208009 ⎘
Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body the substrate comprising an insulating body on a semiconductor body, e.g. SOI
Semiconductor-on-insulator high-voltage device structures, methods of fabricating such device structures, and design structures for high-voltage circuits
#3302Device structures for a metal-oxide-semiconductor field effect transistor and methods of fabricating such device structures
#3303Photosensor and photo IC equipped with same
#3304Hybrid orientation substrate compatible deep trench capacitor embedded DRAM
#3305Fully-depleted (FD)(SOI) MOSFET access transistor and method of fabrication
#3306Apparatus and method for improved leakage current of silicon on insulator transistors using a forward biased diode
#3307SEMICONDUCTOR DEVICE HAVING FIN TRANSISTOR AND PLANAR TRANSISTOR AND ASSOCIATED METHODS OF MANUFACTURE
#3308Three terminal nonvolatile memory device with vertical gated diode
#3309INTEGRATED CIRCUIT AND METHOD OF MANUFACTURING AN INTEGRATED CIRCUIT
#3310NONVOLATILE SEMICONDUCTOR STORAGE DEVICE AND METHOD OF MANUFACTURING THE SAME
#3311Hetero-junction bipolar transistor (HBT) and structure thereof
#3312STRAINED-CHANNEL FET COMPRISING TWIST-BONDED SEMICONDUCTOR LAYER
#3313Method of preparing active silicon regions for CMOS or other devices
#3314RAM CELL INCLUDING A TRANSISTOR WITH FLOATING BODY FOR INFORMATION STORAGE HAVING ASYMMETRIC DRAIN/SOURCE EXTENSIONS
#3315Method for manufacturing semiconductor device
#3316METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
#3317Lateral bipolar transistor
#3318Semiconductor device
#3319Semiconductor device heat dissipation structure
#3320Semiconductor array and method for manufacturing a semiconductor array
#3321Method of fabricating multi-gate semiconductor devices with improved carrier mobility
#3322Semiconductor device
#3323Semiconductor apparatus
#3324Semiconductor device and manufacturing method of semiconductor device
#3325SEMICONDUCTOR MEMORY DEVICE HAVING A FLOATING BODY CAPACITOR AND METHOD OF MANUFACTURING THE SAME
#3326Semiconductor memory device
#3327Semiconductor on insulator (SOI) switching circuit
#3328Structures and methods for manufacturing of dislocation free stressed channels in bulk silicon and SOI MOS devices by gate stress engineering with SiGe and/or Si:C
#3329Integrated circuit having memory cell array, and method of manufacturing same
#3330Grounding front-end-of-line structures on a SOI substrate
#3331Semiconductor on insulator (SOI) structure with more predictable junction capacitance and method for fabrication
#3332Independently controlled, double gate nanowire memory cell with self-aligned contacts
#3333INTEGRATED CIRCUIT SYSTEM EMPLOYING DIFFUSED SOURCE/DRAIN EXTENSIONS
#3334Hybrid semiconductor structure
#3335Memory array having a programmable word length, and method of operating same
#3336Integrated circuit having memory cell array including barriers, and method of manufacturing same
#3337Semiconductor storage device and manufacturing method thereof
#3338Electronic tag chip
#3339High ion/Ioff SOI MOSFET using body voltage control
#3340Programmable structured arrays
#3341Semiconductor device including SRAM
#3342Semiconductor device and method for controlling semiconductor device
#3343Fin-type field effect transistor and semiconductor device
#3344Non-volatile semiconductor memory device and method of manufacturing the same
#3345SEMICONDUCTOR MEMORY
#3346In-line light sensor
#3347Method for fabricating isolated integrated semiconductor structures
#3348Semiconductor device having SOI substrate and method for manufacturing the same
#3349Zero capacitor RAM with reliable drain voltage application and method for manufacturing the same
#3350Semiconductor device and method for manufacturing the same
#3351Method of manufacturing a semiconductor device including a semiconductor substrate with stripes of different crystal plane directions
#3352Method and apparatus for making coplanar isolated regions of different semiconductor materials on a substrate
#3353Semiconductor device with high-breakdown-voltage transistor
#3354DUAL WIRED INTEGRATED CIRCUIT CHIPS
#3355SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#3356Integrated circuit comprising a transistor and a capacitor, and fabrication method
#3357EEPROM and method of manufacturing the same
#3358Semiconductor device
