208009 ⎘
Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body the substrate comprising an insulating body on a semiconductor body, e.g. SOI
Junction butting in SOI transistor with embedded source/drain
#1802Methods of containing defects for non-silicon device engineering
#1803Flexible, stretchable electronic devices
#1804Handle wafer for high resistivity trap-rich SOI
#1805Methodology to avoid gate stress for low voltage devices in FDSOI technology
#1806MOSFET with work function adjusted metal backgate
#1807Embedded Memory Device With Silicon-On-Insulator Substrate, And Method Of Making Same
#1808Quasi-nanowire transistor and method of manufacturing the same
#1809Complementary metal-oxide-semiconductor structure with III-V and silicon germanium transistors on insulator
#1810Method of manufacture for a silicon-on-plastic semiconductor device with interfacial adhesion layer
#1811Silicon-on-insulator heat sink
#1812SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
#1813Third type of metal gate stack for CMOS devices
#1814High speed bipolar junction transistor for high voltage applications
#1815Semiconductor-on-insulator with back side support layer
#1816Semiconductor devices and methods providing non-linear compensation of field-effect transistors
#1817Methods for forming semiconductor device structures
#1818Boron rich nitride cap for total ionizing dose mitigation in SOI devices
#1819Very planar gate cut post replacement gate process
#1820Methods for wafer bonding, and for nucleating bonding nanophases
#1821Pseudo-substrate with improved efficiency of usage of single crystal material
#1822Semiconductor device including groups of nanowires of different semiconductor materials and related methods
#1823Diode biased body contacted transistor
#1824Junction field-effect floating gate memory switch with thin tunnel insulator
#1825CMOS transistors including gate spacers of the same thickness
#1826Wiring structure for trench fuse component with methods of fabrication
#1827On-chip diode with fully depleted semicondutor devices
#1828Handle substrates of composite substrates for semiconductors
#1829Flexible active matrix circuits for interfacing with biological tissue
#1830ISOLATION METHODS FOR LEAKAGE, LOSS AND NON-LINEARITY MITIGATION IN RADIO-FREQUENCY INTEGRATED CIRCUITS ON HIGH-RESISTIVITY SILICON-ON-INSULATOR SUBSTRATES
#1831Monolithically integrated CMOS and acoustic wave device
#1832Reduced threshold voltage-width dependency in transistors comprising high-K metal gate electrode structures
#1833MOSFET with work function adjusted metal backgate
#1834Matching of transistors
#1835Deep trench capacitor
#1836SOI SRAM having well regions with opposite conductivity
#1837High dose implantation for ultrathin semiconductor-on-insulator substrates
#1838Barrier trench structure and methods of manufacture
#1839Integrated passive devices for finFET technologies
#1840Semiconductor device and method of manufacturing the same
#1841Integrated circuit and manufacturing method thereof
#1842STRUCTURE AND PROCESS TO DECOUPLE DEEP TRENCH CAPACITORS AND WELL ISOLATION
#1843Electronic device for ESD protection
#1844Electronic device and protection circuit
#1845Method of making a CMOS semiconductor device using a stressed silicon-on-insulator (SOI) wafer
#1846Hybrid fin field-effect transistor structures and related methods
#1847Semiconductor device and method for forming the same
#1848Apparatus and methods for variable capacitor arrays
#1849Simplified multi-threshold voltage scheme for fully depleted SOI MOSFETs
#1850Semiconductor device structure and method of forming
#1851Semiconductor device
#1852Group III nitride composite substrate and method for manufacturing the same, and method for manufacturing group III nitride semiconductor device
#1853Semiconductor die, integrated circuits and driver circuits, and methods of maufacturing the same
#1854Single-chip field effect transistor (FET) switch with silicon germanium (SiGe) power amplifier and methods of forming
#1855Multi-plasma nitridation process for a gate dielectric
#1856SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
#1857Method for forming deep trench isolation for RF devices on SOI
#1858Semiconductor device having a closed cavity structure and method of manufacturing the same
#1859Three-dimensional non-volatile memory
