DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MICROSCOPY/LITHOGRAPHY TIPS

DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES

A Method of Manufacturing a MEMS Device

SCANNING PROBE MICROSCOPE (SPM) TIP

Debris removal from high aspect structures

SEMICONDUCTOR-LASER-INTEGRATED ATOMIC FORCE MICROSCOPY OPTICAL PROBE

Carbon nanomaterial functionalized needle tip modified with low work function material and preparation method thereof

Debris removal in high aspect structures

Rugged, single crystal wide-band-gap-material scanning-tunneling-microscopy/lithography tips

Nanoscale scanning electrochemical microscopy electrode method

Method, atomic force microscopy system and computer program product

Atomic force microscopy based on nanowire tips for high aspect ratio nanoscale metrology/confocal microscopy

Near field scanning probe microscope, probe for scanning probe microscope, and sample observation method

Debris removal in high aspect structures

Debris removal from high aspect structures

Rugged, single crystal wide-band-gap-material scanning-tunneling-microscopy/lithography tips

Conical nano-carbon material functionalized needle tip and preparation method therefor

Cantilever and manufacturing method for cantilever

Near field scanning probe microscope, probe for scanning probe microscope, and sample observation method

Cantilever for a scanning type probe microscope

Debris removal from high aspect structures

Atomic force microscope integrated with a multiple degrees-of-freedom magnetic actuator

Debris removal in high aspect structures

Method of fabricating nano-scale structures and nano-scale structures fabricated using the method

Electrochemically-grown nanowires and uses thereof

Scanning probe microscope and measurement method using same

Contactor devices with carbon nanotube probes embedded in a flexible film and processes of making such

Scanned probe microscopy (SPM) probe having angled tip

Thermionic emission device

Atomic force microscope probe

Carbon nanotube based micro-tip structure and method for making the same

Probe having nano-fingers

High resolution AFM tips containing an aluminum-doped semiconductor nanowire

Production scale fabrication method for high resolution AFM tips

Cantilever for magnetic force microscope and method of manufacturing the same

Ultra-low damping imaging mode related to scanning probe microscopy in liquid

Scanning probe microscope and method of observing sample using the same

Tip-mounted nanowire light source instrumentation

Production scale fabrication method for high resolution AFM tips

Micro contact prober

SPM Probe and Inspection Device for Light Emission Unit

SPM NANOPROBES AND THE PREPARATION METHOD THEREOF

CARBON NANOTUBE BASED COMPOSITE SURFACE ENHANCED RAMAN SCATTERING (SERS) PROBE

Apparatus and method for investigating surface properties of different materials

CARBON NANOTUBE SUPPORTING BODY AND PROCESS FOR PRODUCING THE CARBON NANOTUBE SUPPORTING BODY

Scanning probe microscope and method of observing sample using the same

Method for the collective fabrication of carbon nanofibers on the surface of micropatterns constructed on the surface of a substrate

PROBE SYSTEM COMPRISING AN ELECTRIC-FIELD-ALIGNED PROBE TIP AND METHOD FOR FABRICATING THE SAME

Scanning probe microscope and method of observing sample using the same

Magnetic device inspection apparatus and magnetic device inspection method

Solid immersion lens and related method for making same

METHOD FOR GROWING A CARBON NANOTUBE ON A NANOMETRIC TIP

Method of making and assembling capsulated nanostructures

Method for manufacturing a one-dimensional nano-structure-based device

Macroscopically manipulable nanoscale devices made from nanotube assemblies

Method for producing tapered metallic nanowire tips on atomic force microscope cantilevers

NANOSTRUCTURE DEVICES AND FABRICATION METHOD

Nanostructure on a probe tip

Aligned nanostructures on a tip

PROBE FOR SCANNING PROBE MICROSCOPE

Apparatus and process for controlled nanomanufacturing using catalyst retaining structures

Tool tips with scanning probe microscopy and/or atomic force microscopy applications

Sidewall tracing nanoprobes, method for making the same, and method for use

CARBON NANOTUBE DEVICE AND PROCESS FOR MANUFACTURING SAME

Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth

Machining nanometer-sized tips from multi-walled nanotubes

Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth

Nanostructure devices and fabrication method

Optical head for near-field recording and reproducing device

MICROTIPS AND NANOTIPS, AND METHOD FOR THEIR PRODUCTION

Tapered probe structures and fabrication

Dual carbon nanotubes for critical dimension metrology on high aspect ratio semiconductor wafer patterns

Method for fabricating SPM and CD-SPM nanoneedle probe using ion beam and SPM and CD-SPM nanoneedle probe thereby

