208009 ⎘
Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body the substrate comprising an insulating body on a semiconductor body, e.g. SOI
Semiconductor device
#3002SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
#3003Three-dimensional semiconductor architecture
#3004SEMICONDUCTOR DEVICE
#3005Hybrid molecular electronic devices containing molecule-functionalized surfaces for switching, memory, and sensor applications and methods for fabricating same
#3006Devices and systems relating to a memory cell having a floating body
#3007SOI radio frequency switch with enhanced electrical isolation
#3008Semiconductor device and production method therefor
#3009Semiconductor device with selected transistor properties
#3010Semiconductor device and manufacturing method thereof
#3011Reducing transistor junction capacitance by recessing drain and source regions
#3012Replacement gate CMOS
#3013Memory device having buried boosting plate and methods of operating the same
#3014Integrated circuit using FinFETs and having a static random access memory (SRAM)
#3015SOI (silicon on insulator) substrate improvements
#3016Method for manufacturing SOI substrate
#3017System for fabricating nanocoils using a wet etch technique
#3018Semiconductor device and manufacturing methods with using non-planar type of transistors
#3019Method for producing semiconductor chip, and field effect transistor and method for manufacturing same
#3020Field effect transistors with vertically oriented gate electrodes and methods for fabricating the same
#3021Strain engineering in semiconductor devices by using a piezoelectric material
#3022Four-terminal gate-controlled LVBJTs
#3023Semiconductor storage device
#3024Semiconductor storage device
#3025Method for fabricating a connection region in a semiconductor device
#3026Production method for surrounding gate transistor semiconductor device
#3027Methods of fabrication of semiconductor devices with low capacitance
#3028Semiconductor device and production method therefor
#3029Semiconductor field-effect transistor, memory cell and memory device
#3030eDRAM memory cell structure and method of fabricating
#3031Semiconductor structure
#3032Semiconductor integrated circuit device and method of manufacturing the same
#3033Method for making a substrate of the semiconductor on insulator type with an integrated ground plane
#3034Body contacts for FET in SOI SRAM array
#3035Solid-state image pick-up device and manufacturing method thereof, image-pickup apparatus, semiconductor device and manufacturing method thereof, and semiconductor substrate
#3036SOI radio frequency switch with reduced signal distortion
#3037Semiconductor device and semiconductor integrated circuit using the same
#3038METHOD FOR TUNING THE THRESHOLD VOLTAGE OF A METAL GATE AND HIGH-K DEVICE
#3039Semiconductor-on-insulator substrate and structure including multiple order radio frequency harmonic supressing region
#3040CMOS semiconductor device
#3041Heavy Ion Upset Hardened Floating Body SRAM Cells
#3042Semiconductor surround gate SRAM storage device
#3043Multiple crystallographic orientation semiconductor structures
#3044SOI SUBSTRATE AND SEMICONDUCTOR DEVICE USING AN SOI SUBSTRATE
#3045Reduction of thickness variations of a threshold semiconductor alloy by reducing patterning non-uniformities prior to depositing the semiconductor alloy
#3046Increased depth of drain and source regions in complementary transistors by forming a deep drain and source region prior to a cavity etch
#3047Embedded DRAM memory cell with additional patterning layer for improved strap formation
#3048INTERLAYER DIELECTRIC UNDER STRESS FOR AN INTEGRATED CIRCUIT
#3049Semiconductor integrated circuit device
#3050Method To Create SOI Layer For 3D-Stacking Memory Array
#3051METHOD TO INCREASE STRAIN ENHANCEMENT WITH SPACERLESS FET AND DUAL LINER PROCESS
#3052Semiconductor device having switching element and method for fabricating semiconductor device having switching element
#3053Semiconductor on insulator (SOI) device including a discharge path for a decoupling capacitor
#3054Semiconductor memory device having a floating storage bulk region capable of holding/emitting excessive majority carriers
#3055Semiconductor device and method of manufacturing the same
#3056Method of fabricating hetero-junction bipolar transistor (HBT)
#3057Receiving device including impedance control circuit and semiconductor device including impedance control circuit
#3058Microelectromechanical systems structures and self-aligned high aspect-ratio combined poly and single-crystal silicon fabrication processes for producing same
