ClassID:

207728

H01L23/5226 - page 30 - CPC Classification

Classification description:

Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body Via connections in a multilevel interconnection structure

Recent Application in this class:
#8701
20180005945
2018-01-04

Cavity generation for embedded interconnect bridges utilizing temporary structures

#8702
20180005941
2018-01-04

Semiconductor device including a porous dielectric layer, and method of forming the semiconductor device

#8703
20180005940
2018-01-04

Semiconductor package and manufacturing method of the same

#8704
20180005939
2018-01-04

Techniques to improve reliability in Cu interconnects using Cu intermetallics

#8705
20180005938
2018-01-04

Memory cell and array structure having a plurality of bit lines

#8706
20180005937
2018-01-04

Enhanced self-alignment of vias for asemiconductor device

#8707
20180005912
2018-01-04

Wafer level chip scale package structure and manufacturing method thereof

#8708
20180005903
2018-01-04

Semiconductor device including dual trench epitaxial dual-liner contacts

#8709
20180005901
2018-01-04

Semiconductor contact

#8710
20180005881
2018-01-04

Methods of enhancing polymer adhesion to copper

#8711
20180005880
2018-01-04

Barrier layers in trenches and vias

#8712
20180005878
2018-01-04

Semiconductor interconnect structure and manufacturing method thereof

#8713
20180005876
2018-01-04

Etch stop layer for semiconductor devices

#8714
20180005875
2018-01-04

Self-aligned pattern formation for a semiconductor device

#8715
20180005874
2018-01-04

Via cleaning to reduce resistance

#8716
20180005868
2018-01-04

Self-aligned airgaps with conductive lines and vias

#8717
20180004883
2018-01-04

Method, apparatus and system for wide metal line for SADP routing

#8718
20170373187
2017-12-28

Semiconductor device including a LDMOS transistor and method

#8719
20170373084
2017-12-28

MEMORY DEVICE HAVING VERTICAL STRUCTURE

#8720
20170373078
2017-12-28

Inter-plane offset in backside contact via structures for a three-dimensional memory device

#8721
20170373065
2017-12-28

Semiconductor device

#8722
20170373056
2017-12-28

Vertical metal insulator metal capacitor having a high-k dielectric material

#8723
20170373054
2017-12-28

Semiconductor switch device

#8724
20170373044
2017-12-28

Interconnect structure and semiconductor structures for assembly of cryogenic electronic packages

#8725
20170373039
2017-12-28

Semiconductor package and manufacturing method of the same

#8726
20170373003
2017-12-28

Semiconductor chip and multi-chip package using thereof

#8727
20170373000
2017-12-28

INTERCONNECTS HAVING HYBRID METALLIZATION

#8728
20170372999
2017-12-28

Conductive terminal on integrated circuit

#8729
20170372983
2017-12-28

Thermally conductive and electrically isolating layers in semiconductor structures

#8730
20170372959
2017-12-28

Gate tie-down enablement with inner spacer

#8731
20170372957
2017-12-28

Self-aligned contact

#8732
20170372956
2017-12-28

Self-aligned contact

#8733
20170372952
2017-12-28

Substrate and method including forming a via comprising a conductive liner layer and conductive plug having different microstructures

#8734
20170372948
2017-12-28

Interconnect structure and method

#8735
20170372947
2017-12-28

Conformal low temperature hermetic dielectric diffusion barriers

#8736
20170365621
2017-12-21

Semiconductor chip including region having rectangular-shaped gate structures and first metal structures

#8737
20170365620
2017-12-21

Semiconductor CIP including region having rectangular-shaped gate structures and first metal structures

#8738
20170365616
2017-12-21

Vertical non-volatile memory device and method for fabricating the same

#8739
20170365612
2017-12-21

Vertical memory devices and methods of manufacturing the same

#8740
20170365600
2017-12-21

Using inter-tier vias in integrated circuits

#8741
20170365593
2017-12-21

Semiconductor device and method of fabricating the same

#8742
20170365568
2017-12-21

Fan-out semiconductor package

#8743
20170365551
2017-12-21

Method of producing a semiconductor device with through-substrate via covered by a solder ball

