface-modified abrasive and nitro-substituted sulfonic acid and method of use

#2210
20070051918
2007-03-08

Abrasive composition for the integrated circuit electronics industry

#2211
20070051917
2007-03-08

Polymeric barrier removal polishing slurry

#2212
20070051638
2007-03-08

Electropolishing liquid, electropolishing method, and method for fabricating semiconductor device

#2213
20070049180
2007-03-01

Aqueous dispersion for chemical mechanical polishing, kit for preparing the aqueous dispersion, chemical mechanical polishing process, and process for producing semiconductor devices

#2214
20070049025
2007-03-01

Chemical-mechanical planarization composition having ketooxime compounds and associated method for use

#2215
20070045234
2007-03-01

Compositions and methods for chemical mechanical polishing silicon dioxide and silicon nitride

#2216
20070045233
2007-03-01

Polishing liquid composition

#2217
20070044386
2007-03-01

Polishing composition

#2218
20070044385
2007-03-01

Polishing composition and polishing method

#2219
20070043230
2007-02-22

Polishing slurries and methods for chemical mechanical polishing

#2220
20070043124
2007-02-22

Dispersion for chemical-mechanical polishing

#2221
20070039927
2007-02-22

CMP wafer contamination reduced by insitu clean

#2222
20070039246
2007-02-22

Method for preparing polishing slurry

#2223
20070037892
2007-02-15

Aqueous slurry containing metallate-modified silica particles

#2224
20070029285
2007-02-08

Polishing method

#2225
20070023731
2007-02-01

Polishing slurries and methods for chemical mechanical polishing

#2226
20070021040
2007-01-25

Polishing composition and polishing method

#2227
20070017160
2007-01-25

Composite materials and method for making same

#2228
20070011952
2007-01-18

Chemical-mechanical polishing (CMP) slurry containing clay and CeO2 abrasive particles and method of planarizing surfaces

#2229
20070010098
2007-01-11

Use of CMP for aluminum mirror and solar cell fabrication

#2230
20070007248
2007-01-11

Compositions and methods for chemical mechanical polishing silica and silicon nitride

#2231
20070004322
2007-01-04

Polishing composition and polishing method

#2232
20070004209
2007-01-04

Slurry for chemical mechanical polishing of aluminum

#2233
20070000872
2007-01-04

Method for chemically mechanically polishing organic film, method of manufacturing semiconductor device, and program therefor

#2234
20060293191
2006-12-28

Semiconductor device fabrication method

#2235
20060289826
2006-12-28

Polishing slurry and polishing method

#2236
20060289387
2006-12-28

NON-AQUEOUS LAPPING COMPOSITION AND METHOD USING SAME

#2237
20060289034
2006-12-28

Compositions containing free radical quenchers

#2238
20060288929
2006-12-28

Polar surface preparation of nitride substrates

#2239
20060283094
2006-12-21

Polishing compound

#2240
20060283093
2006-12-21

Planarization composition

#2241
20060283092
2006-12-21

Abrasive compounds for semiconductor planarization

#2242
20060278614
2006-12-14

Polishing composition and method for defect improvement by reduced particle stiction on copper surface

#2243
20060276041
2006-12-07

Chemical mechanical polishing aqueous dispersion, chemical mechanical polishing method, and kit for preparing chemical mechanical polishing aqueous dispersion

#2244
20060270235
2006-11-30

Dihydroxy enol compounds used in chemical mechanical polishing compositions having metal ion oxidizers

#2245
20060266736
2006-11-30

Detecting particle agglomeration in chemical mechanical polishing slurries

#2246
20060261306
2006-11-23

Engineered non-polymeric organic particles for chemical mechanical planarization

#2247
20060261041
2006-11-23

Method for manufacturing metal line contact plug of semiconductor device

#2248
20060261040
2006-11-23

Methods for planarization of group VIII metal-containing surfaces using oxidizing agents