#3359Floating body memory cell system and method of manufacture
#3360Transient voltage suppressor manufactured in silicon on oxide (SOI) layer
#3361Semiconductor memory device and manufacturing method thereof
#3362Semiconductor device including a plurality of memory cells with no difference in erasing properties
#3363CMOS EPROM and EEPROM devices and programmable CMOS inverters
#3364Semiconductor integrated circuit devices having high-Q wafer back-side capacitors
#3365CMOS structure and method including multiple crystallographic planes
#3366SOI device having a substrate diode formed by reduced implantation energy
#3367Semiconductor memory having both volatile and non-volatile functionality and method of operating
#3368Determining history state of data in data retaining device based on state of partially depleted silicon-on-insulator
#3369Semiconductor structure and method of manufacture
#3370Semiconductor device and method for fabricating the same
#3371SOI CMOS circuits with substrate bias
#3372Semiconductor memory having both volatile and non-volatile functionality and method of operating
#3373Embedded DRAM integrated circuits with extremely thin silicon-on-insulator pass transistors
#3374Multiple crystallographic orientation semiconductor structures
#3375Floating body field-effect transistors, and methods of forming floating body field-effect transistors
#3376One-transistor cell semiconductor on insulator random access memory
#3377Electronically scannable multiplexing device
#3378Semiconductor device
#3379Integrated circuit arrangement comprising a field effect transistor, especially a tunnel field effect transistor
#3380PROCESS FOR FABRICATING A FIELD-EFFECT TRANSISTOR WITH DOPING SEGREGATION USED IN SOURCE AND/OR DRAIN
#3381Semiconductor device and method for manufacturing the same
#3382Semiconductor photodetectors
#3383Non-volatile memory device, method of operating the same, and method of fabricating the same
#3384SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#3385Stacked thin film transistor, non-volatile memory devices and methods for fabricating the same
#3386Semiconductor storage device and manufacturing method thereof
#3387SOI substrate contact with extended silicide area
#3388Electronic device and method of biasing
#3389Non-volatile semiconductor storage device and method of manufacturing the same
#3390Nonvolatile memory and manufacturing method thereof
#3391Field effect transistor and method for manufacturing the same
#3392Semiconductor array including a matrix of cells and a method of making a semiconductor array having a matrix of cells
#3393Non-volatile semiconductor memory based on enhanced gate oxide breakdown
#3394Level shift circuit and semiconductor device thereof
#3395Shallow trench isolation structure compatible with SOI embedded DRAM
#3396Semiconductor device having decreased contact resistance
#3397Stress enhanced semiconductor device and methods for fabricating same
#3398Display device and method for manufacturing the same
#3399Semiconductor device and method of fabricating the same
#3400Semiconductor device and method of fabricating the same
#3401HARDENED TRANSISTORS IN SOI DEVICES
#3402Metal High-K (MHK) Dual Gate Stress Engineering Using Hybrid Orientation (HOT) CMOS
#3403SOI CMOS compatible multiplanar capacitor
#3404Structures having lattice-mismatched single-crystalline semiconductor layers on the same lithographic level and methods of manufacturing the same
#3405Method and structures for accelerated soft-error testing
#3406Metal high-K transistor having silicon sidewall for reduced parasitic capacitance, and process to fabricate same
#3407NON-VOLATILE MEMORY DEVICES
#3408Method and structure for simultaneously fabricating selective film and spacer
#3409NAND type nonvolatile semiconductor memory device having sideface electrode shared by memory cells
#3410Design structure for a digital-to-analog converter using dual-gate transistors
#3411SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF
#3412SEMICONDUCTOR DEVICE
#3413Inverted nonvolatile memory device, stack module, and method of fabricating the same
#3414Semiconductor device and methods for fabricating same
#3415CMOS inverter coupling circuit comprising vertical transistors
#3416Method for fabricating nanocoils
#3417SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING THE SAME AND RESISTOR
