206523 ⎘
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Tubes for localised analysis using electron or ion beams characterised by their application; Secondary particles mass or energy spectrometry of electrons (ESCA, XPS)
Nano vacuum tube
#2Hard X-ray photoelectron spectroscopy arrangement and system
#3Nano vacuum tube
#4Device for obtaining the image and/or spectra of electron energy loss
#5Spherical aberration corrected electrostatic lens, input lens, electron spectrometer, photoemission electron microscope and measuring system
#6Determining layer thickness using photoelectron spectroscopy
#7Electron microscope
#8Carrier and analyzing apparatus including the carrier
#9Multi-mode charged particle beam device