200569 ⎘
Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements Construction details
MEDICAL SYSTEMS, ANTI-SCATTER GRIDS AND METHODS OF MANUFACTURING ANTI-SCATTER GRIDS
#2X-RAY IRRADIATION APPARATUS, INCLUDING A SPECTRALLY SHAPING X-RAY OPTIC AND A SPECTRAL FILTER APERTURE DEVICE, FOR X-RAY IMAGING
#3SIGNAL MANIPULATION ELEMENTS INTEGRATED WITH WINDOW PLATE FOR OPTICAL FEEDTHROUGH TO VACUUM
#4OPTICS-INTEGRATED CONFINEMENT APPARATUS INCLUDING POLARIZATION CONTROLLING OPTICAL ELEMENTS
#5SOLID TARGET IRRADIATOR SYSTEM FOR RADIOISOTOPES PRODUCTION
#6Device and Method for Generating Optical Tweezers
#7System and method for bending crystal wafers for use in high resolution analyzers
#8COLLIMATOR AND METHODS OF FORMING SAME
#9METHOD FOR PRODUCING AN OPTICAL ELEMENT, OPTICAL ELEMENT, DEVICE FOR PRODUCING AN OPTICAL ELEMENT, SECONDARY GAS AND PROJECTION EXPOSURE SYSTEM
#10METHOD FOR PRODUCING REFLECTIVE OPTICAL ELEMENTS FOR THE EUV WAVELENGTH RANGE, AND REFLECTIVE OPTICAL ELEMENTS FOR THE EUV WAVELENGTH RANGE
#11STEPPING STRATEGY FOR DEFECT COMPENSATION IN DAX IMAGING
#12Focusing grating devices with large aspect ratio
#13Interferometer for x-ray phase contrast imaging
#14X-ray scattering apparatus
#15X-ray scattering apparatus
#16Stable top-bridge manufacturing for DAX gratings
#17Light field X-ray optics
#18STABILIZED GRATING STRUCTURES
#19Method of printing and implementing refractive X-ray optical components
#20Reflector and method of manufacturing a reflector
#21Nanopatterned electron beams for temporal coherence and deterministic phase control of x-ray free-electron lasers
#22Electron diffraction intensity from single crystal silicon in a photoinjector
#23Structured grating component, imaging system and manufacturing method
#24Off-axis capillary x-ray optics
#25APPARATUS AND METHOD FOR TREATING RADIOACTIVE EMISSION
#26Metal X-ray grid, X-ray imaging device, and production method for metal X-ray grid
#27Stress patterning systems and methods for manufacturing free-form deformations in thin substrates
#28EUV mask blanks and methods of manufacture
#29Hard X-ray photoelectron spectroscopy system
#30Device and method for phase stepping in phase contrast image acquisition
#31Constructions of x-ray lenses for converging x-rays
#32Metal X-ray grid, X-ray imaging device, and production method for metal X-ray grid
#33Method and apparatus for determining a radiation beam intensity profile
#34System and method for x-ray fluorescence with filtering
#35Detector arrangement for an X-ray phase contrast system and method for X-ray contrast imaging
#36Reflective optical element for EUV lithography
#37Super-high aspect ratio diffractive optics fabricated by batch-processing
#38Irradiator apparatus and system and method for irradiating a sample using x-rays
#39EUV Collector
#40Optical systems, metrology apparatus and associated method
#41OPTICAL ELEMENT AND OPTICAL ASSEMBLY COMPRISING SAME
#42Method of manufacturing a pellicle for a lithographic apparatus, a pellicle for a lithographic apparatus, a lithographic apparatus, a device manufacturing method, an apparatus for processing a pellicle, and a method for processing a pellicle
#43Methods for aligning a spectrometer
#44Radiation-phase-contrast imaging device
#45Optical element for deflecting x-rays
#46Reflective optical element and optical system for EUV lithography having proportions of substances which differ across a surface
#47Method for manufacturing a membrane assembly
#48X-ray phase imaging apparatus
#49Extreme ultraviolet mirrors and masks with improved reflectivity
#50Grating and radiation imaging device
#51Multi-cathode EUV and soft x-ray source
#52Mirror, more particularly for a microlithographic projection exposure apparatus
#53Methods for manufacturing doubly bent X-ray focusing device, doubly bent X-ray focusing device assembly, doubly bent X-ray spectroscopic device and doubly bent X-ray spectroscopic device assembly