#1860Compact semiconductor memory device having reduced number of contacts, methods of operating and methods of making
#1861Silicon-on-insulator substrate and method of manufacturing thereof
#1862Temperature stabilized circuitry
#1863SOI lateral bipolar transistors having surrounding extrinsic base portions
#1864Area efficient field effect device
#1865Method for producing strained semi-conductor blocks on the insulating layer of a semi-conductor on insulator substrate
#1866Heterogeneous semiconductor material integration techniques
#1867Floating body memory cell having gates favoring different conductivity type regions
#1868Semiconductor structures including fluidic microchannels for cooling and related methods
#1869Semiconductor structure with TRL and handle wafer cavities
#1870Handle Substrates of Composite Substrates for Semiconductors
#1871Multi-plasma nitridation process for a gate dielectric
#1872Defective P-N junction for backgated fully depleted silicon on insulator mosfet
#1873Linearity performance for radio-frequency switches
#1874CMOS FABRICATION OF A THIN-FILM BULK ACOUSTIC RESONATOR
#1875Method for manufacturing a semiconductor on insulator structure having low electrical losses
#1876Devices and methods related to radio-frequency switches having improved on-resistance performance
#1877Radio-frequency switching devices having improved voltage handling capability
#1878Antifuse cell comprising program transistor and select transistor arranged on opposite sides of semiconductor layer
#1879CMOS DEVICES WITH STRESSED CHANNEL REGIONS, AND METHODS FOR FABRICATING THE SAME
#1880Semiconductor device and method of manufacturing the same
#1881Pattern factor dependency alleviation for eDRAM and logic devices with disposable fill to ease deep trench integration with fins
#1882Low power die
#1883SEMICONDUCTOR SUBSTRATE WITH MULTIPLE SiGe REGIONS HAVING DIFFERENT GERMANIUM CONCENTRATIONS BY A SINGLE EPITAXY PROCESS
#1884Semiconductor device having semiconductor layers with different thicknesses
#1885Composite substrate
#1886Techniques for providing a semiconductor memory device
#1887Method for producing a strained semiconductor on insulator substrate
#1888Switching device having a discharge circuit for improved intermodulation distortion performance
#1889Deep trench MIM capacitor and moat isolation with epitaxial semiconductor wafer scheme
#1890Circuit and method for improving ESD tolerance and switching speed
#1891FDSOI semiconductor structure and method for manufacturing the same
#1892RF SOI switch with backside cavity and the method to form it
#1893Methods of forming semiconductor structures
#1894CMOS with dual raised source and drain for NMOS and PMOS
#1895CMOS with dual raised source and drain for NMOS and PMOS
#1896Current source array
#1897Integrated circuit assembly with faraday cage
#1898Semiconductor device and manufacturing method thereof
#1899Floating Body Contact Circuit Method for Improving ESD Performance and Switching Speed
#1900Insulation wall between transistors on SOI
#1901Semiconductor device and method of manufacturing the same
#1902Semiconductor device, integrated circuit and method of forming a semiconductor device
#1903Semiconductor structures including bodies of semiconductor material and methods of forming same
#1904CMOS with dual raised source and drain for NMOS and PMOS
#1905Method of manufacturing semiconductor device
#1906Semiconductor structures including an integrated FinFET with deep trench capacitor and methods of manufacture
#1907Non-volatile memory device employing semiconductor nanoparticles
#1908Apparatus and methods for variable capacitor arrays
#1909Semiconductor device comprising epitaxially grown semiconductor material and an air gap
#1910DUAL GATE FD-SOI TRANSISTOR
#1911Devices and methods related to radio-frequency switches having reduced-resistance metal layout
#1912Bridging local semiconductor interconnects
#1913Semiconductor device
#1914Method for manufacturing semiconductor device including a MOS-type transistor
#1915Semiconductor device with an integrated heat sink array
#1916Flexible, stretchable electronic devices
#1917Systems and methods for a semiconductor structure having multiple semiconductor-device layers
#1918Systems and methods for a semiconductor structure having multiple semiconductor-device layers
#1919Strained semiconductor device and method of making the same
