ClassID:

207728

H01L23/5226 - page 28 - CPC Classification

Classification description:

Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body Via connections in a multilevel interconnection structure

Recent Application in this class:
#8101
20180286806
2018-10-04

SEMICONDUCTOR DEVICE HAVING MULTILAYER INTERCONNECTION STRUCTURE AND METHOD OF MANUFACTURING THE SAME

#8102
20180286802
2018-10-04

Structure and method for improving high voltage breakdown reliability of a microelectronic device

#8103
20180286800
2018-10-04

Power distribution networks for a three-dimensional (3D) integrated circuit (IC) (3DIC)

#8104
20180286797
2018-10-04

Integrated circuit package with microstrip routing and an external ground plane

#8105
20180286790
2018-10-04

Fan-out semiconductor package including electromagnetic interference shielding layer

#8106
20180286784
2018-10-04

Method of forming semiconductor device having a dual material redistribution line

#8107
20180286776
2018-10-04

Package structure and method of forming package structure

#8108
20180286773
2018-10-04

Semiconductor device comprising a die seal including long via lines

#8109
20180286770
2018-10-04

BOARD FOR ELECTRONIC COMPONENT PACKAGE, ELECTRONIC COMPONENT PACKAGE, AND METHOD OF MANUFACTURING BOARD FOR ELECTRONIC COMPONENT PACKAGE

#8110
20180286750
2018-10-04

Forming self-aligned vias and air-gaps in semiconductor fabrication

#8111
20180286747
2018-10-04

Semiconductor structure of interconnect and fabrication method thereof

#8112
20180286746
2018-10-04

Selective deposition of WCN barrier/adhesion layer for interconnect

#8113
20180286743
2018-10-04

Asymmetric stair structure and method for fabricating the same

#8114
20180277662
2018-09-27

High-speed semiconductor device and method for forming the same

#8115
20180277620
2018-09-27

Densely stacked metal-insulator-metal capacitor and method of forming the same

#8116
20180277561
2018-09-27

Semiconductor device and method for manufacturing the same

#8117
20180277554
2018-09-27

Semiconductor device and method of manufacturing the same

#8118
20180277526
2018-09-27

Semiconductor structure and method for manufacturing the same

#8119
20180277517
2018-09-27

Semiconductor device

#8120
20180277499
2018-09-27

Three-dimensional semiconductor memory device and method for manufacturing the same

#8121
20180277487
2018-09-27

Graphene wiring structure and semiconductor device using the same

#8122
20180277486
2018-09-27

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR DEVICE

#8123
20180277482
2018-09-27

Reducing metallic interconnect resistivity through application of mechanical strain

#8124
20180277476
2018-09-27

SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME

#8125
20180277459
2018-09-27

Semiconductor device

#8126
20180277453
2018-09-27

Semiconductor device and method for manufacturing the same

#8127
20180277427
2018-09-27

STRUCTURE AND METHOD FOR CAPPING COBALT CONTACTS

#8128
20180277362
2018-09-27

Method of Surface Localized Pore Sealing of Porous Dielectric Material

#8129
20180269154
2018-09-20

Semiconductor integrated circuit device having reduced power consumption

#8130
20180269152
2018-09-20

Power rail for standard cell block

#8131
20180269150
2018-09-20

Metal interconnects for super (skip) via integration

#8132
20180269149
2018-09-20

Memory device having capped embedded wires

#8133
20180269148
2018-09-20

Semiconductor device, layout pattern and method for manufacturing an integrated circuit

#8134
20180269141
2018-09-20

Chip-size, double side connection package and method for manufacturing the same

#8135
20180269103
2018-09-20

Chamferless via structures

#8136
20180265347
2018-09-20

Semiconductor device package and method of manufacturing the same

#8137
20180261664
2018-09-13

Method and structure for dual sheet resistance trimmable thin film resistors

#8138
20180261621
2018-09-13

SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME

#8139
20180261619
2018-09-13

Semiconductor memory device

#8140
20180261618
2018-09-13

Three dimensional semiconductor device and method of forming the same

#8141
20180261613
2018-09-13

Three-dimensional memory device with short-free source select gate contact via structure and method of making the same

