ClassID:

207728

H01L23/5226 - page 32 - CPC Classification

Classification description:

Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body Via connections in a multilevel interconnection structure

Recent Application in this class:
#9301
20170117357
2017-04-27

Dielectric with air gaps for use in semiconductor devices

#9302
20170117356
2017-04-27

Isolation of circuit elements using front side deep trench etch

#9303
20170117299
2017-04-27

Semiconductor device, manufacturing method thereof, and electronic device

#9304
20170117297
2017-04-27

Array substrate and display panel with same

#9305
20170117290
2017-04-27

Semiconductor memory device

#9306
20170117225
2017-04-27

Low resistance contact structures including a copper fill for trench structures

#9307
20170117222
2017-04-27

Vertical memory devices and methods of manufacturing the same

#9308
20170117219
2017-04-27

Inductor device and method of manufacturing the same

#9309
20170117218
2017-04-27

Contact via structure and fabricating method thereof

#9310
20170117182
2017-04-27

Semiconductor device and method of manufacturing the same

#9311
20170117181
2017-04-27

LOW RESISTANCE CONTACT STRUCTURES INCLUDING A COPPER FILL FOR TRENCH STRUCTURES

#9312
20170117179
2017-04-27

Method including a formation of a diffusion barrier and semiconductor structure including a diffusion barrier

#9313
20170117177
2017-04-27

Self aligned via and pillar cut for at least a self aligned double pitch

#9314
20170110569
2017-04-20

Semiconductor devices and methods of manufacturing the same

#9315
20170110505
2017-04-20

Magnetoresistive sensor module and method for manufacturing the same

#9316
20170110496
2017-04-20

Interconnect apparatus and method

#9317
20170110462
2017-04-20

Semiconductor memory device and method for manufacturing the same

#9318
20170110424
2017-04-20

Semiconductor die contact structure and method

#9319
20170110405
2017-04-20

Dual power structure with connection pins

#9320
20170110402
2017-04-20

Conductive structures, systems and devices including conductive structures and related methods

#9321
20170110401
2017-04-20

Bonding structures and methods forming the same

#9322
20170110399
2017-04-20

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME

#9323
20170110398
2017-04-20

Interconnection structure and method of forming the same

#9324
20170110397
2017-04-20

Method and apparatus for forming self-aligned via with selectively deposited etching stop layer

#9325
20170110388
2017-04-20

Semiconductor device

#9326
20170110369
2017-04-20

ELECTRONIC DEVICE AND METHOD FOR PRODUCING SAME

#9327
20170110368
2017-04-20

Selective bottom-up metal feature filling for interconnects

#9328
20170110365
2017-04-20

Nonvolatile memory device and method for fabricating the same

#9329
20170110364
2017-04-20

Reverse self aligned double patterning process for back end of line fabrication of a semiconductor device

#9330
20170110363
2017-04-20

LIQUID COMPOSITION FOR CLEANING SEMICONDUCTOR DEVICE, METHOD FOR CLEANING SEMICONDUCTOR DEVICE, AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE

#9331
20170110361
2017-04-20

Method of forming dielectric with air gaps for use in semiconductor devices

#9332
20170104068
2017-04-13

Three-dimensionally integrated circuit devices including oxidation suppression layers

#9333
20170104055
2017-04-13

Adaptive capacitors with reduced variation in value and in-line methods for making same

#9334
20170104054
2017-04-13

Low temperature fabrication of lateral thin film varistor

#9335
20170103993
2017-04-13

Vertical memory devices

#9336
20170103983
2017-04-13

Semiconductor device

#9337
20170103949
2017-04-13

Forming interlayer dielectric material by spin-on metal oxide deposition

#9338
20170098662
2017-04-06

Semiconductor device and manufacturing method thereof

#9339
20170098661
2017-04-06

Semiconductor device including a repeater/buffer at higher metal routing layers and methods of manufacturing the same