#3418Semiconductor device
#3419Semiconductor device and the method of manufacturing the same
#3420SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#3421Dual port gain cell with side and top gated read transistor
#3422Bipolar transistor FINFET technology
#3423Ultrathin SOI CMOS devices employing differential STI liners
#3424Semiconductor integrated circuit device and fabrication method thereof
#3425Low crosstalk substrate for mixed-signal integrated circuits
#3426Semiconductor device and method for fabricating the same
#3427Semiconductor devices and methods of fabricating the same including forming a fin with first and second gates on the sidewalls
#3428Hybrid orientation CMOS with partial insulation process
#3429Semiconductor device, and method for manufacturing the same
#3430Method for integrating silicon-on-nothing devices with standard CMOS devices
#3431METHOD FOR FORMING A DEEP TRENCH IN AN SOI DEVICE BY REDUCING THE SHIELDING EFFECT OF THE ACTIVE LAYER DURING THE DEEP TRENCH ETCH PROCESS
#3432Hybrid orientation substrate and method for fabrication thereof
#3433NOR-type channel-program channel-erase contactless flash memory on SOI
#3434Buried metal-semiconductor alloy layers and structures and methods for fabrication thereof
#3435Integrated circuit employing variable thickness film
#3436Integrated circuit including a semiconductor assembly in thin-SOI technology
#3437Vertical floating body cell of a semiconductor device and method for fabricating the same
#3438Capacitorless DRAM and methods of operating the same
#3439Liquid Washing or Cleaning Composition Comprising Particulate Peracid Bleach
#3440Tri-gate integration with embedded floating body memory cell using a high-K dual metal gate
#3441Semiconductor integrated circuit, semiconductor integrated circuit control method, and signal transmission circuit
#3442Semiconductor device having particular impurity density characteristics
#3443Semiconductor memory device manufacturing method and semiconductor memory device
#3444Semiconductor device and method for manufacturing the same
#3445FinFET SRAM with asymmetric gate and method of manufacture thereof
#3446Semiconductor device and method of manufacturing the same
#3447Lateral Power MOSFET With Integrated Schottky Diode
#3448Method of high voltage operation of field effect transistor
#3449SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURE THEREOF AND SEMICONDUCTOR INTEGRATED CIRCUIT
#3450Protective bumper adapted for minimizing damage to materials carried by a materials handling vehicle
#3451Semiconductor device with three-dimensional field effect transistor structure
#3452SRAM device
#3453Method of manufacturing semiconductor storage device
#3454THIN FILM TRANSISTORS AND FABRICATION METHODS
#3455Semiconductor device
#3456Semiconductor device having floating body element and bulk body element
#3457SILICON PHOTODETECTOR AND METHOD FOR FORMING THE SAME
#3458Reducing transistor junction capacitance by recessing drain and source regions
#3459Semiconductor device and method of fabricating the same
#3460Method of forming an SOI substrate contact
#3461Method of forming a guard ring or contact to an SOI substrate
#3462NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
#3463Hybrid strained orientated substrates and devices
#3464Structures and methods of forming SiGe and SiGeC buried layer for SOI/SiGe technology
#3465Method of forming alternating regions of Si and SiGe or SiGeC on a buried oxide layer on a substrate
#3466Method for fabricating semiconductor device and semiconductor device with separation along peeling layer
#3467SOI device with charging protection and methods of making same
#3468Semiconductor device, method of manufacturing same and method of designing same
#3469Fabrication of semiconductor architecture having field-effect transistors especially suitable for analog applications
#3470Hybrid strained orientated substrates and devices
#3471Semiconductor architecture having field-effect transistors especially suitable for analog applications
#3472CMOS transistors with differential oxygen content high-k dielectrics
#3473Transistor with reduced charge carrier mobility
#3474Semiconductor apparatus and complimentary MIS logic circuit
#3475Method for manufacturing NAND-type semiconductor storage device
#3476Silicon on insulator (SOI) wafer and process for producing same
