103462 ⎘
Polishing compositions containing abrasives or grinding agents
Halide anions for metal removal rate control
#2102Metal polishing slurry
#2103Method for manufacturing semiconductor device
#2104Semiconductor Polishing Composition
#2105Cleaning and polishing wax composition
#2106Chemical mechanical polishing slurry composition for shallow trench isolation process of semiconductor
#2107Oxidation-stabilized CMP compositions and methods
#2108CMP POLISHING SLURRY AND METHOD OF POLISHING SUBSTRATE
#2109HIGH SELECTIVITY SLURRY COMPOSITIONS FOR CHEMICAL MECHANICAL POLISHING
#2110Copper-based metal polishing compositions and polishing processes
#2111Polishing composition for a tungsten-containing substrate
#2112Compositions for chemical mechanical polishing silicon dioxide and silicon nitride
#2113Cleaning and polishing composition for metallic surfaces
#2114Semiconductor Polishing Composition
#2115Composition and method to polish silicon nitride
#2116Polishing agent
#2117Polishing apparatus and polishing method
#2118Aerosol method and apparatus, particulate products, and electronic devices made therefrom
#2119Process for producing CeOfine particles and polishing slurry containing such fine particles
#2120Polishing composition and polishing method
#2121Chemical mechanical polishing process
#2122Polishing liquid for metals
#2123Metal-Polishing Liquid And Polishing Method Using The Same
#2124CMP slurry and method for polishing semiconductor wafer using the same
#2125Slurry composition and method for polishing organic polymer-based ophthalmic substrates
#2126POLISHING MEDIUM FOR CHEMICAL-MECHANICAL POLISHING, AND POLISHING METHOD
#2127Compositions and methods for CMP of indium tin oxide surfaces
#2128Polishing composition and rinse composition
#2129POLISHING COMPOSITION AND RINSE COMPOSITION
#2130Metal-polishing liquid and chemical mechanical polishing method using the same
#2131Multi-component barrier polishing solution
#2132PASSIVATIVE CHEMICAL MECHANICAL POLISHING COMPOSITION FOR COPPER FILM PLANARIZATION
#2133Polishing liquid for barrier layer
#2134Compositions and methods for CMP of semiconductor materials
#2135CMP porous pad with component-filled pores
#2136Method for improving mechanical properties of polymer particles and its applications
#2137Compositions and methods for CMP of phase change alloys
#2138Metal- polishing liquid and chemical-mechanical polishing method using the same
#2139Compositions and methods for chemical mechanical polishing interlevel dielectric layers
#2140Polishing composition and polishing method
#2141Polishing slurry for silicon oxide, additive liquid and polishing method
#2142CMP abrasive, method for polishing substrate and method for manufacturing semiconductor device using the same, and additive for CMP abrasive
#2143POLISHING COMPOSITION
#2144Materials for polishing liquid for metal, polishing liquid for metal, method for preparation thereof and polishing method using the same
#2145Metal-polishing liquid and chemical-mechanical polishing method using the same
#2146Polishing method
#2147Nanocarbon fulerenes (ncf), method for producing ncf and use of ncf in the form of nanocarbons
#2148Cerium salt, producing method thereof, cerium oxide and cerium based polishing slurry
#2149Composition for polishing semiconductor layers
#2150Copper CMP slurry composition
#2151Slurry composition for chemical-mechanical polishing capable of compensating nanotopography effect and method for planarizing surface of semiconductor device using the same
#2152Dispersion for the chemical-mechanical polishing of metal surfaces containing metal oxide particles and a cationic polymer
#2153Slurry for chemical mechanical polishing process and method of manufacturing semiconductor device using the same
#2154Polishing composition for hard disk substrate
#2155Slurry compositions, methods of polishing polysilicon layers using the slurry compositions and methods of manufacturing semiconductor devices using the slurry compositions
#2156Polishing composition for glass substrate
#2157Slurry and method for chemical-mechanical polishing
#2158Chemical mechanical polishing particles and slurry and method of producing the same
#2159Polishing slurry for polishing aluminum film and polishing method for polishing aluminum film using the same
#2160Security features incorporating photoluminescent phosphor powders and methods for making security features
#2161Use of fluorinated additives in the etching or polishing of integrated circuits
#2162Adjuvant for controlling polishing selectivity and chemical mechanical polishing slurry comprising the same