#54Method for producing an optical element for an optical system, in particular for a microlithographic projection exposure apparatus
#55Batch-processing method for super-high aspect ratio diffractive optics
#56LASER IRRADIATION DEVICE
#57APPARATUS INCLUDING A BENT INTERFERENCE GRATING AND METHOD FOR BENDING AN INTERFERENCE GRATING FOR INTERFEROMETRIC X-RAY IMAGING
#58Charged particle beam device, optical device, irradiation method, diffraction grating system, and diffraction grating
#59X-ray diffractometer with multilayer reflection-type monochromator
#60Method for scanning a sample by means of X-ray optics and an apparatus for scanning a sample
#61X-ray diffractive grating and X-ray Talbot interferometer
#62Faceted EUV optical element
#63EUV-mirror, optical system with EUV-mirror and associated operating method
#64X-ray interferometer
#65Mirror, in particular for a microlithographic projection exposure apparatus
#66EUV mirror and optical system comprising EUV mirror
#67Radiological image capturing apparatus and radiological image capturing system
#68X-ray imaging system and image processing device
#69TALBOT INTERFEROMETER, TALBOT INTERFERENCE SYSTEM, AND FRINGE SCANNING METHOD
#70Structure, method for manufacturing the same, and talbot interferometer
#71Radiation source-collector and method for manufacture
#72Extreme ultraviolet reflective element with amorphous layers and method of manufacturing thereof
#73High aspect ratio dense pattern-programmable nanostructures utilizing metal assisted chemical etching
#74COMPUTATION APPARATUS, PROGRAM, AND X-RAY IMAGING SYSTEM
#75Systems and methods for x-ray phase contrast imaging using arrays of x-ray focusing elements
#76X-ray shield grating and X-ray talbot interferometer including X-ray shield grating
#77Method and apparatus for generating radiation
#78Interferometric dynamic-grating imaging method, diffraction grating and imaging apparatus
#79Photo-masks for lithography
#80Phase contrast X-ray tomography device
#81X-ray diffraction imaging system with integrated supermirror
#82X-ray imaging system and image processing method
#83POLYCAPILLARY LENS
#84X-RAY SHIELD GRADING AND METHOD FOR FABRICATING THE SAME
#85Mirror arrangement for an EUV projection exposure apparatus, method for operating the same, and EUV projection exposure apparatus
#86Lithographic apparatus
#87Structural body and X-ray talbot interferometer including the structural body
#88Reflective optical element
#89Method for examining an object using an X-ray recording system for phase contrast imaging with stochastic phase scanning
#90Illumination optical unit
#91Method for manufacturing microstructure
#92APPARATUS AND METHOD FOR X-RAY PHASE CONTRAST IMAGING
#93Radiological image capturing apparatus and radiological image capturing system
#94Method of producing a Fresnel Zone Plate for applications in high energy radiation
#95EUV-mirror arrangement, optical system with EUV-mirror arrangement and associated operating method
#96Ultra-smooth layer ultraviolet lithography mirrors and blanks, and manufacturing and lithography systems therefor
#97Method for manufacturing compound refractive lens for focusing X-rays in two dimensions
#98Arrangement of a mirror
#99EUV mirror comprising an oxynitride capping layer having a stable composition, EUV lithography apparatus, and operating method
#100Reflective optical element and optical system for EUV lithography
#101Collector
#102Structure, method for manufacturing the same, and image pickup apparatus including the structure
#103Stacked zone plates for pitch frequency multiplication
#104OPTICAL GRATING INCLUDING A SMOOTHING LAYER
#105Method for X-ray phase contrast and dark-field imaging using an arrangement of gratings in planar geometry
#106Lithographic apparatus, spectral purity filter and device manufacturing method
#107Zone compensated multilayer laue lens and apparatus and method of fabricating the same
