206531 ⎘
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Tubes for localised analysis using electron or ion beams characterised by their application; Microprobes, i.e. particle-induced X-ray spectrometry ion
Ion generator device supports
#2Ion sources, systems and methods
#3Ion sources, systems and methods
#4Ion sources, systems and methods
#5DEVICE AND METHOD FOR CRYSTAL ORIENTATION MEASUREMENT BY MEANS OF AN ION BLOCKING PATTERN AND A FOCUSED ION PROBE
#6Elemental analysis method and semiconductor device manufacturing method
#7Ion sources, systems and methods
#8Ion sources, systems and methods
#9Ion sources, systems and methods
#10Ion sources, systems and methods
#11Ion sources, systems and methods
#12Ion sources, systems and methods
#13Ion sources, systems and methods
#14Ion sources, systems and methods
#15Ion sources, systems and methods
#16Ion sources, systems and methods
#17Ion sources, systems and methods
#18Ion sources, systems and methods
#19Ion sources, systems and methods
#20Ion sources, systems and methods
#21Ion sources, systems and methods
#22Ion sources, systems and methods