#9340
20170098641
2017-04-06

Semiconductor device having jumper pattern

#9341
20170098615
2017-04-06

Prevention of premature breakdown of interline porous dielectrics in an integrated circuit

#9342
20170098614
2017-04-06

Contacts for semiconductor devices and methods of forming thereof

#9343
20170098608
2017-04-06

Semiconductor device layout having a power rail

#9344
20170098606
2017-04-06

Semiconductor structure with ultra thick metal and manufacturing method thereof

#9345
20170098605
2017-04-06

Interconnection structure and manufacturing method thereof

#9346
20170098601
2017-04-06

Mask and metal wiring of a semiconductor device formed using the same

#9347
20170098600
2017-04-06

Wiring board including multiple wiring layers that are different in surface roughness

#9348
20170098573
2017-04-06

Methods of forming an integrated circuit chip having two types of memory cells

#9349
20170092693
2017-03-30

Integrated two-terminal device and logic device with compact interconnects having shallow via for embedded application

#9350
20170092691
2017-03-30

Flexible LED display

#9351
20170092680
2017-03-30

Composite wafer semiconductor devices using offset via arrangements and methods of fabricating the same

#9352
20170092642
2017-03-30

Semiconductor device

#9353
20170092591
2017-03-30

Semiconductor device and manufacturing method thereof

#9354
20170092590
2017-03-30

Multiple pre-clean processes for interconnect fabrication

#9355
20170092587
2017-03-30

Integrated circuit devices and methods

#9356
20170092583
2017-03-30

Programmable via devices with metal/semiconductor via links and fabrication methods thereof

#9357
20170092582
2017-03-30

Semiconductor apparatus, system, and method of manufacturing semiconductor apparatus

#9358
20170092581
2017-03-30

Integrated fan-out structure and method of forming

#9359
20170092580
2017-03-30

Structure and method for interconnection

#9360
20170092579
2017-03-30

Multi-layer full dense mesh

#9361
20170092537
2017-03-30

Conductive plug structure and fabrication method thereof

#9362
20170088970
2017-03-30

Electrochemical plating

#9363
20170084626
2017-03-23

Three-dimensional semiconductor device

#9364
20170084591
2017-03-23

Localized redistribution layer structure for embedded component package and method

#9365
20170084582
2017-03-23

Compact semiconductor package and related methods

#9366
20170084552
2017-03-23

Semiconductor chip with anti-reverse engineering function

#9367
20170084535
2017-03-23

Integrated circuit with power saving feature

#9368
20170084534
2017-03-23

Electrically conductive interconnect including via having increased contact surface area

#9369
20170084533
2017-03-23

Interconnects through dielectric vias

#9370
20170084532
2017-03-23

Vertical memory devices and methods of manufacturing the same

#9371
20170084500
2017-03-23

Dual liner silicide

#9372
20170084487
2017-03-23

Seam healing of metal interconnects

#9373
20170084485
2017-03-23

Semiconductor device having interconnect layer that includes dielectric segments interleaved with metal components

#9374
20170084483
2017-03-23

Method of forming metal interconnection

#9375
20170084480
2017-03-23

SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD AND RECORDING MEDIUM

#9376
20170077399
2017-03-16

Socket structure for three-dimensional memory

#9377
20170077319
2017-03-16

Monolithic integration techniques for fabricating photodetectors with transistors on same substrate

#9378
20170077315
2017-03-16

Semiconductor device

#9379
20170077294
2017-03-16

Segmented power transistor

#9380
20170077253
2017-03-16

Contacts for highly scaled transistors

#9381
20170077137
2017-03-16

Memory device and method of manufacturing the same

#9382
20170077131
2017-03-16

Three dimensional vertical channel semiconductor memory device

#9383
20170077130
2017-03-16

Semiconductor memory device

#9384
20170077128
2017-03-16

SEMICONDUCTOR MEMORY DEVICE

#9385
20170077114
2017-03-16

SEMICONDUCTOR MEMORY DEVICE

#9386
20170077113
2017-03-16

Semiconductor memory device and method of manufacturing the same

#9387
20170077102
2017-03-16

Semiconductor device having supporters and method of manufacturing the same

#9388
20170077051
2017-03-16

Monolithic microwave integrated circuits

#9389
20170077037
2017-03-16

Via bottom structure and methods of forming

#9390
20170077026
2017-03-16

Semiconductor memory device with contact plugs extending inside contact connection portions