#8142
20180261590
2018-09-13

Integrated circuit and computer-implemented method of manufacturing the same

#8143
20180261547
2018-09-13

Semiconductor device and method of forming the same

#8144
20180261546
2018-09-13

Integrated circuit device and method of manufacturing the same

#8145
20180261544
2018-09-13

Integrated circuit device and method of manufacturing the same

#8146
20180261542
2018-09-13

Logic cell structure with interconnection design and configuration

#8147
20180261541
2018-09-13

Semiconductor device

#8148
20180261540
2018-09-13

Integrated circuit device

#8149
20180261539
2018-09-13

Assemblies having shield lines of an upper wiring layer electrically coupled with shield lines of a lower wiring layer

#8150
20180261538
2018-09-13

Interconnect structure having power rail structure and related method

#8151
20180261536
2018-09-13

Integrated circuit structure including via interconnect structure abutting lateral ends of metal lines and methods of forming same

#8152
20180261530
2018-09-13

Semiconductor device including a substrate contact plug and manufacturing method thereof

#8153
20180261529
2018-09-13

Semiconductor device and method for manufacturing same

#8154
20180261497
2018-09-13

Methods for forming conductive paths and vias

#8155
20180254315
2018-09-06

Thin film resistor methods of making contacts

#8156
20180254314
2018-09-06

Semiconductor device having inductor

#8157
20180254313
2018-09-06

Integrated transformers and integrated balanced to unbalanced transformers

#8158
20180254276
2018-09-06

SEMICONDUCTOR DEVICE

#8159
20180254248
2018-09-06

Electronic device and method for fabricating the same

#8160
20180254247
2018-09-06

Three-dimensional semiconductor device

#8161
20180254246
2018-09-06

Integrated circuit device

#8162
20180254245
2018-09-06

Wiring with external terminal

#8163
20180254244
2018-09-06

Memory and fabrication method thereof

#8164
20180254242
2018-09-06

Enhanced self-alignment of vias for a semiconductor device

#8165
20180254214
2018-09-06

Integrated circuits having parallel conductors and their formation

#8166
20180253524
2018-09-06

Computationally efficient nano-scale conductor resistance model

#8167
20180248042
2018-08-30

Independent gate FinFET with backside gate contact

#8168
20180248041
2018-08-30

Independent gate FinFET with backside gate contact

#8169
20180248012
2018-08-30

Methods of forming backside self-aligned vias and structures formed thereby

#8170
20180248006
2018-08-30

Body contact layouts for semiconductor structures

#8171
20180247954
2018-08-30

Semiconductor device containing multilayer titanium nitride diffusion barrier and method of making thereof

#8172
20180247914
2018-08-30

Method of bonding semiconductor substrates

#8173
20180247894
2018-08-30

Semiconductor device and method of manufacturing the same

#8174
20180247892
2018-08-30

Semiconductor device, semiconductor integrated circuit, and load driving device

#8175
20180247891
2018-08-30

METHOD OF FABRICATING SEMICONDUCTOR PACKAGE

#8176
20180247890
2018-08-30

Semiconductor structure and manufacturing method thereof

#8177
20180247865
2018-08-30

High performance middle of line interconnects

#8178
20180247864
2018-08-30

Self-aligned pattern formation for a semiconductor device

#8179
20180247813
2018-08-30

Technologies for inverting lithographic patterns and semiconductor devices including high aspect ratio structures

#8180
20180241356
2018-08-23

3D low flux, high-powered MMIC amplifiers

#8181
20180241114
2018-08-23

Antenna apparatus and method

#8182
20180240860
2018-08-23

Microstructure modulation for 3D bonded semiconductor structure with an embedded capacitor

#8183
20180240859
2018-08-23

Microstructure modulation for 3D bonded semiconductor containing an embedded resistor structure