#1920Semiconductor device with heat sinks
#1921NON-VOLATILE MEMORY DEVICE INTEGRATED WITH CMOS SOI FET ON A SINGLE CHIP
#1922Self aligned semiconductor device and structure
#1923Method of stressing a semiconductor layer
#1924Method of forming stressed semiconductor layer
#1925Extended-drain MOS transistor in a thin film on insulator
#1926Silicon-on-plastic semiconductor device and method of making the same
#1927Mechanisms for forming radio frequency (RF) area of integrated circuit structure
#1928Self-protected metal-oxide-semiconductor field-effect transistor
#1929Anisotropic dielectric material gate spacer for a field effect transistor
#1930Method of manufacturing a misfet on an SOI substrate
#1931Anisotropic dielectric material gate spacer for a field effect transistor
#1932Method for fabricating NMOS and PMOS transistors on a substrate of the SOI, in particular FDSOI, type and corresponding integrated circuit
#1933Methods for forming a self-aligned maskless junction butting for integrated circuits
#1934Group III-N transistor on nanoscale template structures
#1935Semiconductor film with adhesion layer and method for forming the same
#1936Semiconductor device using Ge channel and manufacturing method thereof
#1937Semiconductor-on-insulator (SOI) device and related methods for making same using non-oxidizing thermal treatment
#1938Vertical semiconductor device with thinned substrate
#1939Method of making a semiconductor device using trench isolation regions to maintain channel stress
#1940Semiconductor device including SOI butted junction to reduce short-channel penalty
#1941Semiconductor device with relaxation reduction liner and associated methods
#1942Semiconductor device and method for manufacturing the same
#1943Dynamic threshold MOS and methods of forming the same
#1944SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
#1945Overvoltage protection components in an optoelectronic circuit on SOI
#1946Test circuit for testing signal receiving unit, image pickup apparatus, method of testing signal receiving unit, and method of testing image pickup apparatus
#1947Programmable structured arrays
#1948Semiconductor structure and method for manufacturing the same
#1949Multi-threshold circuitry based on silicon-on-insulator technology
#1950Method of forming different voltage devices with high-K metal gate
#1951Semiconductor-on-insulator with back side strain topology
#1952Semiconductor structure with deep trench thermal conduction
#1953On-SOI integrated circuit equipped with a device for protecting against electrostatic discharges
#1954Semi-conductor device with epitaxial source/drain facetting provided at the gate edge
#1955Semiconductor device and method of manufacturing the same
#1956Semiconductor device with transistor in semiconductor subtrate and insulated contact plug extending trough the substrate
#1957Semiconductor device having diffusion barrier to reduce back channel leakage
#1958Strain engineering in semiconductor devices by using a piezoelectric material
#1959Semiconductor structure with deep trench thermal conduction
#1960Epitaxial semiconductor resistor with semiconductor structures on same substrate
#1961Shallow trench isolation structure having a nitride plug
#1962Passive devices for FinFET integrated circuit technologies
#1963Semiconductor device and manufacturing method thereof
#1964Method of forming a complementary metal-oxide-semiconductor (CMOS) device
#1965Solar-powered energy-autonomous silicon-on-insulator device
#1966Memory device and manufacturing method of the same
#1967Semiconductor device including an oxide semiconductor layer
#1968Thermally stable high-K tetragonal HFO2 layer within high aspect ratio deep trenches
#1969Dense arrays and charge storage devices
#1970Electric charge flow circuit for a time measurement
#1971Semiconductor device manufacturing method
#1972Field-effect transistor stack voltage compensation
#1973Transistors with various levels of threshold voltages and absence of distortions between nMOS and pMOS
#1974Voltage contrast inspection of deep trench isolation
#1975Structure, method and system for complementary strain fill for integrated circuit chips
#1976Memory cell and memory cell array having an electrically floating body transistor, and methods of operating same
#1977Methods and apparatuses for forming multiple radio frequency (RF) components associated with different RF bands on a chip
