ClassID:

206610

H01J2237/31703 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Electron or ion beam tubes for processing objects; Processing objects on a microscale; Ion implantation Dosimetry

Recent Application in this class:
#1
20260148933
2026-05-28

SUBSTRATE PROPERTY CONTROL USING DOSE-DEPENDENT RESPONSE

#2
20260148932
2026-05-28

SCANNED BEAM DOSE RATE MEASUREMENT FOR ION BEAM OPTIMIZATION

#3
20260018379
2026-01-15

BEAM TUNING FOR NON-UNIFORM ION IMPLANTATION

#4
20250299919
2025-09-25

ION IMPLANT DOSE MONITORING BY THERMAL WAVE MEASUREMENT

#5
20250140523
2025-05-01

SUBSTRATE STRESS MANAGEMENT USING VARIABLE ENERGY AND VARIABLE DOSE IMPLANTATION

#6
20240194444
2024-06-13

ION BEAM CURRENT MEASUREMENT DEVICE AND ION BEAM IMPLANTATION SYSTEM

#7
20240145247
2024-05-02

ION BEAM IMPLANTATION METHOD AND SEMICONDUCTOR DEVICE

#8
20230386786
2023-11-30

GA IMPLANT PROCESS CONTROL FOR ENHANCED PARTICLE PERFORMANCE

#9
20230038439
2023-02-09

Ion implanter and model generation method

#10
20210280388
2021-09-09

Ion implanter and model generation method

#11
20210193435
2021-06-24

Ion beam implantation method and semiconductor device

#12
20210175048
2021-06-10

Techniques for determining and correcting for expected dose variation during implantation of photoresist-coated substrates

#13
20210043421
2021-02-11

Ion implanter and ion implantation method

#14
20200027698
2020-01-23

APPARATUS AND TECHNIQUES FOR BEAM MAPPING IN ION BEAM SYSTEM

#15
20190164718
2019-05-30

Ion implantation amount adjustment device and method, ion implantation apparatus and determination method

#16
20190139740
2019-05-09

Apparatus and techniques for beam mapping in ion beam system

#17
20180350557
2018-12-06

Ion implanter, ion beam irradiated target, and ion implantation method

#18
20180068828
2018-03-08

In situ beam current monitoring and control in scanned ion implantation systems

#19
20170207063
2017-07-20

Method for implantation of semiconductor wafers having high bulk resistivity

#20
20170162459
2017-06-08

Apparatus and method for ion implantation

#21
20170062285
2017-03-02

Ion implantation apparatus and semiconductor manufacturing method

#22
20160254122
2016-09-01

Method for generating parameter pattern, ion implantation method and feed forward semiconductor manufacturing method

#23
20160225577
2016-08-04

Magnetic field fluctuation for beam smoothing

#24
20160217973
2016-07-28

Monitoring device, ion implantation device, and monitoring method

#25
20160189926
2016-06-30

Beam profiling speed enhancement for scanned beam implanters

#26
20150262790
2015-09-17

Ion irradiation apparatus and ion irradiation method

#27
20150262787
2015-09-17

Ion implanter, beam energy measuring device, and method of measuring beam energy

#28
20150221561
2015-08-06

Method for monitoring ion implantation

#29
20140212595
2014-07-31

Magnetic field fluctuation for beam smoothing

#30
20140065730
2014-03-06

Implant-induced damage control in ion implantation

#31
20130280823
2013-10-24

Apparatus for monitoring ion implantation

#32
20130186457
2013-07-25

Solar cell, solar cell manufacturing device, and method for manufacturing the same

#33
20130153779
2013-06-20

Dose measurement device for plasma-immersion ion implantation

#34
20130146760
2013-06-13

System and method for ion implantation with improved productivity and uniformity

#35
20130092825
2013-04-18

Ion implantation apparatus and ion implantation method

#36
20130068960
2013-03-21

Apparatus for monitoring ion implantation

#37
20130068162
2013-03-21

System and method of dosage profile control

#38
20130042809
2013-02-21

Ion implanter

#39
20130023069
2013-01-24

Method for checking ion implantation condition and method for manufacturing semiconductor wafer

