208009 ⎘
Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body the substrate comprising an insulating body on a semiconductor body, e.g. SOI
Hybrid orientation SOI substrates, and method for forming the same
#3602SEMICONDUCTOR INTEGRATED CIRCUIT
#3603Methods of forming semiconductor constructions
#3604SHALLOW TRENCH ISOLATION FILL BY LIQUID PHASE DEPOSITION OF SiO2
#3605Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors
#3606Stressed SOI FET having tensile and compressive device regions
#3607Semiconductor structure and method of forming the structure
#3608Semiconductor device and method for manufacturing the same
#3609Buried stress isolation for high-performance CMOS technology
#3610SOI type semiconductor device having a protection circuit
#3611One transistor DRAM device and method of forming the same
#3612Silicon-on-insulator (“SOI”) transistor test structure for measuring body-effect
#3613METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
#3614Semiconductor device with electrically floating body
#3615Pseudomorphic Si/SiGe/Si body device with embedded SiGe source/drain
#3616Electronic device including insulating layers having different strains
#3617Two-sided semiconductor-on-insulator structures and methods of manufacturing the same
#3618Semiconductor storage device and manufacturing method thereof
#3619SEMICONDUCTOR MEMORY DEVICE
#3620Transistor with embedded silicon/germanium material on a strained semiconductor on insulator substrate
#3621Non-volatile semiconductor memory based on enhanced gate oxide breakdown
#3622MOSFET on SOI device
#3623SEMICONDUCTOR DEVICE
#3624CMOS devices having channel regions with a V-shaped trench and hybrid channel orientations, and method for forming the same
#3625Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same
#3626Subground rule STI fill for hot structure
#3627Method of forming stressed SOI FET having doped glass box layer using sacrificial stressed layer
#3628Non-volatile semiconductor memory and method for fabricating a non-volatile semiconductor memory
#3629SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
#3630Device selection circuitry constructed with nanotube ribbon technology
#3631Integrated assist features for epitaxial growth bulk/SOI hybrid tiles with compensation
#3632Integrated assist features for epitaxial growth bulk tiles with compensation
#3633Electrically conductive path forming below barrier oxide layer and integrated circuit
#3634Sub-lithographics opening for back contact or back gate
#3635Semiconductor device
#3636Wafer, semiconductor device, and fabrication methods therefor
#3637Structure and method for MOSFET gate electrode landing pad
#3638DYNAMIC RANDOM ACCESS MEMORY CELL AND MANUFACTURING METHOD THEREOF
#3639Light erasable memory and method therefor
#3640Structure and method for mobility enhanced MOSFETs with unalloyed silicide
#3641Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same
#3642Silicon-on-insulator chip with multiple crystal orientations
#3643SIMULTANEOUSLY FORMING HIGH-SPEED AND LOW-POWER MEMORY DEVICES ON A SINGLE SUBSTRATE
#3644Methods of forming semiconductor devices with extended active regions
#3645Semiconductor device, method of controlling the same, and method of manufacturing the same
#3646Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same
#3647Soft error reduction of CMOS circuits on substrates with hybrid crystal orientation using buried recombination centers
#3648Convex shaped thin-film transistor device
#3649Method of combining floating body cell and logic transistors
#3650Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same
#3651Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same
#3652Method for manufacturing a SOI substrate associating silicon based areas and GaAs based areas
#3653Non-volatile memory device and method of operating the same
#3654Method and resultant structure for floating body memory on bulk wafer
#3655Semiconductor device including an active region and two layers having different stress characteristics
#3656Semiconductor memory and manufacturing method thereof
#3657Nonvolatile memory device and method of operating the same
#3658Flash NAND memory cell array with charge storage elements positioned in trenches
#3659Floating body memory cell having gates favoring different conductivity type regions
#3660ID label, ID card, and ID tag
#3661Crystal imprinting methods for fabricating substrates with thin active silicon layers
#3662ELECTROSTATIC DISCHARGE PROTECTION DEVICE AND METHOD OF FABRICATING SAME
#3663Isolation spacer for thin SOI devices
#3664SEMICONDUCTOR INTEGRATED CIRCUIT AND MANUFACTURING METHOD THEREFOR
#3665Isolated multigate FET circuit blocks with different ground potentials