#8744
20170365550
2017-12-21

Copper interconnect structures

#8745
20170365549
2017-12-21

Semiconductor device and manufacturing method thereof

#8746
20170365508
2017-12-21

Via patterning using multiple photo multiple etch

#8747
20170359097
2017-12-14

Semiconductor device and communication circuit

#8748
20170358606
2017-12-14

Semiconductor device and method for manufacturing semiconductor device

#8749
20170358600
2017-12-14

Semiconductor chip including region having rectangular-shaped gate structures and first-metal structures

#8750
20170358594
2017-12-14

Method of forming a staircase in a semiconductor device using a linear alignment control feature

#8751
20170358593
2017-12-14

Within-array through-memory-level via structures and method of making thereof

#8752
20170358566
2017-12-14

Systems and methods for a sequential spacer scheme

#8753
20170358528
2017-12-14

Package substrate having noncircular interconnects

#8754
20170358519
2017-12-14

Semiconductor Device and Method of Fabricating the Same

#8755
20170358486
2017-12-14

Metal-graphene heterojunction metal interconnects, method of forming the same, and semiconductor device including the same

#8756
20170358485
2017-12-14

Semiconductor structure

#8757
20170358481
2017-12-14

Multi-barrier deposition for air gap formation

#8758
20170358367
2017-12-14

Methods and devices for reducing program disturb in non-volatile memory cell arrays

#8759
20170358362
2017-12-14

Semiconductor device and method of manufacturing the same

#8760
20170352673
2017-12-07

Semiconductor device and manufacturing method thereof

#8761
20170352669
2017-12-07

Three-dimensional memory device having multilayer word lines containing selectively grown cobalt or ruthenium and method of making the same

#8762
20170352650
2017-12-07

Integrated circuit and standard cell library

#8763
20170352632
2017-12-07

Connector formation methods and packaged semiconductor devices

#8764
20170352623
2017-12-07

Integrated circuit having staggered conductive features

#8765
20170352622
2017-12-07

Semiconductor device and manufacturing method thereof

#8766
20170352621
2017-12-07

Avoiding gate metal via shorting to source or drain contacts

#8767
20170352620
2017-12-07

Assemblies having shield lines of an upper wiring level electrically coupled with shield lines of a lower wiring level

#8768
20170352597
2017-12-07

Low resistance dual liner contacts for fin field-effect transistors (FinFETs)

#8769
20170352591
2017-12-07

Method for producing self-aligned line end vias and related device

#8770
20170352590
2017-12-07

Interconnect structures with enhanced electromigration resistance

#8771
20170352589
2017-12-07

Interconnect structures with enhanced electromigration resistance

#8772
20170352586
2017-12-07

Hardmask layer for 3D NAND staircase structure in semiconductor applications

#8773
20170352585
2017-12-07

Self-aligned quadruple patterning (SAQP) for routing layouts including multi-track jogs

#8774
20170345844
2017-11-30

Semiconductor device and method of manufacturing the same

#8775
20170345843
2017-11-30

Vertical memory devices

#8776
20170345839
2017-11-30

Semiconductor device and manufacturing method thereof

#8777
20170345814
2017-11-30

Semiconductor device

#8778
20170345806
2017-11-30

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

#8779
20170345805
2017-11-30

PACKAGE INCLUDING STACKED DIE AND PASSIVE COMPONENT

#8780
20170345766
2017-11-30

DEVICES AND METHODS OF FORMING LOW RESISTIVITY NOBLE METAL INTERCONNECT WITH IMPROVED ADHESION

#8781
20170345765
2017-11-30

Contact structure and formation thereof

#8782
20170345758
2017-11-30

Electrical fuse structure and method of formation

#8783
20170345753
2017-11-30

Integrated circuit having slot via and method of forming the same

#8784
20170345752
2017-11-30

Devices and methods of forming low resistivity noble metal interconnect

#8785
20170345751
2017-11-30

Semiconductor device and method of manufacturing the same

#8786
20170345750
2017-11-30

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

#8787
20170345736
2017-11-30

Semiconductor device and semiconductor package

#8788
20170345711
2017-11-30

Semiconductor devices and methods for forming a semiconductor device

#8789
20170345710
2017-11-30

Method of forming pattern of semiconductor device

#8790
20170345705
2017-11-30

Reducing neighboring word line in interference using low-k oxide

#8791
20170343603
2017-11-30

Multi-layer integrated circuits having isolation cells for layer testing and related methods