#108Device for adjusting curvature of mirror while avoiding movement of central point of mirror, and mirror adjustment system comprising same
#109Deflection mirror and projection exposure apparatus for microlithography comprising such a deflection mirror
#110Method for producing a reflective optical component for an EUV projection exposure apparatus and component of this type
#111Differential phase-contrast imaging with increased dynamic range
#112Method for manufacturing X-ray/γ-ray focusing optical system using atomic layer deposition
#113Hybrid X-ray optic apparatus and methods
#114Radiological image capturing apparatus and radiological image capturing system
#115Silicon focusing mirror system
#116X-ray apparatus and X-ray measuring method
#117X-RAY INTERFEROMETER
#118Optical arrangement for EUV lithography and method for configuring such an optical arrangement
#119Corrosion-resistant multilayer structures with improved reflectivity
#120Optical device for analyzing a specimen by the scattering of an X-ray beam and associated collimation device and collimator
#121X-ray waveguide
#122High Aspect Ratio Grid for Phase Contrast X-ray Imaging and Method of Making the Same
#123Multilayer total internal reflection optic devices and methods of making and using the same
#124EUV collector
#125APPARATUS FOR ALIGNMENT OF MULTILAYER FILM MIRRORS FOR MONOCHROMATIC X-RAY GENERATOR AND X-RAY IMAGE DETECTING METHOD USING THE SAME
#126Reflective surface shape controllable mirror device, and method for manufacturing reflective surface shape controllable mirror
#127Projection objective having mirror elements with reflective coatings
#128Reflective optical element and method for production of such an optical element
#129Grid for radiation imaging and method for producing the same
#130Surface correction on coated mirrors
#131Semiconductor exposure device using extreme ultra violet radiation
#132REFLECTIVE OPTICAL ELEMENT AND METHOD FOR OPERATING AN EUV LITHOGRAPHY APPARATUS
#133MULTILAYER MIRROR, LITHOGRAPIC APPARATUS, AND METHODS FOR MANUFACTURING A MULTILAYER MIRROR AND A PRODUCT
#134MIRROR FOR THE EUV WAVELENGTH RANGE, PROJECTION OBJECTIVE FOR MICROLITHOGRAPHY CROMPRISING SUCH A MIRROR, AND PROJECTION EXPOSURE APPARATUS FOR MICROLITHOGRAPHY COMPRISING SUCH A PROJECTION OBJECTIVE
#135Technique for etching monolayer and multilayer materials
#136Method for assembling a mirror plate stack
#137Mirror, method of manufacturing the same, exposure apparatus, and device manufacturing method
#138Illumination optical unit for microlithography
#139GRID FOR USE IN RADIATION IMAGING, METHOD FOR PRODUCING THE SAME, AND RADIATION IMAGING SYSTEM
#140SPECTRAL PURITY FILTER, LITHOGRAPHIC APPARATUS, AND METHOD FOR MANUFACTURING A SPECTRAL PURITY FILTER
#141Component of an EUV or UV lithography apparatus and method for producing it
#142Zone plate
#143Adjustable electromagnetic energy collimator
#144Projection objective and projection exposure apparatus with negative back focus of the entry pupil
#145Source-collector module with GIC mirror and xenon ice EUV LPP target system
#146Source-collector module with GIC mirror and xenon liquid EUV LPP target system
#147EUV collector with cooling device
#148X-ray optical systems with adjustable convergence and focal spot size
#149Method and system for thermally conditioning an optical element
#150X-ray waveguide
#151X-ray waveguide
#152X-ray radiator to generate quasi-monochromatic x-ray radiation, and radiography x-ray acquisition system employing same
#153MIRROR AND EXTREME ULTRAVIOLET LIGHT GENERATION SYSTEM
#154X-ray imaging apparatus, X-ray imaging method, and X-ray imaging program
#155Ultraviolet reflector with coolant gas holes and method
#156Reflective optical element and method for production of such an optical element
#157Extreme ultraviolet light generation system
#158OPTICAL COMPONENT HAVING AN IMPROVED TRANSIENT THERMAL BEHAVIOR AND METHOD FOR IMPROVING THE TRANSIENT THERMAL BEHAVIOR OF AN OPTICAL COMPONENT
#159High flux photon beams using optic devices
