207728 ⎘
Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body Via connections in a multilevel interconnection structure
THIN FILM RESISTOR INTEGRATION IN COPPER DAMASCENE METALLIZATION
#9902Composite contact via structure containing an upper portion which fills a cavity within a lower portion
#9903Semiconductor device and structure
#9904Device comprising a ductile layer and method of making the same
#9905Patterning approach for improved via landing profile
#9906Method of fabricating a semiconductor device with reduced leak paths
#9907Interconnect structure and manufacturing method thereof
#9908Electrical connection structure with via hole, array substrate and display device
#9909Hybrid bonding with uniform pattern density
#9910SEMICONDUCTOR PACKAGE AND METHOD OF FORMING THE SAME
#9911Integrated circuit devices and methods
#9912Integrated circuit having slot via and method of forming the same
#9913Fishbone structure enhancing spacing with adjacent conductive line in power network
#9914Semiconductor device and method of manufacturing the same
#9915Lateral charge storage region formation for semiconductor wordline
#9916Method for preventing copper contamination in metal-insulator-metal (MIM) capacitors
#9917Dicing method for power transistors
#9918Semiconductor device with reduced via resistance
#9919Electronic package and method of connecting a first die to a second die to form an electronic package
#9920Tank circuit structure and method of making the same
#9921CHIP PACKAGE AND FABRICATION METHOD THEREOF
#9922Semiconductor device structures with improved planarization uniformity, and related methods
#9923Semiconductor memory device and method for manufacturing same
#9924Semiconductor device
#9925Hybrid bonding with air-gap structure
#9926THREE-DIMENSIONAL INTEGRATED STRUCTURE COMPRISING AN ANTENNA CROSS REFERENCE TO RELATED APPLICATIONS
#9927Support structure for barrier layer of semiconductor device
#9928Stacked via structure for metal fuse applications
#9929SELF-ALIGNED VIA INTERCONNECT STRUCTURES
#9930Localized high density substrate routing
#9931Stacked multilayer structure and manufacturing method thereof
#9932Self-aligned via interconnect structures
#9933Subtractive self-aligned via and plug patterning for back end of line (BEOL) interconnects
#9934Semiconductor device with reduced via resistance
#9935Interconnect structures incorporating air-gap spacers
#9936LTPS TFT substrate structure and method of forming the same
#9937Semiconductor device and method of manufacturing same
#9938Contact structure and formation thereof
#9939Interconnect structure with misaligned metal lines coupled using different interconnect layer
#9940Chip package having a laser stop structure
#9941Interconnection structure and manufacturing method thereof
#9942Semiconductor device and method of manufacturing the same
#9943Forming layers of materials over small regions by selective chemical reaction including limiting enchroachment of the layers over adjacent regions
#9944Package apparatus and manufacturing method thereof
#9945Previous layer self-aligned via and plug patterning for back end of line (BEOL) interconnects
#9946Physical unclonable interconnect function array
#9947Semiconductor devices having low contact resistance and low current leakage
#9948Deformable electronic device and methods of providing and using deformable electronic device
#9949Three-dimensional integrated circuit integration
#9950Subtractive etch interconnects
#9951Semiconductor devices having expanded recess for bit line contact
#9952RELIABLE PASSIVATION LAYERS FOR SEMICONDUCTOR DEVICES
#9953Through substrate vias with improved connections
#9954Self-aligned interconnection for integrated circuits
#9955Semiconductor device with multi-layer metallization
#9956Titanium tungsten liner used with copper interconnects
#9957Semiconductor structure and fabrication method thereof
#9958Method of fabricating semiconductor device
#9959Integrated circuits with capacitors and methods of producing the same
#9960Backside through vias in a bonded structure
#9961Picture frame stiffeners for microelectronic packages
#9962Compact semiconductor package and related methods
#9963Conductive structure and manufacturing method thereof, and electronic device and manufacturing method thereof
#9964Integrated device package comprising photo sensitive fill between a substrate and a die
#9965Semiconductor device and manufacturing method of the same
#9966Designed-based interconnect structure in semiconductor structure
#9967Semiconductor device and method for manufacturing the same
#9968HIGH ASPECT RATIO STRUCTURE
#9969SYSTEM, APPARATUS, AND METHOD FOR SEMICONDUCTOR PACKAGE GROUNDS
#9970Array substrate, display panel and display apparatus
#9971Three-dimensional semiconductor memory devices
#9972Air trench in packages incorporating hybrid bonding
#9973Monolithic stacked integrated circuits with a redundant layer for repairing defects
#9974Optimized wires for resistance or electromigration
#9975SEMICONDUCTOR STRUCTURE WITH BOTTOM-FREE LINER FOR TOP CONTACT