#8792
20170338299
2017-11-23

Adaptive capacitors with reduced variation in value and in-line methods for making same

#8793
20170338242
2017-11-23

Three-dimensional semiconductor device

#8794
20170338240
2017-11-23

Semiconductor device and method for manufacturing the same

#8795
20170338207
2017-11-23

Semiconductor device and method of manufacture

#8796
20170338192
2017-11-23

Method of forming metal interconnection and method of fabricating semiconductor apparatus using the method

#8797
20170338181
2017-11-23

Integrated circuit structures comprising conductive vias and methods of forming conductive vias

#8798
20170338180
2017-11-23

METHOD OF MAKING VERTICAL AND BOTTOM BIAS E-FUSES AND RELATED DEVICES

#8799
20170338151
2017-11-23

Method of forming interconnect structures by self-aligned approach

#8800
20170338149
2017-11-23

Semiconductor device and fabricating method thereof

#8801
20170331455
2017-11-16

Acoustic wave device

#8802
20170331031
2017-11-16

Semiconductor device including via plugs

#8803
20170330894
2017-11-16

Three-dimensional semiconductor memory devices

#8804
20170330893
2017-11-16

Semiconductor device

#8805
20170330892
2017-11-16

Manufacturing method of a semiconductor device and semiconductor device

#8806
20170330882
2017-11-16

Semiconductor memory device having coplanar digit line contacts and storage node contacts in memory array and method for fabricating the same

#8807
20170330832
2017-11-16

Air gap over transistor gate and related method

#8808
20170330830
2017-11-16

Trench silicide with self-aligned contact vias

#8809
20170330814
2017-11-16

Electronic component package and method of manufacturing the same

#8810
20170330761
2017-11-16

Method and structure to contact tight pitch conductive layers with guided vias using alternating hardmasks and encapsulating etchstop liner scheme

#8811
20170328949
2017-11-16

Semiconductor structure and testing method using the same

#8812
20170323969
2017-11-09

SGT-including pillar-shaped semiconductor device and method for producing the same

#8813
20170323902
2017-11-09

METHOD, APPARATUS, AND SYSTEM FOR IMPROVED CELL DESIGN HAVING UNIDIRECTIONAL METAL LAYOUT ARCHITECTURE

#8814
20170323900
2017-11-09

VERTICAL MEMORY DEVICES

#8815
20170323898
2017-11-09

Semiconductor memory device including 3-dimensional structure and method for manufacturing the same

#8816
20170323850
2017-11-09

Semiconductor devices having staggered air gaps

#8817
20170323843
2017-11-09

Gas-Cooled 3D IC with Wireless Interconnects

#8818
20170323830
2017-11-09

Integrated circuit package having pin up interconnect

#8819
20170317167
2017-11-02

Semiconductor integrated circuits (ICs) employing localized low dielectric constant (low-K) material in inter-layer dielectric (ILD) material for improved speed performance

#8820
20170317143
2017-11-02

Metal landing method for RRAM technology

#8821
20170317099
2017-11-02

Methods of forming integrated structures comprising vertical channel material and having conductively-doped semiconductor material directly against lower sidewalls of the channel material

#8822
20170317065
2017-11-02

Static random access memory (SRAM) cell including fin-type transistor

#8823
20170317064
2017-11-02

Oversized Contacts and Vias in Layout Defined by Linearly Constrained Topology

#8824
20170317063
2017-11-02

Integrated circuit, system for and method of forming an integrated circuit

#8825
20170317052
2017-11-02

Wafer bonding edge protection using double patterning with edge exposure

#8826
20170317035
2017-11-02

Semiconductor device, semiconductor chip and method of manufacturing the semiconductor device

