207728 ⎘
Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body Via connections in a multilevel interconnection structure
Graphene layer for reduced contact resistance
#4802Electro-migration reduction
#4803Metal line structure and method
#4804Semiconductor devices including a thick metal layer
#4805Contact via formation
#4806Fan-out semiconductor package
#4807Methods of forming interconnect structures in semiconductor fabrication
#4808Semiconductor package with improved interposer structure
#4809Microelectronic arrangement and method for manufacturing the same
#4810Contact structures for reducing electrical shorts and methods of forming the same
#4811Semiconductor storage device
#4812Sidewall spacer structure enclosing conductive wire sidewalls to increase reliability
#4813Interconnection structure having increased conductive features and method of manufacturing the same
#4814Hybrid interconnect structure for self aligned via
#4815Capacitor between two passivation layers with different etching rates
#4816Directed self-assembly structures and techniques
#4817Semiconductor device with alleviation feature
#4818Variable dielectric constant materials in same layer of a package
#4819Hybrid ball grid array package for high speed interconnects
#4820PACKAGE STRUCTURE
#4821Through-circuit vias in interconnect structures
#4822Superconducting device having a plurality of thermal sink layers and a plurality of ground planes
#4823Method to manufacture semiconductor device
#4824Semiconductor device including contact structure
#4825Interconnect structure with partial sidewall liner
#4826Methods of modifying portions of layer stacks
#4827Methods of modifying portions of layer stacks
#4828EUV patterning methods, structures, and materials
#4829Decoupling capacitors based on dummy through-silicon-vias
#4830Chemical compositions and methods of patterning microelectronic device structures
#4831SCALABLE CIRCUIT-UNDER-PAD DEVICE TOPOLOGIES FOR LATERAL GaN POWER TRANSISTORS
#4832Interconnect landing method for RRAM technology
#4833Solid-state imaging device and electronic apparatus
#4834Through-stack contact via structures for a three-dimensional memory device and methods of forming the same
#4835Semiconductor device and method of forming the same
#4836Semiconductor device, circuit board structure and manufacturing method thereof
#4837Semiconductor die containing dummy metallic pads and methods of forming the same
#4838Air channel formation in packaging process
#4839VIA RAIL SOLUTION FOR HIGH POWER ELECTROMIGRATION
#4840Method of forming semiconductor device
#4841Semiconductor storage device and manufacturing method thereof
#4842Semiconductor devices including line identifier
#4843Semiconductor structure with ultra thick metal and manufacturing method thereof
#4844Semiconductor device
#4845Semiconductor devices and methods of manufacturing the same
#4846Vertical memory device
#4847Semiconductor structure with via extending across adjacent conductive lines and method of forming the same
#4848Back end of line integration for self-aligned vias
#4849Hybrid via interconnect structure
#4850Interconnect structure and method of forming the same
#4851Via structure and methods for forming the same
#4852Semiconductor structure having air gap dielectric
#4853Via connection to a partially filled trench
#4854Memory device and method of manufacturing the same
#4855Via structure with low resistivity and method for forming the same
#4856Substrate and manufacturing method thereof and electronic device
#4857Semiconductor device
#4858Three-dimensional memory device including ferroelectric-metal-insulator memory cells and methods of making the same
#4859Three-dimensional memory device containing auxiliary support pillar structures and method of making the same
#4860Microelectronic devices including decoupling capacitors, and related apparatuses, electronic systems, and methods
#4861Microelectronic devices with a polysilicon structure adjacent a staircase structure, and related methods
#4862Integrated circuit, system and method of forming the same
#4863Integrated assemblies and methods of forming integrated assemblies
#4864Semiconductor device comprising air gaps having different configurations
#4865Seal ring between interconnected chips mounted on an integrated circuit
#4866Methods of forming contact features in field-effect transistors
#4867Integrated assemblies and methods of forming integrated assemblies
#4868Forming decoupled interconnects
#4869Method of forming a deep trench isolation structure for isolation of high-voltage devices
#4870Selective passivation and selective deposition
#4871Semiconductor memory device
#4872TECHNIQUES FOR MRAM MTJ TOP ELECTRODE CONNECTION
#4873Semiconductor device and manufacturing method of semiconductor device
#4874Manufacturing method for memory structure