#2249
20060258267
2006-11-16

Polishing composition and polishing method using same

#2250
20060257659
2006-11-16

Electroluminescent phosphor powders, methods for making phosphor powders and devices incorporating same

#2251
20060255314
2006-11-16

Polishing slurry and method of reclaiming wafers

#2252
20060255015
2006-11-16

Surface modified colloidal abrasives, including stable bimetallic surface coated silica sols for chemical mechanical planarization

#2253
20060252268
2006-11-09

Slurry for use in polishing semiconductor device conductive structures that include copper and tungsten and polishing methods

#2254
20060249482
2006-11-09

Chemical mechanical polishing compositions for step-ll copper line and other associated materials and method of using same

#2255
20060249252
2006-11-09

Slurry for use in polishing semiconductor device conductive structures that include copper and tungsten and polishing methods

#2256
20060249135
2006-11-09

Method of producing III-nitride substrate

#2257
20060248804
2006-11-09

Abrasive, method of polishing target member and process for producing semiconductor device

#2258
20060246724
2006-11-02

Method for polishing wafer

#2259
20060246723
2006-11-02

Slurry composition for chemical mechanical polishing, method for planarization of surface of semiconductor element using the same, and method for controlling selection ratio of slurry composition

#2260
20060245995
2006-11-02

Process for preparing a polishing composition

#2261
20060243702
2006-11-02

CMP slurry for metallic film, polishing method and method of manufacturing semiconductor device

#2262
20060242912
2006-11-02

Slurry composition for secondary polishing of silicon wafer

#2263
20060241006
2006-10-26

Method of washing a polished object

#2264
20060240748
2006-10-26

Method of manufacturing abrasive composition

#2265
20060240672
2006-10-26

Polishing liquid composition

#2266
20060236922
2006-10-26

Method of surface treatment of group III nitride crystal film, group III nitride crystal substrate, group III nitride crystal substrate with epitaxial layer, and semiconductor device

#2267
20060236615
2006-10-26

Compositions and methods for removing scratches from plastic surfaces

#2268
20060234509
2006-10-19

Cerium oxide abrasives for chemical mechanical polishing

#2269
20060231795
2006-10-19

Sulfur-containing phosphor powders, methods for making phosphor powders and devices incorporating same

#2270
20060229001
2006-10-12

Exposing substance, exposing method, and exposing device

#2271
20060228999
2006-10-12

Slurry composition and method for polishing organic polymer-based ophthalmic substrates

#2272
20060226126
2006-10-12

Polymeric inhibitors for enhanced planarization

#2273
20060226125
2006-10-12

Chemical-mechanical polishing (CMP) slurry and method of planarizing computer memory disk surfaces

#2274
20060223320
2006-10-05

Polishing technique to minimize abrasive removal of material and composition therefor

#2275
20060219663
2006-10-05

Metal CMP process on one or more polishing stations using slurries with oxidizers

#2276
20060218867
2006-10-05

Polishing composition and polishing method using the same

#2277
20060216939
2006-09-28

Materials for polishing liquid for metal, polishing liquid for metal, method for preparation thereof and polishing method using the same

#2278
20060216936
2006-09-28

Chemical and mechanical polishing method and polishing liquid using therefor

#2279
20060216935
2006-09-28

Composition for oxide CMP in CMOS device fabrication

#2280
20060214133
2006-09-28

Metal polishing solution and polishing method

#2281
20060213868
2006-09-28

Low-dishing composition and method for chemical-mechanical planarization with branched-alkylphenol-substituted benzotriazole

#2282
20060213126
2006-09-28

Method for preparing a polishing slurry having high dispersion stability

#2283
20060207635
2006-09-21

Barrier polishing fluid

#2284
20060207188
2006-09-21

Ceria abrasive for cmp

#2285
20060205219
2006-09-14

Compositions and methods for chemical mechanical polishing interlevel dielectric layers

