206610 ⎘
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Electron or ion beam tubes for processing objects; Processing objects on a microscale; Ion implantation Dosimetry
SUBSTRATE PROPERTY CONTROL USING DOSE-DEPENDENT RESPONSE
#2SCANNED BEAM DOSE RATE MEASUREMENT FOR ION BEAM OPTIMIZATION
#3BEAM TUNING FOR NON-UNIFORM ION IMPLANTATION
#4ION IMPLANT DOSE MONITORING BY THERMAL WAVE MEASUREMENT
#5SUBSTRATE STRESS MANAGEMENT USING VARIABLE ENERGY AND VARIABLE DOSE IMPLANTATION
#6ION BEAM CURRENT MEASUREMENT DEVICE AND ION BEAM IMPLANTATION SYSTEM
#7ION BEAM IMPLANTATION METHOD AND SEMICONDUCTOR DEVICE
#8GA IMPLANT PROCESS CONTROL FOR ENHANCED PARTICLE PERFORMANCE
#9Ion implanter and model generation method
#10Ion implanter and model generation method
#11Ion beam implantation method and semiconductor device
#12Techniques for determining and correcting for expected dose variation during implantation of photoresist-coated substrates
#13Ion implanter and ion implantation method
#14APPARATUS AND TECHNIQUES FOR BEAM MAPPING IN ION BEAM SYSTEM
#15Ion implantation amount adjustment device and method, ion implantation apparatus and determination method
#16Apparatus and techniques for beam mapping in ion beam system
#17Ion implanter, ion beam irradiated target, and ion implantation method
#18In situ beam current monitoring and control in scanned ion implantation systems
#19Method for implantation of semiconductor wafers having high bulk resistivity
#20Apparatus and method for ion implantation
#21Ion implantation apparatus and semiconductor manufacturing method
#22Method for generating parameter pattern, ion implantation method and feed forward semiconductor manufacturing method
#23Magnetic field fluctuation for beam smoothing
#24Monitoring device, ion implantation device, and monitoring method
#25Beam profiling speed enhancement for scanned beam implanters
#26Ion irradiation apparatus and ion irradiation method
#27Ion implanter, beam energy measuring device, and method of measuring beam energy
#28Method for monitoring ion implantation
#29Magnetic field fluctuation for beam smoothing
#30Implant-induced damage control in ion implantation
#31Apparatus for monitoring ion implantation
#32Solar cell, solar cell manufacturing device, and method for manufacturing the same
#33Dose measurement device for plasma-immersion ion implantation
#34System and method for ion implantation with improved productivity and uniformity
#35Ion implantation apparatus and ion implantation method
#36Apparatus for monitoring ion implantation
#37System and method of dosage profile control
#38Ion implanter
#39Method for checking ion implantation condition and method for manufacturing semiconductor wafer
#40Beam line system of ion implanter
#41DETERMINING RELATIVE SCAN VELOCITY TO CONTROL ION IMPLANTATION OF WORK PIECE
#42Dose Measurement Method using Calorimeter
#43Using beam blockers to perform a patterned implant of a workpiece
#44Versatile beam glitch detection system
#45System and method of dosage profile control
#46Handling beam glitches during ion implantation of workpieces
#47Ion beam irradiation system and ion beam irradiation method
#48Throughput Enhancement for Scanned Beam Ion Implanters
#49Ion implanting apparatus
#50Transmission energy contamination detector
#51Method for improving implant uniformity during photoresist outgassing
#52Ion beam apparatus and method employing magnetic scanning
#53Ion beam monitoring arrangement
#54Ion implantation ion source, system and method
#55METHOD OF DETERMINING ANGLE MISALIGNMENT IN BEAM LINE ION IMPLANTERS
#56REDUCED IMPLANT VOLTAGE DURING ION IMPLANTATION
#57Method and apparatus for controlling beam current uniformity in an ion implanter
#58Implant uniformity control
#59ION IMPLANTING DEVICE AND METHOD
#60Elemental analysis method and semiconductor device manufacturing method
#61System and method of controlling broad beam uniformity
#62Ion implanter having combined hybrid and double mechanical scan architecture
#63System and method of performing uniform dose implantation under adverse conditions
#64Ion beam apparatus and method employing magnetic scanning
#65Techniques for improved uniformity tuning in an ion implanter system
#66Extraction electrode system for high current ion implanter
#67Ion implantation method
#68Ion source and ion implantation apparatus
#69Ion beam apparatus and method for ion implantation
#70Ion implantation method and apparatus
#71Ion implantation method and apparatus
#72METHODS FOR MONITORING IMPLANTER PERFORMANCE
#73TECHNIQUES FOR MEASURING AND CONTROLLING ION BEAM ANGLE AND DENSITY UNIFORMITY
#74Manufacturing system for semiconductor device capable of controlling variation in electrical property of element in wafer surface and method for manufacturing the semiconductor device
#75Measuring energy contamination using time-of-flight techniques
#76Implant beam utilization in an ion implanter
#77SINGLE WAFER IMPLANTER FOR SILICON-ON-INSULATOR WAFER FABRICATION
#78Ion implanting apparatus
#79Ion implanter having combined hybrid and double mechanical scan architecture
#80Dosage accuracy monitoring systems of implanters
#81Ion implantation apparatus
#82Ion implantation apparatus and ion implantation method
#83Ion implanting apparatus and method for implanting ions
#84Methods for monitoring ion implant process in bond and cleave, silicon-on-insulator (SOI) wafer manufacturing
#85Ion implantation device and method for implanting ions
#86Magnetic monitoring of a Faraday cup for an ion implanter
#87Partial ion implantation apparatus and method using bundled beam
