208009 ⎘
Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body the substrate comprising an insulating body on a semiconductor body, e.g. SOI
Semiconductor integrated circuit device and semiconductor memory using the same
#4802Semiconductor integrated circuit device and sense amplifier of memory
#4803Double silicon-on-insulator (SOI) metal oxide semiconductor field effect transistor (MOSFET) structures
#4804Vertically wired integrated circuit and method of fabrication
#4805Semiconductor memory device and method of manufacturing the same
#4806Non-volatile semiconductor memory with single layer gate structure
#4807Semiconductor device and semiconductor memory using the same
#4808Fully depleted silicon-on-insulator CMOS logic
#4809Static random access memories including a silicon-on-insulator substrate
#4810Shallow trench isolation (STI) region with high-K liner and method of formation
#4811High-density split-gate FinFET
#4812TFT mask ROM and method for making same
#4813Three dimensional CMOS integrated circuits having device layers built on different crystal oriented wafers
#4814Trench capacitor DRAM cell using buried oxide as array top oxide
#4815Silicide proximity structures for CMOS device performance improvements
#4816Capacitorless 1-transistor DRAM cell and fabrication method
#4817High performance voltage control diffusion resistor
#4818Semiconductor over-voltage protection structure for integrated circuit and for diode
#4819Semiconductor device
#4820Processes of forming stacked resistor constructions
#4821Silicon on insulator device and layout method of the same
#4822MOSFET performance improvement using deformation in SOI structure
#4823Nanotube films and articles
#4824Semiconductor-on-insulator constructions
#4825Semiconductor device including transistors having different drain breakdown voltages on a single substrate
#4826High breakdown voltage junction terminating structure
#4827Semiconductor-on-insulator constructions
#4828Fully-depleted castellated gate MOSFET device and method of manufacture thereof
#4829Double gate field effect transistor and method of manufacturing the same
#4830Display device using electroluminescence material
#4831Solution to thermal budget
#4832Ultra thin channel MOSFET
#4833Methods of forming devices, constructions and systems comprising thyristors
#4834Sealing gasket with flexible stopper
#4835Ultra-thin silicon-on-insulator and strained-silicon-direct-on-insulator with hybrid crystal orientations
#4836Bipolar/thin film SOI CMOS structure and method of making same
#4837Computer systems containing resistors which include doped silicon/germanium
#4838Semiconductor device including first and second transistor groups and semiconductor integrated circuit device
#4839Semiconductor device having epitaxial layer
#4840Heterojunction bipolar transistor with monolithically integrated junction field effect transistor and method of manufacturing same
#4841Semiconductor device having electrical contact from opposite sides including a via with an end formed at a bottom surface of the diffusion region
#4842Semiconductor device having silicon on insulator structure and method of fabricating the same
#4843Silicon on insulator device and layout method of the same
#4844Integrated semiconductor storage with at least a storage cell and procedure
#4845Resistor with reduced leakage
#4846CMOS device on ultrathin SOI with a deposited raised source/drain, and a method of manufacture
#4847SOI type MOSFET
#4848Stress inducing spacers
#4849Semiconductor memory device and method for fabricating the same
#4850Strained-channel Fin field effect transistor (FET) with a uniform channel thickness and separate gates
#4851EMI and noise shielding for multi-metal layer high frequency integrated circuit processes
#4852Method of manufacturing semiconductor device having trench isolation
#4853Semiconductor diode with reduced leakage
#4854Localized biasing for silicon on insulator structures
#4855Semiconductor element and process for manufacturing the same
#4856Strained Si/SiGe/SOI islands and processes of making same
#4857Varying carrier mobility in semiconductor devices to achieve overall design goals
#4858Structure and method of making strained semiconductor CMOS transistors having lattice-mismatched semiconductor regions underlying source and drain regions
#4859Method and structure for buried circuits and devices
#4860Silicon-on-insulator device structure
#4861Method and apparatus for providing an integrated active region on silicon-on-insulator devices
#4862Method using quasi-planar double gated fin field effect transistor process for the fabrication of a thyristor-based static read/write random-access memory
#4863Vertical system integration
#4864Stabilization in device characteristics of a bipolar transistor that is included in a semiconductor device with a CMOSFET
