Patents-Review.com
ClassID:

206408 ⎘

H01J2237/1415 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Lenses magnetic; Constructional details Bores or yokes, i.e. magnetic circuit in general

Recent Application in this class:
#1
20250174425
2025-05-29

ELECTROMAGNETIC LENS, SCANNING ELECTRON MICROSCOPE, AND MULTI-ELECTRON BEAM INSPECTION APPARATUS

 #2
20250046563
2025-02-06

MAGNETIC FOCUSING DEVICE LOW ENERGY ION BEAMS

 #3
20250006453
2025-01-02

MAGNETIC LENSES, CHARGED PARTICLE MICROSCOPE SYSTEMS INCLUDING THE SAME, AND ASSOCIATED METHODS

 #4
20240304410
2024-09-12

ELECTRON BEAM MICROSCOPE

 #5
20240274395
2024-08-15

CHARGED PARTICLE BEAM DEVICE AND METHOD FOR DEMAGNETIZING MAGNETIC LENS

 #6
20240062983
2024-02-22

Systems and methods for electron beam focusing in electron beam additive manufacturing

 #7
20240021403
2024-01-18

Adjustable Permanent Magnetic Lens Having Thermal Control Device

 #8
20230360878
2023-11-09

Adjustable Permanent Magnetic Lens Having Shunting Device

 #9
20230005704
2023-01-05

Scanning electron microscope device and electron beam inspection apparatus

 #10
20220270844
2022-08-25

Multipole unit and charged particle beam device

 #11
20220199353
2022-06-23

Magnetic field free sample plane for charged particle microscope

 #12
20220068589
2022-03-03

CHARGED PARTICLE SOURCE

 #13
20220037105
2022-02-03

Systems and methods for electron beam focusing in electron beam additive manufacturing

 #14
20210366684
2021-11-25

Axial alignment assembly, and charged particle microscope comprising such an alignment assembly

 #15
20200243296
2020-07-30

Objective lens arrangement usable in particle-optical systems

 #16
20200126753
2020-04-23

Charged particle source

 #17
20200066478
2020-02-27

Scanning magnet design with enhanced efficiency

 #18
20200051774
2020-02-13

Charged particle beam optical system, exposure apparatus, exposure method and device manufacturing method

 #19
20190295808
2019-09-26

Magnetic lens and exciting current control method

 #20
20190057833
2019-02-21

Charged particle source

 #21
20180323036
2018-11-08

Gun lens design in a charged particle microscope

 #22
20170294287
2017-10-12

Objective lens arrangement usable in particle-optical systems

 #23
20170125204
2017-05-04

Charged particle source

 #24
20170125203
2017-05-04

Charged particle source

 #25
20170125202
2017-05-04

Charged particle source

 #26
20170076908
2017-03-16

Techniques and apparatus for manipulating an ion beam

 #27
20160189913
2016-06-30

Combined multipole magnet and dipole scanning magnet

 #28
20160163500
2016-06-09

Charged particle source

 #29
20150332889
2015-11-19

Multipole lens, aberration corrector, and electron microscope

 #30
20150294833
2015-10-15

Charged particle beam apparatus

 #31
20150287566
2015-10-08

Multipole lens, method of fabricating same, and charged particle beam system

 #32
20150279610
2015-10-01

Notched magnetic lens for improved sample access in an SEM

 #33
20150155129
2015-06-04

Ion implantation apparatus

 #34
20150129772
2015-05-14

SURFACE MICRO-MACHINED MULTI-POLE ELECTROMAGNETS

 #35
20150060662
2015-03-05

Apparatus of plural charged particle beams with multi-axis magnetic lens

 #36
20150021476
2015-01-22

Magnetic lens for focusing a beam of charged particles

 #37
20140110597
2014-04-24

Configurable charged-particle apparatus

 #38
20130153782
2013-06-20

Multi-axis magnetic lens for focusing a plurality of charged particle beams

 #39
20120298861
2012-11-29

Vector Potential Photoelectron Microscope

 #40
20120145917
2012-06-14

Apparatus of plural charged particle beams with multi-axis magnetic lens

 #41
20120091337
2012-04-19

Charged particle beam devices

 #42
20110168888
2011-07-14

WEAK-LENS COUPLING OF HIGH CURRENT ELECTRON SOURCES TO ELECTRON MICROSCOPE COLUMNS

 #43
20090159810
2009-06-25

Particle-Optical Component

 #44
20080149833
2008-06-26

Electron microscope and combined illumination lens