#160EUV light source components and methods for producing, using and refurbishing same
#161Multi-beam X-ray system
#162X-ray shield grating, manufacturing method therefor, and X-ray imaging apparatus
#163Cooled spider and method for grazing-incidence collectors
#164Analysis method, radiation imaging apparatus using analysis method, and analysis program for executing analysis method
#165Spectral purity filter for multi-layer mirror, lithographic apparatus including such multi-layer mirror, method for enlarging the ratio of desired radiation and undesired radiation, and device manufacturing method
#166Cooling systems and methods for grazing incidence EUV lightography collectors
#167Extreme UV radiation reflecting element comprising a sputter-resistant material
#168MULTILAYER MIRROR AND LITHOGRAPHIC APPARATUS
#169Radiation Collector
#170Projection objective and projection exposure apparatus with negative back focus of the entry pupil
#171SPECTRAL PURITY FILTERS FOR USE IN A LITHOGRAPHIC APPARATUS
#172EUV projection lens and optic system having the same
#173Slit mechanism apparatus and X-ray computed tomography apparatus
#174ILLUMINATION SYSTEM FOR A MICROLITHOGRAPHY PROJECTION EXPOSURE APPARATUS
#175Nano-structured nuclear radiation shielding
#176X-ray detector for phase contrast imaging
#177Optical component for EUVL and smoothing method thereof
#178Grazing incidence collector for laser produced plasma sources
#179Optimizing total internal reflection multilayer optics through material selection
#180X-ray imaging apparatus, X-ray imaging method, and X-ray imaging program
#181Wavelength-dispersive X-ray spectrometer
#182Zone-optimized mirrors and optical systems using same
#183Grating with a large aspect ratio, in particular to be used as an X-ray optical grating in a CT system, produced by a lithography method
#184SPECTRAL FILTER, LITHOGRAPHIC APPARATUS INCLUDING SUCH A SPECTRAL FILTER, DEVICE MANUFACTURING METHOD, AND DEVICE MANUFACTURED THEREBY
#185Electron-beam-assisted EEM method
#186Curvature distribution crystal lens and X-ray reflectometer
#187Projection objective having mirror elements with reflective coatings
#188X-ray condensing method and its device using phase restoration method
#189METHOD FOR PRODUCING AN OPTICAL ELEMENT THROUGH A MOLDING PROCESS, OPTICAL ELEMENT PRODUCED ACCORDING TO THE METHOD, COLLECTOR, AND LIGHTING SYSTEM
#190Reflective-type mask blank for EUV lithography
#191Projection objective and method for its manufacture
#192SPECTRAL PURITY FILTER FOR MULTI-LAYER MIRROR, LITHOGRAPHIC APPARATUS INCLUDING SUCH MULTI-LAYER MIRROR, METHOD FOR ENLARGING THE RATIO OF DESIRED RADIATION AND UNDESIRED RADIATION, AND DEVICE MANUFACTURING METHOD
#193Method for the protection of extreme ultraviolet lithography optics
#194Radiological image capturing apparatus and radiological image capturing system
#195Ultraviolet reflector with coolant gas holes and method
#196Optical component for EUVL and smoothing method thereof
#197Optical element for radiation in the EUV and/or soft X-ray region and an optical system with at least one optical element
#198Procedure of Manufacturing a Neutron-Guiding Flat Surface
#199Radiation phase image radiographing apparatus
#200Ultra-high density diffraction grating
#201Radiation sources and methods of generating radiation
#202Coated mirrors and their fabrication
#203High-resolution, active-optic X-ray fluorescence analyzer
#204High-resolution X-ray optic and method for constructing an X-ray optic
#205High intensity x-ray beam system
#206Titania-doped quartz glass and making method, EUV lithographic member and photomask substrate
#207Lithographic apparatus
#208Semiconductor exposure device using extreme ultra violet radiation
#209Approach and device for focusing x-rays
#210Mammography X-ray homogenizing optic
#211MULTILAYER FILM REFLECTOR
#212Highly aligned x-ray optic and source assembly for precision x-ray analysis applications