#1978Field effect transistor (FET) with self-aligned contacts, integrated circuit (IC) chip and method of manufacture
#1979Semiconductor device having GaN-based layer
#1980Semiconductor device and fabricating the same
#1981ZRAM heterochannel memory
#1982Methods of forming replacement fins for a FinFET semiconductor device by performing a replacement growth process
#1983Semiconductor memory device
#1984Radio-frequency switches having gate bias and frequency-tuned body bias
#1985Nonvolatile latch circuit and logic circuit, and semiconductor device using the same
#1986Metal-insulator-metal (MIM) capacitor with deep trench (DT) structure and method in a silicon-on-insulator (SOI)
#1987Method of localized modification of the stresses in a substrate of the SOI type, in particular FD SOI type, and corresponding device
#1988Semiconductor structures including an integrated finFET with deep trench capacitor and methods of manufacture
#1989Metal trench capacitor and improved isolation and methods of manufacture
#1990SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING THE SAME AND SYSTEM FOR MANUFACTURING THE SAME
#1991SOI bipolar junction transistor with substrate bias voltages
#1992Semiconductor device
#1993Semiconductor device
#1994Semiconductor device
#1995Transistor having a stressed body
#1996Carbon-doped cap for a raised active semiconductor region
#1997Static electricity protection circuit, electro-optic device and electronic device
#1998STRUCTURE AND METHOD OF HIGH-PERFORMANCE EXTREMELY THIN SILICON ON INSULATOR COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR TRANSISTORS WITH DUAL STRESS BURIED INSULATORS
#1999System with memory having voltage applying unit
#2000Selective amorphization for signal isolation and linearity
#2001Methods for the formation of a trap rich layer
#2002Semiconductor device
#2003Reliable electrical fuse with localized programming and method of making the same
#2004Semiconductor device and manufacturing method thereof
#2005Method and system for a photonic interposer
#2006Methods of forming three-dimensionally integrated semiconductor systems including photoactive devices and semiconductor-on-insulator substrates
#2007Semiconductor device with strain technique
#2008Flexible, stretchable electronic devices
#2009Semiconductor device
#2010Structure and method for adjusting threshold voltage of the array of transistors
#2011Semiconductor structure having column III-V isolation regions
#2012Device including a transistor having a stressed channel region and method for the formation thereof
#2013Solid-state image pick-up device and manufacturing method thereof, image-pickup apparatus, semiconductor device and manufacturing method thereof, and semiconductor substrate
#2014Semiconductor memory having both volatile and non-volatile functionality and method of operating
#2015Bipolar transistor, band-gap reference circuit and virtual ground reference circuit
#2016Semiconductor device and method of manufacturing the same
#2017Semiconductor device including a channel region and method for manufacturing the semiconductor device
#2018SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
#2019Method for manufacturing silicon-based electronics with disabling feature
#2020SILICON-ON-INSULATOR (SOI) BODY-CONTACT PASS GATE STRUCTURE
#2021Silicon-based electronics with disabling feature
#2022Forming semiconductor structure with device layers and TRL
#2023Transistor devices having an anti-fuse configuration and methods of forming the same
#2024Method of fabricating a semiconductor device including embedded crystalline back-gate bias planes
#2025Memory device and manufacturing method the same
#2026Semiconductor-on-insulator integrated circuit with back side gate
#2027Semiconductor device
#2028Tristate gate
#2029Integrating channel SiGe into pFET structures
#2030Fabricating polysilicon MOS devices and passive ESD devices
#2031Integrated circuit having raised source drains devices with reduced silicide contact resistance and methods to fabricate same
#2032Structure and method for reducing floating body effect of SOI MOSFETS
#2033Semiconductor device
#2034Semiconductor device
#2035Semiconductor device and driving method thereof
#2036Semiconductor-on-insulator integrated circuit with reduced off-state capacitance
#2037Redistribution layer contacting first wafer through second wafer