#40
20130009075
2013-01-10

Beam line system of ion implanter

#41
20120196047
2012-08-02

DETERMINING RELATIVE SCAN VELOCITY TO CONTROL ION IMPLANTATION OF WORK PIECE

#42
20120161037
2012-06-28

Dose Measurement Method using Calorimeter

#43
20120056110
2012-03-08

Using beam blockers to perform a patterned implant of a workpiece

#44
20120025107
2012-02-02

Versatile beam glitch detection system

#45
20120009692
2012-01-12

System and method of dosage profile control

#46
20110315899
2011-12-29

Handling beam glitches during ion implantation of workpieces

#47
20110297842
2011-12-08

Ion beam irradiation system and ion beam irradiation method

#48
20110272567
2011-11-10

Throughput Enhancement for Scanned Beam Ion Implanters

#49
20110248182
2011-10-13

Ion implanting apparatus

#50
20110240847
2011-10-06

Transmission energy contamination detector

#51
20110215262
2011-09-08

Method for improving implant uniformity during photoresist outgassing

#52
20110089321
2011-04-21

Ion beam apparatus and method employing magnetic scanning

#53
20110042578
2011-02-24

Ion beam monitoring arrangement

#54
20100148089
2010-06-17

Ion implantation ion source, system and method

#55
20100090131
2010-04-15

METHOD OF DETERMINING ANGLE MISALIGNMENT IN BEAM LINE ION IMPLANTERS

#56
20100084583
2010-04-08

REDUCED IMPLANT VOLTAGE DURING ION IMPLANTATION

#57
20100084582
2010-04-08

Method and apparatus for controlling beam current uniformity in an ion implanter

#58
20100084581
2010-04-08

Implant uniformity control

#59
20100025597
2010-02-04

ION IMPLANTING DEVICE AND METHOD

#60
20100003770
2010-01-07

Elemental analysis method and semiconductor device manufacturing method

#61
20090321657
2009-12-31

System and method of controlling broad beam uniformity

#62
20090321625
2009-12-31

Ion implanter having combined hybrid and double mechanical scan architecture

#63
20090272918
2009-11-05

System and method of performing uniform dose implantation under adverse conditions

#64
20090261248
2009-10-22

Ion beam apparatus and method employing magnetic scanning

#65
20090242808
2009-10-01

Techniques for improved uniformity tuning in an ion implanter system

#66
20090236547
2009-09-24

Extraction electrode system for high current ion implanter

#67
20090230329
2009-09-17

Ion implantation method

#68
20090212232
2009-08-27

Ion source and ion implantation apparatus

#69
20090206270
2009-08-20

Ion beam apparatus and method for ion implantation

#70
20090200492
2009-08-13

Ion implantation method and apparatus

#71
20090200491
2009-08-13

Ion implantation method and apparatus

#72
20090166564
2009-07-02

METHODS FOR MONITORING IMPLANTER PERFORMANCE

#73
20090121122
2009-05-14

TECHNIQUES FOR MEASURING AND CONTROLLING ION BEAM ANGLE AND DENSITY UNIFORMITY

#74
20090114853
2009-05-07

Manufacturing system for semiconductor device capable of controlling variation in electrical property of element in wafer surface and method for manufacturing the semiconductor device

#75
20090114813
2009-05-07

Measuring energy contamination using time-of-flight techniques

#76
20090090876
2009-04-09

Implant beam utilization in an ion implanter

#77
20090084988
2009-04-02

SINGLE WAFER IMPLANTER FOR SILICON-ON-INSULATOR WAFER FABRICATION

#78
20090072164
2009-03-19

Ion implanting apparatus

#79
20090032726
2009-02-05

Ion implanter having combined hybrid and double mechanical scan architecture

#80
20080296472
2008-12-04

Dosage accuracy monitoring systems of implanters

#81
20080251737
2008-10-16

Ion implantation apparatus

#82
20080251713
2008-10-16

Ion implantation apparatus and ion implantation method

#83
20080191154
2008-08-14

Ion implanting apparatus and method for implanting ions

#84
20080182347
2008-07-31

Methods for monitoring ion implant process in bond and cleave, silicon-on-insulator (SOI) wafer manufacturing