Apparatus and Methods for Growing Nanofibres and Nanotips

Scanning probe microscopy cantilever, corresponding manufacturing method, scanning probe microscope, and scanning method

Electronic device containing carbon nanotubes

Method of manufacturing sample for atom probe analysis by FIB and focused ion beam apparatus implementing the same

Micro-protruding structure

Probe system comprising an electric-field-aligned probe tip and method for fabricating the same

PROBE TIPS

Carbon nanotube device and process for manufacturing same

Probe for a scanning magnetic force microscope, method for producing the same, and method for forming ferromagnetic alloy film on carbon nanotubes

Cantilever with carbon nano-tube for AFM

Nanotube-Based Nanoprobe Structure and Method for Making the Same

Carbon nanotube detection system

NANOWIRE SCANNING PROBE MICROSCOPY PROBE FOR MOLECULAR RECOGNITION IMAGING

Method of Producing Nanostructure Tips

ATOMIC FORCE MICROSCOPE CANTILEVER AND METHOD FOR MANUFACTURING THE SAME

SPM cantilever and manufacturing method thereof

MULTI-TIP SURFACE CANTILEVER PROBE

Scanning probe microscope probe and manufacturing method therefor, scanning probe microscope and using method therefor, needle-like body and manufacturing method therefor, electronic device and manufacturing method therefor, charge density wave quantum phase microscope, and charge density wave quantum interferometer

Atomic force microscope tip arrays and methods of manufacturing same

Amyloid beta protein channel structure and uses thereof in identifying potential drug molecules for neurodegenerative diseases

Cantilever probes for nanoscale magnetic and atomic force microscopy

Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth

Electronic device containing a carbon nanotube

Carbon thin line probe

Coherent electron junction scanning probe interference microscope, nanomanipulator and spectrometer with assembler and DNA sequencing applications

Functionalizable nanowire-based AFM probe

Method for performing a measurement inside a specimen using an insertable nanoscale FET probe

High aspect ratio AFM probe and method of making

Conductive carbon nanotube tip, probe having the conductive carbon nanotube tip, and method of manufacturing the conductive carbon nanotube tip

Y-shaped carbon nanotubes as AFM probe for analyzing substrates with angled topography

Data recording device with conducting microtips and production method thereof

Electric discharge apparatus for controlling the length of a carbon nanotube

Nano tip and fabrication method of the same

Probe for scanning thermal microscope

Oscillating probe with a virtual probe tip

Cantilever and inspecting apparatus

METHOD FOR ATTACHING ROD-SHAPED NANO STRUCTURE TO PROBE HOLDER

Nanotube probe and a method for manufacturing the same

Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers

Methods for assembly and sorting of nanostructure-containing materials and related articles

Probe manufacturing method, probe, and scanning probe microscope

Method for manufacturing a one-dimensional nano-structure-based device

Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers

Interferometric apparatus utilizing a cantilever array to measure a surface

Telegraph signal microscopy device and method

Method of fabricating a probe having a field effect transistor channel structure

Method for manufacturing a one-dimensional nano-structure-based device

Carbon nanotube excitation system

Probe for a scanning microscope

Method of making an angled tip for a scanning force microscope

SPM sensor

Cantilever

Apparatus for and method of bonding nano-tip using electrochemical etching

Electrostatically driven carbon nanotube gripping device

Bulk synthesis of long nanotubes of transition metal chalcogenides

Angled tip for a scanning force microscope

Electronic device containing a carbon nanotube

Surface characteristic analysis apparatus

Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus

Protein structures and protein fibres

Method for manufacturing single wall carbon nanotube tips

Method for fractionating single-wall carbon nanotubes

Scanning probe microscope and specimen surface structure measuring method

Cantilever probes for nanoscale magnetic and atomic force microscopy

High aspect ratio tip atomic force microscopy cantilevers and method of manufacture

Micro-protruding structure

Coatings for carbon nanotubes

Selective functionalization of carbon nanotube tips allowing fabrication of new classes of nanoscale sensing and manipulation tools

Magnetic carbon nanotube

Use of arrays of atomic force microscope/scanning tunneling microscope tips to scan nanocodes

Microstructures

Method and apparatus for fabricating commercially feasible and structurally robust nanotube-based nanomechanical devices

Vertically aligned nanostructure scanning probe microscope tips

Method for fabricating nanometer-scale structure

Probe structures incorporating nanowhiskers, production methods thereof and methods of forming nanowhiskers

Telescopic nanotube device for hot nanolithography

Carbon nanotube probes and structures and methods of measurement