H01J2237/2544 - CPC Classification Index

ClassID:

206527 ⎘

H01J2237/2544 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Tubes for localised analysis using electron or ion beams characterised by their application; Low energy electron microscopy [LEEM] Diffraction [LEED]

Sub-classes:

H01J2237/255 » Reflection diffraction [RHEED] 1

Recent Application in this class:

20160356729

2016-12-08

Method of performing electron diffraction pattern analysis upon a sample

20160172157

2016-06-16

Image type electron spin polarimeter

20070200070

2007-08-30

Aberration-correcting cathode lens microscopy instrument

20070200062

2007-08-30

Energy-filtering cathode lens microscopy instrument

20060113473

2006-06-01

Method and apparatus for measuring the physical properties of micro region