#3059LOW COST FABRICATION OF DOUBLE BOX BACK GATE SILICON-ON-INSULATOR WAFERS WITH SUBSEQUENT SELF ALIGNED SHALLOW TRENCH ISOLATION
#3060Semiconductor apparatus and method of manufacturing the semiconductor apparatus
#3061Nonvolatile semiconductor memory device and method of manufacturing the same
#3062Junction Field-Effect Transistor Having Insulator-Isolated Source/Drain Regions and Fabrication Method Therefor
#3063SOI device with a buried insulating material having increased etch resistivity
#3064Method of fabricating a semiconductor on insulator device having a frontside substrate contact
#3065Metal High-K (MHK) Dual Gate Stress Engineering Using Hybrid Orientation (HOT) CMOS
#3066Magnetoresistive memory cell using floating body effect, memory device having the same, and method of operating the memory device
#3067SOI radio frequency switch with enhanced signal fidelity and electrical isolation
#3068BIAS voltage generation circuit for an SOI radio frequency switch
#3069SOI radio frequency switch for reducing high frequency harmonics
#3070INTEGRATED MEMS AND IC SYSTEMS AND RELATED METHODS
#3071Semiconductor device and method for manufacturing semiconductor device
#3072Technique for providing stress sources in transistors in close proximity to a channel region by recessing drain and source regions
#3073SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
#3074Stacked non-volatile memory device and methods for fabricating the same
#3075Method and structure for integrating capacitor-less memory cell with logic
#3076Method for forming semiconductor devices with active silicon height variation
#3077Anisotropic stress generation by stress-generating liners having a sublithographic width
#3078Vertical floating body cell of a semiconductor device and method for fabricating the same
#3079Memory device and manufacturing method the same
#3080CMOS transistors with differential oxygen content high-K dielectrics
#3081SOI substrates and SOI devices, and methods for forming the same
#3082JFET device structures and methods for fabricating the same
#3083SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
#3084Multi-thickness semiconductor with fully depleted devices and photonic integration
#3085Semiconductor device manufacturing method and semiconductor device
#3086Semiconductor device and method for manufacturing the same
#3087Semiconductor device with ESD protection function and ESD protection circuit
#3088Method for reducing leakage current and increasing drive current in a metal-oxide semiconductor (MOS) transistor
#3089Semiconductor devices and semiconductor device manufacturing methods
#3090Depletion-type NAND flash memory
#3091RESTRICTED STRESS REGIONS FORMED IN THE CONTACT LEVEL OF A SEMICONDUCTOR DEVICE
#3092SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF
#3093Recessed channel negative differential resistance-based memory cell
#3094SEMICONDUCTOR-ON-INSULATOR (SOI) DEVICES USING VOID SPACES
#3095Semiconductor Devices
#3096Method for manufacturing semiconductor device
#3097SEMICONDUCTOR DEVICES
#3098Nonvolatile semiconductor memory device and manufacturing method thereof
#3099Semiconductor device and method of manufacturing the same
#3100High performance capacitors in planar back gates CMOS
#3101CMOS structure and method for fabrication thereof using multiple crystallographic orientations and gate materials
#3102Method of manufacturing semiconductor storage device
#3103Semiconductor structure and method of forming the structure
#3104SRAM DEVICE
#3105SEMICONDUCTOR DEVICE
#3106Semiconductor memory device
#3107Method of forming a guard ring or contact to an SOI substrate
#3108Recessed drain and source areas in combination with advanced silicide formation in transistors
#3109Semiconductor Device and Method for Fabricating the Same
#3110Ultrathin SOI CMOS devices employing differential STI liners
#3111Semiconductor device with increased channel area and fabrication method thereof
#3112Semiconductor device having buried insulation films and method of manufacturing the same
#3113Semiconductor device with increased channel area
#3114Manufacturing method of semiconductor device comprising silicide layer with varied thickness
#3115SEMICONDUCTOR INTEGRATED CIRCUIT
#3116Transistors, semiconductor memory cells having a transistor and methods of forming the same
#3117Semiconductor device having controllable transistor threshold voltage
#3118SOI substrate contact with extended silicide area
#3119Capacitor-Less Dynamic Random Access Memory (DRAM) Devices
#3120Layer transfer process and functionally enhanced integrated circuits produced thereby
