207728 ⎘
Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body Via connections in a multilevel interconnection structure
SEMICONDUCTOR DEVICE HAVING MULTILAYER INTERCONNECTION STRUCTURE AND METHOD OF MANUFACTURING THE SAME
#8102Structure and method for improving high voltage breakdown reliability of a microelectronic device
#8103Power distribution networks for a three-dimensional (3D) integrated circuit (IC) (3DIC)
#8104Integrated circuit package with microstrip routing and an external ground plane
#8105Fan-out semiconductor package including electromagnetic interference shielding layer
#8106Method of forming semiconductor device having a dual material redistribution line
#8107Package structure and method of forming package structure
#8108Semiconductor device comprising a die seal including long via lines
#8109BOARD FOR ELECTRONIC COMPONENT PACKAGE, ELECTRONIC COMPONENT PACKAGE, AND METHOD OF MANUFACTURING BOARD FOR ELECTRONIC COMPONENT PACKAGE
#8110Forming self-aligned vias and air-gaps in semiconductor fabrication
#8111Semiconductor structure of interconnect and fabrication method thereof
#8112Selective deposition of WCN barrier/adhesion layer for interconnect
#8113Asymmetric stair structure and method for fabricating the same
#8114High-speed semiconductor device and method for forming the same
#8115Densely stacked metal-insulator-metal capacitor and method of forming the same
#8116Semiconductor device and method for manufacturing the same
#8117Semiconductor device and method of manufacturing the same
#8118Semiconductor structure and method for manufacturing the same
#8119Semiconductor device
#8120Three-dimensional semiconductor memory device and method for manufacturing the same
#8121Graphene wiring structure and semiconductor device using the same
#8122SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR DEVICE
#8123Reducing metallic interconnect resistivity through application of mechanical strain
#8124SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME
#8125Semiconductor device
#8126Semiconductor device and method for manufacturing the same
#8127STRUCTURE AND METHOD FOR CAPPING COBALT CONTACTS
#8128Method of Surface Localized Pore Sealing of Porous Dielectric Material
#8129Semiconductor integrated circuit device having reduced power consumption
#8130Power rail for standard cell block
#8131Metal interconnects for super (skip) via integration
#8132Memory device having capped embedded wires
#8133Semiconductor device, layout pattern and method for manufacturing an integrated circuit
#8134Chip-size, double side connection package and method for manufacturing the same
#8135Chamferless via structures
#8136Semiconductor device package and method of manufacturing the same
#8137Method and structure for dual sheet resistance trimmable thin film resistors
#8138SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
#8139Semiconductor memory device
#8140Three dimensional semiconductor device and method of forming the same
#8141Three-dimensional memory device with short-free source select gate contact via structure and method of making the same
#8142Integrated circuit and computer-implemented method of manufacturing the same
#8143Semiconductor device and method of forming the same
#8144Integrated circuit device and method of manufacturing the same
#8145Integrated circuit device and method of manufacturing the same
#8146Logic cell structure with interconnection design and configuration
#8147Semiconductor device
#8148Integrated circuit device
#8149Assemblies having shield lines of an upper wiring layer electrically coupled with shield lines of a lower wiring layer
#8150Interconnect structure having power rail structure and related method
#8151Integrated circuit structure including via interconnect structure abutting lateral ends of metal lines and methods of forming same
#8152Semiconductor device including a substrate contact plug and manufacturing method thereof
#8153Semiconductor device and method for manufacturing same
#8154Methods for forming conductive paths and vias
#8155Thin film resistor methods of making contacts
#8156Semiconductor device having inductor
#8157Integrated transformers and integrated balanced to unbalanced transformers
#8158SEMICONDUCTOR DEVICE
#8159Electronic device and method for fabricating the same
#8160Three-dimensional semiconductor device
#8161Integrated circuit device
#8162Wiring with external terminal
#8163Memory and fabrication method thereof
#8164Enhanced self-alignment of vias for a semiconductor device
#8165Integrated circuits having parallel conductors and their formation
#8166Computationally efficient nano-scale conductor resistance model
#8167Independent gate FinFET with backside gate contact
#8168Independent gate FinFET with backside gate contact
#8169Methods of forming backside self-aligned vias and structures formed thereby
#8170Body contact layouts for semiconductor structures
#8171Semiconductor device containing multilayer titanium nitride diffusion barrier and method of making thereof
#8172Method of bonding semiconductor substrates
#8173Semiconductor device and method of manufacturing the same
