H01J2237/2505 - CPC Classification Index

ClassID:

206520 ⎘

H01J2237/2505 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Tubes for localised analysis using electron or ion beams characterised by their application

Sub-classes:

H01J2237/2511 » Auger spectrometers 10
H01J2237/2516 » Secondary particles mass or energy spectrometry 9
H01J2237/2538 » Low energy electron microscopy [LEEM] 16
H01J2237/2555 » Microprobes, i.e. particle-induced X-ray spectrometry 5
H01J2237/2583 » using tunnel effects, e.g. STM, AFM 8
H01J2237/2588 » Lorenz microscopy (magnetic field measurement) 4
H01J2237/2594 » Measuring electric fields or potentials 54

Recent Application in this class:

20260085932

2026-03-26

MEASUREMENT DEVICE

20260045438

2026-02-12

APPARATUS AND METHOD FOR IMPROVED ELECTRON MULTI-BEAM INSPECTION

20240339288

2024-10-10

HYBRID APPARATUS, SYSTEM AND TECHNIQUES FOR MASS ANALYZED ION BEAM

20240339287

2024-10-10

APPARATUS, SYSTEM AND TECHNIQUES FOR MASS ANALYZED ION BEAM

20140332684

2014-11-13

Electron beam interference device and electron beam interferometry

20140067102

2014-03-06

Virtual wireless multitrack recording system

20130193321

2013-08-01

Systems and methods for investigating a characteristic of a material using electron microscopy

20100227523

2010-09-09

METHODS FOR IMPROVING THE BIOACTIVITY CHARACTERISTICS OF A SURFACE AND OBJECTS WITH SURFACES IMPROVED THEREBY

20100217414

2010-08-26

Virtual wireless multitrack recording system

#10

20090278045

2009-11-12

Substrate-examining apparatus

#11

20070215802

2007-09-20

Systems and methods for a gas field ion microscope

#12

20070200063

2007-08-30

Wafer-level testing of light-emitting resonant structures

#13

20070085004

2007-04-19

Substrate-examining apparatus