#8827
20170317032
2017-11-02

Composite manganese nitride / low-k dielectric cap

#8828
20170317026
2017-11-02

Selective and non-selective barrier layer wet removal

#8829
20170317025
2017-11-02

Method of manufacturing self-aligned interconnects by deposition of a non-conformal air-gap forming layer having an undulated upper surface

#8830
20170317022
2017-11-02

Ruthenium metal feature fill for interconnects

#8831
20170317011
2017-11-02

Through substrate vias with improved connections

#8832
20170317010
2017-11-02

Method for forming interconnect structure of semiconductor device

#8833
20170316975
2017-11-02

Structure and formation method of damascene structure

#8834
20170316970
2017-11-02

Enhancement of iso-via reliability

#8835
20170316875
2017-11-02

Fluxgate device with low fluxgate noise

#8836
20170316830
2017-11-02

Light-erasable embedded memory device and method of manufacturing the same

#8837
20170316144
2017-11-02

Integrated circuit and layout method

#8838
20170309682
2017-10-26

Side bottom contact RRAM structure

#8839
20170309636
2017-10-26

Manufacturing method of memory device

#8840
20170309632
2017-10-26

Pillar-shaped semiconductor memory device and method for producing the same

#8841
20170309627
2017-10-26

Semiconductor device and method of manufacturing the same

#8842
20170309608
2017-10-26

Semiconductor device including stacked die with continuous integral via holes

#8843
20170309582
2017-10-26

Semiconductor Devices with On-Chip Antennas and Manufacturing Thereof

#8844
20170309573
2017-10-26

Interconnect structure having tungsten contact copper wiring

#8845
20170309563
2017-10-26

Metal-insulator-metal capacitor and methods of fabrication

#8846
20170309562
2017-10-26

Semiconductor device and layout design thereof

#8847
20170309560
2017-10-26

Devices and methods for forming cross coupled contacts

#8848
20170309531
2017-10-26

Electronic component package and method of manufacturing the same

#8849
20170309513
2017-10-26

Interconnect structure with porous low k dielectric and barrier layer

#8850
20170309474
2017-10-26

Metal interconnect structure

#8851
20170301691
2017-10-19

SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME

#8852
20170301690
2017-10-19

Nonvolatile memory device and method for fabricating the same

#8853
20170301682
2017-10-19

Erasable programmable non-volatile memory

#8854
20170301672
2017-10-19

Sub 59 MV/decade SI CMOS compatible tunnel FET as footer transistor for power gating

#8855
20170301665
2017-10-19

Semiconductor device and design method of same

#8856
20170301664
2017-10-19

Semiconductor device

#8857
20170301636
2017-10-19

Electrostatic discharge protection for antenna using vias

#8858
20170301634
2017-10-19

Semiconductor apparatus with fake functionality

#8859
20170301631
2017-10-19

Vertical interconnects for self shielded system in package (SiP) modules

#8860
20170301627
2017-10-19

Line structure and a method for producing the same

#8861
20170301624
2017-10-19

Selective and non-selective barrier layer wet removal

#8862
20170301621
2017-10-19

Airgap protection layer for via alignment

#8863
20170301620
2017-10-19

STRUCTURE AND PROCESS FOR METAL CAP INTEGRATION

#8864
20170301618
2017-10-19

Advanced metal connection with metal cut

#8865
20170301584
2017-10-19

Method and apparatus for single chamber treatment

#8866
20170301406
2017-10-19

Random number generator device and control method thereof

#8867
20170300806
2017-10-19

NEUROMORPHIC DEVICE INCLUDING SYNAPSES HAVING FIXED RESISTANCE VALUES

#8868
20170300611
2017-10-19

Semiconductor structure

#8869
20170294895
2017-10-12

Acoustic wave device

#8870
20170294446
2017-10-12

Semiconductor memory device

#8871
20170294444
2017-10-12

Semiconductor structure having gate replacement and method for manufacturing the same