#3666Isolation spacer for thin SOI devices
#3667Floating body memory and method of fabricating the same
#3668SEMICONDUCTOR DEVICE STRUCTURE WITH ACTIVE REGIONS HAVING DIFFERENT SURFACE DIRECTIONS
#3669NMOS device, PMOS device, and SiGe HBT device formed on SOI substrate and method of fabricating the same
#3670Method for fabricating SOI device
#3671Semiconductor memory device
#3672Semiconductor storage unit, semiconductor device and display device as well as liquid crystal display and image receiving apparatus
#3673Device patterned with sub-lithographic features with variable widths
#3674Semiconductor device and manufacturing method thereof
#3675Integrated circuit having a top side wafer contact and a method of manufacture therefor
#3676Semiconductor device
#3677Semiconductor Device and Manufacturing Method Thereof
#3678Dual wired integrated circuit chips
#3679Semiconductor device
#3680Semiconductor device and manufacturing method thereof
#3681Semiconductor device fabrication method and semiconductor device
#3682Semiconductor substrate including a plurality of insulating regions, semiconductor device having the same, and method of manufacturing the device
#3683Semiconductor device formed on (111) surface of a Si crystal and fabrication process thereof
#3684Methods for forming III-V semiconductor device structures
#3685Process of forming an electronic device including a conductive structure extending through a buried insulating layer
#3686Methods of forming vertical transistors
#3687CMOS device with metal and silicide gate electrodes and a method for making it
#3688Reducing Crystal Defects from Hybrid Orientation Technology During Semiconductor Manufacture
#3689Electronic device including a conductive structure extending through a buried insulating layer
#3690SEMICONDUCTOR SUBSTRATE, SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
#3691TRANSISTOR HAVING SOURCE/DRAIN REGION ONLY UNDER SIDEWALL SPACER EXCEPT FOR CONTACTS AND METHOD
#3692Memory device and semiconductor device
#3693Semiconductor device, logic circuit and electronic equipment
#3694CMOS structure including topographic active region
#3695Method of fabricating a stressed MOSFET by bending SOI region
#3696Method of enhancing hole mobility
#3697Method of fabricating a semiconductor device
#3698Method of fabricating a semiconductor device
#3699Hybrid orientation substrate and method for fabrication of thereof
#3700Integration of a floating body memory on SOI with logic transistors on bulk substrate
#3701HYBRID CRYSTALLOGRAPHIC SURFACE ORIENTATION SUBSTRATE HAVING ONE OR MORE SOI REGIONS AND/OR BULK SEMICONDUCTOR REGIONS
#3702SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF
#3703Nonvolatile semiconductor memory device and method for manufacturing the same
#3704Electronic device including a heterojunction region
#3705Method of providing protection against charging damage in hybrid orientation transistors
#3706Planar substrate with selected semiconductor crystal orientations formed by localized amorphization and recrystallization of stacked template layers
#3707Process charging and electrostatic damage protection in silicon-on-insulator technology
#3708Non-volatile memory device having separate charge trap patterns and method of fabricating the same
#3709FET Channel Having a Strained Lattice Structure Along Multiple Surfaces
#3710FET Channel Having a Strained Lattice Structure Along Multiple Surfaces
#3711Phosphorous doping methods of manufacturing field effect transistors having multiple stacked channels
#3712Method of fabricating vertical body-contacted SOI transistor
#3713SOI BIPOLAR TRANSISTORS WITH REDUCED SELF HEATING
#3714MULTIPLE LAYER AND CRYSTAL PLANE ORIENTATION SEMICONDUCTOR SUBSTRATE
#3715Integrated circuits
#3716Multiple layer and crystal plane orientation semiconductor substrate
#3717Ultra-thin oxide bonding for S1 to S1 dual orientation bonding
#3718Anodization
#3719Semiconductor device and fabrication method thereof
#3720Method of forming an implantable electronic device chip level hermetic and biocompatible electronics package using SOI wafers
#3721Semiconductor device and method for fabricating a semiconductor device
#3722Decoder for a stationary switch machine
#3723Vertical channel transistor structure and manufacturing method thereof
#3724Dual work-function single gate stack
#3725Semiconductor structures including multiple crystallographic orientations and methods for fabrication thereof
#3726DUAL-GATE MEMORY DEVICE AND OPTIMIZATION OF ELECTRICAL INTERACTION BETWEEN FRONT AND BACK GATES TO ENABLE SCALING
#3727Self-aligned strap for embedded trench memory on hybrid orientation substrate
#3728MOS transistor on an SOI substrate with a body contact and a gate insulating film with variable thickness
