ClassID:

209866

H01L2224/27616 - CPC Classification

Classification description:

Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by; Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto; Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto; Manufacturing methods by patterning a pre-deposited material; Physical or chemical etching Chemical mechanical polishing [CMP]

Recent Application in this class:
#1
20250046747
2025-02-06

SEMICONDUCTOR PACKAGE

#2
20240395774
2024-11-28

PACKAGE STRUCTURE AND METHOD OF FORMING THE SAME

#3
20240379607
2024-11-14

CHEMICAL MECHANICAL POLISHING FOR HYBRID BONDING

#4
20240355782
2024-10-24

INTEGRATED CIRCUIT PACKAGES

#5
20240332261
2024-10-03

PACKAGE STRUCTURE AND METHOD OF FORMING THE SAME

#6
20240321805
2024-09-26

WET ATOMIC LAYER ETCHING METHOD AND METHOD OF MANUFACTURING THE SAME

#7
20230268308
2023-08-24

CHEMICAL MECHANICAL POLISHING FOR HYBRID BONDING

#8
20230067035
2023-03-02

Integrated circuit packages

#9
20230066610
2023-03-02

Chemical mechanical polishing for copper dishing control

#10
20220165711
2022-05-26

Method of manufacturing die stack structure

#11
20210288030
2021-09-16

Integrated circuit package and method

#12
20210098318
2021-04-01

DAM FOR THREE-DIMENSIONAL INTEGRATED CIRCUIT

#13
20210066233
2021-03-04

Chemical mechanical polishing for hybrid bonding

#14
20200381396
2020-12-03

Integrated circuit package and method

#15
20200035636
2020-01-30

Semiconductor device production method

#16
20190273108
2019-09-05

Solid-state imaging device including a sensor substrate and a logic substrate

#17
20190131277
2019-05-02

Die stack structure with hybrid bonding structure and method of fabricating the same and package

#18
20190096842
2019-03-28

Chemical mechanical polishing for hybrid bonding

#19
20180323118
2018-11-08

Dam for three-dimensional integrated circuit

#20
20180226374
2018-08-09

Semiconductor device including built-in crack-arresting film structure

#21
20170221850
2017-08-03

Semiconductor device including built-in crack-arresting film structure

#22
20160167195
2016-06-16

System and process for in situ byproduct removal and platen cooling during CMP

#23
20160035833
2016-02-04

Trap rich layer for semiconductor devices

#24
20150262900
2015-09-17

Dam for three-dimensional integrated circuit

#25
20150228535
2015-08-13

Bonded processed semiconductor structures and carriers

#26
20140377908
2014-12-25

Methods for the formation of a trap rich layer

#27
20140327113
2014-11-06

3D integrated heterostructures having low-temperature bonded interfaces with high bonding energy

#28
20140220735
2014-08-07

Method and apparatus for a wafer seal ring

#29
20130256907
2013-10-03

Bonded processed semiconductor structures and carriers

#30
20120161310
2012-06-28

Trap rich layer for semiconductor devices

#31
20120153496
2012-06-21

Method of fabricating a TSV for 3D packaging of semiconductor device

#32
20120043647
2012-02-23

Low-temperature bonding process

#33
20120013013
2012-01-19

Methods of forming bonded semiconductor structures using a temporary carrier having a weakened ion implant region for subsequent separation along the weakened region

#34
16737176
2022-02-01

Curved pillar interconnects