#9976Semiconductor device and fabrication method thereof
#9977Interconnect structures with fully aligned vias
#9978Substrate-less stackable package with wire-bond interconnect
#9979Semiconductor structure and fabrication method thereof
#9980POWER REDUCED COMPUTING
#9981Semiconductor structure and fabrication method thereof
#9982Self-aligned via interconnect structures
#9983Methods of fabricating a semiconductor device having a via structure and an interconnection structure
#9984Method of forming semiconductor packages having through package vias
#9985Self-aligned contacts
#9986SEMICONDUCTOR PACKAGE
#9987Different scaling ratio in FEOL/ MOL/ BEOL
#9988Opening fill process and structure formed thereby
#9989Package structure and manufacturing method thereof
#9990Interconnect structure for an integrated circuit and method of fabricating an interconnect structure
#9991MIMCAP STRUCTURE IN A SEMICONDUCTOR DEVICE PACKAGE
#9992Metal-insulator-metal on-die capacitor with partial vias
#9993Semiconductor devices having a TSV, a front-side bumping pad, and a back-side bumping pad
#9994Contact module for optimizing emitter and contact resistance
#9995ELECTRONIC PACKAGE
#9996TFT substrates and the manufacturing method thereof
#9997Methods of forming stacked microelectronic dice embedded in a microelectronic substrate
#9998Method for forming interconnect structure that avoids via recess
#9999Method and structure to contact tight pitch conductive layers with guided vias
#10000PRECISION INTRALEVEL METAL CAPACITOR FABRICATION
#10001Voltage contrast characterization structures and methods for within chip process variation characterization
#10002Vias and methods of formation thereof
#10003Set of stepped surfaces formation for a multilevel interconnect structure
#10004Metal segments as landing pads and local interconnects in an IC device
#10005Integrated thinfilm resistor and MIM capacitor with a low serial resistance
#10006Stacked semiconductor die assemblies with improved thermal performance and associated systems and methods
#10007Radio-frequency integrated circuits including inductors and methods of fabricating the same
#10008Semiconductor device and method for fabricating the same
#10009METHOD AND APPARATUS FOR A HIGH YIELD CONTACT INTEGRATION SCHEME
#10010Self-aligned via process flow
#10011High speed electroplating metallic conductors
#10012Low-noise arrangement for very-large-scale integration differential input/output structures
#10013Semiconductor devices and methods of manufacture thereof having guard ring structure
#10014Wiring Structures and Methods of Forming the Same
#10015Semiconductor device with damascene bit line and method for fabricating the same
#10016Methods for thermally forming a selective cobalt layer
#10017Semiconductor package including dielectric layers defining via holes extending to component pads
#10018Dual sided circuit for surface mounting
#10019Phase changing on-chip thermal heat sink
#10020APPARATUS AND METHOD FOR GENERATING DIGITAL VALUE
#10021Segmented power transistor
#10022Semiconductor devices including contact patterns having a rising portion and a recessed portion
#10023Electrostatic discharge protection structure and method
#10024Method of fabricating a tungsten plug in a semiconductor device
#10025Methods of forming an improved via to contact interface by selective formation of a conductive capping layer
#10026Bond pad structure with dual passivation layers
#10027Method for manufacturing copper layer
#10028Diagonal hardmasks for improved overlay in fabricating back end of line (BEOL) interconnects
#10029Electrically conductive interconnect including via having increased contact surface area
#10030Integrated circuitry
#10031Via structure for optimizing signal porosity
#10032Buried etch stop layer for damascene bit line formation
#10033Memory cell having multi-level word line
#10034Methods of forming an improved via to contact interface by selective formation of a metal silicide capping layer
#10035Air gaps structures for damascene metal patterning
#10036Semiconductor device, display driver integrated circuit including the device, and display device including the device
#10037Metal-insulator-metal back end of line capacitor structures
#10038Planar passivation for pads
#10039Strain detection structures for bonded wafers and chips
#10040Semiconductor device and method
#10041Oversized contacts and vias in layout defined by linearly constrained topology
#10042Fuse structure and method of blowing the same
#10043Precut metal lines
#10044Low-Resistance Interconnects and Methods of Making Same
#10045Structure having isolated deep substrate vias with decreased pitch and increased aspect ratio and related method
#10046Semiconductor structures and fabrication methods thereof
#10047EMBEDDED PACKAGES, METHODS OF FABRICATING THE SAME, ELECTRONIC SYSTEMS INCLUDING THE SAME, AND MEMORY CARDS INCLUDING THE SAME
#10048Semiconductor device structure with conductive pillar and conductive line and method for forming the same
#10049Two step metallization formation
#10050Systems and method for ohmic contacts in silicon carbide devices
