ClassID:

206371

H01J2237/06333 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Sources; Electron sources; Cold-cathode sources Photo emission

Recent Application in this class:
#1
20260155328
2026-06-04

Control System For Ultrafast Electron Beam Microscope

#2
20260120990
2026-04-30

ELECTRON GUN AND ELECTRON MICROSCOPE

#3
20260051451
2026-02-19

ELECTRON BEAM DEVICES WITH SEMICONDUCTOR ULTRAVIOLET LIGHT SOURCE

#4
20250132117
2025-04-24

METHOD FOR CREATING DETECTION DATA IN ELECTRON BEAM APPLICATION DEVICE, METHOD FOR SYNTHESIZING IMAGE OF OBJECT BEING IRRADIATED, PROGRAM, RECORDING MEDIUM, AND ELECTRON BEAM APPLICATION DEVICE

#5
20240412939
2024-12-12

ELECTRON BEAM APPLICATION DEVICE AND METHOD FOR CREATING DETECTION DATA IN ELECTRON BEAM APPLICATION DEVICE

#6
20240412938
2024-12-12

SEMICONDUCTING COLD PHOTOCATHODE DEVICE USING ELECTRIC FIELD TO CONTROL THE ELECTRON AFFINITY

#7
20240212967
2024-06-27

ELECTRON GUN, ELECTRON BEAM APPLICATOR, AND EMISSION METHOD OF ELECTRON BEAM

#8
20240120168
2024-04-11

Electron gun and electron beam application apparatus

#9
20230402246
2023-12-14

ELECTRON GUN AND ELECTRON BEAM APPLICATION DEVICE

#10
20230395349
2023-12-07

Creating multiple electron beams with a photocathode film

#11
20230230794
2023-07-20

ELECTRON GUN, ELECTRON RAY APPLYING DEVICE, AND ELECTRON BEAM PROJECTING METHOD

#12
20230207249
2023-06-29

Electron gun, electron gun component, electron beam applicator, and alignment method

#13
20220406558
2022-12-22

Electron gun and electron microscope

#14
20220367139
2022-11-17

Pulsed generator of electrically charged particles and method for using a pulsed generator of electrically charged particles

#15
20220359146
2022-11-10

Electron gun, electron beam applicator, emission axis verification method for electron beam emitted from photocathode, and emission axis alignment method for electron beam emitted from photocathode

#16
20220301804
2022-09-22

ELECTRON BEAM DEVICES WITH SEMICONDUCTOR ULTRAVIOLET LIGHT SOURCE

#17
20220230834
2022-07-21

Electron beam writing apparatus and cathode life span prediction method

#18
20220199350
2022-06-23

ELECTRON BEAM APPLICATION DEVICE, AND ELECTRON BEAM EMISSION METHOD FOR ELECTRON BEAM APPLICATION DEVICE

#19
20210375578
2021-12-02

Incident axis alignment method for electron gun equipped with photocathode, computer program, and electron gun equipped with photocathode

#20
20200303152
2020-09-24

Electron microscope

#21
20200111637
2020-04-09

Photocathode designs and methods of generating an electron beam using a photocathode

#22
20200090895
2020-03-19

Metal encapsulated photocathode electron emitter

#23
20200088660
2020-03-19

Handheld material analyser

#24
20190295804
2019-09-26

System and method for photocathode illumination inspection

#25
20190108967
2019-04-11

Electron beam generation and measurement

#26
20190108964
2019-04-11

Photocathode designs and methods of generating an electron beam using a photocathode

#27
20190108963
2019-04-11

Silicon electron emitter designs

#28
20190019648
2019-01-17

Plasmon-excited electron beam array for complementary patterning

#29
20170229276
2017-08-10

High voltage feedthrough assembly, time-resolved transmission electron microscope and method of electrode manipulation in a vacuum environment

#30
20160329184
2016-11-10

Array of carbon nanotube micro-tip structures

#31
20160307726
2016-10-20

Inspection device

#32
20160181050
2016-06-23

Integrated photoemission sources and scalable photoemission structures

#33
20160172144
2016-06-16

Activation chamber, kit used in treatment device and treatment device, for lowering electron affinity

#34
20160005567
2016-01-07

High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing

#35
20160005566
2016-01-07

Method and system for electron microscope with multiple cathodes

#36
20150332888
2015-11-19

High-speed multi-frame dynamic transmission electron microscope image acquisition system with arbitrary timing

#37
20150235800
2015-08-20

High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing

#38
20150008323
2015-01-08

Device and method for electron emission and device including such an electron emission system

#39
20140346355
2014-11-27

Electron microscope

#40
20130341527
2013-12-26

Electron beam apparatus

#41
20130224429
2013-08-29

Carbon nanotube based micro-tip structure and method for making the same

#42
20130187541
2013-07-25

Photocathode high-frequency electron-gun cavity apparatus

#43
20130161511
2013-06-27

Sample observing device and sample observing method

#44
20130009058
2013-01-10

Electron microscope

#45
20120235036
2012-09-20

Inspection device

#46
20120223245
2012-09-06

ELECTRON BEAM SOURCE SYSTEM AND METHOD

#47
20120145919
2012-06-14

Charged particle source from a photoionized cold atom beam

#48
20110226949
2011-09-22

Inspection system

#49
20110089397
2011-04-21

Spin-polarized electron source

#50
20100117510
2010-05-13

Apparatus and method for generating femtosecond electron beam

#51
20090236521
2009-09-24

Method and system for ultrafast photoelectron microscope

#52
20090127473
2009-05-21

Electron beam irradiation device

#53
20080169436
2008-07-17

Electron beam lithography method and apparatus using a dynamically controlled photocathode

#54
20080017796
2008-01-24

Method and system for ultrafast photoelectron microscope

#55
20070228286
2007-10-04

Polarized pulsed front-end beam source for electron microscope

#56
20060243922
2006-11-02

Raster frame beam system for electron beam lithography

#57
20060243918
2006-11-02

Raster frame beam system for electron beam lithography

#58
20060055321
2006-03-16

Hetero-junction electron emitter with Group III nitride and activated alkali halide

#59
20050274911
2005-12-15

Raster frame beam system for electron beam lithography

#60
20050264148
2005-12-01

Multiple electron beam system with electron transmission gates

#61
20050253069
2005-11-17

Method and system for ultrafast photoelectron microscope