#3729Memory devices and memory systems having the same
#3730SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#3731SOI semiconductor components and methods for their fabrication
#3732Bottom-gate sonos-type cell having a silicide gate
#3733Transistor surround gate structure with silicon-on-insulator isolation for memory cells, memory arrays, memory devices and systems and methods of forming same
#3734Strained Si/SiGe/SOI islands and processes of making same
#3735High-voltage MOS device improvement by forming implantation regions
#3736Semiconductor device
#3737Semiconductor memory and method for manufacturing a semiconductor memory
#3738Method of fabricating a semiconductor device
#3739Integrated circuit having a drive circuit
#3740Semiconductor device
#3741Semiconductor memory device and semiconductor integrated circuit
#3742Electronically scannable multiplexing device
#3743Method of fabricating a semiconductor device
#3744Insulated-gate field-effect thin film transistors
#3745Semiconductor device
#3746Semiconductor device and manufacturing method of the same
#3747Method for producing multi-gate field-effect transistor with fin structure having drain-extended MOS field-effect transistor
#3748SEMICONDUCTOR DEVICE AND METHOD FOR MAKING THE SAME
#3749Structures and methods for manufacturing of dislocation free stressed channels in bulk silicon and SOI CMOS devices by gate stress engineering with SiGe and/or Si:C
#3750Vertical SOI transistor memory cell and method of forming the same
#3751CMOS devices incorporating hybrid orientation technology (HOT) with embedded connectors
#3752Strained-channel fin field effect transistor (FET) with a uniform channel thickness and separate gates
#3753Variable Threshold Transistor For The Schottky FPGA And Multilevel Storage Cell Flash Arrays
#3754Apparatus and methods for multi-gate silicon-on-insulator transistors
#3755Semiconductor device
#3756Examination apparatus for biological sample and chemical sample
#3757Strained-channel fin field effect transistor (FET) with a uniform channel thickness and separate gates
#3758SEMICONDUCTOR ELEMENT AND SEMICONDUCTOR MEMORY DEVICE USING THE SAME
#3759Method for fabricating semiconductor device
#3760Semiconductor device
#3761Method of manufacturing semiconductor device having impurity region under isolation region
#3762Semiconductor apparatus having a semicondutor element with a high dielectric constant film
#3763SEMICONDUCTOR DEVICE HAVING CMOS DEVICE
#3764THREE-DIMENSIONAL SEMICONDUCTOR STRUCTURE AND METHOD FOR FABRICATION THEREOF
#3765Semiconductor structure with enhanced performance using a simplified dual stress liner configuration
#3766Electrically erasable and programmable read only memory device comprising common source region and method of manufacturing same
#3767Method of fabricating a semiconductor device
#3768Coplanar silicon-on-insulator (SOI) regions of different crystal orientations and methods of making the same
#3769Hybrid oriented substrates and crystal imprinting methods for forming such hybrid oriented substrates
#3770Semiconductor structures with body contacts and fabrication methods thereof
#3771Method of manufacturing semiconductor device having impurity region under isolation region
#3772Coplanar silicon-on-insulator (SOI) regions of different crystal orientations and methods of making the same
#3773Buried decoupling capacitors, devices and systems including same, and methods of fabrication
#3774Trench isolated capacitive micromachined ultrasonic transducer arrays with a supporting frame
#3775Element formation substrate, method of manufacturing the same, and semiconductor device
#3776Body-contacted semiconductor structures and methods of fabricating such body-contacted semiconductor structures
#3777SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#3778Semiconductor system using germanium condensation
#3779THREE DIMENSIONAL INTEGRATED CIRCUIT AND METHOD OF DESIGN
#3780Ballistic direct injection NROM cell on strained silicon structures
#3781Semiconductor device and method for manufacturing the same
#3782VARIABLE THRESHOLD TRANSISTOR FOR THE SCHOTTKY FPGA AND MULTILEVEL STORAGE CELL FLASH ARRAYS
#3783SEMICONDUCTOR DEVICE
#3784Semiconductor device and method of fabricating semiconductor device
#3785Pseudo SOI substrate and associated semiconductor devices
#3786SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#3787INTEGRATED CIRCUIT (IC) WITH HIGH-Q ON-CHIP DISCRETE CAPACITORS
#3788Integrated circuit with metal heat flow path coupled to transistor and method for manufacturing such circuit
#3789Programmable random logic arrays using PN isolation
#3790Semiconductor device with fin-type field effect transistor and manufacturing method thereof.