#10051Batch contacts for multiple electrically conductive layers
#10052Vertical breakdown protection layer
#10053Low energy etch process for nitrogen-containing dielectric layer
#10054Semiconductor device with metal think film and via
#10055Chip package structure
#10056Dummy metal structure and method of forming dummy metal structure
#10057Fabrication method of interconnect structure
#10058Etch stop layer in integrated circuits
#10059Vertical type memory device
#10060Self aligned active trench contact
#10061Metallisation for semiconductor device
#10062Interconnects through dielecric vias
#10063Integrated circuit with elongated coupling
#10064FIN-SHAPED FIELD-EFFECT TRANSISTOR WITH A GERMANIUM EPITAXIAL CAP AND A METHOD FOR FABRICATING THE SAME
#10065LOW CAPACITANCE BALLISTIC CONDUCTOR SIGNAL LINES
#10066INTERLAYER BALLISTIC CONDUCTOR SIGNAL LINES
#10067Self-aligned via and plug patterning with photobuckets for back end of line (BEOL) interconnects
#10068Semiconductor device and method of manufacturing the same
#10069Embedded package and method thereof
#10070Semiconductor package assembly
#10071Discrete flexible interconnects for modules of integrated circuits
#10072Semiconductor device and manufacturing method thereof
#10073Semiconductor device structure and method for forming the same
#10074System on chip
#10075Semiconductor package and method of manufacturing the same
#10076Memory device and manufacturing method thereof
#10077Stacked conductor structure and methods for manufacture of same
#10078Semiconductor structure including a through electrode, and method for forming the same
#10079Dimension-controlled via formation processing
#10080Display having vertical gate line extensions and minimized borders
#10081Display having vertical gate line extensions and touch sensor
#10082Non-volatile random access memory (NVRAM)
#10083MRAM integration with low-K inter-metal dielectric for reduced parasitic capacitance
#10084Microelectromechanical system (MEMS) bond release structure and method of wafer transfer for three-dimensional integrated circuit (3D IC) integration
#10085Fan out package structure and methods of forming
#10086SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
#10087Semiconductor device and process
#10088SYSTEM, APPARATUS, AND METHOD OF INTERCONNECTION IN A SUBSTRATE
#10089Air gap structure and method
#10090Device resulting from printing minimum width semiconductor features at non-minimum pitch
#10091Integration of heat spreader for beol thermal management
#10092Semiconductor device structure and manufacturing methods
#10093FAN-OUT WAFER LEVEL PACKAGE CONTAINING BACK-TO-BACK EMBEDDED MICROELECTRONIC COMPONENTS AND ASSEMBLY METHOD THEREFOR
#10094CARBON NANOTUBE INTERCONNECT STRUCTURE, AND METHOD OF MANUFACTURING THE SAME
#10095Semiconductor device and method for forming the same
#10096Fine line space resolution lithography structure for integrated circuit features using double patterning technology
#10097PACKAGE SUBSTRATE
#10098Mitigating electromigration effects using parallel pillars
#10099Method for making a photolithography mask intended for the formation of contacts, mask and integrated circuit corresponding thereto
#10100Semiconductor device having improved heat-dissipation characteristics
#10101Sample stack structure and method for preparing the same
#10102Semiconductor chip including integrated circuit including at least five gate level conductive structures having particular spatial and electrical relationship and method for manufacturing the same
#10103SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
#10104Non-volatile semiconductor memory device and manufacturing method thereof
#10105Semiconductor substrate and semiconductor package structure
#10106Nonvolatile semiconductor memory device and method of manufacturing the same
#10107Middle-of-line (MOL) manufactured integrated circuits (ICs) employing local interconnects of metal lines using an elongated via, and related methods
#10108Polymer member based interconnect
#10109Semiconductor memory device with electrode connecting to circuit chip through memory array chip
#10110Semiconductor package
#10111Semiconductor device, layout of semiconductor device, and method of manufacturing semiconductor device
#10112Additional etching to increase via contact area
#10113Semiconductor package structure including die and substrate electrically connected through conductive segments
#10114Substrate structure and method of manufacturing the same
#10115Semiconductor package
#10116Semiconductor device and a method of manufacturing the same
#10117SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
#10118Single damascene interconnect structure
#10119SEMICONDUCTOR DEVICE ETCHING FOR RC DELAY IMPROVEMENT
#10120Semiconductor package having conductive pillars
#10121SEMICONDUCTOR PACKAGE AND METHOD OF FABRICATING THE SAME
#10122Copper contact plugs with barrier layers
#10123Hydrogen-free silicon-based deposited dielectric films for nano device fabrication