#9391
20170077025
2017-03-16

Semiconductor memory device

#9392
20170076996
2017-03-16

Method for manufacturing an SGT-including semiconductor device

#9393
20170076974
2017-03-16

Semiconductor devices having an air gap

#9394
20170076814
2017-03-16

Semiconductor pillars charged in read operation

#9395
20170069719
2017-03-09

Method of forming body contact layouts for semiconductor structures

#9396
20170069708
2017-03-09

Metal thin film resistor and process

#9397
20170069668
2017-03-09

Monolithic integration techniques for fabricating photodetectors with transistors on same substrate

#9398
20170069653
2017-03-09

SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME

#9399
20170069638
2017-03-09

Metal line with increased inter-metal breakdown voltage

#9400
20170069636
2017-03-09

Semiconductor devices including a conductive pattern contacting a channel pattern and methods of manufacturing the same

#9401
20170069617
2017-03-09

Plasma protection diode for a HEMT device

#9402
20170069593
2017-03-09

Air trench in packages incorporating hybrid bonding

#9403
20170069582
2017-03-09

SEMICONDUCTOR DEVICE INCLUDING PASSIVE EQUALIZER CIRCUIT

#9404
20170069576
2017-03-09

Semiconductor device and manufacturing method thereof

#9405
20170069574
2017-03-09

Semiconductor device allowing metal layer routing formed directly under metal pad

#9406
20170069573
2017-03-09

Method of preventing pattern collapse

#9407
20170069572
2017-03-09

Apparatus and method for placing stressors within an integrated circuit device to manage electromigration failures

#9408
20170069571
2017-03-09

Semiconductor device and method of manufacturing the same

#9409
20170069568
2017-03-09

CAPACITOR FORMED IN SEMICONDUCTOR

#9410
20170069557
2017-03-09

Semiconductor device and electronic apparatus encapsulated in resin with embedded filler particles

#9411
20170069532
2017-03-09

Semiconductor chip package and method of manufacturing the same

#9412
20170069530
2017-03-09

Integrated circuit with a sidewall layer and an ultra-thick metal layer and method of making

#9413
20170063236
2017-03-02

Package systems including passive electrical components

#9414
20170062569
2017-03-02

SURFACE ENCAPSULATION FOR WAFER BONDING

#9415
20170062553
2017-03-02

Integrated circuit with lateral flux capacitor

#9416
20170062472
2017-03-02

Three-dimensional semiconductor memory devices

#9417
20170062463
2017-03-02

Semiconductor device including three dimensional memory string

#9418
20170062454
2017-03-02

Method of making a multilevel memory stack structure using a cavity containing a sacrificial fill material

#9419
20170062439
2017-03-02

Metal layers for a three-port bit cell

#9420
20170062435
2017-03-02

Semiconductor devices including nanowire capacitors and fabricating methods thereof

#9421
20170062404
2017-03-02

Via placement within an integrated circuit

#9422
20170062391
2017-03-02

3DIC package and methods of forming the same

#9423
20170062385
2017-03-02

POWER CONVERTING DEVICE

#9424
20170062383
2017-03-02

Methods of forming multi-die package structures including redistribution layers

#9425
20170062370
2017-03-02

Electronic component device

#9426
20170062350
2017-03-02

Semiconductor device, method for manufacturing semiconductor device and alignment mark

#9427
20170062347
2017-03-02

Semiconductor devices having air spacers and methods of manufacturing the same

#9428
20170062346
2017-03-02

Semiconductor device and manufacturing method thereof

#9429
20170062345
2017-03-02

Semiconductor device and manufacturing method thereof

#9430
20170062340
2017-03-02

Semiconductor device

#9431
20170062338
2017-03-02

Integrated circuit structures comprising conductive vias and methods of forming conductive vias