#2038SEMICONDUCTOR-ON-INSULATOR STRUCTURE AND PROCESS FOR PRODUCING SAME
#20396T SRAM architecture for gate-all-around nanowire devices
#2040Method of manufacturing an LTPS array substrate
#2041Semiconductor device and method for manufacturing the same
#20426T SRAM architecture for gate-all-around nanowire devices
#2043Method of producing a silicon-on-insulator article
#2044Simplified multi-threshold voltage scheme for fully depleted SOI MOSFETs
#2045Semiconductor memory device
#2046High-current N-type silicon-on-insulator lateral insulated-gate bipolar transistor
#2047Semiconductor field-effect transistor, memory cell and memory device
#2048SHALLOW TRENCH ISOLATION FOR SOI STRUCTURES COMBINING SIDEWALL SPACER AND BOTTOM LINER
#2049Semiconductor device and method for manufacturing semiconductor device
#2050Method for controlling an integrated circuit
#2051Semiconductor-on-insulator integrated circuit with interconnect below the insulator
#2052Semiconductor device with antenna and light-emitting element
#2053Integrated semiconductor device having an insulating structure and a manufacturing method
#2054Thermally assisted flash memory with diode strapping
#2055Semiconductor structure with deep trench thermal conduction
#2056Methods of fabricating silicon-on-insulator (SOI) semiconductor devices using blanket fusion bonding
#2057Circuit structures, memory circuitry, and methods
#2058Apparatus and methods relating to a memory cell having a floating body
#2059Three-dimensional semiconductor architecture
#2060Devices including a diamond layer
#2061Integrated structure with bidirectional vertical actuation
#2062Hybrid ETSOI structure to minimize noise coupling from TSV
#2063Semiconductor structures with deep trench capacitor and methods of manufacture
#2064Carbon-doped cap for a raised active semiconductor region
#2065Extremely thin semiconductor on insulator (ETSOI) logic and memory hybrid chip
#2066Field-effect transistor, and memory and semiconductor circuit including the same
#2067Semiconductor device comprising a channel region of a transistor with a crystalline oxide semiconductor and a specific off-state current for the transistor
#2068Methods of forming strained-semiconductor-on-insulator device structures
#2069Methods of containing defects for non-silicon device engineering
#2070Electronic device
#2071High freuency semiconductor switch and wireless device
#2072High frequency switch
#2073Diode structure for gate all around silicon nanowire technologies
#2074Diode structure and method for gate all around silicon nanowire technologies
#2075Diode structure and method for wire-last nanomesh technologies
#2076Semiconductor integrated circuit device, electronic apparatus, and display apparatus
#2077Diode structure and method for wire-last nanomesh technologies
#2078Method of fabricating isolated capacitors and structure thereof
#2079SOI RF device and method for forming the same
#2080Short circuit reduction in a ferroelectric memory cell comprising a stack of layers arranged on a flexible substrate
#2081ESD-protection circuit for integrated circuit device
#2082Convex shaped thin-film transistor device having elongated channel over insulating layer
#2083Memory device
#2084Nanowire capacitor for bidirectional operation
#2085Nanowire capacitor for bidirectional operation
#2086Methods of forming semiconductor structures including bodies of semiconductor material
#2087Method of forming a gated diode structure for eliminating RIE damage from cap removal
#2088Semiconductor device and manufacturing method thereof
#2089Thermal shunt
#2090NANOELECTROMECHANICAL RESONATORS
#2091Semiconductor device with silicon layer containing carbon
#2092Butted SOI junction isolation structures and devices and method of fabrication
#2093Hybrid fin field-effect transistor structures and related methods
#2094Fabricating polysilicon MOS devices and passive ESD devices
#2095Integrated circuit having back gating, improved isolation and reduced well resistance and method to fabricate same
#2096Structure for self-aligned silicide contacts to an upside-down FET by epitaxial source and drain
#2097Fabrication method of semiconductor apparatus
#2098Integrated circuit comprising a clock tree cell
#2099Integrated circuit comprising a clock tree cell
#2100Silicon-on-insulator radio frequency device and silicon-on-insulator substrate