#8174Semiconductor device, semiconductor integrated circuit, and load driving device
#8175METHOD OF FABRICATING SEMICONDUCTOR PACKAGE
#8176Semiconductor structure and manufacturing method thereof
#8177High performance middle of line interconnects
#8178Self-aligned pattern formation for a semiconductor device
#8179Technologies for inverting lithographic patterns and semiconductor devices including high aspect ratio structures
#81803D low flux, high-powered MMIC amplifiers
#8181Antenna apparatus and method
#8182Microstructure modulation for 3D bonded semiconductor structure with an embedded capacitor
#8183Microstructure modulation for 3D bonded semiconductor containing an embedded resistor structure
#8184Method and structure for semiconductor mid-end-of-line (MEOL) process
#8185Microstructure modulation for metal wafer-wafer bonding
#8186Nitride structure having gold-free contact and methods for forming such structures
#8187BEOL vertical fuse formed over air gap
#8188Fan-out semiconductor package
#8189Mechanisms for forming metal-insulator-metal (MIM) capacitor structure
#8190SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
#8191SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
#8192Method for blocking a trench portion
#8193Memory array and method of forming the same
#8194Seal-ring structure for stacking integrated circuits
#8195Methods of forming integrated circuit package with thermally conductive pillar
#8196SEMICONDUCTOR APPARATUS AND METHOD FOR PREPARING THE SAME
#8197SEMICONDUCTOR APPARATUS AND METHOD FOR PREPARING THE SAME
#8198Seal ring for wafer level package
#8199Method for fabricating contact electrical fuse
#8200Substrate-less stackable package with wire-bond interconnect
#8201Microelectronic components with features wrapping around protrusions of conductive vias protruding from through-holes passing through substrates
#8202Low resistance seed enhancement spacers for voidless interconnect structures
#8203Low resistance seed enhancement spacers for voidless interconnect structures
#8204Lithographacally defined vias for organic package substrate scaling
#8205Dual liner silicide
#8206Self aligned conductive lines with relaxed overlay
#8207Method of forming a self-aligned contact using selective SiOdeposition
#8208Semiconductor device having groove-shaped via-hole
#8209Variable space mandrel cut for self aligned double patterning
#8210Self-aligned quadruple patterning (SAQP) for routing layouts including multi-track jogs
#8211Semiconductor device
#8212Method of fabricating semiconductor device
#8213Selective passivation and selective deposition
#8214Integrated structures comprising channel material extending into source material
#8215Package with solder regions aligned to recesses
#8216Forming bonding structures by using template layer as templates
#8217Semiconductor device and manufacturing method thereof
#8218Series MIM structures
#8219Three plate MIM capacitor via integrity verification
#8220Three plate MIM capacitor via integrity verification
#8221Devices with chamfer-less vias multi-patterning and methods for forming chamfer-less vias
#8222RANDOM NUMBER GENERATING DEVICE AND RANDOM NUMBER GENERATING METHOD
#8223Critical dimension shrink through selective metal growth on metal hardmask sidewalls
#8224Fully integrated broadband interconnect
#8225Contacts for highly scaled transistors
#8226Semiconductor devices with non-overlapping slits in-between memory blocks
#8227Protective layer for contact pads in fan-out interconnect structure and method of forming same
#8228METAL BOND PAD WITH COBALT INTERCONNECT LAYER AND SOLDER THEREON
#8229Sensor shielding for harsh media applications
#8230Semiconductor device including an air gap between wirings and manufacturing method thereof
#8231Circuit design having aligned power staples
#8232Semiconductor devices including a capping layer
#8233Enhancing integrated circuit density with active atomic reservoir
#8234Electronic device and method for fabricating the same
#8235Semiconductor device
#8236Conformal low temperature hermetic dielectric diffusion barriers
#8237Semiconductor devices and methods for forming semiconductor devices
#8238Group III-V device structure
#8239Discrete charge trapping elements for 3D NAND architecture
#8240Vertical memory devices and methods of manufacturing the same
#8241Semiconductor device including resistor structure
#8242Drain-extended metal-oxide-semiconductor bipolar switch for electrical overstress protection
#8243Thin 3D die with electromagnetic radiation blocking encapsulation
#8244Hybrid dielectric scheme for varying liner thickness and manganese concentration
#8245Cobalt based interconnects and methods of fabrication thereof
#8246Raised via for terminal connections on different planes
#8247Method and apparatus for forming self-aligned via with selectively deposited etching stop layer
#8248Self-aligned via forming to conductive line and related wiring structure
#8249Design-aware pattern density control in directed self-assembly graphoepitaxy process
#8250Methods for isolating portions of a loop of pitch-multiplied material and related structures