#9432
20170062337
2017-03-02

Methods of forming semiconductor device structures including stair step structures

#9433
20170062331
2017-03-02

Chamferless via structures

#9434
20170062330
2017-03-02

Three-dimensional semiconductor memory device

#9435
20170062328
2017-03-02

Semiconductor device and method of manufacturing the same

#9436
20170062313
2017-03-02

Semiconductor device having wire bonding connection and method for manufacturing the same

#9437
20170062308
2017-03-02

Semiconductor devices and methods of manufacturing the same

#9438
20170062301
2017-03-02

Semiconductor device

#9439
20170062288
2017-03-02

Methods for manufacturing semiconductor device and for detecting end point of dry etching

#9440
20170062286
2017-03-02

SEMICONDUCTOR MANUFACTURING METHOD AND SEMICONDUCTOR MANUFACTURING APPARATUS

#9441
20170062275
2017-03-02

Chamferless via structures

#9442
20170062269
2017-03-02

Semiconductor device manufacturing method and storage medium

#9443
20170059650
2017-03-02

High capacity I/O (input/output) cells

#9444
20170054318
2017-02-23

3D shaped inductive charging coil and method of making the same

#9445
20170054039
2017-02-23

PHOTONIC DEVICES WITH THROUGH DIELECTRIC VIA INTERPOSER

#9446
20170054014
2017-02-23

Semiconductor device

#9447
20170053967
2017-02-23

Dummy bottom electrode in interconnect to reduce CMP dishing

#9448
20170053926
2017-02-23

Antifuse-type one time programming memory cell and array structure with same

#9449
20170053925
2017-02-23

Antifuse-type one time programming memory cell and array structure with same

#9450
20170053907
2017-02-23

Double-side process silicon MOS and passive devices for RF front-end modules

#9451
20170053902
2017-02-23

Three-dimensional integrated circuit structure and bonded structure

#9452
20170053891
2017-02-23

Wafer bonding edge protection using double patterning with edge exposure

#9453
20170053876
2017-02-23

Trench liner for removing impurities in a non-copper trench

#9454
20170053870
2017-02-23

Interconnection structure and methods of fabrication the same

#9455
20170053869
2017-02-23

Semiconductor device and method for manufacturing the same

#9456
20170053868
2017-02-23

Semiconductor device structure and method for forming the same

#9457
20170053867
2017-02-23

Memory device and method of manufacturing the same

#9458
20170053866
2017-02-23

Via structure for optimizing signal porosity

#9459
20170053865
2017-02-23

Interconnect structure with twin boundaries and method for forming the same

#9460
20170053864
2017-02-23

Method of forming metal interconnection

#9461
20170053863
2017-02-23

Structure and method for interconnection

#9462
20170047513
2017-02-16

PROTON RESISTIVE MEMORY DEVICES AND METHODS

#9463
20170047374
2017-02-16

Semiconductor metallization structure

#9464
20170047345
2017-02-16

Nonvolatile memory device having pad structure for high speed operation

#9465
20170047342
2017-02-16

Semiconductor device having channel holes

#9466
20170047335
2017-02-16

Semiconductor device and method of manufacturing the same

#9467
20170047333
2017-02-16

Device having an inter-layer via (ILV), and method of making same

#9468
20170047301
2017-02-16

Semiconductor device structure and method for forming the same

#9469
20170047297
2017-02-16

Stress tuning for reducing wafer warpage

#9470
20170047287
2017-02-16

Semiconductor device including fuse structure

#9471
20170047283
2017-02-16

Conductive through-polymer vias for capacitative structures integrated with packaged semiconductor chips

#9472
20170047282
2017-02-16

Reducing liner corrosion during metallization of semiconductor devices

#9473
20170047259
2017-02-16

Mitigating electromigration, in-rush current effects, IR-voltage drop, and jitter through metal line and via matrix insertion