#8872
20170294430
2017-10-12

Standard cell for removing routing interference between adjacent pins and device including the same

#8873
20170294429
2017-10-12

Semiconductor layout structure

#8874
20170294388
2017-10-12

Vertical memory devices and methods of manufacturing the same

#8875
20170294384
2017-10-12

Semiconductor structure having etching stop layer and manufacturing method of the same

#8876
20170294383
2017-10-12

Semiconductor device structures including staircase structures, and related methods and electronic systems

#8877
20170294382
2017-10-12

Semiconductor interconnect structure with double conductors

#8878
20170294381
2017-10-12

Semiconductor interconnect structure with double conductors

#8879
20170294380
2017-10-12

Semiconductor device and method for forming the same

#8880
20170294379
2017-10-12

Method for forming an electrical contact between a semiconductor film and a bulk handle wafer, and resulting structure

#8881
20170294377
2017-10-12

Multi-tier three-dimensional memory devices including vertically shared source lines and method of making thereof

#8882
20170294376
2017-10-12

Reliable packaging and interconnect structures

#8883
20170294363
2017-10-12

Formation of getter layer for memory device

#8884
20170294360
2017-10-12

Semiconductor device

#8885
20170294349
2017-10-12

Two-dimensional self-aligned super via integration on self-aligned gate contact

#8886
20170294348
2017-10-12

Methods for forming 2-dimensional self-aligned vias

#8887
20170294347
2017-10-12

Two-dimensional self-aligned super via integration on self-aligned gate contact

#8888
20170294342
2017-10-12

Structure and method for interconnection

#8889
20170294225
2017-10-12

Semiconductor structure and memory device including the structure

#8890
20170294172
2017-10-12

Display having vertical gate line extensions and minimized borders

#8891
20170290157
2017-10-05

Magnetically-coupled inductors on integrated passive devices and assemblies including same

#8892
20170290156
2017-10-05

Integrated passive devices and assemblies including same

#8893
20170288176
2017-10-05

Embedded chip packages and methods for manufacturing an embedded chip package

#8894
20170288141
2017-10-05

Socket structure for three-dimensional memory

#8895
20170288038
2017-10-05

Semiconductor memory device

#8896
20170287918
2017-10-05

Static random access memory (SRAM) device

#8897
20170287907
2017-10-05

3D cross-point memory manufacturing process having limited lithography steps

#8898
20170287906
2017-10-05

3D cross-point memory manufacturing process having limited lithography steps

#8899
20170287863
2017-10-05

SEMICONDUCTOR DIE, SEMICONDUCTOR WAFER AND METHOD FOR MANUFACTURING THE SAME

#8900
20170287845
2017-10-05

Alignment mark design for packages

#8901
20170287842
2017-10-05

Semiconductor device and manufacturing method thereof

#8902
20170287833
2017-10-05

Three dimensional storage cell array with highly dense and scalable word line design approach

#8903
20170287831
2017-10-05

Localized high density substrate routing

#8904
20170287830
2017-10-05

Treating copper interconnects

#8905
20170287794
2017-10-05

Methods for manufacturing semiconductor device and for detecting end point of dry etching

#8906
20170287775
2017-10-05

Interconnect structure having an etch stop layer over conductive lines

#8907
20170287774
2017-10-05

Method for manufacturing semiconductor device with trench isolation structure having plural oxide films

#8908
20170278939
2017-09-28

Method of forming a dual metal interconnect structure

#8909
20170278927
2017-09-28

Nanowire-based vertical memory cell array having a back plate and nanowire seeds contacting a bit line

#8910
20170278841
2017-09-28

Electronic device with integrated galvanic isolation, and manufacturing method of the same

#8911
20170278800
2017-09-28

High aspect ratio contact metallization without seams

#8912
20170278797
2017-09-28

Semiconductor devices including a capping layer

#8913
20170278789
2017-09-28

Method for layout design and structure with inter-layer vias

#8914
20170278788
2017-09-28

Interconnect structure including air gaps enclosed between conductive lines and a permeable dielectric layer