#8251Memory device including multiple gate-induced drain leakage current generator circuits
#8252Memory device having programmable impedance elements with a common conductor formed below bit lines
#8253Semiconductor memory device and structure
#8254Semiconductor structure and manufacturing method thereof
#8255Multiple driver pin integrated circuit structure
#8256Methods of forming conductive structures including stair step or tiered structures having conductive portions
#8257Increased contact alignment tolerance for direct bonding
#8258Bottom-up selective dielectric cross-linking to prevent via landing shorts
#8259Embedded metal-insulator-metal (MIM) decoupling capacitor in monolitic three-dimensional (3D) integrated circuit (IC) structure
#8260Semiconductor device and semiconductor device fabrication method
#8261Self-aligned isotropic etch of pre-formed vias and plugs for back end of line (BEOL) interconnects
#8262Maskless air gap to prevent via punch through
#8263Interconnect structure including airgaps and substractively etched metal lines
#8264Semiconductor devices and methods of fabricating the same
#8265Semiconductor device
#8266Magnetic memory devices
#8267Pixel structure, manufacturing method and display panel
#8268Three-dimensional memory device with enhanced mechanical stability semiconductor pedestal and method of making thereof
#8269SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
#8270Semiconductor device for avoiding short circuit between adjacent storage nodes and manufacturing method thereof
#8271Semiconductor device including fuse structure
#82723D semiconductor device and structure
#8273Cobalt contact and interconnect structures
#8274Cobalt contact and interconnect structures
#8275Method for forming fin field effect transistor (FinFET) device structure with interconnect structure
#8276Via connection to a partially filled trench
#8277Magnetically enhanced high density plasma-chemical vapor deposition plasma source for depositing diamond and diamond-like films
#8278Semiconductor device and a method for fabricating the same
#8279Nanowire-based vertical memory cell array having a metal layer interposed between a common back plate and the nanowires
#8280MIM CAPACITOR WITH ENHANCED CAPACITANCE
#8281Method of forming semiconductor memory device
#8282Electronic device with integrated galvanic isolation, and manufacturing method of the same
#8283Structure and method to reduce copper loss during metal cap formation
#8284Semiconductor device structures including stair step structures, and related semiconductor devices
#8285Semiconductor memory device and a manufacturing method thereof
#8286Semiconductor device including a porous dielectric layer, and method of forming the semiconductor device
#8287Circuits for and methods of implementing an inductor and a pattern ground shield in an integrated circuit
#8288BONDED STRUCTURES WITH INTEGRATED PASSIVE COMPONENT
#8289Solid state memory device, and manufacturing method thereof
#8290Semiconductor packaging method, semiconductor package and stacked semiconductor packages
#8291Alternative ground lines for inter-slot grounding
#8292Multiple via structure for high performance standard cells
#8293Semiconductor devices and contact plugs
#8294Semiconductor device and method of manufacturing thereof
#8295Methods of manufacturing integrated magnetic core inductors with vertical laminations
#8296Semiconductor apparatus, system, and method of producing semiconductor apparatus
#8297Vertical semiconductor devices
#8298Semiconductor device and method of manufacturing semiconductor device
#8299Controlled resistance integrated snubber for power switching device
#8300Semiconductor arrangement with a sealing structure
#8301Integrated circuit interconnect structure having metal oxide adhesive layer
#8302Corrosion and/or etch protection layer for contacts and interconnect metallization integration
#8303Interconnect structure and method of forming the same
#8304Method of forming high density, high shorting margin, and low capacitance interconnects by alternating recessed trenches
#8305Fan-out semiconductor package
#8306Phase changing on-chip thermal heat sink
#8307Test structure for testing via resistance and method
#8308Middle of the line (MOL) contacts with two-dimensional self-alignment
#8309Microelectronic assembly from processed substrate
#8310Data processing device using neural network, electronic component, and electronic device
#8311Semiconductor devices, methods of manufacture thereof, and capacitors
#8312Semiconductor device and method for fabricating the same
#8313ROM chip manufacturing structures having shared gate electrodes
#8314Integrated circuit having vertical transistor and semiconductor device including the integrated circuit
#8315Semiconductor device including overlay patterns
#8316Integrated circuit structure with continuous metal crack stop
#8317Conductive structure and method of forming the same
#8318Interconnection structure and manufacturing method thereof
#8319Air gap structure and method
#8320Memory devices, semiconductor devices and related methods