#8184
20180240790
2018-08-23

Method and structure for semiconductor mid-end-of-line (MEOL) process

#8185
20180240783
2018-08-23

Microstructure modulation for metal wafer-wafer bonding

#8186
20180240753
2018-08-23

Nitride structure having gold-free contact and methods for forming such structures

#8187
20180240752
2018-08-23

BEOL vertical fuse formed over air gap

#8188
20180240751
2018-08-23

Fan-out semiconductor package

#8189
20180240750
2018-08-23

Mechanisms for forming metal-insulator-metal (MIM) capacitor structure

#8190
20180240749
2018-08-23

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

#8191
20180240702
2018-08-23

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME

#8192
20180240699
2018-08-23

Method for blocking a trench portion

#8193
20180240505
2018-08-23

Memory array and method of forming the same

#8194
20180233490
2018-08-16

Seal-ring structure for stacking integrated circuits

#8195
20180233488
2018-08-16

Methods of forming integrated circuit package with thermally conductive pillar

#8196
20180233480
2018-08-16

SEMICONDUCTOR APPARATUS AND METHOD FOR PREPARING THE SAME

#8197
20180233479
2018-08-16

SEMICONDUCTOR APPARATUS AND METHOD FOR PREPARING THE SAME

#8198
20180233462
2018-08-16

Seal ring for wafer level package

#8199
20180233449
2018-08-16

Method for fabricating contact electrical fuse

#8200
20180233448
2018-08-16

Substrate-less stackable package with wire-bond interconnect

#8201
20180233447
2018-08-16

Microelectronic components with features wrapping around protrusions of conductive vias protruding from through-holes passing through substrates

#8202
20180233445
2018-08-16

Low resistance seed enhancement spacers for voidless interconnect structures

#8203
20180233444
2018-08-16

Low resistance seed enhancement spacers for voidless interconnect structures

#8204
20180233431
2018-08-16

Lithographacally defined vias for organic package substrate scaling

#8205
20180233417
2018-08-16

Dual liner silicide

#8206
20180233408
2018-08-16

Self aligned conductive lines with relaxed overlay

#8207
20180233407
2018-08-16

Method of forming a self-aligned contact using selective SiOdeposition

#8208
20180233405
2018-08-16

Semiconductor device having groove-shaped via-hole

#8209
20180233404
2018-08-16

Variable space mandrel cut for self aligned double patterning

#8210
20180233403
2018-08-16

Self-aligned quadruple patterning (SAQP) for routing layouts including multi-track jogs

#8211
20180233402
2018-08-16

Semiconductor device

#8212
20180233375
2018-08-16

Method of fabricating semiconductor device

#8213
20180233350
2018-08-16

Selective passivation and selective deposition

#8214
20180226427
2018-08-09

Integrated structures comprising channel material extending into source material

#8215
20180226370
2018-08-09

Package with solder regions aligned to recesses

#8216
20180226342
2018-08-09

Forming bonding structures by using template layer as templates

#8217
20180226341
2018-08-09

Semiconductor device and manufacturing method thereof

#8218
20180226340
2018-08-09

Series MIM structures

#8219
20180226339
2018-08-09

Three plate MIM capacitor via integrity verification

#8220
20180226338
2018-08-09

Three plate MIM capacitor via integrity verification

#8221
20180226294
2018-08-09

Devices with chamfer-less vias multi-patterning and methods for forming chamfer-less vias

#8222
20180225094
2018-08-09

RANDOM NUMBER GENERATING DEVICE AND RANDOM NUMBER GENERATING METHOD

#8223
20180223522
2018-08-09

Critical dimension shrink through selective metal growth on metal hardmask sidewalls

#8224
20180219270
2018-08-02

Fully integrated broadband interconnect

#8225
20180219078
2018-08-02

Contacts for highly scaled transistors

#8226
20180219023
2018-08-02

Semiconductor devices with non-overlapping slits in-between memory blocks

#8227
20180219000
2018-08-02

Protective layer for contact pads in fan-out interconnect structure and method of forming same