#4875Method for fabricating semiconductor device including capacitor structure
#4876Semiconductor structure
#4877Capacitor die for stacked integrated circuits
#4878Semiconductor device and method of forming the same
#4879Semiconductor Device and Method of Forming Same
#4880Binary metal liner layers
#4881Memory device
#4882Redistribution layer structures for integrated circuit package
#4883Memory Array Comprising Strings Of Memory Cells
#4884Integrated fan-out packages and methods of forming the same
#4885Microelectronic devices with self-aligned interconnects, and related methods
#4886Via array design for multi-layer redistribution circuit structure
#4887Semiconductor device
#4888Semiconductor package and method of fabricating the same
#4889Contacts and liners having multi-segmented protective caps
#4890Planarization controllability for interconnect structures
#4891Using a self-assembly layer to facilitate selective formation of an etching stop layer
#4892Metal-oxide-metal capacitor from subtractive back-end-of-line scheme
#4893Nonvolatile memory device and method for fabricating the same
#4894Semiconductor device and method for fabricating the same
#4895Floating gate test structure for embedded memory device
#4896Through silicon via design for stacking integrated circuits
#4897Semiconductor devices having standard cells therein with improved integration and reliability
#4898Semiconductor device and method for manufacturing the same
#4899Standard cell having power rails disposed in central region thereof and standard cell block
#4900Semiconductor structure and semiconductor layout structure
#4901System on integrated chips and methods of forming same
#4902Wafer-level design and wiring pattern for a semiconductor package
#4903Integrated circuit and method for forming the same
#4904Semiconductor memory device
#4905Top via interconnect having a line with a reduced bottom dimension
#4906Thin film resistor with punch-through vias
#4907Semiconductor device and method of manufacturing the same
#4908Memory Arrays Comprising Operative Channel-Material Strings And Dummy Pillars
#4909Integrated circuit structure with backside via
#4910Sensor package and method
#4911Microelectronic devices including stadium structures, and related methods, memory devices, and electronic systems
#4912Semiconductor device and layout design thereof
#4913Semiconductor package and method
#4914Flexible transistors with near-junction heat dissipation
#4915Semiconductor package
#4916Barrier-less prefilled via formation
#4917Interconnect structure and method
#4918Passivation layer for integrated circuit structure and forming the same
#4919Interconnects having spacers for improved top via critical dimension and overlay tolerance
#4920Integrated circuit structure with backside dielectric layer having air gap
#4921Power grid, IC and method for placing power grid
#4922Multiple power domains using nano-sheet structures
#4923Memory device and method of fabricating the same
#4924Memory device with sub-slits
#4925Three-dimensional memory arrays with layer selector transistors
#4926Semiconductor device including base pillar, connection pad, and insulation layer disposed on a substrate
#4927Semiconductor storage device
#4928Capping layer for liner-free conductive structures
#4929Semiconductor device and method for forming the same
#4930Semiconductor structure
#4931Semiconductor device
#4932Semiconductor device including a porous dielectric layer, and method of forming the semiconductor device
#4933Terminal structure and wiring substrate
#4934Semiconductor structure and fabrication method thereof
#4935NOVEL MIM STRUCTURE
#4936Thermal dissipation in semiconductor devices
#4937BEOL metallization formation
#4938Subtractive RIE interconnect
#4939Semiconductor structure and method for forming the same
#4940Fully aligned via interconnects with partially removed etch stop layer
#4941Method for preparing semiconductor device with air spacer
#4942Inter-wire cavity for low capacitance
#4943Semiconductor device and method for fabricating semiconductor device
#4944Vertical memory devices
#4945SRAM device and manufacturing method thereof
#4946Semiconductor memory device with air gaps between conductive features and method for preparing the same
#4947Semiconductor device and manufacturing method of semiconductor device
#4948Semiconductor structure with through substrate vias and manufacturing method thereof
#4949Structures and methods for reducing thermal expansion mismatch during integrated circuit packaging
#4950Semiconductor device with EMI protection structure and method for fabricating the same
#4951Methods of manufacturing semiconductor device and semiconductor device
#4952Semiconductor device with connecting structure having a doped layer and method for forming the same
#4953Layer structure including diffusion barrier layer and method of manufacturing the same