#3121Inverter, method of operating the same and logic circuit comprising inverter
#3122eFuse and Resistor Structures and Method for Forming Same in Active Region
#3123Semiconductor device comprising a buried poly resistor
#3124ULTRA-THIN OXIDE BONDING FOR SI TO SI DUAL ORIENTATION BONDING
#3125Semiconductor device with increased channel area and decreased leakage current
#3126Asymmetric channel doping for improved memory operation for floating body cell (FBC) memory
#3127Semiconductor devices including auxiliary gate electrodes and methods of fabricating the same
#3128SOI device with more immunity from substrate voltage
#3129Method for producing a thyristor
#3130Semiconductor device
#3131Method and system for monolithic integration of photonics and electronics in CMOS processes
#3132Transistor, inverter including the same and methods of manufacturing transistor and inverter
#3133Structured strained substrate for forming strained transistors with reduced thickness of active layer
#3134Semiconductor device having vertical field effect transistor and method of manufacturing the same
#3135Method of manufacturing semiconductor device over SOI substrate
#3136Deep trench capacitor for SOI CMOS devices for soft error immunity
#3137SOI MuGFETs having single gate electrode level
#3138Semiconductor memory having both volatile and non-volatile functionality including resistance change material and method of operating
#3139Logic switch and circuits utilizing the switch
#3140Semiconductor device and methods for fabricating same
#3141CMOS with channel P-FinFET and channel N-FinFET having different crystalline orientations and parallel fins
#3142Method of producing a field effect transistor arrangement
#3143INTEGRATING FABRICATION OF PHOTODETECTOR WITH FABRICATION OF CMOS DEVICE ON A SILICON-ON-INSULATOR SUBSTRATE
#3144SEMICONDUCTOR DEVICE
#3145Method of forming a high performance fet and a high voltage fet on a SOI substrate
#3146Dynamic random access memory cell and manufacturing method thereof
#3147Gate driving circuit
#3148Implementing decoupling capacitors with hot-spot thermal reduction on integrated circuit chips
#3149Semiconductor device including gate electrode having a laminate structure and plug electrically connected thereto
#3150Area efficient 3D integration of low noise JFET and MOS in linear bipolar CMOS process
#3151Component comprising a thin-film transistor and CMOS-transistors and methods for production
#3152Performance enhancement in PMOS and NMOS transistors on the basis of silicon/carbon material
#3153Transistor device and method of manufacturing such a transistor device
#3154Lithographic process using a nanowire mask, and nanoscale devices fabricated using the process
#3155Image sensor and manufacturing method thereof
#3156Method for evaluating semiconductor wafer
#3157Nonvolatile semiconductor memory device
#3158Memory cell and memory cell array having an electrically floating body transistor, and methods of operating same
#3159Semiconductor device and fabrication method of the same
#3160Implementing Reduced Hot-Spot Thermal Effects for SOI Circuits
#3161Memory device
#3162Three-dimensional silicon on oxide device isolation
#3163CMOS image sensor including tunable read amplifier
#3164High performance stress-enhance MOSFET and method of manufacture
#3165ESD protection structures on SOI substrates
#3166Localized biasing for silicon on insulator structures
#3167Pin photodiode structure
#3168Trench capacitor for high voltage processes and method of manufacturing the same
#3169Backside illuminated image sensor with reduced dark current
#3170Metal high-k transistor having silicon sidewall for reduced parasitic capacitance
#3171Integration of a floating body memory on SOI with logic transistors on bulk substrate
#3172High integrated semiconductor memory device
#3173Dielectric layer above floating gate for reducing leakage current
#3174Planar Metal-Insulator-Metal Circuit Element and Method for Planar Integration of Same
#3175ELECTROSTATIC DISCHARGE PROTECTION DEVICE
#3176TFT MONOS or SONOS memory cell structures
#3177SEMICONDUCTOR DEVICE, INTEGRATED CIRCUIT, AND SEMICONDUCTOR MANUFACTURING METHOD
#3178Semiconductor device
#3179INTEGRATED CIRCUIT DEVICE, SYSTEM, AND METHOD OF FABRICATION
#3180Semiconductor device reducing output capacitance due to parasitic capacitance
#3181CMOS devices incorporating hybrid orientation technology (HOT) with embedded connectors
#3182Bipolar junction transistor-based uncooled infrared sensor and manufacturing method thereof
#3183Memory device and method for manufacturing the same