#8228
20180218993
2018-08-02

METAL BOND PAD WITH COBALT INTERCONNECT LAYER AND SOLDER THEREON

#8229
20180218984
2018-08-02

Sensor shielding for harsh media applications

#8230
20180218982
2018-08-02

Semiconductor device including an air gap between wirings and manufacturing method thereof

#8231
20180218981
2018-08-02

Circuit design having aligned power staples

#8232
20180218980
2018-08-02

Semiconductor devices including a capping layer

#8233
20180218976
2018-08-02

Enhancing integrated circuit density with active atomic reservoir

#8234
20180218945
2018-08-02

Electronic device and method for fabricating the same

#8235
20180218941
2018-08-02

Semiconductor device

#8236
20180218940
2018-08-02

Conformal low temperature hermetic dielectric diffusion barriers

#8237
20180218939
2018-08-02

Semiconductor devices and methods for forming semiconductor devices

#8238
20180212047
2018-07-26

Group III-V device structure

#8239
20180211969
2018-07-26

Discrete charge trapping elements for 3D NAND architecture

#8240
20180211968
2018-07-26

Vertical memory devices and methods of manufacturing the same

#8241
20180211952
2018-07-26

Semiconductor device including resistor structure

#8242
20180211951
2018-07-26

Drain-extended metal-oxide-semiconductor bipolar switch for electrical overstress protection

#8243
20180211924
2018-07-26

Thin 3D die with electromagnetic radiation blocking encapsulation

#8244
20180211920
2018-07-26

Hybrid dielectric scheme for varying liner thickness and manganese concentration

#8245
20180211918
2018-07-26

Cobalt based interconnects and methods of fabrication thereof

#8246
20180211912
2018-07-26

Raised via for terminal connections on different planes

#8247
20180211911
2018-07-26

Method and apparatus for forming self-aligned via with selectively deposited etching stop layer

#8248
20180211871
2018-07-26

Self-aligned via forming to conductive line and related wiring structure

#8249
20180211869
2018-07-26

Design-aware pattern density control in directed self-assembly graphoepitaxy process

#8250
20180211868
2018-07-26

Methods for isolating portions of a loop of pitch-multiplied material and related structures

#8251
20180211710
2018-07-26

Memory device including multiple gate-induced drain leakage current generator circuits

#8252
20180205012
2018-07-19

Memory device having programmable impedance elements with a common conductor formed below bit lines

#8253
20180204835
2018-07-19

Semiconductor memory device and structure

#8254
20180204828
2018-07-19

Semiconductor structure and manufacturing method thereof

#8255
20180204806
2018-07-19

Multiple driver pin integrated circuit structure

#8256
20180204799
2018-07-19

Methods of forming conductive structures including stair step or tiered structures having conductive portions

#8257
20180204798
2018-07-19

Increased contact alignment tolerance for direct bonding

#8258
20180204797
2018-07-19

Bottom-up selective dielectric cross-linking to prevent via landing shorts

#8259
20180204796
2018-07-19

Embedded metal-insulator-metal (MIM) decoupling capacitor in monolitic three-dimensional (3D) integrated circuit (IC) structure

#8260
20180204766
2018-07-19

Semiconductor device and semiconductor device fabrication method

#8261
20180204763
2018-07-19

Self-aligned isotropic etch of pre-formed vias and plugs for back end of line (BEOL) interconnects

#8262
20180204760
2018-07-19

Maskless air gap to prevent via punch through

#8263
20180204759
2018-07-19

Interconnect structure including airgaps and substractively etched metal lines

#8264
20180198059
2018-07-12

Semiconductor devices and methods of fabricating the same

#8265
20180197950
2018-07-12

Semiconductor device

#8266
20180197914
2018-07-12

Magnetic memory devices

#8267
20180197894
2018-07-12

Pixel structure, manufacturing method and display panel

#8268
20180197876
2018-07-12

Three-dimensional memory device with enhanced mechanical stability semiconductor pedestal and method of making thereof