#88Ion implantation apparatus and method for obtaining non-uniform ion implantation energy
#89Determining dopant information
#90Method of determining angle misalignment in beam line ion implanters
#91Sensor for ion implanter
#92Beam line architecture for ion implanter
#93Technique for improving ion implantation throughput and dose uniformity
#94Technique for improving ion implantation based on ion beam angle-related information
#95Ion beam current uniformity monitor, ion implanter and related method
#96Ion beam irradiating apparatus and method of adjusting uniformity of a beam
#97Ion beam measuring method and ion implanting apparatus
#98Methods and apparatus for beam density measurement in two dimensions
#99Ion beam scanning control methods and systems for ion implantation uniformity
#100Dose uniformity correction technique
#101Non-uniform ion implantation
#102System and method of ion beam control in response to a beam glitch
#103Beam measuring equipment and beam measuring method using the same
#104Closed loop dose control for ion implantation
#105ION IMPLANTATION ION SOURCE, SYSTEM AND METHOD
#106Ion implantation ion source, system and method
#107Method of implanting a substrate and an ion implanter for performing the method
#108Preventing dosage drift with duplicate dose integrators
#109Ion beam current monitoring
#110METHOD OF CHARACTERIZING AN ION BEAM
#111Apparatus and method for partial ion implantation
#112Wafer charge monitoring
#113Controlling the characteristics of implanter ion-beams
#114Ion implantation system and control method
#115Ion implantation system and control method
#116Ion implantation system having variable screen aperture and ion implantation method using the same
#117Ion implantation apparatus and ion implanting method
#118Ion beam angle measurement systems and methods for ion implantation systems
#119Beam current stabilization utilizing gas feed control loop
#120Ion implanation method and device using thereof
#121Means to establish orientation of ion beam to wafer and correct angle errors
#122Ion implanter and ion implantation control method thereof
#123Dual mode ion source for ion implantation
#124Method of implanting a substrate and an ion implanter for performing the method
#125Faraday system integrity determination
#126Method, system, and apparatus for improving doping uniformity in high-tilt ion implantation
#127Ion beam profiler
#128Controlling the characteristics of implanter ion-beams
#129Systems and methods for implant dosage control
#130Ion beam measuring method and ion implanting apparatus
#131Methods and apparatus for ion beam angle measurement in two dimensions
#132Technique for uniformity tuning in an ion implanter system
#133Technique for uniformity tuning in an ion implanter system
#134Matching dose and energy of multiple ion implanters
#135Technique for tuning an ion implanter system
#136Ion implantation system and control method
#137Method of measuring ion beam position
#138Technique for ion beam angle spread control for advanced applications
#139Technique for ion beam angle process control
#140Technique for ion beam angle spread control
#141Method of implanting a substrate and an ion implanter for performing the method
#142Ion beam measurement apparatus and method
#143Controlling the characteristics of implanter ion-beams
#144Ion implant ion beam parallelism and direction integrity determination and adjusting
#145Ion beam scanning control methods and systems for ion implantation uniformity
#146Ion-implanting apparatus, ion-implanting method, and device manufactured thereby
#147Method and apparatus for ion beam profiling
#148Ion beam implant current, spot width and position tuning
#149Ion implanters having an arc chamber that affects ion current density
#150Scanning systems and methods for providing ions from an ion beam to a workpiece
#151Ion beam measurement systems and methods for ion implant dose and uniformity control
#152Ion implantation monitor system and method thereof
#153Ion implanter and method of manufacturing semiconductor device
#154Device and method for measurement of beam angle and divergence
#155Method of implanting a substrate and an ion implanter for performing the method
#156Ion implantation ion source, system and method
#157Uniformity control multiple tilt axes, rotating wafer and variable scan velocity
#158Uniformity control using multiple fixed wafer orientations and variable scan velocity
#159Controlling the characteristics of implanter ion-beams
#160Method for reciprocating a workpiece through an ion beam
#161Reciprocating drive for scanning a workpiece
#162Reciprocating drive for scanning a workpiece through an ion beam
#163Ion implantation apparatus and ion implanting method
#164Ion beam monitoring arrangement
#165Modulating ion beam current
#166Matching dose and energy of multiple ion implanters
#167Ion implantation apparatus and partical collection structure thereof
#168Method and system for in-situ calibration of a dose controller for ion implantation
#169Beam current measuring device and apparatus using the same
#170Method of controlling implant dosage and pressure compensation factor in-situ
#171Utilization of an ion gauge in the process chamber of a semiconductor ion implanter
#172Ion implantation ion source, system and method
#173Technique for adjusting a penetration depth during the implantation of ions into a semiconductor region
#174Electromagnetic regulator assembly for adjusting and controlling the current uniformity of continuous ion beams
#175Selective area implant of a workpiece