#213Evaluation method and fabrication method of optical element having multilayer film, exposure apparatus having the multilayer film, and device fabrication method
#214EUV light source components and methods for producing, using and refurbishing same
#215OPTICAL ELEMENT FOR X-RAY
#216Multi-energy imaging system and method using optic devices
#217EXPOSURE MIRROR AND EXPOSURE APPARATUS HAVING SAME
#218OPTICAL ELEMENT, AND LIGHT SOURCE UNIT AND EXPOSURE APPARATUS HAVING THE SAME
#219Use of a focusing vortex lens as the objective in spiral phase contrast microscopy
#220Sputtering target used for production of reflective mask blank for EUV lithography
#221EXTREME ULTRAVIOLET (EUV) MASK PROTECTION AGAINST INSPECTION LASER DAMAGE
#222X-ray imaging system and methods of using and forming an array of optic devices therein
#223Fresnel zone plate and x-ray microscope using the fresnel zone plate
#224Optical component having an improved transient thermal behavior and method for improving the transient thermal behavior of an optical component
#225PROJECTION OBJECTIVE AND METHOD FOR ITS MANUFACTURE
#226Thermally stable multilayer mirror for the EUV spectral range
#227X-ray lens assembly and X-ray device incorporating said assembly
#228Spectral purity filter for a multi-layer mirror, lithographic apparatus including such multi-layer mirror, method for enlarging the ratio of desired radiation and undesired radiation, and device manufacturing method
#229X-Ray or neutron monochromator
#230Multilayer-film reflective mirror, exposure apparatus, device manufacturing method, and manufacturing method of multilayer-film reflective mirror
#231Device for improving the resolution capability of an x-ray optical apparatus
#232Methods to manufacture contaminant-gettering materials in the surface of EUV optics
#233METHOD FOR DEPOSITING REFLECTIVE MULTILAYER FILM OF REFLECTIVE MASK BLANK FOR EUV LITHOGRAPHY AND METHOD FOR PRODUCING REFLECTIVE MASK BLANK FOR EUV LITHOGRAPHY
#234Patterning device, method of providing a patterning device, photolithographic apparatus and device manufacturing method
#235System, method and apparatus for RF directed energy
#236Illumination system, lithographic apparatus, mirror, method of removing contamination from a mirror and device manufacturing method
#237Optical arrangement and EUV lithography device with at least one heated optical element, operating methods, and methods for cleaning as well as for providing an optical element
#238Substrate and method of fabricating the same
#239Method of making and structure of multilayer laue lens for focusing hard x-rays
#240Polishing method for extreme ultraviolet optical elements and elements produced using the method
#241Extreme UV radiation focusing mirror and extreme UV radiation source device
#242Method for fabricating neutron supermirror using neutron monochromator structures
#243Collector mirror exchanging apparatus and method for extreme ultraviolet light source apparatus
#244High-Precision Optical Surface Prepared by Sagging from a Masterpiece
#245Thermally stable multilayer mirror for the EUV spectral region
#246Reflective optical illumination collector
#247Apparatus and method for exposing a substrate to UV radiation using asymmetric reflectors
#248EUV light source
#249Collector configured of mirror shells
#250Multilayer mirror, evaluation method, exposure apparatus, device manufacturing method
#251X-RAY REFLECTOR EXHIBITING TAPER, METHOD OF MAKING SAME, NARROW BAND X-RAY FILTERS INCLUDING SAME, DEVICES INCLUDING SUCH FILTERS, MULTISPECTRAL X-RAY PRODUCTION VIA UNISPECTRAL FILTER, AND MULTISPECTRAL X-RAY PRODUCTION VIA MULTISPECTRAL FILTER
#252Method of providing a shaped body made of glass or glass ceramics
#253X-ray generating method and x-ray generating apparatus
#254Projection objective and projection exposure apparatus with negative back focus of the entry pupil
#255OPTICAL ELEMENT, AND LIGHT SOURCE UNIT AND EXPOSURE APPARATUS HAVING THE SAME