#8269
20180197874
2018-07-12

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME

#8270
20180197865
2018-07-12

Semiconductor device for avoiding short circuit between adjacent storage nodes and manufacturing method thereof

#8271
20180197817
2018-07-12

Semiconductor device including fuse structure

#8272
20180197812
2018-07-12

3D semiconductor device and structure

#8273
20180197774
2018-07-12

Cobalt contact and interconnect structures

#8274
20180197773
2018-07-12

Cobalt contact and interconnect structures

#8275
20180197771
2018-07-12

Method for forming fin field effect transistor (FinFET) device structure with interconnect structure

#8276
20180197750
2018-07-12

Via connection to a partially filled trench

#8277
20180195164
2018-07-12

Magnetically enhanced high density plasma-chemical vapor deposition plasma source for depositing diamond and diamond-like films

#8278
20180190809
2018-07-05

Semiconductor device and a method for fabricating the same

#8279
20180190770
2018-07-05

Nanowire-based vertical memory cell array having a metal layer interposed between a common back plate and the nanowires

#8280
20180190761
2018-07-05

MIM CAPACITOR WITH ENHANCED CAPACITANCE

#8281
20180190665
2018-07-05

Method of forming semiconductor memory device

#8282
20180190646
2018-07-05

Electronic device with integrated galvanic isolation, and manufacturing method of the same

#8283
20180190592
2018-07-05

Structure and method to reduce copper loss during metal cap formation

#8284
20180190587
2018-07-05

Semiconductor device structures including stair step structures, and related semiconductor devices

#8285
20180190586
2018-07-05

Semiconductor memory device and a manufacturing method thereof

#8286
20180190585
2018-07-05

Semiconductor device including a porous dielectric layer, and method of forming the semiconductor device

#8287
20180190584
2018-07-05

Circuits for and methods of implementing an inductor and a pattern ground shield in an integrated circuit

#8288
20180190583
2018-07-05

BONDED STRUCTURES WITH INTEGRATED PASSIVE COMPONENT

#8289
20180190540
2018-07-05

Solid state memory device, and manufacturing method thereof

#8290
20180190513
2018-07-05

Semiconductor packaging method, semiconductor package and stacked semiconductor packages

#8291
20180186151
2018-07-05

Alternative ground lines for inter-slot grounding

#8292
20180183439
2018-06-28

Multiple via structure for high performance standard cells

#8293
20180182856
2018-06-28

Semiconductor devices and contact plugs

#8294
20180182850
2018-06-28

Semiconductor device and method of manufacturing thereof

#8295
20180182841
2018-06-28

Methods of manufacturing integrated magnetic core inductors with vertical laminations

#8296
20180182802
2018-06-28

Semiconductor apparatus, system, and method of producing semiconductor apparatus

#8297
20180182775
2018-06-28

Vertical semiconductor devices

#8298
20180182751
2018-06-28

Semiconductor device and method of manufacturing semiconductor device

#8299
20180182750
2018-06-28

Controlled resistance integrated snubber for power switching device

#8300
20180182710
2018-06-28

Semiconductor arrangement with a sealing structure

#8301
20180182709
2018-06-28

Integrated circuit interconnect structure having metal oxide adhesive layer

#8302
20180182708
2018-06-28

Corrosion and/or etch protection layer for contacts and interconnect metallization integration

#8303
20180182703
2018-06-28

Interconnect structure and method of forming the same

#8304
20180182702
2018-06-28

Method of forming high density, high shorting margin, and low capacitance interconnects by alternating recessed trenches

#8305
20180182691
2018-06-28

Fan-out semiconductor package

#8306
20180182687
2018-06-28

Phase changing on-chip thermal heat sink

#8307
20180182677
2018-06-28

Test structure for testing via resistance and method

#8308
20180182668
2018-06-28

Middle of the line (MOL) contacts with two-dimensional self-alignment

#8309
20180182666
2018-06-28

Microelectronic assembly from processed substrate

#8310
20180181862
2018-06-28

Data processing device using neural network, electronic component, and electronic device