#4954Reducing RC delay in semiconductor devices
#4955Semiconductor device
#4956Semiconductor device and manufacturing method for the same
#4957Tank circuit structure and method of making the same
#4958Semiconductor device extension insulation
#4959Manufacturing method of semiconductor structure
#4960Semiconductor package and method
#4961Semiconductor memory device and erasing method of the semiconductor memory device
#4962Semiconductor devices including contact plugs
#4963Interconnects with enlarged contact area
#4964IC having trench-based metal-insulator-metal capacitor
#4965Manufacturing method of semiconductor structure
#4966Method and structure for forming fully-aligned via
#4967Etch stop layer removal for capacitance reduction in damascene top via integration
#4968SEMICONDUCTOR DEVICE AND METHODS OF MANUFACTURING THEREOF
#4969SEMICONDUCTOR DEVICE AND IMAGING DEVICE
#4970Display device
#4971Three-dimensional semiconductor memory devices
#4972Vertical memory devices
#4973Vertical memory structure with air gaps and method for preparing the same
#4974Die interconnect substrate, an electrical device and a method for forming a die interconnect substrate
#4975Methods and apparatus for forming dual metal interconnects
#4976Semiconductor structure and manufacturing method thereof
#4977Contact formation method and related structure
#4978Electrode-via structure
#4979Method of forming shield structure for backside through substrate vias (TSVS)
#4980Semiconductor structures and methods for forming the same
#4981Magnetically Enhanced High Density Plasma-Chemical Vapor Deposition Plasma Source For Depositing Diamond and Diamond-Like Films
#4982Semiconductor device and manufacturing method thereof
#4983SEMICONDUCTOR DEVICE INCLUDING STACK STRUCTURE AND TRENCHES
#4984Integrated assemblies having one or more modifying substances distributed within semiconductor material, and methods of forming integrated assemblies
#4985Memory cell and method of forming the memory cell
#4986Multi-layer line structure and method for manufacturing thereof
#4987Semiconductor device with a through contact and method of fabricating the same
#4988Semiconductor structure having buried power rail disposed between two fins and method of making the same
#4989Advanced node interconnect routing methodology
#4990Package comprising a substrate with interconnect routing over solder resist layer and an integrated device coupled to the substrate and method for manufacturing the package
#4991Top via with next level line selective growth
#4992Back end of line metallization
#4993Semiconductor devices having power rails and signal tracks arranged in different layer
#4994Hybrid method for forming semiconductor interconnect structure
#49953D IC decoupling capacitor structure and method for manufacturing the same
#4996Semiconductor die including edge ring structures and methods for making the same
#4997Semiconductor die including edge ring structures and methods for making the same
#4998Via formation with robust hardmask removal
#4999Subtractive back-end-of-line vias
#5000Interconnects with tight pitch and reduced resistance
#5001Via and plug architectures for integrated circuit interconnects and methods of manufacture
#5002Semiconductor arrangement and method of making
#5003FORMING VIAS IN A SEMICONDUCTOR DEVICE
#5004Semiconductor device and manufacturing method thereof
#5005Parallel-connected trench capacitor structure with multiple electrode layers and method of fabricating the same
#5006Defect detection structures, semiconductor devices including the same, and methods of detecting defects in semiconductor dies
#5007Method for manufacturing a FinFET device with a backside power rail and a backside self-aligned via by etching an extended source trench
#5008Semiconductor devices with backside power rail and backside self-aligned via
#5009Semiconductor device structure
#5010Device contact sizing in integrated circuit structures
#5011Magnetoresistive random access memory and method for fabricating the same
#5012Three-dimensional memory device and method for manufacturing the same
#5013Peripheral circuitry under array memory device and method of fabricating thereof
#5014Memory architecture with shared bitline at back-end-of-line
#5015Semiconductor device
#5016Semiconductor device with composite connection structure and method for fabricating the same
#5017High voltage isolation barrier with electric overstress integrity
#5018Corner structures for an optical fiber groove
#5019Deposition of graphene on a dielectric surface for next generation interconnects
#5020Microelectronic device interface configurations, and associated methods, devices, and systems
#5021WLCSP reliability improvement for package edges including package shielding
#5022VIA ZERO INTERCONNECT LAYER METAL RESISTOR INTEGRATION
#5023Magnetic structures in integrated circuit package supports