#3791Selective silicon-on-insulator isolation structure and method
#3792Semiconductor-on-insulator (SOI) strained active area transistor
#3793Display device using light-emitting element
#3794Semiconductor method and device with mixed orientation substrate
#3795INTEGRATED CIRCUIT CHIP WITH FETS HAVING MIXED BODY THICKNESSES AND METHOD OF MANUFACTURE THEREOF
#3796Semiconductor memory device and manufacturing method of the same
#3797Semiconductor memory device and manufacturing method of the same
#3798Memory element and semiconductor device
#3799Method of manufacturing a semiconductor device and a non-volatile semiconductor storage device including the formation of an insulating layer using a plasma treatment
#3800Process for controlling performance characteristics of a negative differential resistance (NDR) device
#3801Twisted dual-substrate orientation (DSO) substrates
#3802Front-rear contacts of electronics devices with induced defects to increase conductivity thereof
#3803SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#3804SOI device and method for its fabrication
#3805Vertical-type, integrated bipolar device and manufacturing process thereof
#3806Semiconductor-on-insulator (SOI) structures including gradient nitrided buried oxide (BOX)
#3807Selective uniaxial stress modification for use with strained silicon on insulator integrated circuit
#3808Semiconductor component including an isolation structure and a contact to the substrate
#3809Semiconductor device formed in semiconductor layer arranged on substrate with one of insulating film and cavity interposed between the substrate and the semiconductor layer
#3810Semiconductor device to suppress leak current at an end of an isolation film
#3811Test structure for determining characteristics of semiconductor alloys in SOI transistors by x-ray diffraction
#3812SOI Device with charging protection and methods of making same
#3813Capacitorless one transistor DRAM cell, integrated circuitry comprising an array of capacitorless one transistor DRAM cells, and method of forming lines of capacitorless one transistor DRAM cells
#3814Dynamic random access memory with an amplified capacitor
#3815Hybrid crystal orientation CMOS structure for adaptive well biasing and for power and performance enhancement
#3816Method for fabricating a localize SOI in bulk silicon substrate including changing first trenches formed in the substrate into unclosed empty space by applying heat treatment
#3817Selective formation of stress memorization layer
#3818Semiconductor device and driving method therefor
#3819Controlling output current delivered by a transistor
#3820Semiconductor memory device and method of manufacturing the same
#3821Method of making metal gate transistors
#3822SOI devices and methods for fabricating the same
#3823Silicon-on-insulator (SOI) junction field effect transistor and method of manufacture
#3824CMOS devices with stressed channel regions, and methods for fabricating the same
#3825Semiconductor device fabrication method
#3826Epitaxy silicon on insulator (ESOI)
#3827SILICON-ON-INSULATOR (SOI) MEMORY DEVICE
#3828Semiconductor device including a capacitance
#3829Backside contacts for MOS devices
#3830Forward body bias-controlled semiconductor integrated circuit
#3831Protect diodes for hybrid-orientation substrate structures
#3832Method of fabricating heterojunction photodiodes with CMOS
#3833SEMICONDUCTOR DEVICE AND A METHOD OF MANUFACTURING THE SAME
#3834Nonvolatile semiconductor memory device
#3835MULTIPLE DIELECTRIC FINFET STRUCTURE AND METHOD
#3836Method for producing a semiconductor arrangement, semiconductor arrangement and its application
#3837Semiconductor memory device and method of manufacturing the same
#3838Method for producing SiGebased zones with different contents in Ge on a same substrate by condensation of germanium
#3839Bipolar transistor, BiCMOS device, and method for fabricating thereof
#3840Three dimensional integrated circuit and method of design
#3841Memory array having a programmable word length, and method of operating same
#3842Semiconductor memory device and method of manufacturing the same
#3843Curled semiconductor transistor
#3844Method for producing SiGebased zones with different contents in Ge on a same substrate by condensation of germanium
#3845Semiconductor device and manufacturing method of the same