#256Reflective-type mask blank for EUV lithography
#257Reflective mask blank for EUV lithography and substrate with a conductive film for the mask blank
#258EUV light source
#259EUV light source
#260Titania-doped quartz glass and making method, EUV lithographic member and photomask substrate
#261Mask blank and photomask having antireflective properties
#262EUV light source
#263Low loss hollow core optical waveguide
#264Optical element for radiation in the EUV and/or soft X-ray region and an optical system with at least one optical element
#265Multilayer reflective film coated substrate, manufacturing method thereof, reflective mask blank, and reflective mask
#266Polarized neutron guide
#267Electrostatic chuck with temperature sensing unit, exposure equipment having the same, and method of detecting temperature from photomask
#268Curved X-ray reflector
#269Discharge produced plasma EUV light source
#270EUV light source collector erosion mitigation
#271Reflective mask blank, reflective mask, and method for manufacturing semiconductor device
#272Photomask and method thereof
#273Reflective-type mask blank for EUV lithography and method for producing the same
#274Spectral purity filter for a multi-layer mirror, lithographic apparatus including such multi-layer mirror, method for enlarging the ratio of desired radiation and undesired radiation, and device manufacturing method
#275Spectral purity filter for multi-layer mirror, lithographic apparatus including such multi-layer mirror, method for enlarging the ratio of desired radiation and undesired radiation, and device manufacturing method
#276Sputtering target, method of manufacturing a multilayer reflective film coated substrate, method of manufacturing a reflective mask blank, and method of manufacturing a reflective mask
#277Method for repairing mask-blank defects using repair-zone compensation
#278Methods to manufacture contaminant-gettering materials in the surface of EUV optics
#279Illumination system particularly for microlithography
#280Methods of forming capping layers on reflective materials
#281Spectral purity filter, lithographic apparatus including such a spectral purity filter, device manufacturing method, and device manufactured thereby
#282Optical element, lithographic apparatus including such an optical element, device manufacturing method, and device manufactured thereby
#283Photomasks and methods of manufacturing the same
#284Lithographic apparatus, device manufacturing method, and optical component
#285Forming a capping layer for a EUV mask and structures formed thereby
#286Systems and methods for cleaning a chamber window of an EUV light source
#287Collector having unused region for illumination systems using a wavelength ≦193 nm
#288Optical component having an improved transient thermal behavior and method for improving the transient thermal behavior of an optical component
#289Thermal casting of polymers in centrifuge for producing X-ray optics
#290Production method of radiation image conversion panel
#291Multilayer film reflector and X-ray exposure system
#292Deformable system comprising a parallelepiped-shaped part and an actuator
#293Defect repair device and defect repair method
#294X-ray reflector exhibiting taper, method of making same, narrow band x-ray filters including same, devices including such filters, multispectral x-ray production via unispectral filter, and multispectral x-ray production via multispectral filter
#295Reflection mask, use of the reflection mask and method for fabricating the reflection mask
#296Interference multilayer capping design for multilayer reflective mask blanks
#297Evaluation method and fabrication method of optical element having multilayer film, exposure apparatus having the multilayer film, and device fabrication method
#298Light scattering EUVL mask
#299Technique to prevent tin contamination of mirrors and electrodes in an EUV lithography system
#300Extreme ultraviolet radiation imaging