#5024Semiconductor device and method of fabricating the same
#5025INVERTED, SELF-ALIGNED TOP-VIA STRUCTURES
#5026Semiconductor device
#5027Stacked transistor structures with asymmetrical terminal interconnects
#5028Ion implant process for defect elimination in metal layer planarization
#5029Dual damascene fully aligned via in interconnects
#50303D semiconductor device and structure
#5031Semiconductor device and method for fabricating the same
#5032Semiconductor device
#5033Isolator
#5034Semiconductor structure
#5035Three-dimensional semiconductor memory devices
#5036Semiconductor memory device
#5037Semiconductor storage device
#5038Semiconductor device and method of manufacturing the same
#5039Semiconductor storage device and manufacturing method of the same
#5040Three-dimensional memory devices having through array contacts and methods for forming the same
#5041Semiconductor memory device and method of manufacturing thereof
#5042Vertical memory devices
#5043Package structure, chip structure and method of fabricating the same
#5044EMIB copper layer for signal and power routing
#5045Semiconductor storage device
#5046SEMICONDUCTOR MEMORY DEVICE
#5047Integrated circuit apparatus and power distribution network thereof
#5048INTERCONNECTION FABRIC FOR BURIED POWER DISTRIBUTION
#5049Semiconductor chip with stacked conductor lines and air gaps
#5050Staircase structure in three-dimensional memory device and method for forming the same
#5051Planar slab vias for integrated circuit interconnects
#5052Wiring structure and method for manufacturing the same
#5053SEMICONDUCTOR MEMORY DEVICE
#5054Semiconductor device with conductive protrusions and method for fabricating the same
#5055Fin Field-Effect Transistor device and method of forming the same
#5056Fully aligned interconnects with selective area deposition
#5057Self-aligned top vias over metal lines formed by a damascene process
#5058Conductive feature formation and structure
#5059Semiconductor device and a method of manufacturing the same
#5060Top via structure with enlarged contact area with upper metallization level
#5061Method of manufacturing redistribution substrate
#5062Enlarging contact area and process window for a contact via
#5063Semiconductor device and method for manufacturing the semiconductor device
#5064Semiconductor storage device
#5065SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
#5066Semiconductor device having selection line stud connected to string selection line
#5067Integrated circuit package and method
#5068High connectivity device stacking
#5069Semiconductor packages
#5070Wiring formation method, method for manufacturing semiconductor device, and semiconductor device
#5071Metal bumps and method forming same
#5072Semiconductor device and method of manufacturing semiconductor device
#5073Methods of forming microelectronic devices, and related microelectronic devices, memory devices, and electronic systems
#5074Semiconductor devices
#5075Semiconductor memory device
#5076Semiconductor device with isolation structure
#5077Semiconductor device
#5078Filling member between a heat sink and substrate
#5079Wire bond damage detector including a detection bond pad over a first and a second connected structures
#5080Semiconductor device with connecting structure having a step-shaped conductive feature and method for fabricating the same
#5081Method for manufacturing standard cell regions and engineering change order (ECO) cell regions
#5082Method for routing local interconnect structure at same level as reference metal line
#5083Three-dimensional vertical nor flash thin-film transistor strings
#5084Semiconductor storage device
#5085Three-dimensional (3D), vertically-integrated field-effect transistors (FETs) electrically coupled by integrated vertical FET-to-FET interconnects for complementary metal-oxide semiconductor (CMOS) cell circuits
#5086Method for forming semiconductor device
#5087Semiconductor device package including stress buffering layer
#5088Semiconductor devices having a conductive pillar and methods of manufacturing the same
#5089Semiconductor device and manufacturing method thereof
#5090Package structure and semiconductor pacakge
#5091Package panel processing with integrated ceramic isolation
#5092Package structure and method of forming the same
#5093Hybrid selective dielectric deposition for aligned via integration
#5094Semiconductor device and method of manufacturing a semiconductor device
#5095Protection structures in semiconductor chips and methods for forming the same
#5096Structurally stable self-aligned subtractive vias
#5097SELF-ALIGNED BLOCK VIA PATTERNING FOR DUAL DAMASCENE DOUBLE PATTERNED METAL LINES
#5098Using a liner layer to enlarge process window for a contact via
#5099Apparatus with multi-wafer based device and method for forming such
#5100Redistribution Lines Having Stacking Vias