#2286
20060205218
2006-09-14

Compositions and methods for chemical mechanical polishing thin films and dielectric materials

#2287
20060201914
2006-09-14

Chemical mechanical polishing aqueous dispersion, chemical mechanical polishing method, and kit for preparing chemical mechanical polishing aqueous dispersion

#2288
20060201913
2006-09-14

Methods and compositions for removing Group VIII metal-containing materials from surfaces

#2289
20060201647
2006-09-14

Pyrogenic silicon dioxide powder and dispersion thereof

#2290
20060201378
2006-09-14

Multi-formulated composition and method for pretreatment, resurfacing, and restoration of plastic material

#2291
20060197055
2006-09-07

Slurry for CMP, polishing method and method of manufacturing semiconductor device

#2292
20060197054
2006-09-07

CMP abrasive, liquid additive for CMP abrasive and method for polishing substrate

#2293
20060196850
2006-09-07

Polishing slurry composition and method of using the same

#2294
20060196849
2006-09-07

Composition and method for polishing a sapphire surface

#2295
20060196848
2006-09-07

Method of polishing a silicon-containing dielectric

#2296
20060193764
2006-08-31

Process for the production of metal oxide powders

#2297
20060191872
2006-08-31

Method of polishing a wafer

#2298
20060191473
2006-08-31

Method for manufacturing semiconductor device, integrated circuit, electrooptics device, and electronic apparatus

#2299
20060189152
2006-08-24

Slurry composition, method of polishing an object and method of forming a contact in a semiconductor device using the slurry composition

#2300
20060186373
2006-08-24

Polishing medium for chemical-mechanical polishing, and polishing method

#2301
20060186372
2006-08-24

CMP abrasive, liquid additive for CMP abrasive and method for polishing substrate

#2302
20060186089
2006-08-24

Chemical mechanical polishing method

#2303
20060183334
2006-08-17

Methods for planarization of group VIII metal-containing surfaces using oxidizing gases

#2304
20060180788
2006-08-17

Free radical-forming activator attached to solid and used to enhance CMP formulations

#2305
20060180787
2006-08-17

Cerium oxide abrasive and method of polishing substrates

#2306
20060175298
2006-08-10

Method and composition for polishing a substrate

#2307
20060175295
2006-08-10

Abrasive partilcle for chemical mechanical polishing

#2308
20060163531
2006-07-27

Slurry for polishing copper film and method for polishing copper film using the same

#2309
20060163530
2006-07-27

Corrosion-resistant barrier polishing solution

#2310
20060163206
2006-07-27

Novel polishing slurries and abrasive-free solutions having a multifunctional activator

#2311
20060162261
2006-07-27

Composition and associated method for catalyzing removal rates of dielectric films during chemical mechanical planarization

#2312
20060160475
2006-07-20

Chemical mechanical polishing compositions for metal and associated materials and method of using same

#2313
20060157671
2006-07-20

Slurry for use in metal-chemical mechanical polishing and preparation method thereof

#2314
20060151854
2006-07-13

Polishing composition and rinsing composition

#2315
20060148667
2006-07-06

CMP polishing compound and polishing method

#2316
20060148260
2006-07-06

Selective polish for fabricating electronic devices

#2317
20060144825
2006-07-06

Dual reduced agents for barrier removal in chemical mechanical polishing

#2318
20060144824
2006-07-06

Method of polishing a silicon-containing dielectric

#2319
20060143993
2006-07-06

Slurry compositions for use in chemical mechanical polishing and method of manufacturing semiconductor device using the same

#2320
20060143990
2006-07-06

Polishing fluid for metal, and polishing method

#2321
20060141790
2006-06-29

Chemical mechanical polishing method

#2322
20060141741
2006-06-29

Adjuvant for chemical mechanical polishing slurry

#2323
20060138087
2006-06-29

Copper containing abrasive particles to modify reactivity and performance of copper CMP slurries