#10124Integrated circuits including a MIMCAP device and methods of forming the same for long and controllable reliability lifetime
#10125Semiconductor device having mesh-patterned wirings
#10126SEMICONDUCTOR DEVICE
#10127Metal cap apparatus and method
#10128Method and structure to reduce the electric field in semiconductor wiring interconnects
#10129Semiconductor device and structure therefor
#10130Semiconductor device and method of manufacturing the same
#10131Designed-based interconnect structure in semiconductor structure
#10132Method and structure to reduce the electric field in semiconductor wiring interconnects
#10133Multiheight contact via structures for a multilevel interconnect structure
#10134Method for forming three-dimensional interconnection, circuit arrangement comprising three-dimensional interconnection, and metal film-forming composition for three-dimensional interconnection
#10135Semiconductor device having stable structure and method of manufacturing the same
#10136Electric connection element manufacturing method
#10137Structure of dual damascene structures having via hole and trench
#10138Method of making openings in a semiconductor device with reduced residue by transferring layers
#10139Hydrogen-free silicon-based deposited dielectric films for nano device fabrication
#10140Method and system for via retargeting
#10141Liquid crystal display
#10142POWER TRANSISTOR WITH DISTRIBUTED DIODES
#10143Power transistor with distributed gate
#10144Hybrid carbon-metal interconnect structures
#10145Integrated thermoelectric generator
#10146Semiconductor device and fabrication method therefor
#10147Capacitor having a graphene structure, semiconductor device including the capacitor and method of forming the same
#10148Semiconductor device, manufacturing method thereof, and electronic device
#10149Semiconductor devices and methods of forming the same
#10150Electrical interconnect structure for an embedded semiconductor device package and method of manufacturing thereof
#10151Semiconductor structure including a through electrode, and method for forming the same
#10152CHIP PACKAGE MODULE AND PACKAGE SUBSTRATE
#10153Wafer with liquid molding compound and post-passivation interconnect
#10154Fabricating pillar solder bump
#10155Hydrogen-free silicon-based deposited dielectric films for nano device fabrication
#10156E-fuse structure of semiconductor device
#10157Wiring for semiconductor device and method of forming same
#10158Semiconductor device and manufacturing method therefor
#10159Self-aligned back end of line cut
#10160Semiconductor device, method of manufacturing the same, and electronic device
#10161PACKAGE SUBSTRATES INCLUDING EMBEDDED CAPACITORS
#10162Array substrate structure and contact structure
#10163Semiconductor device
#10164Apparatus for high speed ROM cells
#10165SEMICONDUCTOR DEVICE
#101663DIC package and methods of forming the same
#10167Buffer layer(s) on a stacked structure having a via
#10168Via pre-fill on back-end-of-the-line interconnect layer
#10169Semiconductor device
#10170Interconnect structure
#10171Interconnect structures with fully aligned vias
#10172Semiconductor device and method
#10173Interconnect structure and method of forming the same
#10174Phase changing on-chip thermal heat sink
#10175Structure and formation method of damascene structure
#10176Long-term heat treated integrated circuit arrangements and methods for producing the same
#10177Method for improving adhesion between porous low k dielectric and barrier layer
#10178Hydrogen-free silicon-based deposited dielectric films for nano device fabrication
#10179Via density in radio frequency shielding applications
#10180Semiconductor device having control conductors
#10181Thin film transistor, manufacturing method thereof, array substrate and display apparatus
#10182FINFET SEMICONDUCTOR DEVICES WITH STRESSED LAYERS
#10183MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
#10184Electrode lead-out structure, array substrate and display device
#10185Semiconductor structure and manufacturing method of the same
#10186SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
#10187Interconnect structures for integrated circuits and their formation
#10188Meander line resistor structure
#10189Power semiconductor package having vertically stacked driver IC
#10190Semiconductor device packages, packaging methods, and packaged semiconductor devices
#10191ROUTING PATHS AND SEMICONDUCTOR DEVICES INCLUDING THE SAME
#10192Semiconductor devices with close-packed via structures having in-plane routing and method of making same
#10193Methods for fabricating integrated circuits having device contacts
#10194Copper wire and dielectric with air gaps
#10195Method for forming seed layer on high-aspect ratio via and semiconductor device having high-aspect ratio via formed thereby
#10196Array substrate and manufacturing method thereof, display device
#10197Array substrate, method for fabricating the same and display device
#10198Memory device structure
#10199Semiconductor device with reduced via resistance
#10200E-fuse structure with methods of fusing the same and monitoring material leakage