#9474
20170047248
2017-02-16

FILLING CAVITIES IN AN INTEGRATED CIRCUIT AND RESULTING DEVICES

#9475
20170047247
2017-02-16

Self-aligned back end of line cut

#9476
20170047246
2017-02-16

Semiconductor device having insulating layers containing oxygen and a barrier layer containing manganese

#9477
20170047245
2017-02-16

Connector structure and method for fabricating the same

#9478
20170044668
2017-02-16

Metal capping process and processing platform thereof

#9479
20170040444
2017-02-09

Heterojunction semiconductor device for reducing parasitic capacitance

#9480
20170040374
2017-02-09

Semiconductor devices having a pad structure

#9481
20170040297
2017-02-09

Semiconductor device having through silicon vias and manufacturing method thereof

#9482
20170040296
2017-02-09

Multi-layer semiconductor devices fabricated using a combination of substrate and via structures and fabrication techniques

#9483
20170040263
2017-02-09

AVD hardmask for damascene patterning

#9484
20170040260
2017-02-09

Integrated circuit having slot via and method of forming the same

#9485
20170040259
2017-02-09

Semiconductor device including source/drain contact having height below gate stack

#9486
20170040258
2017-02-09

Hybrid subtractive etch/metal fill process for fabricating interconnects

#9487
20170040257
2017-02-09

HYBRID SUBTRACTIVE ETCH/METAL FILL PROCESS FOR FABRICATING INTERCONNECTS

#9488
20170040256
2017-02-09

Capacitor in post-passivation structures and methods of forming the same

#9489
20170040253
2017-02-09

Semiconductor devices

#9490
20170040218
2017-02-09

Self-aligned contacts

#9491
20170040216
2017-02-09

Damascene wires with top via structures

#9492
20170040213
2017-02-09

Hybrid subtractive etch/metal fill process for fabricating interconnects

#9493
20170040211
2017-02-09

Desmear with metalized protective film

#9494
20170037526
2017-02-09

Method of electroplating photoresist defined features from copper electroplating baths containing reaction products of imidazole and bisepoxide compounds

#9495
20170033117
2017-02-02

Semiconductor device and method of manufacturing the same

#9496
20170033102
2017-02-02

Semiconductor device

#9497
20170033078
2017-02-02

Multi-device package and manufacturing method thereof

#9498
20170033052
2017-02-02

Semiconductor device and a method of manufacturing the same

#9499
20170033051
2017-02-02

Interconnection structure

#9500
20170033048
2017-02-02

Semiconductor devices

#9501
20170033044
2017-02-02

Semiconductor device and method for fabricating the same

#9502
20170033043
2017-02-02

Semiconductor device having a porous low-k structure

#9503
20170033041
2017-02-02

Semiconductor device having a multi-level interconnection structure

#9504
20170033030
2017-02-02

Interconnect arrangement with stress-reducing structure and method of fabricating the same

#9505
20170033023
2017-02-02

Test structure macro for monitoring dimensions of deep trench isolation regions and local trench isolation regions

#9506
20170033005
2017-02-02

Method of manufacturing a semiconductor device having groove-shaped via-hole

#9507
20170032977
2017-02-02

Redistribution lines having stacking vias

#9508
20170032891
2017-02-02

Varainductor and operation method thereof based on mutual capacitance

#9509
20170032072
2017-02-02

Stacked chip layout having overlapped regions

#9510
20170025508
2017-01-26

Electrode connecting structure including adhesion layer and electronic device including the same

#9511
20170025401
2017-01-26

Conductive line patterning

#9512
20170025381
2017-01-26

Hybrid bond using a copper alloy for yield improvement

#9513
20170025368
2017-01-26

Conductive seal ring for power bus distribution

#9514
20170025360
2017-01-26

SEMICONDUCTOR INTERCONNECT STRUCTURE AND MANUFACTURING METHOD THEREOF

#9515
20170025352
2017-01-26

Antifuse structure in via hole in interplayer dielectric

#9516
20170025351
2017-01-26

Semiconductor device with through-substrate via covered by a solder ball

#9517
20170025350
2017-01-26

Semiconductor memory device and method for manufacturing the same

#9518
20170025349
2017-01-26

Semiconductor wafers with through substrate vias and back metal, and methods of fabrication thereof