#4865Semiconductor-on-insulator SRAM configured using partially-depleted and fully-depleted transistors
#4866Semiconductor element and semiconductor memory device using the same
#4867Stable PD-SOI devices and methods
#4868Ultra-thin semiconductors bonded on glass substrates
#4869Semiconductor device and method for manufacturing partial SOI substrates
#4870Electronic systems comprising memory devices
#4871Semiconductor device and method of fabricating the same
#4872Stable PD-SOI devices and methods
#4873Fabrication of silicon-on-nothing (SON) MOSFET fabrication using selective etching of SiGelayer
#4874SOI device with reduced drain induced barrier lowering
#4875Method for converting a planar transistor design to a vertical double gate transistor design
#4876Semiconductor chip having multiple functional blocks integrated in a single chip and method for fabricating the same
#4877FET channel having a strained lattice structure along multiple surfaces
#4878Field effect transistor and method of manufacturing the same
#4879Semiconductor element, semiconductor device and methods for manufacturing thereof
#4880Capacitor that includes high permittivity capacitor dielectric
#4881Semiconductor device and method for manufacturing the same
#4882CaF2 lenses with reduced birefringence
#4883Method for fabricating semiconductor device
#4884Coiled circuit device and method of making the same
#4885Semiconductor substrate and manufacturing process therefor
#4886Semiconductor device
#4887Damascene gate multi-mesa MOSFET
#4888GATE LENGTH PROXIMITY CORRECTED DEVICE
#4889Semiconductor apparatus having first and second gate electrodes
#4890Method of fabricating a semiconductor device
#4891Silicon-on-insulator (SOI) integrated circuit (IC) chip with the silicon layers consisting of regions of different thickness
#4892Radiation-hardened silicon-on-insulator CMOS device, and method of making the same
#4893Semiconductor device with an enhancement type field effect transistor in which threshold voltage is dependent upon substrate bias voltage
#4894Method for making a system for selecting one wire from a plurality of wires
#4895SRAM cell
#4896Methods of fabricating double-sided hemispherical silicon grain electrodes and capacitor modules
#4897Multi-configurable independently multi-gated MOSFET
#4898Integrated circuit having pairs of parallel complementary FinFETs
#4899Thin film memory, array, and operation method and manufacture method therefor
#4900Semiconductor memory device including an SOI substrate
#4901High-performance one-transistor memory cell
#4902Double-gated transistor circuit
#4903Method of fabricating semiconductor side wall fin
#4904Methods for producing a 3D semiconductor memory device and structure
#49053D semiconductor device and structure with transistors
#49063D semiconductor device and structure with oxide bonds
#4907Monolithic multi-FETs
#4908Integrated circuit with active region jogs
#4909Structure with polycrystalline isolation region below polycrystalline fill shape(s) and selective active device(s), and related method
#4910Analog-to-digital inverter circuit structure with FDSOI transistors
#4911High density IC capacitor structure
#4912SOI devices with air gaps and stressing layers
#4913Efficient heat-sinking in PIN diode
#4914Simplified bias scheme for digital designs
#4915Devices with slotted active regions
#4916Dynamic substrate biasing for extended voltage operation
#4917Vertically stacked transistors
#4918Formation of stacked nanosheet semiconductor devices
#4919Formation of semiconductor devices with dual trench isolations
#4920Multiple work function nanosheet field-effect transistors with differential interfacial layer thickness
#4921Enhanced field bipolar resistive RAM integrated with FDSOI technology
#4922AC coupling modules for bias ladders
#4923Bulk substrates with a self-aligned buried polycrystalline layer
#4924Method and apparatus for using back gate biasing for power amplifiers for millimeter wave devices
#4925Bent polysilicon gate structure for small footprint radio frequency (RF) switch
#4926SOI-based floating gate memory cell
#4927Semiconductor device
#4928Stacked vertical NFET and PFET
#4929Three-dimensional monolithic vertical field effect transistor logic gates
#4930Semiconductor device and manufacturing method thereof
#4931Devices and methods for fully depleted silicon-on-insulator back biasing
#4932Post gate silicon germanium channel condensation and method for producing the same
#4933Method for reducing switch on state resistance of switched-capacitor charge pump using self-generated switching back-gate bias voltage
#4934Fully depleted silicon on insulator integration
#4935Method to fabricate both FD-SOI and PD-SOI devices within a single integrated circuit
#4936Back biasing in SOI FET technology
#4937Method of forming high performance vertical natural capacitor (VNCAP)