#2163Composition for polishing semiconductor layers
#2164ROLL-OFF REDUCING AGENT
#2165CHEMICAL MECHANICAL POLISHING METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
#2166Aqueous dispersion for CMP, polishing method and method for manufacturing semiconductor device
#2167Polishing composition and polishing method
#2168Texturing slurry and texturing method by using same
#2169Coated silver-containing particles, method and apparatus of manufacture, and silver-containing devices made therefrom
#2170Texturing pads and slurry for magnetic heads
#2171System for the preferential removal of silicon oxide
#2172SURFACE DEFECT TREATMENT COMPOSITIONS
#2173Polishing slurry for CMP and polishing method
#2174Polishing apparatus and method of polishing work
#2175Method of producing III-nitride substrate
#2176COPPER-BASED METAL POLISHING SOLUTION AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
#2177Coated silver-containing particles, method and apparatus of manufacture, and silver-containing devices made therefrom
#2178Chemical mechanical polishing slurry compositions, methods of preparing the same and methods of using the same
#2179Method for preparing of cerium oxide powder for chemical mechanical polishing and method for preparing of chemical mechanical polishing slurry using the same
#2180Abrasive slurry having high dispersion stability and manufacturing method for a substrate
#2181Polishing liquid
#2182CERIUM OXIDE SLURRY, CERIUM OXIDE POLISHING SLURRY AND METHOD FOR POLISHING SUBSTRATE USING THE SAME
#2183Polishing method of Cu film and method for manufacturing semiconductor device
#2184CMP of copper/ruthenium substrates
#2185Polishing slurries
#2186Polishing composition for a semiconductor substrate
#2187LOW COST AND LOW DISHING SLURRY FOR POLYSILICON CMP
#2188Polishing composition and polishing method
#2189Cerium-based abrasive, abrasive slurry, and production of cerium-based abrasive
#2190Method for controlling polysilicon removal
#2191Polishing method, polishing composition and polishing composition kit
#2192Ultrapure colloidal silica for use in chemical mechanical polishing applications
#2193CMP slurry, preparation method thereof and method of polishing substrate using the same
#2194Stabilizer-Fenton's reaction metal-vinyl pyridine polymer-surface-modified chemical mechanical planarization composition and associated method
#2195Polishing slurry, method of treating surface of GaInAsPcrystal and GaInAsPcrystal substrate
#2196Composition and method for planarizing surfaces
#2197Polishing composition and polishing method
#2198Method for fabricating semiconductor device and polishing method
#2199Aqueous polishing liquid and chemical mechanical polishing method
#2200Composition and method for enhancing pot life of hydrogen peroxide-containing CMP slurries
#2201Metal cations for initiating polishing
#2202Metal polishing liquid and polishing method using it
#2203Polishing method for glass substrate, and glass substrate
#2204Metal-polishing liquid and chemical-mechanical polishing method
#2205Polishing method for semiconductor wafer
#2206Ed's baby powder glaze polish
#2207Conductive hydrocarbon fluid
#2208Rapid generation of nanoparticles from bulk solids at room temperature
#2209CMP composition of boron surface-modified abrasive and nitro-substituted sulfonic acid and method of use
#2210Abrasive composition for the integrated circuit electronics industry
#2211Polymeric barrier removal polishing slurry
#2212Electropolishing liquid, electropolishing method, and method for fabricating semiconductor device
#2213Aqueous dispersion for chemical mechanical polishing, kit for preparing the aqueous dispersion, chemical mechanical polishing process, and process for producing semiconductor devices
#2214Chemical-mechanical planarization composition having ketooxime compounds and associated method for use
#2215Compositions and methods for chemical mechanical polishing silicon dioxide and silicon nitride
#2216Polishing liquid composition
#2217Polishing composition
#2218Polishing composition and polishing method
#2219Polishing slurries and methods for chemical mechanical polishing
#2220Dispersion for chemical-mechanical polishing
#2221CMP wafer contamination reduced by insitu clean
#2222Method for preparing polishing slurry
#2223Aqueous slurry containing metallate-modified silica particles
#2224Polishing method
#2225Polishing slurries and methods for chemical mechanical polishing
#2226Polishing composition and polishing method