#3477MuGFET circuit for increasing output resistance
#3478Super hybrid SOI CMOS devices
#3479Integrated circuit system with triode
#3480Dual work-function single gate stack
#3481Silicon on insulator (SOI) wafer and process for producing same
#3482Semiconductor storage device and semiconductor integrated circuit
#3483Semiconductor device
#3484MOS structures with remote contacts and methods for fabricating the same
#3485Semiconductor memory device and manufacturing method thereof
#3486Strained silicon directly-on-insulator substrate with hybrid crystalline orientation and different stress levels
#3487Electronic device including a transistor structure having an active region adjacent to a stressor layer
#3488Nanosilicon semiconductor substrate manufacturing method and semiconductor circuit device using nanosilicon semiconductor substrate manufactured by the method
#3489Semiconductor device having a fin structure and method of manufacturing the same
#3490MULTIPLE WAFER LEVEL MULTIPLE PORT REGISTER FILE CELL
#3491Integrated circuit on corrugated substrate
#3492Electrical fuse with metal silicide pipe under gate electrode
#3493Semiconductor device with a plurality of isolated conductive films
#3494USE OF ALLOYS TO PROVIDE LOW DEFECT GATE FULL SILICIDATION
#3495MULTI-WAFER 3D CAM CELL
#3496Manufacturing method of SOI substrate and manufacturing method of semiconductor device
#3497Vertical system integration
#3498Compact multi-port CAM cell implemented in 3D vertical integration
#3499Hybrid oriented substrates and crystal imprinting methods for forming such hybrid oriented substrates
#3500Non-volatile semiconductor storage device and manufacturing method thereof
#3501Method of manufacturing a semiconductor device with a gate electrode having a laminate structure
#3502Layer Transfer Process and Functionally Enhanced Integrated Circuits Products Thereby
#3503SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
#3504Devices with Metal Gate, High-k Dielectric, and Butted Electrodes
#3505Semiconductor memory device and manufacturing method thereof
#3506Dual substrate orientation or bulk on SOI integrations using oxidation for silicon epitaxy spacer formation
#3507Step height reduction between SOI and EPI for DSO and BOS integration
#3508Formation of dummy features and inductors in semiconductor fabrication
#3509Dual metal gates for mugfet device
#3510SONOS memory device with reduced short-channel effects
#3511Semiconductor storage element and manufacturing method thereof
#3512Conductive spacers for semiconductor devices and methods of forming
#3513SOI device having a substrate diode with process tolerant configuration and method of forming the SOI device
#3514Integrated circuits and power supplies
#3515IC chip and its manufacturing method
#3516BUILDING FULLY-DEPLETED AND BULK TRANSISTORS ON SAME CHIP
#3517BUILDING FULLY-DEPLETED AND PARTIALLY-DEPLETED TRANSISTORS ON SAME CHIP
#3518Non-Volatile Memory Device Having a Gap in the Tunnuel Insulating Layer and Method of Manufacturing the Same
#3519Embedded silicon germanium using a double buried oxide silicon-on-insulator wafer
#3520Hybrid fin field-effect transistor structures and related methods
#3521Methods for fabricating a stress enhanced semiconductor device having narrow pitch and wide pitch transistors
#3522SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
#3523Separate layer formation in a semiconductor device
#3524Vertical bipolar transistor with a majority carrier accumulation layer as a subcollector for SOI BiCMOS with reduced buried oxide thickness for low-substrate bias operation
#3525Shallow trench isolation for SOI structures combining sidewall spacer and bottom liner
#3526Structure and method of fabricating a hybrid substrate for high-performance hybrid-orientation silicon-on-insulator CMOS devices
#3527Ion implantation combined with in situ or ex situ heat treatment for improved field effect transistors
#3528Stacked SONOS memory
#3529Hybrid substrates and methods for forming such hybrid substrates
#3530Semiconductor device, optical measuring and detecting device, and method of manufacturing the same
#3531Strained silicon CMOS on hybrid crystal orientations
#3532Fabrication process for silicon-on-insulator field effect transistors using high temperature nitrogen annealing
#3533SOI semiconductor device with body contact and method thereof
#3534Vertical system integration