#4938Heat dissipation and series resistance reduction of PA and RF switch in SLT by backside thick metal
#4939Hybrid MOS-PCM CMOS SOI switch
#4940DC-coupled high-voltage level shifter
#4941Memory cells and devices
#4942Connection arrangements for integrated lateral diffusion field effect transistors
#4943Current mirror devices using cascode with back-gate bias
#4944Biasing the substrate region of an MOS transistor
#4945Tapered polysilicon gate layout for power handling improvement for radio frequency (RF) switch applications
#4946Junction formation with reduced Cfor 22nm FDSOI devices
#4947Etch stop liner for contact punch through mitigation in SOI substrate
#4948Diffusion break forming after source/drain forming and related IC structure
#4949SRAM bitcell structures facilitating biasing of pull-up transistors
#4950Fully depleted silicon-on-insulator (FDSOI) transistor device and self-aligned active area in FDSOI bulk exposed regions
#4951Device structures with multiple nitrided layers
#4952Systems, methods and apparatus for enabling high voltage circuits
#4953Digital frequency multiplier to generate a local oscillator signal in FDSOI technology
#4954Contact punch through mitigation in SOI substrate
#4955Semiconductor structure including a first transistor at a semiconductor-on-insulator region and a second transistor at a bulk region and method for the formation thereof
#4956Coaxial connector feed-through for multi-level interconnected semiconductor wafers
#4957High density nanosheet diodes
#4958One time programmable read-only memory (ROM) in SOI CMOS
#4959Body tie optimization for stacked transistor amplifier
#4960Conductive contacts in semiconductor on insulator substrate
#4961Methods of forming a device having semiconductor devices on two sides of a buried dielectric layer
#4962Integrated circuits with peltier cooling provided by back-end wiring
#4963Utilization of backside silicidation to form dual side contacted capacitor
#4964Lateral bipolar junction transistor with multiple base lengths
#4965Electronic chip comprising transistors with front and back gates
#4966Germanium lateral bipolar transistor with silicon passivation
#4967On-chip DC-DC power converters with fully integrated GaN power switches, silicon CMOS transistors and magnetic inductors
#4968Apparatus and method of fabrication for GaN/Si transistors isolation
#4969Defect reduction in channel silicon germanium on patterned silicon
#4970Methods, apparatus and system for providing NMOS-only memory cells
#4971Integrated circuit including a dummy gate structure and method for the formation thereof
#4972Grounded die seal integrated circuit structure for RF circuits
#4973Pass-through contact using silicide
#4974Semiconductor structure including a trench capping layer and method for the formation thereof
#4975Reduced parasitic capacitance and contact resistance in extremely thin silicon-on-insulator (ETSOI) devices due to wrap-around structure of source/drain regions
#4976Chip structures with distributed wiring
#4977Self-aligned contacts for vertical field effect transistors
#4978SOI lateral bipolar for integrated-injection logic SRAM
#4979Magnetic-field and magnetic-field gradient sensors based on lateral SOI bipolar transistors
#4980Method of fabrication of ETSOI CMOS device by sidewall image transfer (SIT)
#4981Stacked nanowire semiconductor device
#4982Connecting to back-plate contacts or diode junctions through a RMG electrode and resulting devices
#4983Method and structure for forming dually strained silicon
#4984Method of fabricating ultra-thin inorganic semiconductor film and method of fabricating three-dimensional semiconductor device using the same
#4985Semiconductor device
#4986Method for creating metal gate resistor in FDSOL and resulting device
#4987Stacked nanowire device width adjustment by gas cluster ion beam (GCIB)
#4988Self-aligned contacts for vertical field effect transistors
#4989Compact FDSOI device with Bulex contact extending through buried insulating layer adjacent gate structure for back-bias
#4990VTFT with a top-gate structure
#4991Vertical and planar TFTS on common substrate
#4992Preventing unauthorized use of integrated circuits for radiation-hard applications
#4993Efficient buried oxide layer interconnect scheme
#4994Complementary metal-oxide silicon having silicon and silicon germanium channels
#4995Multiple Vin III-V FETs
#4996Transistor device structure
#4997Modeling charge distribution on FinFET sidewalls
#4998Integrated circuit including a liner silicide with low contact resistance
#4999Schottky clamped radio frequency switch
#5000Method for fabricating semiconductor layers including transistor channels having different strain states, and related semiconductor layers
#5001Integrated circuit and method of forming integrated circuit
#5002Monolithic integration of GaN and InP components