#2227Composite materials and method for making same
#2228Chemical-mechanical polishing (CMP) slurry containing clay and CeO2 abrasive particles and method of planarizing surfaces
#2229Use of CMP for aluminum mirror and solar cell fabrication
#2230Compositions and methods for chemical mechanical polishing silica and silicon nitride
#2231Polishing composition and polishing method
#2232Slurry for chemical mechanical polishing of aluminum
#2233Method for chemically mechanically polishing organic film, method of manufacturing semiconductor device, and program therefor
#2234Semiconductor device fabrication method
#2235Polishing slurry and polishing method
#2236NON-AQUEOUS LAPPING COMPOSITION AND METHOD USING SAME
#2237Compositions containing free radical quenchers
#2238Polar surface preparation of nitride substrates
#2239Polishing compound
#2240Planarization composition
#2241Abrasive compounds for semiconductor planarization
#2242Polishing composition and method for defect improvement by reduced particle stiction on copper surface
#2243Chemical mechanical polishing aqueous dispersion, chemical mechanical polishing method, and kit for preparing chemical mechanical polishing aqueous dispersion
#2244Dihydroxy enol compounds used in chemical mechanical polishing compositions having metal ion oxidizers
#2245Detecting particle agglomeration in chemical mechanical polishing slurries
#2246Engineered non-polymeric organic particles for chemical mechanical planarization
#2247Method for manufacturing metal line contact plug of semiconductor device
#2248Methods for planarization of group VIII metal-containing surfaces using oxidizing agents
#2249Polishing composition and polishing method using same
#2250Electroluminescent phosphor powders, methods for making phosphor powders and devices incorporating same
#2251Polishing slurry and method of reclaiming wafers
#2252Surface modified colloidal abrasives, including stable bimetallic surface coated silica sols for chemical mechanical planarization
#2253Slurry for use in polishing semiconductor device conductive structures that include copper and tungsten and polishing methods
#2254Chemical mechanical polishing compositions for step-ll copper line and other associated materials and method of using same
#2255Slurry for use in polishing semiconductor device conductive structures that include copper and tungsten and polishing methods
#2256Method of producing III-nitride substrate
#2257Abrasive, method of polishing target member and process for producing semiconductor device
#2258Method for polishing wafer
#2259Slurry composition for chemical mechanical polishing, method for planarization of surface of semiconductor element using the same, and method for controlling selection ratio of slurry composition
#2260Process for preparing a polishing composition
#2261CMP slurry for metallic film, polishing method and method of manufacturing semiconductor device
#2262Slurry composition for secondary polishing of silicon wafer
#2263Method of washing a polished object
#2264Method of manufacturing abrasive composition
#2265Polishing liquid composition
#2266Method of surface treatment of group III nitride crystal film, group III nitride crystal substrate, group III nitride crystal substrate with epitaxial layer, and semiconductor device
#2267Compositions and methods for removing scratches from plastic surfaces
#2268Cerium oxide abrasives for chemical mechanical polishing
#2269Sulfur-containing phosphor powders, methods for making phosphor powders and devices incorporating same
#2270Exposing substance, exposing method, and exposing device
#2271Slurry composition and method for polishing organic polymer-based ophthalmic substrates
#2272Polymeric inhibitors for enhanced planarization
#2273Chemical-mechanical polishing (CMP) slurry and method of planarizing computer memory disk surfaces
#2274Polishing technique to minimize abrasive removal of material and composition therefor
#2275Metal CMP process on one or more polishing stations using slurries with oxidizers
#2276Polishing composition and polishing method using the same
#2277Materials for polishing liquid for metal, polishing liquid for metal, method for preparation thereof and polishing method using the same
#2278Chemical and mechanical polishing method and polishing liquid using therefor
#2279Composition for oxide CMP in CMOS device fabrication
#2280Metal polishing solution and polishing method
#2281Low-dishing composition and method for chemical-mechanical planarization with branched-alkylphenol-substituted benzotriazole