#8311
20180175137
2018-06-21

Semiconductor devices, methods of manufacture thereof, and capacitors

#8312
20180175070
2018-06-21

Semiconductor device and method for fabricating the same

#8313
20180175026
2018-06-21

ROM chip manufacturing structures having shared gate electrodes

#8314
20180175024
2018-06-21

Integrated circuit having vertical transistor and semiconductor device including the integrated circuit

#8315
20180175016
2018-06-21

Semiconductor device including overlay patterns

#8316
20180174982
2018-06-21

Integrated circuit structure with continuous metal crack stop

#8317
20180174963
2018-06-21

Conductive structure and method of forming the same

#8318
20180174962
2018-06-21

Interconnection structure and manufacturing method thereof

#8319
20180174961
2018-06-21

Air gap structure and method

#8320
20180174960
2018-06-21

Memory devices, semiconductor devices and related methods

#8321
20180174959
2018-06-21

Memory device and method of disposing conduction lines of the same

#8322
20180174957
2018-06-21

Method of forming interconnection structure

#8323
20180174903
2018-06-21

Semiconductor device with reduced via resistance

#8324
20180174899
2018-06-21

Barrier layers in trenches and vias

#8325
20180174896
2018-06-21

Interconnection lines having variable widths and partially self-aligned continuity cuts

#8326
20180174895
2018-06-21

Interconnection cells having variable width metal lines and fully-self aligned variable length continuity cuts

#8327
20180174894
2018-06-21

Apparatus and method for forming interconnection lines having variable pitch and variable widths

#8328
20180174893
2018-06-21

Via blocking layer

#8329
20180174886
2018-06-21

Interconnect structure and method of forming the same

#8330
20180166601
2018-06-14

Solar cell module and conductor

#8331
20180166588
2018-06-14

MONOLITHIC INTEGRATION TECHNIQUES FOR FABRICATING PHOTODETECTORS WITH TRANSISTORS ON SAME SUBSTRATE

#8332
20180166568
2018-06-14

Semiconductor device and method for manufacturing the same

#8333
20180166528
2018-06-14

Monolayer thin film capacitor and method for manufacturing the same

#8334
20180166464
2018-06-14

Integrated structures and methods of forming vertically-stacked memory cells

#8335
20180166461
2018-06-14

Semiconductor device

#8336
20180166432
2018-06-14

Integrated circuit for reducing ohmic drop in power rails

#8337
20180166431
2018-06-14

Semiconductor device and fabrication method of the same

#8338
20180166419
2018-06-14

SEMICONDUCTOR PACKAGE

#8339
20180166410
2018-06-14

Power module assembly with dual substrates and reduced inductance

#8340
20180166408
2018-06-14

Bond structures and the methods of forming the same

#8341
20180166401
2018-06-14

Semiconductor device

#8342
20180166386
2018-06-14

Power grid, IC and method for placing power grid

#8343
20180166385
2018-06-14

Method to form interconnect structure with tungsten fill

#8344
20180166384
2018-06-14

Semiconductor device and manufacturing method thereof

#8345
20180166381
2018-06-14

Through-silicon via with improved substrate contact for reduced through-silicon via (TSV) capacitance variability

