ClassID:

209502

H01L2224/03826 - CPC Classification

Classification description:

Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by; Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto; Bonding areas; Manufacturing methods related thereto; Manufacturing methods; Post-treatment of the bonding area; Applying permanent coating, e.g. in-situ coating Physical vapour deposition [PVD], e.g. evaporation, or sputtering

Recent Application in this class:
#1
20250029941
2025-01-23

SEMICONDUCTOR PACKAGE AND METHOD OF FABRICATING THE SAME

#2
20240332227
2024-10-03

SEMICONDUCTOR ELEMENT WITH BONDING LAYER HAVING LOW-K DIELECTRIC MATERIAL

#3
20240203914
2024-06-20

Manufacturing method of flip chip package structure

#4
20230260936
2023-08-17

Flip chip package structure and manufacturing method thereof

#5
20210272917
2021-09-02

Method of manufacturing semiconductor device

#6
20210140029
2021-05-13

Methods and apparatus for processing a substrate

#7
20210082861
2021-03-18

Chip package, method of forming a chip package and method of forming an electrical contact

#8
20200203297
2020-06-25

Interconnect structures for preventing solder bridging, and associated systems and methods

#9
20200185343
2020-06-11

Semiconductor device and method of manufacturing a semiconductor device

#10
20200075522
2020-03-05

Fabrication of solder balls with injection molded solder

#11
20200013749
2020-01-09

Method of forming an electrical contact and method of forming a chip package with a metal contact structure and protective layer

#12
20200006621
2020-01-02

Superconducting bump bonds

#13
20200006620
2020-01-02

Superconducting bump bonds

#14
20190244919
2019-08-08

Semiconductor Devices and Methods of Manufacture Thereof

#15
20190198470
2019-06-27

Interconnect structures for preventing solder bridging, and associated systems and methods

#16
20180366634
2018-12-20

Superconducting bump bonds

#17
20180269171
2018-09-20

Semiconductor device and method of manufacturing a semiconductor device

#18
20180269170
2018-09-20

Semiconductor device and method of manufacturing a semiconductor device

#19
20180261562
2018-09-13

Semiconductor device and method of manufacturing the same

#20
20170338169
2017-11-23

Chip package and method of forming a chip package with a metal contact structure and protective layer, and method of forming an electrical contact

#21
20170278805
2017-09-28

Integrated circuit chip and integrated circuit wafer with guard ring

#22
20170221843
2017-08-03

Semiconductor devices and methods of manufacture thereof

#23
20170148760
2017-05-25

Semiconductor device and method of manufacturing the same

#24
20160079192
2016-03-17

Metal routing architecture for integrated circuits

#25
20160053383
2016-02-25

Etching agent for copper or copper alloy

#26
20150228533
2015-08-13

Method of forming Cu pillar bump with non-metal sidewall spacer and metal top cap

#27
20150179599
2015-06-25

Die substrate assembly and method

#28
20140238953
2014-08-28

Etching agent for copper or copper alloy

#29
20140191390
2014-07-10

Metal routing architecture for integrated circuits

#30
20130252375
2013-09-26

Magnet assisted alignment method for wafer bonding and wafer level chip scale packaging

#31
20110298123
2011-12-08

Cu pillar bump with non-metal sidewall spacer and metal top cap

#32
20080194077
2008-08-14

Method of low temperature wafer bonding through Au/Ag diffusion

#33
17953697
2024-01-09

Bonding process with inhibited oxide formation

#34
17138255
2022-11-01

Bonding process with inhibited oxide formation