#8915
20170278787
2017-09-28

Microelectronic components with features wrapping around protrusions of conductive vias protruding from through-holes passing through substrates

#8916
20170278786
2017-09-28

Semiconductor device

#8917
20170278785
2017-09-28

Interconnect structure for semiconductor devices

#8918
20170278752
2017-09-28

Self-aligned gate contact

#8919
20170278747
2017-09-28

High performance middle of line interconnects

#8920
20170278746
2017-09-28

Method of manufacturing a wiring structure on a self-forming barrier pattern

#8921
20170278744
2017-09-28

Method of forming trenches with different depths

#8922
20170278740
2017-09-28

Method of manufacturing an interconnect without dielectric exclusion zones by thermal decomposition of a sacrificial filler material

#8923
20170271594
2017-09-21

Hybrid carbon-metal interconnect structures

#8924
20170271527
2017-09-21

Semiconductor memory device with charge-diffusion-less transistors

#8925
20170271463
2017-09-21

Semiconductor device and method for manufacturing the same

#8926
20170271436
2017-09-21

Deep trench capacitor with a filled trench and a doped region serving as a capacitor electrode

#8927
20170271412
2017-09-21

Dual-layer dielectric in memory device

#8928
20170271358
2017-09-21

Semiconductor memory device and method of manufacturing the same

#8929
20170271354
2017-09-21

Semiconductor device

#8930
20170271353
2017-09-21

Semiconductor device

#8931
20170271351
2017-09-21

Vertical memory devices and methods of manufacturing the same

#8932
20170271322
2017-09-21

Area-efficient and robust electrostatic discharge circuit

#8933
20170271317
2017-09-21

INTEGRATED CIRCUIT, AND DESIGN METHOD, DESIGN APPARATUS AND DESIGN PROGRAM FOR INTEGRATED CIRCUIT

#8934
20170271313
2017-09-21

Semiconductor devices for integration with light emitting chips and modules thereof

#8935
20170271269
2017-09-21

Oxidation resistant barrier metal process for semiconductor devices

#8936
20170271268
2017-09-21

Semiconductor device having a metal adhesion and barrier structure and a method of forming such a semiconductor device

#8937
20170271265
2017-09-21

Semiconductor device and wafer level package including such semiconductor device

#8938
20170271262
2017-09-21

Semiconductor device and method for manufacturing semiconductor device

#8939
20170271261
2017-09-21

Three-dimensional memory device containing annular etch-stop spacer and method of making thereof

#8940
20170271260
2017-09-21

Semiconductor device including a passive component formed in a redistribution layer

#8941
20170271259
2017-09-21

Semiconductor device and a method of manufacturing the same

#8942
20170271256
2017-09-21

Semiconductor memory device having a stepped structure and contact wirings formed thereon

#8943
20170271255
2017-09-21

Integrated circuit device

#8944
20170271205
2017-09-21

Semiconductor device and method

#8945
20170264269
2017-09-14

Saw resonator having negative profile metal structure and manufacturing method thereof

#8946
20170263773
2017-09-14

Composite and transistor

#8947
20170263651
2017-09-14

Semiconductor device, semiconductor wafer, module, electronic device, and manufacturing method the same

#8948
20170263638
2017-09-14

SEMICONDUCTOR MEMORY DEVICE

#8949
20170263636
2017-09-14

Stacked non-volatile semiconductor memory device with buried source line and method of manufacture

#8950
20170263574
2017-09-14

Semiconductor chip with anti-reverse engineering function

#8951
20170263562
2017-09-14

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

#8952
20170263559
2017-09-14

Power and ground routing of integrated circuit devices with improved IR drop and chip performance

#8953
20170263558
2017-09-14

Semiconductor device and method for manufacturing same

#8954
20170263556
2017-09-14

Conductive structures, systems and devices including conductive structures and related methods

#8955
20170263553
2017-09-14

Structure and method to self align via to top and bottom of tight pitch metal interconnect layers