#8346
20180166380
2018-06-14

Vertical semiconductor device

#8347
20180166379
2018-06-14

Replacement contacts

#8348
20180166343
2018-06-14

Methods of manufacturing semiconductor devices

#8349
20180166335
2018-06-14

Self-aligned middle of the line (MOL) contacts

#8350
20180166332
2018-06-14

Semiconductor device and manufacturing method thereof

#8351
20180166330
2018-06-14

Multi-metal fill with self-align patterning

#8352
20180166329
2018-06-14

Method for forming semiconductor device contact

#8353
20180165403
2018-06-14

Layout for semiconductor device including via pillar structure

#8354
20180158941
2018-06-07

Semiconductor device

#8355
20180158834
2018-06-07

3D NAND device with five-folded memory stack structure configuration

#8356
20180158777
2018-06-07

Redistribution layer structures for integrated circuit package

#8357
20180158776
2018-06-07

Integrated circuit having a high cell density

#8358
20180158774
2018-06-07

Fabrication method of semiconductor substrate

#8359
20180158773
2018-06-07

Semiconductor device including a bit line

#8360
20180158766
2018-06-07

Semiconductor package device and method of manufacturing the same

#8361
20180158745
2018-06-07

Semiconductor device comprising a die seal including long via lines

#8362
20180158733
2018-06-07

Integrated circuit product having a through-substrate-via (TSV) and a metallization layer that are formed after formation of a semiconductor device

#8363
20180158730
2018-06-07

Semiconductor device with a conductive liner

#8364
20180158728
2018-06-07

Memory device and method of forming thereof

#8365
20180158726
2018-06-07

Interconnection structure having air gap

#8366
20180158724
2018-06-07

Semiconductor device having composite structures and fabrication method thereof

#8367
20180158694
2018-06-07

Textile patterning for subtractively-patterned self-aligned interconnects, plugs, and vias

#8368
20180157781
2018-06-07

Semiconductor device, method of designing a layout of a semiconductor device, and method of manufacturing a semiconductor device

#8369
20180156865
2018-06-07

Integrated circuit package structure and testing method using the same

#8370
20180155824
2018-06-07

METHOD OF GROWING NANOSTRUCTURES

#8371
20180151683
2018-05-31

Semiconductor device and manufacturing method thereof

#8372
20180151589
2018-05-31

Three-dimensional memory device having passive devices at a buried source line level and method of making thereof

#8373
20180151576
2018-05-31

Semiconductor devices

#8374
20180151567
2018-05-31

Interconnect metal layout for integrated circuit

#8375
20180151553
2018-05-31

Static random access memory device

#8376
20180151522
2018-05-31

Semiconductor device structure and method for forming the same

#8377
20180151513
2018-05-31

Integrated circuit (IC) devices with varying diameter via layer

#8378
20180151511
2018-05-31

Semiconductor device including dummy via anchored to dummy metal layer

#8379
20180151504
2018-05-31

Self aligned interconnect structures

#8380
20180151503
2018-05-31

Interlevel conductor pre-fill utilizing selective barrier deposition

#8381
20180151496
2018-05-31

Power grid structures and method of forming the same

#8382
20180151493
2018-05-31

Semiconductor device and method of forming the same

#8383
20180151492
2018-05-31

Device-manufacturing scheme for increasing the density of metal patterns in inter-layer dielectrics

#8384
20180151491
2018-05-31

Airgap protection layer for via alignment

#8385
20180151490
2018-05-31

Semiconductor device and method of fabricating the same

#8386
20180151489
2018-05-31

Metallic blocking layer for reliable interconnects and contacts

#8387
20180151488
2018-05-31

Method of manufacturing an interconnect structure by forming metal layers in mask openings

#8388
20180151487
2018-05-31

Interconnect via with grown graphitic material

#8389
20180151471
2018-05-31

High thermal conductivity vias by additive processing

#8390
20180151470
2018-05-31

Integrated circuit nanoparticle thermal routing structure in interconnect region

#8391
20180151467
2018-05-31

Semiconductor device package thermal conduit

#8392
20180151464
2018-05-31

Thermal routing trench by additive processing

#8393
20180151463
2018-05-31

Integrated circuit nanoparticle thermal routing structure over interconnect region

#8394
20180151458
2018-05-31

Semiconductor structure, testing and fabricating methods thereof

#8395
20180151457
2018-05-31

Semiconductor manufacturing method and semiconductor manufacturing apparatus

#8396
20180151433
2018-05-31

Gate tie-down enablement with inner spacer

#8397
20180151432
2018-05-31

Self aligned via and method for fabricating the same

#8398
20180151430
2018-05-31

Method of forming superconductor structures

#8399
20180151423
2018-05-31

Use of noble metals in the formation of conductive connectors

#8400
20180151420
2018-05-31

Interconnect structure