207234 ⎘
Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof; Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AB compounds with or without impurities, e.g. doping materials; Treatment of semiconductor bodies using processes or apparatus not provided for in groups - to modify their internal properties, e.g. to produce internal imperfections of silicon bodies, e.g. for gettering
Active device on a cleaved silicon substrate
#302Method of peeling thin film device and method of manufacturing semiconductor device using peeled thin film device
#303Semiconductor device with heat-resistant gate
#304Method of producing a vertically inhomogeneous platinum or gold distribution in a semiconductor substrate and in a semiconductor device
#305METHOD OF FABRICATING POLYCRYSTALLINE SILICON LAYER, TFT FABRICATED USING THE SAME, METHOD OF FABRICATING TFT, AND ORGANIC LIGHT EMITTING DIODE DISPLAY DEVICE HAVING THE SAME
#306First inter-layer dielectric stack for non-volatile memory
#307Gettering structures and methods and their application
#308Method and structure for thick layer transfer using a linear accelerator
#309Silicon wafer and its manufacturing method
#310Semiconductor wafer pre-process annealing and gettering method and system for solar cell formation
#311Substrate with Two Sided Doping and Method of Producing the Same
#312Silicon wafer for IGBT and method for producing same
#313Semiconductor storage device, semiconductor device, and manufacturing method therefor
#314Wafer processing method
#315Semiconductor thin film and semiconductor device
#316Semiconductor wafer processing method
#317Methods of forming transistor devices
#318Support with integrated deposit of gas absorbing material for manufacturing microelectronic microoptoelectronic or micromechanical devices
#319Multilayer gettering structure for semiconductor device and method
#320Method of degassing thin layer and method of manufacturing silicon thin film
#321IMPROVED THERMAL BUDGET USING NICKEL BASED SILICIDES FOR ENHANCED SEMICONDUCTOR DEVICE PERFORMANCE
#322Silicon structures with improved resistance to radiation events
#323Non-uniform minority carrier lifetime distributions in high performance silicon power devices
#324Support with integrated deposit of gas absorbing material for manufacturing microelectronic, microoptoelectronic or micromechanical devices
#325Method for assaying copper in silicon wafers
#326Semiconductor device and method of manufacturing the same
#327Light-detecting device and manufacturing method thereof
#328ELECTROSTATIC PARTICLE GETTERING IN AN ION IMPLANTER
#329Single crystal silicon wafer for insulated gate bipolar transistors
#330Method of manufacturing semiconductor device
#331Semiconductor device and manufacturing method thereof
#332Method of fabricating semiconductor device
#333MANUFACTURING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
#334Silicon wafer and method for production of silicon wafer
#335Cleaved silicon substrate active device
#336Method of manufacturing silicon wafer
#337Semiconductor device and method of fabricating same
#338Low defect epitaxial semiconductor substrate having gettering function, image sensor using the same, and fabrication method thereof
#339Semiconductor device and method of manufacturing the same
#340Method for manufacturing semiconductor device
#341Silicon wafer reclamation method and reclaimed wafer
#342Manufacturing a semiconductor device
#343Silicon wafer for IGBT and method for producing same
#344Method of manufacturing a semiconductor device having a reverse staggered thin film transistor
#345WAFER GETTERING USING RELAXED SILICON GERMANIUM EPITAXIAL PROXIMITY LAYERS
#346Gettering of silicon on insulator using relaxed silicon germanium epitaxial proximity layers
#347Fabrication method of semiconductor device
#348Semiconductor substrate with occurrence of slip suppressed and method of manufacturing the same
#349Semiconductor device including semiconductor memory element and method for producing same
#350Semiconductor storage device, semiconductor device, and manufacturing method therefor
#351Method of manufacturing an epitaxial semiconductor substrate and method of manufacturing a semiconductor device
#352Strained gettering layers for semiconductor processes
#353Bonded SOI substrate, and method for manufacturing the same
#354Semiconductor device
#355Method for fabricating a buried metallic layer in a semiconductor body and semiconductor component having a buried metallic layer
#356Solid-state imaging device, camera and method of producing the solid-state imaging device
#357Method of forming semiconductor constructions
#358Semiconductor constructions
#359Semiconductor device, and fabrication method of semiconductor device
#360Semiconductor device including semiconductor memory element and method for producing same
#361Method of manufacturing transistors
#362Process for metallic contamination reduction in silicon wafers
#363Semiconductor device and process for fabricating the same
#364Semiconductor device having a gettering layer
#365Semiconductor device and manufacturing method of the same
#366Semiconductor device of a charge storage type
#367Semiconductor device and manufacturing method thereof
#368Semiconductor device and method of manufacturing the same
#369Solid-state image sensor
#370Method of manufacturing a semiconductor device
#371Semiconductor thin film and semiconductor device
#372Method of reclaiming silicon wafers
#373Method of manufacturing a semiconductor device
#374Semiconductor device having a crystalline semiconductor film
#375Semiconductor device and method of fabricating same
#376Method of manufacturing a semiconductor device
#377Semiconductor film, semiconductor device and method of their production
#378Process for making non-uniform minority carrier lifetime distribution in high performance silicon power devices
#379Method of forming a multilayer structure for reducing defects in semiconductor devices and structure
#380Methods of forming alternative material fins with reduced defect density for a FinFET semiconductor device