#2324
20060138086
2006-06-29

Multi-step methods for chemical mechanical polishing silicon dioxide and silicon nitride

#2325
20060135045
2006-06-22

Polishing compositions for reducing erosion in semiconductor wafers

#2326
20060131275
2006-06-22

Selective slurry for chemical mechanical polishing

#2327
20060130408
2006-06-22

Polishing slurry for ionic materials, method for selecting a dispersant to be contained in the polishing slurring, method for determining a mixing concentration of the selected dispersant and polishing method using said polishing slurry

#2328
20060124597
2006-06-15

Polishing medium for chemical-mechanical polishing, and method of polishing substrate member

#2329
20060124594
2006-06-15

Chemical mechanical polishing (CMP) slurries and CMP methods using and making the same

#2330
20060124593
2006-06-15

Colloidal silica based chemical mechanical polishing slurry

#2331
20060124592
2006-06-15

Chemical mechanical polish slurry

#2332
20060124591
2006-06-15

Polishing slurry for chemical mechanical polishing and method for polishing substrate

#2333
20060124026
2006-06-15

Polishing solutions

#2334
20060123709
2006-06-15

Abrasive enhancing composition

#2335
20060120930
2006-06-08

Method for setting firing temperature of cerium carbonate, method for producing cerium oxide abrasives and cerium oxide abrasives obtained by the method

#2336
20060118760
2006-06-08

Slurry composition and methods for chemical mechanical polishing

#2337
20060118524
2006-06-08

CERIUM OXIDE ABRASIVE AND METHOD OF POLISHING SUBSTRATES

#2338
20060117667
2006-06-08

Free radical-forming activator attached to solid and used to enhance CMP formulations

#2339
20060117666
2006-06-08

Polishing composition

#2340
20060115973
2006-06-01

Metal polishing composition and method of polishing using the same

#2341
20060113283
2006-06-01

Polishing composition for a semiconductor substrate

#2342
20060112649
2006-06-01

Hydrothermal synthesis of cerium-titanium oxide for use in CMP

#2343
20060111024
2006-05-25

Cellulose-containing polishing compositions and methods relating thereto

#2344
20060110923
2006-05-25

Barrier polishing solution

#2345
20060108326
2006-05-25

Polishing composition and method for high silicon nitride to silicon oxide removal rate ratios

#2346
20060108325
2006-05-25

Polishing process for producing damage free surfaces on semi-insulating silicon carbide wafers

#2347
20060104881
2006-05-18

Process for the produciton of metal oxide and metalloid oxide dispersions

#2348
20060099890
2006-05-11

Simultaneous planarization of pole piece and coil materials for write head applications

#2349
20060099817
2006-05-11

Novel slurry for chemical mechanical polishing of metals

#2350
20060099814
2006-05-11

Polishing composition and method for high silicon nitride to silicon oxide removal rate ratios

#2351
20060097347
2006-05-11

Novel slurry for chemical mechanical polishing of metals

#2352
20060097219
2006-05-11

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Chemical mechanical polishing process for 2.45T CoFeNi structures of thin film magnetic heads

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Ceria composition and process for preparing same

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Slurry, chemical mechanical polishing method using the slurry, and method of forming a surface of a capacitor using the slurry

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Polishing medium for chemical-mechanical polishing, and method of polishing substrate member

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Ceria composition and process for preparing same

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Method of manufacturing polishing slurry for use in precise polishing process

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Method of preparing slurry composition for chemical mechanical polishing

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Polymer-coated particles for chemical mechanical polishing

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Polishing composition

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Compositions and methods for tantalum CMP

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Slurry, chemical mechanical polishing method using the slurry, and method of forming metal wiring using the slurry

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Method of forming a polishing inhibiting layer using a slurry having an additive

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CMP composition containing organic nitro compounds

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Polish having improved abrasion resistance

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Polishing composition for noble metals

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Method of manufacturing of polymer-coated particles for chemical mechanical polishing

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