#2282Method for preparing a polishing slurry having high dispersion stability
#2283Barrier polishing fluid
#2284Ceria abrasive for cmp
#2285Compositions and methods for chemical mechanical polishing interlevel dielectric layers
#2286Compositions and methods for chemical mechanical polishing thin films and dielectric materials
#2287Chemical mechanical polishing aqueous dispersion, chemical mechanical polishing method, and kit for preparing chemical mechanical polishing aqueous dispersion
#2288Methods and compositions for removing Group VIII metal-containing materials from surfaces
#2289Pyrogenic silicon dioxide powder and dispersion thereof
#2290Multi-formulated composition and method for pretreatment, resurfacing, and restoration of plastic material
#2291Slurry for CMP, polishing method and method of manufacturing semiconductor device
#2292CMP abrasive, liquid additive for CMP abrasive and method for polishing substrate
#2293Polishing slurry composition and method of using the same
#2294Composition and method for polishing a sapphire surface
#2295Method of polishing a silicon-containing dielectric
#2296Process for the production of metal oxide powders
#2297Method of polishing a wafer
#2298Method for manufacturing semiconductor device, integrated circuit, electrooptics device, and electronic apparatus
#2299Slurry composition, method of polishing an object and method of forming a contact in a semiconductor device using the slurry composition
#2300Polishing medium for chemical-mechanical polishing, and polishing method
#2301CMP abrasive, liquid additive for CMP abrasive and method for polishing substrate
#2302Chemical mechanical polishing method
#2303Methods for planarization of group VIII metal-containing surfaces using oxidizing gases
#2304Free radical-forming activator attached to solid and used to enhance CMP formulations
#2305Cerium oxide abrasive and method of polishing substrates
#2306Method and composition for polishing a substrate
#2307Abrasive partilcle for chemical mechanical polishing
#2308Slurry for polishing copper film and method for polishing copper film using the same
#2309Corrosion-resistant barrier polishing solution
#2310Novel polishing slurries and abrasive-free solutions having a multifunctional activator
#2311Composition and associated method for catalyzing removal rates of dielectric films during chemical mechanical planarization
#2312Chemical mechanical polishing compositions for metal and associated materials and method of using same
#2313Slurry for use in metal-chemical mechanical polishing and preparation method thereof
#2314Polishing composition and rinsing composition
#2315CMP polishing compound and polishing method
#2316Selective polish for fabricating electronic devices
#2317Dual reduced agents for barrier removal in chemical mechanical polishing
#2318Method of polishing a silicon-containing dielectric
#2319Slurry compositions for use in chemical mechanical polishing and method of manufacturing semiconductor device using the same
#2320Polishing fluid for metal, and polishing method
#2321Chemical mechanical polishing method
#2322Adjuvant for chemical mechanical polishing slurry
#2323Copper containing abrasive particles to modify reactivity and performance of copper CMP slurries
#2324Multi-step methods for chemical mechanical polishing silicon dioxide and silicon nitride
#2325Polishing compositions for reducing erosion in semiconductor wafers
#2326Selective slurry for chemical mechanical polishing
#2327Polishing slurry for ionic materials, method for selecting a dispersant to be contained in the polishing slurring, method for determining a mixing concentration of the selected dispersant and polishing method using said polishing slurry
#2328Polishing medium for chemical-mechanical polishing, and method of polishing substrate member
#2329Chemical mechanical polishing (CMP) slurries and CMP methods using and making the same
#2330Colloidal silica based chemical mechanical polishing slurry
#2331Chemical mechanical polish slurry
#2332Polishing slurry for chemical mechanical polishing and method for polishing substrate
#2333Polishing solutions
#2334Abrasive enhancing composition
#2335Method for setting firing temperature of cerium carbonate, method for producing cerium oxide abrasives and cerium oxide abrasives obtained by the method
#2336Slurry composition and methods for chemical mechanical polishing
#2337CERIUM OXIDE ABRASIVE AND METHOD OF POLISHING SUBSTRATES
#2338Free radical-forming activator attached to solid and used to enhance CMP formulations
