H01J2237/2807 - CPC Classification Index

#1

20250391630

2025-12-25

Charged Particle Beam Apparatus and Image Production Method

#2

20250210301

2025-06-26

3D METROLOGY FROM 3D DATACUBE CREATED FROM STACK OF REGISTERED IMAGES OBTAINED DURING DELAYERING OF THE SAMPLE

#3

20230335370

2023-10-19

3D metrology from 3D datacube created from stack of registered images obtained during delayering of the sample

#4

20230055155

2023-02-23

Semiconductor Analysis System

#5

20230020967

2023-01-19

Method and apparatus for inspecting a sample by means of multiple charged particle beamlets

#6

20230003675

2023-01-05

Method and system for determining sample composition from spectral data

#7

20220415610

2022-12-29

3D metrology from 3D datacube created from stack of registered images obtained during delayering of the sample

#8

20220254598

2022-08-11

High-resolution x-ray spectroscopy surface material analysis

#9

20220028653

2022-01-27

Charged particle beam apparatus and setting assisting method

#10

20210151288

2021-05-20

Apparatus and method for nanoscale X-ray imaging

#11

20210042943

2021-02-11

SCANNING ELECTRON MICROSCOPE

#12

20190311881

2019-10-10

Nondestructive sample imaging

#13

20190242836

2019-08-08

Systems and methods for in situ high temperature X-ray spectroscopy in electron microscopes

#14

20190228948

2019-07-25

Scanning electron microscope and measurement method for obtaining images of a specimen using an ion beam and an electron beam

#15

20190189391

2019-06-20

Retractable detector

#16

20190187306

2019-06-20

Acquisition and processing of data in a tomographic imaging apparatus

#17

20180330917

2018-11-15

Electron microscope and control method

#18

20180226221

2018-08-09

Wide field atmospheric scanning electron microscope

#19

20180204647

2018-07-19

Statistical analysis in X-ray imaging

#20

20180158649

2018-06-07

Cross sectional depth composition generation utilizing scanning electron microscopy

#21

20180151330

2018-05-31

Cross sectional depth composition generation utilizing scanning electron microscopy

#22

20180012728

2018-01-11

Retractable detector

#23

20170213697

2017-07-27

Multi mode system with a dispersion X-ray detector

#24

20170052264

2017-02-23

Acquisition and processing of data in a tomographic imaging apparatus

#25

20160155606

2016-06-02

INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENVIRONMENT AND A SCANNING ELECTRON MICROSCOPE

#26

20160079031

2016-03-17

Method of constructing 3D image, image processor, and electron microscope

#27

20150279610

2015-10-01

Notched magnetic lens for improved sample access in an SEM

#28

20150262788

2015-09-17

Cross-section processing and observation method and cross-section processing and observation apparatus

#29

20150048247

2015-02-19

Scanning ion microscope and secondary particle control method

#30

20150046097

2015-02-12

Method and data analysis system for semi-automated particle analysis using a charged particle beam

#31

20140291508

2014-10-02

Focused ion beam apparatus, method for observing cross-section of sample by using the same, and storage medium

#32

20140117231

2014-05-01

Automated mineral classification

#33

20140070095

2014-03-13

Method of performing tomographic imaging of a sample in a charged-particle microscope

#34

20140001356

2014-01-02

Cluster analysis of unknowns in SEM-EDS dataset

#35

20130299698

2013-11-14

Electron microscope with integrated detector(s)

#36

20130070900

2013-03-21

COMBINE APPARATUS OF SCANNING ELECTRON MICROSCOPE AND ENERGY DISPERSIVE X-RAY SPECTROSCOPY

#37

20120292508

2012-11-22

X-ray detection system

#38

20120292503

2012-11-22

Charged-particle microscopy with occlusion detection

#39

20120241608

2012-09-27

Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscope

#40

20120160999

2012-06-28

High collection efficiency X-ray spectrometer system with integrated electron beam stop, electron detector and X-ray detector for use on electron-optical beam lines and microscopes

#41

20120138795

2012-06-07

Specimen observation method

#42

20110204229

2011-08-25

Electron microscope with integrated detector(s)

#43

20110129066

2011-06-02

Method for quantitative analysis of a material

#44

20100270468

2010-10-28

System and method for a charged particle beam

#45

20100140470

2010-06-10

Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscope

#46

20100059672

2010-03-11

Device and method for analyzing a sample

#47

20090323895

2009-12-31

Method and Apparatus for Treating Workpieces

#48

20090278044

2009-11-12

In-situ differential spectroscopy

#49

20090274359

2009-11-05

Specimen observation method

#50

20090194691

2009-08-06

Electronic microscope apparatus

#51

20080121810

2008-05-29

System and method for a charged particle beam

#52

20080073527

2008-03-27

Specimen observation method

#53

20070194231

2007-08-23

Method and apparatus for displaying detected defects

#54

20070075271

2007-04-05

Method of adjusting the operating region of a tool component to a pre-determined element

#55

20060219914

2006-10-05

Charged-particle beam instrument

#56

20060157649

2006-07-20

Method for non-destructive trench depth measurement using electron beam source and X-ray detection

#57

20060033038

2006-02-16

Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope

#58

17166885

2022-06-28

Method and system for component analysis of spectral data

#59

16532459

2024-09-17

Scanning charged-particle-beam microscopy with energy-dispersive x-ray spectroscopy