#8321Memory device and method of disposing conduction lines of the same
#8322Method of forming interconnection structure
#8323Semiconductor device with reduced via resistance
#8324Barrier layers in trenches and vias
#8325Interconnection lines having variable widths and partially self-aligned continuity cuts
#8326Interconnection cells having variable width metal lines and fully-self aligned variable length continuity cuts
#8327Apparatus and method for forming interconnection lines having variable pitch and variable widths
#8328Via blocking layer
#8329Interconnect structure and method of forming the same
#8330Solar cell module and conductor
#8331MONOLITHIC INTEGRATION TECHNIQUES FOR FABRICATING PHOTODETECTORS WITH TRANSISTORS ON SAME SUBSTRATE
#8332Semiconductor device and method for manufacturing the same
#8333Monolayer thin film capacitor and method for manufacturing the same
#8334Integrated structures and methods of forming vertically-stacked memory cells
#8335Semiconductor device
#8336Integrated circuit for reducing ohmic drop in power rails
#8337Semiconductor device and fabrication method of the same
#8338SEMICONDUCTOR PACKAGE
#8339Power module assembly with dual substrates and reduced inductance
#8340Bond structures and the methods of forming the same
#8341Semiconductor device
#8342Power grid, IC and method for placing power grid
#8343Method to form interconnect structure with tungsten fill
#8344Semiconductor device and manufacturing method thereof
#8345Through-silicon via with improved substrate contact for reduced through-silicon via (TSV) capacitance variability
#8346Vertical semiconductor device
#8347Replacement contacts
#8348Methods of manufacturing semiconductor devices
#8349Self-aligned middle of the line (MOL) contacts
#8350Semiconductor device and manufacturing method thereof
#8351Multi-metal fill with self-align patterning
#8352Method for forming semiconductor device contact
#8353Layout for semiconductor device including via pillar structure
#8354Semiconductor device
#83553D NAND device with five-folded memory stack structure configuration
#8356Redistribution layer structures for integrated circuit package
#8357Integrated circuit having a high cell density
#8358Fabrication method of semiconductor substrate
#8359Semiconductor device including a bit line
#8360Semiconductor package device and method of manufacturing the same
#8361Semiconductor device comprising a die seal including long via lines
#8362Integrated circuit product having a through-substrate-via (TSV) and a metallization layer that are formed after formation of a semiconductor device
#8363Semiconductor device with a conductive liner
#8364Memory device and method of forming thereof
#8365Interconnection structure having air gap
#8366Semiconductor device having composite structures and fabrication method thereof
#8367Textile patterning for subtractively-patterned self-aligned interconnects, plugs, and vias
#8368Semiconductor device, method of designing a layout of a semiconductor device, and method of manufacturing a semiconductor device
#8369Integrated circuit package structure and testing method using the same
#8370METHOD OF GROWING NANOSTRUCTURES
#8371Semiconductor device and manufacturing method thereof
#8372Three-dimensional memory device having passive devices at a buried source line level and method of making thereof
#8373Semiconductor devices
#8374Interconnect metal layout for integrated circuit
#8375Static random access memory device
#8376Semiconductor device structure and method for forming the same
#8377Integrated circuit (IC) devices with varying diameter via layer
#8378Semiconductor device including dummy via anchored to dummy metal layer
#8379Self aligned interconnect structures
#8380Interlevel conductor pre-fill utilizing selective barrier deposition
#8381Power grid structures and method of forming the same
#8382Semiconductor device and method of forming the same
#8383Device-manufacturing scheme for increasing the density of metal patterns in inter-layer dielectrics
#8384Airgap protection layer for via alignment
#8385Semiconductor device and method of fabricating the same
#8386Metallic blocking layer for reliable interconnects and contacts
#8387Method of manufacturing an interconnect structure by forming metal layers in mask openings
#8388Interconnect via with grown graphitic material
#8389High thermal conductivity vias by additive processing
#8390Integrated circuit nanoparticle thermal routing structure in interconnect region
#8391Semiconductor device package thermal conduit
#8392Thermal routing trench by additive processing
#8393Integrated circuit nanoparticle thermal routing structure over interconnect region
#8394Semiconductor structure, testing and fabricating methods thereof
#8395Semiconductor manufacturing method and semiconductor manufacturing apparatus
#8396Gate tie-down enablement with inner spacer
#8397Self aligned via and method for fabricating the same
#8398Method of forming superconductor structures
#8399Use of noble metals in the formation of conductive connectors
#8400Interconnect structure