ClassID:

209472

H01L2224/035 - CPC Classification

Classification description:

Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by; Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto; Bonding areas; Manufacturing methods related thereto; Manufacturing methods by chemical or physical modification of a pre-existing or pre-deposited material

Sub-classes:
Recent Application in this class:
#1
20260005166
2026-01-01

SEMICONDUCTOR DIE PACKAGES AND METHODS OF FORMATION

#2
20250096190
2025-03-20

METHODS AND DEVICES FOR IMPROVING BOND STRENGTH OF DIFFUSION BARRIERS

#3
20250006674
2025-01-02

METHODS AND STRUCTURES FOR LOW TEMPERATURE HYBRID BONDING

#4
20240387425
2024-11-21

OXIDATION AND CORROSION PREVENTION IN SEMICONDUCTOR DEVICES AND SEMICONDUCTOR DEVICE ASSEMBLIES

#5
20230072507
2023-03-09

Redistribution layer metallic structure and method

#6
20220328434
2022-10-13

Oxidation and corrosion prevention in semiconductor devices and semiconductor device assemblies

#7
20210159196
2021-05-27

Redistribution layer metallic structure and method

#8
20200144208
2020-05-07

Redistribution layer metallic structure and method

#9
20190304939
2019-10-03

Redistribution layer metallic structure and method

#10
20160210495
2016-07-21

Connection pads for a fingerprint sensing device

#11
20150179593
2015-06-25

Low z-height package assembly

#12
20150091165
2015-04-02

Semiconductor device and method of forming patterned repassivation openings between RDL and UBM to reduce adverse effects of electro-migration

#13
20140225267
2014-08-14

Solderless die attach to a direct bonded aluminum substrate

#14
20130328204
2013-12-12

Solderless die attach to a direct bonded aluminum substrate

#15
20130140691
2013-06-06

Semiconductor device and method of forming patterned repassivation openings between RDL and UBM to reduce adverse effects of electro-migration

#16
20120279767
2012-11-08

Techniques for improving bond pad performance

#17
20110086468
2011-04-14

ASSEMBLY OF SEMICONDUCTOR CHIPS/WAFERS

#18
20110027942
2011-02-03

Semiconductor package

#19
20100213622
2010-08-26

Semiconductor device

#20
20100171221
2010-07-08

Semiconductor device and manufacturing method thereof

#21
20090102054
2009-04-23

Semiconductor package

#22
20070015351
2007-01-18

Process for making a semiconductor device having a roughened surface

#23
20060244138
2006-11-02

Techniques for improving bond pad performance