#8956
20170263550
2017-09-14

Semiconductor device and designing method thereof

#8957
20170263548
2017-09-14

Structure and formation method of semiconductor device structure

#8958
20170263547
2017-09-14

Metallic blocking layer for reliable interconnects and contacts

#8959
20170263530
2017-09-14

Encapsulated power semiconductor device having a metal moulded body as a first connecting conductor

#8960
20170263497
2017-09-14

Semiconductor device

#8961
20170263496
2017-09-14

Materials and deposition schemes using photoactive materials for interface chemical control and patterning of predefined structures

#8962
20170256587
2017-09-07

Crossbar switch with an arrangement of wires, logic integrated circuit using the same, and semiconductor device

#8963
20170256571
2017-09-07

Sharing Capacitor, Pixel Having Sharing Capacitor, And Array Substrate Having Sharing Capacitor

#8964
20170256558
2017-09-07

Semiconductor memory devices

#8965
20170256525
2017-09-07

Localized redistribution layer structure for embedded component package and method

#8966
20170256506
2017-09-07

SEMICONDUCTOR DEVICE

#8967
20170256504
2017-09-07

Semiconductor device

#8968
20170256495
2017-09-07

Hybrid metal interconnects with a bamboo grain microstructure

#8969
20170256493
2017-09-07

E-fuse structure of semiconductor device

#8970
20170256492
2017-09-07

Ultra high performance interposer

#8971
20170256491
2017-09-07

Semiconductor structure and method making the same

#8972
20170256490
2017-09-07

Low capacitance through substrate via structures

#8973
20170256486
2017-09-07

Method and apparatus for forming self-aligned via with selectively deposited etching stop layer

#8974
20170256485
2017-09-07

Integrated circuit device having an air gap between interconnects and method for manufacturing the same

#8975
20170256484
2017-09-07

Middle end-of-line strap for standard cell

#8976
20170256451
2017-09-07

Self-aligned interconnects

#8977
20170256445
2017-09-07

Interconnect structure and method

#8978
20170256411
2017-09-07

Semiconductor device including an electrically floated dummy contact plug and a method of manufacturing the same

#8979
20170250244
2017-08-31

Monolayer thin film capacitor

#8980
20170250165
2017-08-31

Semiconductor package assembly

#8981
20170250159
2017-08-31

Integrated circuit die having backside passive components and methods associated therewith

#8982
20170250139
2017-08-31

Alignment mark design for packages

#8983
20170250134
2017-08-31

Methods for microelectronics fabrication and packaging using a magnetic polymer

#8984
20170250133
2017-08-31

Systems and methods for microelectronics fabrication and packaging using a magnetic polymer

#8985
20170250132
2017-08-31

Low stress vias

#8986
20170250131
2017-08-31

Semiconductor device and method of manufacturing the same

#8987
20170250115
2017-08-31

Stacked device and associated layout structure

#8988
20170250110
2017-08-31

Methods for isolating portions of a loop of pitch-multiplied material and related structures

#8989
20170250104
2017-08-31

Via self alignment and shorting improvement with airgap integration capacitance benefit

#8990
20170250080
2017-08-31

Compensating for lithographic limitations in fabricating semiconductor interconnect structures

#8991
20170244412
2017-08-24

Ultra dense vertical transport FET circuits

#8992
20170243945
2017-08-24

Semiconductor memory device and method for manufacturing the same

#8993
20170243883
2017-08-24

Semiconductor memory device

#8994
20170243877
2017-08-24

Semiconductor memory device and method of manufacturing semiconductor memory device

#8995
20170243847
2017-08-24

SEMICONDUCTOR DEVICE

#8996
20170243842
2017-08-24

Semiconductor arrangement and formation thereof

#8997
20170243835
2017-08-24

Semiconductor device including air gaps between interconnects and method of manufacturing the same

#8998
20170243830
2017-08-24

Semiconductor device interconnect structures formed by metal reflow process

#8999
20170243829
2017-08-24

Semiconductor structure having tapered damascene aperture and method of the same

#9000
20170243823
2017-08-24

Method, apparatus, and system for MOL interconnects without titanium liner