#9519
20170025347
2017-01-26

METHODS AND STRUCTURES FOR BACK END OF LINE INTEGRATION

#9520
20170025346
2017-01-26

Method for interconnect scheme

#9521
20170025345
2017-01-26

Via pattern to reduce crosstalk between differential signal pairs

#9522
20170024339
2017-01-26

Network unit of electronic appliances, network of electronic appliances, and method of using chip identification device

#9523
20170020006
2017-01-19

Method for forming wiring

#9524
20170018566
2017-01-19

SEMICONDUCTOR MEMORY DEVICE

#9525
20170018518
2017-01-19

Method of producing a semiconductor device with through-substrate via covered by a solder ball

#9526
20170018517
2017-01-19

Microelectronic assemblies formed using metal silicide, and methods of fabrication

#9527
20170018514
2017-01-19

Transmission line for 3D integrated circuit

#9528
20170018512
2017-01-19

Semiconductor device

#9529
20170018504
2017-01-19

Semiconductor device having structure for improving voltage drop and device including the same

#9530
20170018501
2017-01-19

VIA STRUCTURES FOR THERMAL DISSIPATION

#9531
20170018498
2017-01-19

Method of semiconductor integrated circuit fabrication

#9532
20170018496
2017-01-19

Interconnect structure for semiconductor devices

#9533
20170018456
2017-01-19

Layered benzocyclobutene interconnected circuit and method of manufacturing same

#9534
20170016851
2017-01-19

Integrated biosensor

#9535
20170012111
2017-01-12

Trench MOSFET with depleted gate shield and method of manufacture

#9536
20170012052
2017-01-12

Semiconductor memory device

#9537
20170012050
2017-01-12

Semiconductor memory device and method for manufacturing the same

#9538
20170012004
2017-01-12

Semiconductor device and method of producing semiconductor device

#9539
20170012001
2017-01-12

SELF-ALIGNED BARRIER AND CAPPING LAYERS FOR INTERCONNECTS

#9540
20170011999
2017-01-12

Semiconductor integrated circuit and electronic system including the same

#9541
20170011998
2017-01-12

Semiconductor interconnect structures

#9542
20170011997
2017-01-12

Thickened stress relief and power distribution layer

#9543
20170011996
2017-01-12

Semiconductor device having interconnection structure

#9544
20170011994
2017-01-12

Semiconductor device and manufacturing method thereof

#9545
20170011982
2017-01-12

Insulated die

#9546
20170011960
2017-01-12

Conductive plug and method of forming the same

#9547
20170011959
2017-01-12

Connectible nanotube circuit

#9548
20170011948
2017-01-12

Semiconductor structures including carrier wafers and attached device wafers, and methods of forming such semiconductor structures

#9549
20170005651
2017-01-05

Semiconductor switch

#9550
20170005100
2017-01-05

Semiconductor device including dummy metal

#9551
20170005097
2017-01-05

Semiconductor device having air gap spacer and method of fabricating the same

#9552
20170005088
2017-01-05

Distributed decoupling capacitor

#9553
20170005087
2017-01-05

Distributed decoupling capacitor

#9554
20170005076
2017-01-05

Stacked integrated circuits with redistribution lines

#9555
20170005054
2017-01-05

Post-passivation interconnect structure and methods thereof

#9556
20170005053
2017-01-05

Chip mounting structure

#9557
20170005047
2017-01-05

Electronic apparatus operable in high frequencies

#9558
20170005045
2017-01-05

Semiconductor device and method including an intertial mass element

#9559
20170005037
2017-01-05

Method to reduce resistance for a copper (CU) interconnect landing on multilayered metal contacts, and semiconductor structures formed therefrom

