H01J2237/0805 - CPC Classification Index

ClassID:

206384 ⎘

H01J2237/0805 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Sources; Ion sources; Field ionization sources Liquid metal sources

Recent Application in this class:

20240331967

2024-10-03

LIQUID METAL ION SOURCE DEVICE FOR USING BISMUTH AND ALLOY OF BISMUTH

20210090842

2021-03-25

Liquid metal ion source and focused ion beam apparatus

20200303154

2020-09-24

Liquid metal ion source

20200152410

2020-05-14

ION BEAM GENERATING DEVICE INCLUDING LIQUID METAL ION SOURCE AND METHOD OF MANUFACTURING THE SAME

20190355551

2019-11-21

Method for operating a particle beam generator for a particle beam device and particle beam device comprising a particle beam generator

20190304743

2019-10-03

Charged particle beam system and method

20170076901

2017-03-16

Techniques for optimizing nanotips derived from frozen taylor cones

20170069456

2017-03-09

Focused ion beam apparatus

20150123010

2015-05-07

Bright and durable field emission source derived from refractory taylor cones

#10

20130256553

2013-10-03

Automated ion beam idle

#11

20130256532

2013-10-03

Ion sources, systems and methods

#12

20120241640

2012-09-27

Ion sources, systems and methods

#13

20120212120

2012-08-23

Liquid metal wetting of micro-fabricated charge-emission structures

#14

20120126684

2012-05-24

Liquid metal ion gun

#15

20120119086

2012-05-17

Gas field ion source, charged particle microscope, and apparatus

#16

20120056088

2012-03-08

Navigation and sample processing using an ion source containing both low-mass and high-mass species

#17

20110309263

2011-12-22

Dual beam system

#18

20110240853

2011-10-06

Ion sources, systems and methods

#19

20110186745

2011-08-04

Charged particle beam apparatus using an electrostatic lens gun

#20

20100297787

2010-11-25

System and method for backside circuit editing on full thickness silicon device

#21

20100237234

2010-09-23

Liquid metal ion source, secondary ion mass spectrometer, secondary ion mass spectrometric analysis method and use thereof

#22

20100187436

2010-07-29

High resolution gas field ion column

#23

20100176296

2010-07-15

Composite focused ion beam device, and processing observation method and processing method using the same

#24

20100025578

2010-02-04

Dual beam system

#25

20100012839

2010-01-21

Increasing current in charged particle sources and systems

#26

20090289191

2009-11-26

Ultra high precision measurement tool with control loop

#27

20090278434

2009-11-12

Liquid metal wetting of micro-fabricated charge-emission structures

#28

20090256081

2009-10-15

Focused ion beam apparatus

#29

20090173888

2009-07-09

Gas field ion source, charged particle microscope, and apparatus

#30

20090121160

2009-05-14

Charged particle source with automated tip formation

#31

20080210883

2008-09-04

Liquid metal ion gun

#32

20080185517

2008-08-07

Method and apparatus for in-situ sample preparation

#33

20080185514

2008-08-07

Achromatic mass separator

#34

20080035860

2008-02-14

Dual beam system

#35

20070257200

2007-11-08

Liquid metal ion gun

#36

20070152174

2007-07-05

Focused ion beam apparatus and liquid metal ion source

#37

20070034399

2007-02-15

Emitter for an ion source and method of producing same

#38

20060145090

2006-07-06

Metal ion emission device and process for producing the same, ion beam irradiation device, processing apparatus and analyzing apparatus provided with emission device

#39