H01J2237/0802 - CPC Classification Index

ClassID:

206383 ⎘

H01J2237/0802 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Sources; Ion sources Field ionization sources

Sub-classes:

H01J2237/0805 » Liquid metal sources 43
H01J2237/0807 » Gas field ion sources [GFIS] 133

Recent Application in this class:

20220348361

2022-11-03

Ion propulsion device

20210287872

2021-09-16

Ion source with single-slot tubular cathode

20200266021

2020-08-20

Ion beam generator with nanowires

20200144015

2020-05-07

Device for generating a source current of charge carriers

20190355543

2019-11-21

Method and apparatus for a porous electrospray emitter

20190157036

2019-05-23

Method and apparatus for a porous electrospray emitter

20180076003

2018-03-15

Method and apparatus for a porous electrospray emitter

20170352521

2017-12-07

Ion sources and methods for generating ion beams with controllable ion current density distributions over large treatment areas

20170076901

2017-03-16

Techniques for optimizing nanotips derived from frozen taylor cones

#10

20160104597

2016-04-14

Electron gun, charged particle gun, and charged particle beam apparatus using electron gun and charged particle gun

#11

20150170865

2015-06-18

Method and apparatus for a porous electrospray emitter

#12

20130264496

2013-10-10

Charged particle beam apparatus with cleaning photo-irradiation apparatus

#13

20120168638

2012-07-05

Charged particle source with multiple selectable particle emitters

#14

20120068067

2012-03-22

Gas field ion microscopes having multiple operation modes

#15

20090121148

2009-05-14

High Brightness Solid State Ion Beam Generator, its use, and Method for Making such a Generator