#3184Memory device and method for manufacturing the same
#3185Semiconductor device having buried oxide film
#3186SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
#3187SEMICONDUCTOR DEVICE AND SEMICONDUCTOR SUBSTRATE
#3188Strained-silicon-on-insulator single-and double-gate MOSFET and method for forming the same
#3189Transistor and semiconductor device
#3190Defect-free hybrid orientation technology for semiconductor devices
#3191THIN SILICON SINGLE DIFFUSION FIELD EFFECT TRANSISTOR FOR ENHANCED DRIVE PERFORMANCE WITH STRESS FILM LINERS
#3192ISOLATING BACK GATES OF FULLY DEPLETED SOI DEVICES
#3193Compact multi-port cam cell implemented in 3D vertical integration
#3194Semiconductor device
#3195Integrated circuit chip with FETs having mixed body thicknesses and method of manufacture thereof
#3196Structure and design structure having isolated back gates for fully depleted SOI devices
#3197High density stable static random access memory
#3198Switching device and testing apparatus
#3199Method to reduce parastic capacitance in a metal high dielectric constant (MHK) transistor
#3200Structures having lattice-mismatched single-crystalline semiconductor layers on the same lithographic level and methods of manufacturing the same
#3201Bipolar transistor and back-gated transistor structure and method
#3202Methods for fabricating SOI devices
#3203Method of making wafer structure for backside illuminated color image sensor
#3204Negative differential resistance device with high PVCR and fast switching speed and memory using the same
#3205SRAM memory cell having transistors integrated at several levels and the threshold voltage VT of which is dynamically adjustable
#3206Storage cell having a T-shaped gate electrode and method for manufacturing the same
#3207Circuit with transistors integrated in three dimensions and having a dynamically adjustable threshold voltage VT
#3208Capacitive sensor with stress relief that compensates for package stress
#3209Stacked transistors and process
#3210ULTRA-THIN SOI CMOS WITH RAISED EPITAXIAL SOURCE AND DRAIN AND EMBEDDED SIGE PFET EXTENSION
#3211SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
#3212SOI deep trench capacitor employing a non-conformal inner spacer
#3213Wafer For Backside Illumination Type Solid Imaging Device, Production Method Thereof And Backside Illumination Solid Imaging Device
#3214Method for Making Transistors and the Device Thereof
#3215Structure and method for buried inductors for ultra-high resistivity wafers for SOI/RF SiGe applications
#3216CMOS DEVICE WITH METAL AND SILICIDE GATE ELECTRODES AND A METHOD FOR MAKING IT
#3217Methods of fabricating a device structure for use as a memory cell in a non-volatile random access memory
#3218SOI device with improved storage capacity and method for manufacturing the same
#3219FinFETs having dielectric punch-through stoppers
#3220Circuit and methods to improve the operation of SOI devices
#3221Semiconductor substrate, semiconductor device, and method for manufacturing the semiconductor device
#3222Transistor with high-k dielectric sidewall spacer
#3223Structure and method for semiconductor power devices
#3224Optical communication integration
#3225Semiconductor device including a P-type field-effect transistor
#3226Integrated circuit including a body transistor and method
#3227Semiconductor array and method for manufacturing a semiconductor array
#3228Semiconductor device with multi-trench separation region
#3229P-channel germanium on insulator (GOI) one transistor memory cell
#3230Semiconductor-on-insulator device structures with a body-to-substrate connection for enhanced electrostatic discharge protection, and design structures for such semiconductor-on-insulator device structures
#3231Metallized conductive strap spacer for SOI deep trench capacitor
#3232Structure and method for elimination of process-related defects in poly/metal plate capacitors
#3233Semiconductor device and method for manufacturing same
#3234Simultaneous buried strap and buried contact via formation for SOI deep trench capacitor
#3235Circuit device
#3236Method, structure and design structure for customizing history effects of SOI circuits
#3237SOI TRANSISTOR WITH FLOATING BODY FOR INFORMATION STORAGE HAVING ASYMMETRIC DRAIN/SOURCE REGIONS
#3238WAFER FOR BACKSIDE ILLUMINATION TYPE SOLID IMAGING DEVICE, PRODUCTION METHOD THEREOF AND BACKSIDE ILLUMINATION SOLID IMAGING DEVICE
#3239Methods of forming lines of capacitorless one transistor DRAM cells, methods of patterning substrates, and methods of forming two conductive lines
#3240Semiconductor device with cross-talk isolation using M-cap and method thereof