#3846SEMICONDUCTOR CIRCUIT ARRANGEMENT AND ASSOCIATED METHOD FOR TEMPERATURE DETECTION
#3847Heating element for microfluidic and micromechanical applications
#3848Dual surface SOI by lateral epitaxial overgrowth
#3849Semiconductor device and manufacturing method thereof
#3850Semiconductor integrated circuit devices having high-Q wafer back-side capacitors
#3851CMOS structure and method for fabrication thereof using multiple crystallographic orientations and gate materials
#3852STRUCTURE AND METHOD FOR IMPLEMENTING OXIDE LEAKAGE BASED VOLTAGE DIVIDER NETWORK FOR INTEGRATED CIRCUIT DEVICES
#3853Asymmetric channel doping for improved memory operation for floating body cell (FBC) memory
#3854Nonvolatile semiconductor memory device
#3855Integrated Circuit with a Transistor Structure Element
#3856Semiconductor device and method of manufacturing same
#3857Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors
#3858Electronic devices including a semiconductor layer
#3859Semiconductor device having multi-gate structure and method of manufacturing the same
#3860Structure and method of fabricating a hybrid substrate for high-performance hybrid-orientation silicon-on-insulator CMOS devices
#3861ESD protection element
#3862Dual wired integrated circuit chips
#3863Silicon-on-insulator structures
#3864Hybrid strained orientated substrates and devices
#3865Method and system for reducing charge damage in silicon-on-insulator technology
#3866Semiconductor-on-insulator SRAM configured using partially-depleted and fully-depleted transistors
#3867Semiconductor memory device
#3868Semiconductor device having a frontside contact and vertical trench isolation and method of fabricating same
#3869LOCOS on SOI and HOT semiconductor device and method for manufacturing
#3870Selective uniaxial stress relaxation by layout optimization in strained silicon on insulator integrated circuit
#3871Semiconductor device and method of manufacturing the same
#3872SOI SUBSTRATE AND SEMICONDUCTOR INTEGRATED CIRUIT DEVICE
#3873Semiconductor device and method for manufacturing semiconductor device
#3874Method of making wafer structure for backside illuminated color image sensor
#3875Strained silicon directly-on-insulator substrate with hybrid crystalline orientation and different stress levels
#3876Electrostatic discharge protection device and method of fabricating same
#3877Structure Having Isolation Structure Including Deuterium Within A Substrate And Related Method
#3878Method of forming transistor structure having stressed regions of opposite types
#3879Methods and apparatus for implementing bit-by-bit erase of a flash memory device
#3880Semiconductor device
#3881Hybrid Transistor Structure and a Method for Making the Same
#3882Ion implantation combined with in situ or ex situ heat treatment for improved field effect transistors
#3883Integrated circuit chip with FETs having mixed body thickness and method of manufacture thereof
#3884Semiconductor memory device including an SOI substrate
#3885SEMICONDUCTOR-ON-INSULATOR (SOI) SUBSTRATES AND SEMICONDUCTOR DEVICES USING VOID SPACES
#3886Body-tied MOSFET device with strained active area
#3887Semiconductor Device and Method for Manufacturing the Same
#3888Semiconductor device having stressed etch stop layers of different intrinsic stress in combination with PN junctions of different design in different device regions
#3889Method for fabricating semiconductor
#3890Method of manufacturing a semiconductor integrated circuit and semiconductor integrated circuit
#3891High performance stress-enhance MOSFET and method of manufacture
#3892High performance stress-enhance MOSFET and method of manufacture
#3893Structure and method for implementing oxide leakage based voltage divider network for integrated circuit devices
#3894Hybrid orientation SOI substrates, and method for forming the same
#3895Semiconductor element, semiconductor device and methods for manufacturing thereof
#3896SOI transistor having a reduced body potential and a method of forming the same
#3897Patterning sub-lithographic features with variable widths
#3898Method for fabricating a semiconductor component including a high capacitance per unit area capacitor
#3899Method of forming silicon-on-insulator wafer having reentrant shape dielectric trenches
#3900CONDUCTIVE SPACERS FOR SEMICONDUCTOR DEVICES AND METHODS OF FORMING