#3535Vertical system integration
#3536MIXED ORIENTATION AND MIXED MATERIAL SEMICONDUCTOR-ON-INSULATOR WAFER
#3537Electronically scannable multiplexing device
#3538Semiconductor storage device and driving method thereof
#3539Integration of strained Ge into advanced CMOS technology
#3540CMOS structure for body ties in ultra-thin SOI (UTSOI) substrates
#3541ELECTRONIC DEVICE AND METHOD
#3542Device fabrication by anisotropic wet etch
#3543Method for forming multi-gate non-volatile memory devices using a damascene process
#3544Method for manufacturing semiconductor device
#3545Method of fabricating non-volatile memory device
#3546Semiconductor device production process
#3547Semiconductor memory device
#3548Semiconductor device
#3549Structure of high-frequency components with low stray capacitances
#3550SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
#3551Semiconductor device with bipolar transistor
#3552Fully Depleted SOI Multiple Threshold Voltage Application
#3553Manufacturing process for zero-capacitor random access memory circuits
#3554SOI transistor having drain and source regions of reduced length and a stressed dielectric material adjacent thereto
#3555Semiconductor memory device
#3556NONVOLATILE SEMICONDUCTOR MEMORY DEVICE, METHOD FOR MANUFACTURING THE SAME, AND SEMICONDUCTOR DEVICE
#3557Structure and method for strained transistor directly on insulator
#3558High breakdown voltage semiconductor circuit device
#3559Vertical system integration
#3560Methods of forming integrated circuitry
#3561Apparatus and methods for integrated circuit with devices with body contact and devices with electrostatic discharge protection
#3562Semiconductor memory device and manufacturing process therefore
#3563Radiation-hardened silicon-on-insulator CMOS device, and method of making the same
#3564Semiconductor device and boost circuit
#3565Nonvolatile semiconductor memory device
#3566Nonvolatile semiconductor memory device
#3567Vertical trench memory cell with insulating ring
#3568Methods of forming vertical transistors
#3569METHOD OF FABRICATING SEMICONDUCTOR DEVICE
#3570Semiconductor integrated circuit
#3571Semiconductor device, semiconductor display device, and manufacturing method of semiconductor device
#3572Semiconductor device
#3573Semiconductor-on-insulator(SOI) structures including gradient nitrided buried oxide (BOX)
#3574SUBGROUND RULE STI FILL FOR HOT STRUCTURE
#3575Radio frequency semiconductor device
#3576Trench-edge-defect-free recrystallization by edge-angle-optimized solid phase epitaxy: method and applications to hybrid orientation substrates
#3577Electrostatic discharge protection device and method of fabricating same
#3578Semiconductor device formed on (111) surface of a Si crystal and fabrication process thereof
#3579Defect-free hybrid orientation technology for semiconductor devices
#3580Method for preparing 2-dimensional semiconductor devices for integration in a third dimension
#3581Radio frequency isolation for SOI transistors
#3582Heterogeneous Semiconductor Substrate
#3583Latch-up resistant semiconductor structures on hybrid substrates and methods for forming such semiconductor structures
#3584ULTRA-THIN SOI CMOS WITH RAISED EPITAXIAL SOURCE AND DRAIN AND EMBEDDED SIGE PFET EXTENSION
#3585Semiconductor device and manufacturing method thereof
#3586Dual wired integrated circuit chips
#3587Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same
#3588Semiconductor memory device
#3589Memory device and manufacturing method of the same
#3590METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
#3591High performance field effect transistors on SOI substrate with stress-inducing material as buried insulator and methods
#3592Forming semiconductor fins using a sacrificial fin
#3593Semiconductor fin integration using a sacrificial fin
#3594Semiconductor memory device and method of operating same
#3595Structure incorporating latch-up resistant semiconductor device structures on hybrid substrates
#3596Semiconductor substrate, semiconductor device, method for manufacturing semiconductor substrate, and method for manufacturing semiconductor device
#3597FIELD EFFECT TRANSISTOR ARRANGEMENT AND METHOD OF PRODUCING A FIELD EFFECT TRANSISTOR ARRANGEMENT
#3598Semiconductor device
#3599Semiconductor device including a memory
#3600Independently-double-gated transistor memory (IDGM)