#85
20080173828
2008-07-24

Ion implantation device and method for implanting ions

#86
20080135776
2008-06-12

Magnetic monitoring of a Faraday cup for an ion implanter

#87
20080128640
2008-06-05

Partial ion implantation apparatus and method using bundled beam

#88
20080128639
2008-06-05

Ion implantation apparatus and method for obtaining non-uniform ion implantation energy

#89
20080111069
2008-05-15

Determining dopant information

#90
20080096359
2008-04-24

Method of determining angle misalignment in beam line ion implanters

#91
20080087846
2008-04-17

Sensor for ion implanter

#92
20080078954
2008-04-03

Beam line architecture for ion implanter

#93
20080078953
2008-04-03

Technique for improving ion implantation throughput and dose uniformity

#94
20080078952
2008-04-03

Technique for improving ion implantation based on ion beam angle-related information

#95
20080073584
2008-03-27

Ion beam current uniformity monitor, ion implanter and related method

#96
20080073581
2008-03-27

Ion beam irradiating apparatus and method of adjusting uniformity of a beam

#97
20080073579
2008-03-27

Ion beam measuring method and ion implanting apparatus

#98
20080073550
2008-03-27

Methods and apparatus for beam density measurement in two dimensions

#99
20080067444
2008-03-20

Ion beam scanning control methods and systems for ion implantation uniformity

#100
20080067438
2008-03-20

Dose uniformity correction technique

#101
20080067434
2008-03-20

Non-uniform ion implantation

#102
20080067433
2008-03-20

System and method of ion beam control in response to a beam glitch

#103
20080024126
2008-01-31

Beam measuring equipment and beam measuring method using the same

#104
20070278427
2007-12-06

Closed loop dose control for ion implantation

#105
20070278417
2007-12-06

ION IMPLANTATION ION SOURCE, SYSTEM AND METHOD

#106
20070262262
2007-11-15

Ion implantation ion source, system and method

#107
20070259511
2007-11-08

Method of implanting a substrate and an ion implanter for performing the method

#108
20070257210
2007-11-08

Preventing dosage drift with duplicate dose integrators

#109
20070200075
2007-08-30

Ion beam current monitoring

#110
20070194227
2007-08-23

METHOD OF CHARACTERIZING AN ION BEAM

#111
20070187620
2007-08-16

Apparatus and method for partial ion implantation

#112
20070187615
2007-08-16

Wafer charge monitoring

#113
20070181832
2007-08-09

Controlling the characteristics of implanter ion-beams

#114
20070176115
2007-08-02

Ion implantation system and control method

#115
20070176114
2007-08-02

Ion implantation system and control method

#116
20070173043
2007-07-26

Ion implantation system having variable screen aperture and ion implantation method using the same

#117
20070152173
2007-07-05

Ion implantation apparatus and ion implanting method

#118
20070145298
2007-06-28

Ion beam angle measurement systems and methods for ion implantation systems

#119
20070120075
2007-05-31

Beam current stabilization utilizing gas feed control loop

#120
20070120073
2007-05-31

Ion implanation method and device using thereof

#121
20070120067
2007-05-31

Means to establish orientation of ion beam to wafer and correct angle errors

#122
20070114456
2007-05-24

Ion implanter and ion implantation control method thereof

#123
20070108394
2007-05-17

Dual mode ion source for ion implantation

#124
20070105355
2007-05-10

Method of implanting a substrate and an ion implanter for performing the method

#125
20070100567
2007-05-03

Faraday system integrity determination

#126
20070085037
2007-04-19

Method, system, and apparatus for improving doping uniformity in high-tilt ion implantation