#2339Polishing composition
#2340Metal polishing composition and method of polishing using the same
#2341Polishing composition for a semiconductor substrate
#2342Hydrothermal synthesis of cerium-titanium oxide for use in CMP
#2343Cellulose-containing polishing compositions and methods relating thereto
#2344Barrier polishing solution
#2345Polishing composition and method for high silicon nitride to silicon oxide removal rate ratios
#2346Polishing process for producing damage free surfaces on semi-insulating silicon carbide wafers
#2347Process for the produciton of metal oxide and metalloid oxide dispersions
#2348Simultaneous planarization of pole piece and coil materials for write head applications
#2349Novel slurry for chemical mechanical polishing of metals
#2350Polishing composition and method for high silicon nitride to silicon oxide removal rate ratios
#2351Novel slurry for chemical mechanical polishing of metals
#2352High selectivity slurry compositions for chemical mechanical polishing
#2353CMP composition comprising surfactant
#2354CMP composition containing surface-modified abrasive particles
#2355Chemical mechanical polishing method, and washing/rinsing method associated therewith
#2356Generating nano-particles for chemical mechanical planarization
#2357Polishing composition
#2358Methods and compositions for chemical mechanical polishing substrates
#2359Methods and compositions for chemical mechanical polishing substrates
#2360Aqueous slurry composition for chemical mechanical planarization
#2361Metal ion-containing CMP composition and method for using the same
#2362Polishing slurries for copper and associated materials
#2363Systems, methods and slurries for chemical mechanical polishing
#2364Composition for selectively polishing silicon nitride layer and polishing method employing it
#2365Polishing composition and polishing method using the same
#2366CMP composition with a polymer additive for polishing noble metals
#2367Polishing composition and method of polishing with the same
#2368Selective barrier slurry for chemical mechanical polishing
#2369Polishing composition and process for producing wiring structure using it
#2370Slurry compositions, methods of preparing slurry compositions, and methods of polishing an object using slurry compositions
#2371CHEMICAL MECHANICAL POLISHING PROCESS
#2372Chemical mechanical polishing process
#2373Ceria-based polish processes, and ceria-based slurries
#2374Metal surface protective film forming agent and use thereof
#2375Polishing composition and polishing method using the same
#2376Monitoring and control of a fabrication process
#2377Polishing composition and polishing method using the same
#2378Chemical-mechanical planarization composition having benzenesulfonic acid and per-compound oxidizing agents, and associated method for use
#2379Composition for polishing metal, polishing metod for metal layer, and production method for wafer
#2380Chemical mechanical polishing process for 2.45T CoFeNi structures of thin film magnetic heads
#2381Ceria composition and process for preparing same
#2382Slurry, chemical mechanical polishing method using the slurry, and method of forming a surface of a capacitor using the slurry
#2383Polishing medium for chemical-mechanical polishing, and method of polishing substrate member
#2384Ceria composition and process for preparing same
#2385METHODS OF CONTROLLING THE PROPERTIES OF ABRASIVE PARTICLES FOR USE IN CHEMICAL-MECHANICAL POLISHING SLURRIES
#2386Polishing slurry, method of producing same, and method of polishing substrate
#2387Method of manufacturing polishing slurry for use in precise polishing process
#2388Method of preparing slurry composition for chemical mechanical polishing
#2389Polymer-coated particles for chemical mechanical polishing
#2390Slurry for CMP, polishing method and method of manufacturing semiconductor device
#2391Polishing composition
#2392Compositions and methods for tantalum CMP
#2393Slurry, chemical mechanical polishing method using the slurry, and method of forming metal wiring using the slurry
#2394Method of forming a polishing inhibiting layer using a slurry having an additive
#2395High surface quality GaN wafer and method of fabricating same
#2396CMP composition containing organic nitro compounds
#2397Polish having improved abrasion resistance
#2398Polishing composition for noble metals
#2399Method of manufacturing of polymer-coated particles for chemical mechanical polishing
#2400Compositions and methods for chemical mechanical polishing silicon dioxide and silicon nitride