Patents-Review.com
ClassID:

206530 ⎘

H01J2237/2561 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Tubes for localised analysis using electron or ion beams characterised by their application; Microprobes, i.e. particle-induced X-ray spectrometry electron

Recent Application in this class:
#1
20250210301
2025-06-26

3D METROLOGY FROM 3D DATACUBE CREATED FROM STACK OF REGISTERED IMAGES OBTAINED DURING DELAYERING OF THE SAMPLE

 #2
20230335370
2023-10-19

3D metrology from 3D datacube created from stack of registered images obtained during delayering of the sample

 #3
20220415610
2022-12-29

3D metrology from 3D datacube created from stack of registered images obtained during delayering of the sample

 #4
20220367146
2022-11-17

X-ray imaging in cross-section using un-cut lamella with background material

 #5
20200161085
2020-05-21

Nano vacuum tube

 #6
20200058464
2020-02-20

X-ray analyzer and method for correcting counting rate

 #7
20190035598
2019-01-31

Nano vacuum tube

 #8
20190006146
2019-01-03

Electron probe microanalyzer and storage medium

 #9
20170018397
2017-01-19

SAMPLE HOLDER FOR CHARGED PARTICLE BEAM DEVICE, AND CHARGED PARTICLE BEAM DEVICE

 #10
20160240344
2016-08-18

Charged particle inspection method and charged particle system

 #11
20150338358
2015-11-26

Mineral identification using sequential decomposition into elements from mineral definitions

 #12
20150008331
2015-01-08

Charged particle inspection method and charged particle system

 #13
20140117229
2014-05-01

Mineral identification using sequential decomposition into elements from mineral definitions

 #14
20110301869
2011-12-08

Method and system for spectroscopic data analysis

 #15
20090323895
2009-12-31

Method and Apparatus for Treating Workpieces

 #16
20090310748
2009-12-17

Method and apparatus for analysis using X-ray spectra

 #17
20090306906
2009-12-10

Method and system for spectroscopic data analysis

 #18
20090256075
2009-10-15

Charged Particle Inspection Method and Charged Particle System

 #19
20090114818
2009-05-07

Charged particle-optical systems, methods and components

 #20
20090052620
2009-02-26

Apparatus and Method for X-Ray Analysis of Chemical State

 #21
20080111072
2008-05-15

Method and apparatus for analyzing sample

 #22
20080067379
2008-03-20

X-ray analyzer using electron beam

 #23
20080061234
2008-03-13

Inspection apparatus and method

 #24
20070210249
2007-09-13

Electron Spectroscope With Emission Induced By A Monochromatic Electron Beam

 #25
20060138325
2006-06-29

X-ray detecting devices and apparatus for analyzing a sample using the same

 #26
20060028643
2006-02-09

Method and system for spectroscopic data analysis

 #27
20050211898
2005-09-29

Device for measuring the emission of X-rays produced by an object exposed to an electron beam

 #28
20050049836
2005-03-03

METHOD OF DEFECT ROOT CAUSE ANALYSIS