#127
20070069156
2007-03-29

Ion beam profiler

#128
20070023697
2007-02-01

Controlling the characteristics of implanter ion-beams

#129
20070023695
2007-02-01

Systems and methods for implant dosage control

#130
20070023674
2007-02-01

Ion beam measuring method and ion implanting apparatus

#131
20060289798
2006-12-28

Methods and apparatus for ion beam angle measurement in two dimensions

#132
20060284114
2006-12-21

Technique for uniformity tuning in an ion implanter system

#133
20060266957
2006-11-30

Technique for uniformity tuning in an ion implanter system

#134
20060255296
2006-11-16

Matching dose and energy of multiple ion implanters

#135
20060249696
2006-11-09

Technique for tuning an ion implanter system

#136
20060238133
2006-10-26

Ion implantation system and control method

#137
20060219955
2006-10-05

Method of measuring ion beam position

#138
20060208204
2006-09-21

Technique for ion beam angle spread control for advanced applications

#139
20060208203
2006-09-21

Technique for ion beam angle process control

#140
20060208202
2006-09-21

Technique for ion beam angle spread control

#141
20060197016
2006-09-07

Method of implanting a substrate and an ion implanter for performing the method

#142
20060192134
2006-08-31

Ion beam measurement apparatus and method

#143
20060169924
2006-08-03

Controlling the characteristics of implanter ion-beams

#144
20060169922
2006-08-03

Ion implant ion beam parallelism and direction integrity determination and adjusting

#145
20060145096
2006-07-06

Ion beam scanning control methods and systems for ion implantation uniformity

#146
20060138353
2006-06-29

Ion-implanting apparatus, ion-implanting method, and device manufactured thereby

#147
20060124867
2006-06-15

Method and apparatus for ion beam profiling

#148
20060076510
2006-04-13

Ion beam implant current, spot width and position tuning

#149
20060060797
2006-03-23

Ion implanters having an arc chamber that affects ion current density

#150
20060033046
2006-02-16

Scanning systems and methods for providing ions from an ion beam to a workpiece

#151
20060033045
2006-02-16

Ion beam measurement systems and methods for ion implant dose and uniformity control

#152
20060033041
2006-02-16

Ion implantation monitor system and method thereof

#153
20060017017
2006-01-26

Ion implanter and method of manufacturing semiconductor device

#154
20060006346
2006-01-12

Device and method for measurement of beam angle and divergence

#155
20050269527
2005-12-08

Method of implanting a substrate and an ion implanter for performing the method

#156
20050269520
2005-12-08

Ion implantation ion source, system and method

#157
20050263721
2005-12-01

Uniformity control multiple tilt axes, rotating wafer and variable scan velocity

#158
20050258379
2005-11-24

Uniformity control using multiple fixed wafer orientations and variable scan velocity

#159
20050242294
2005-11-03

Controlling the characteristics of implanter ion-beams

#160
20050232749
2005-10-20

Method for reciprocating a workpiece through an ion beam

#161
20050232748
2005-10-20

Reciprocating drive for scanning a workpiece

#162
20050230643
2005-10-20

Reciprocating drive for scanning a workpiece through an ion beam

#163
20050211924
2005-09-29

Ion implantation apparatus and ion implanting method

#164
20050191409
2005-09-01

Ion beam monitoring arrangement

#165
20050189500
2005-09-01

Modulating ion beam current

#166
20050181524
2005-08-18

Matching dose and energy of multiple ion implanters

#167
20050133736
2005-06-23

Ion implantation apparatus and partical collection structure thereof

#168
20050133728
2005-06-23

Method and system for in-situ calibration of a dose controller for ion implantation

#169
20050110484
2005-05-26

Beam current measuring device and apparatus using the same

#170
20050092940
2005-05-05

Method of controlling implant dosage and pressure compensation factor in-situ

#171
20050092938
2005-05-05

Utilization of an ion gauge in the process chamber of a semiconductor ion implanter

#172
20050051096
2005-03-10

Ion implantation ion source, system and method

#173
20050048679
2005-03-03

Technique for adjusting a penetration depth during the implantation of ions into a semiconductor region

#174
20050017202
2005-01-27

Electromagnetic regulator assembly for adjusting and controlling the current uniformity of continuous ion beams

#175
14972602
2017-02-28

Selective area implant of a workpiece