#3241METHOD OF FABRICATING A SEMICONDUCTOR DEVICE
#3242Hybrid orientation substrate with stress layer
#3243Semiconductor structures with rare-earths
#3244Three-dimensional memory devices and methods of manufacturing and operating the same
#3245Semiconductor device
#3246Field effect structure including carbon alloyed channel region and source/drain region not carbon alloyed
#3247Charge breakdown avoidance for MIM elements in SOI base technology and method
#3248SEMICONUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
#3249Semiconductor Device Having a Floating Body Transistor and Method for Manufacturing the Same
#3250Cell device and cell string for high density NAND flash memory
#3251Semiconductor Device and Method for Manufacturing the Same
#3252IC Substrate and Method of Manufacture of IC Substrate
#3253Method and resultant structure for floating body memory on bulk wafer
#3254Merged field effect transistor cells for switching
#3255SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
#3256Method of fabricating non-volatile memory device having separate charge trap patterns
#3257Method of fabricating PMOS and NMOS transistor on the same substrate
#3258Reduction of memory instability by local adaptation of re-crystallization conditions in a cache area of a semiconductor device
#3259Semiconductor device comprising a metal gate stack of reduced height and method of forming the same
#3260CMOS DEVICE COMPRISING AN NMOS TRANSISTOR WITH RECESSED DRAIN AND SOURCE AREAS AND A PMOS TRANSISTOR HAVING A SILICON/GERMANIUM MATERIAL IN THE DRAIN AND SOURCE AREAS
#3261Modified hybrid orientation technology
#3262SOI device having an increasing charge storage capacity of transistor bodies and method for manufacturing the same
#3263SOI devices
#3264TEMPERATURE MONITORING IN A SEMICONDUCTOR DEVICE BY USING AN PN JUNCTION BASED ON SILICON/GERMANIUM MATERIAL
#3265Semiconductor chips having redistributed power/ground lines directly connected to power/ground lines of internal circuits and methods of fabricating the same
#3266SOI field effect transistor with a back gate for modulating a floating body
#3267Super hybrid SOI CMOS devices
#3268Semiconductor devices and semiconductor apparatuses including the same
#3269Vertical wrap-around-gate field-effect-transistor for high density, low voltage logic and memory array
#3270Semiconductor signal processing device
#3271Hybrid orientation scheme for standard orthogonal circuits
#3272Apparatus for using a well current source to effect a dynamic threshold voltage of a MOS transistor
#3273Semiconductor device
#3274Integrated circuit having memory cells including gate material having high work function, and method of manufacturing same
#3275Semiconductor device having SOI structure
#3276Method for forming a substrate contact for advanced SOI devices based on a deep trench capacitor configuration
#3277Semiconductor device and method of manufacturing the same
#3278Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same
#3279SEMICONDUCTOR DEVICE USING ELEMENT ISOLATION REGION OF TRENCH ISOLATION STRUCTURE AND MANUFACTURING METHOD THEREOF
#3280Method of creating a strained channel region in a transistor by deep implantation of strain-inducing species below the channel region
#3281Vertical system integration
#3282Semiconductor substrate, semiconductor device, and manufacturing methods for them
#3283Capacitorless DRAM on bulk silicon
#3284Solid-state image pickup element and solid-state image pickup device
#3285Semiconductor memory device
#3286Structure and method for improved SRAM interconnect
#3287Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same
#3288Anisotropic stress generation by stress-generating liners having a sublithographic width
#3289SOI semiconductor components and methods for their fabrication
#3290SEMICONDUCTOR DEVICE WITH AN SOI STRUCTURE
#3291Semiconductor memory device and method for fabricating the same
#3292SEMICONDUCTOR MEMORY DEVICE USING SILICON NITRIDE FILM AS CHARGE STORAGE LAYER OF STORAGE TRANSISTOR AND MANUFACTURING METHOD THEREOF
#3293Silicon on insulator device and method for fabricating the same
#3294Flash memory cell string
#3295SOI BASED INTEGRATED CIRCUIT AND METHOD FOR MANUFACTURING
#3296Methods of forming semiconductor devices having self-aligned bodies
#3297Method and apparatus for fabricating a high-performance band-edge complementary metal-oxide-semiconductor device
#3298Methods of designing an integrated circuit on corrugated substrate
#3299Protection against charging damage in hybrid orientation transistors
#3300Design structures for high-voltage integrated circuits