#9560
20170005035
2017-01-05

Stacked semiconductor devices and methods of forming same

#9561
20170005034
2017-01-05

Package structure

#9562
20170005014
2017-01-05

Test structure macro for monitoring dimensions of deep trench isolation regions and local trench isolation regions

#9563
20170004999
2017-01-05

SELF-ALIGNED VIA PROCESS FLOW

#9564
20170004998
2017-01-05

Gate contact structure over active gate and method to fabricate same

#9565
20170004994
2017-01-05

Metal-semiconductor contact structure with doped interlayer

#9566
20160380115
2016-12-29

THIN FILM TRANSISTOR, SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING THIN FILM TRANSISTOR

#9567
20160380065
2016-12-29

Semiconductor structures with field effect transistor(s) having low-resistance source/drain contact(s)

#9568
20160379999
2016-12-29

High performance heat shields with reduced capacitance

#9569
20160379973
2016-12-29

Ultrasonic transducers in complementary metal oxide semiconductor (CMOS) wafers and related apparatus and methods

#9570
20160379963
2016-12-29

Multi-wafer stacking by Ox-Ox bonding

#9571
20160379936
2016-12-29

Method of fabricating a semiconductor device and semiconductor product

#9572
20160379929
2016-12-29

Self aligned via in integrated circuit

#9573
20160379927
2016-12-29

Optimized wires for resistance or electromigration

#9574
20160379920
2016-12-29

Apparatus, system, and method for wireless connection in integrated circuit packages

#9575
20160379891
2016-12-29

Wiring structure and method of forming the same, and semiconductor device including the wiring structure

#9576
20160379885
2016-12-29

Structures and methods for reliable packages

#9577
20160379880
2016-12-29

Low resistance metal contacts to interconnects

#9578
20160379877
2016-12-29

Optimized wires for resistance or electromigration

#9579
20160379871
2016-12-29

Interconnect structure having an etch stop layer over conductive lines

#9580
20160379869
2016-12-29

Low resistance metal contacts to interconnects

#9581
20160372566
2016-12-22

Formation method of semiconductor device structure

#9582
20160372544
2016-12-22

Semiconductor integrated circuits (ICs) employing localized low dielectric constant (low-K) material in inter-layer dielectric (ILD) material for improved speed performance

#9583
20160372516
2016-12-22

CMOS compatible thermopile with low impedance contact

#9584
20160372477
2016-12-22

Static random access memory (SRAM) device

#9585
20160372446
2016-12-22

Low profile integrated circuit (IC) package comprising a plurality of dies

#9586
20160372431
2016-12-22

Semiconductor device allowing metal layer routing formed directly under metal pad

#9587
20160372422
2016-12-22

Additional etching to increase via contact area

#9588
20160372420
2016-12-22

Manufacturing a damascene thin-film resistor

#9589
20160372419
2016-12-22

Semiconductor device having a discontinued part between a first insulating film and a second insulating film

#9590
20160372418
2016-12-22

Semiconductor device including a boundary of conductivity in a substrate

#9591
20160372416
2016-12-22

Backside device contact

#9592
20160372415
2016-12-22

Semiconductor devices

#9593
20160372414
2016-12-22

Integrated circuits having reduced dimensions between components

#9594
20160372413
2016-12-22

UNIQUE BI-LAYER ETCH STOP TO PROTECT CONDUCTIVE STRUCTURES DURING A METAL HARD MASK REMOVAL PROCESS AND METHODS OF USING SAME

#9595
20160372369
2016-12-22

Method for forming interconnects

#9596
20160372368
2016-12-22

Method of manufacturing a semiconductor device

#9597
20160372367
2016-12-22

Plating method, plated component, and plating system

#9598
20160372364
2016-12-22

Bulk layer transfer wafer with multiple etch stop layers

#9599
20160372332
2016-12-22

Dual liner silicide

#9600
20160370675
2016-12-22

Array substrate, fault line repair method and display device