171877 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Testing of digital circuits; Functional testing; Reconfiguring for testing, e.g. LSSD, partitioning Test of Sequential circuits
Sub-classes:SCAN CHAIN CONTROL
#2Pseudo-random binary sequences (PRBS) generator for performing on-chip testing and a method thereof
#3Sequential circuit, scan chain circuit including the same and integrated circuit including the same
#4Semiconductor power and performance optimization
#5Hybrid on-chip clock controller techniques for facilitating at-speed scan testing and scan architecture support
#6Digital fault detection circuit and method
#7MONITORING DEGRADATION OF CIRCIUT SPEED
#8Testing A Pipeline In An Ic
#9Timing optimizations in circuit designs using opposite clock edge triggered flip-flops
#10Method and apparatus for efficient hierarchical chip testing and diagnostics with support for partially bad dies