208009 ⎘
Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body the substrate comprising an insulating body on a semiconductor body, e.g. SOI
Hybrid CMOS nanowire mesh device and PDSOI device
#2102Hybrid CMOS nanowire mesh device and FINFET device
#2103Method for driving semiconductor device
#2104Method and apparatus improving gate oxide reliability by controlling accumulated charge
#2105Semiconductor device
#2106Device with FD-SOI cell and insulated semiconductor contact region and related methods
#2107Memory device, semiconductor device, and electronic device
#2108Method for fabricating array substrate, array substrate and display device
#2109Method of forming a suspended structure and a transistor co-integrated on a same substrate
#2110Compact semiconductor memory device having reduced number of contacts, methods of operating and methods of making
#2111Method of forming substrate contact for semiconductor on insulator (SOI) substrate
#2112Complementary SOI lateral bipolar for SRAM in a CMOS platform
#2113Complementary SOI lateral bipolar for SRAM in a CMOS platform
#2114Method for fabricating a connection region in a semiconductor device
#2115Inducing channel stress in semiconductor-on-insulator devices by base substrate oxidation
#2116Thin film transistor comprising pixel electrode
#2117Integrated circuit with a thin body field effect transistor and capacitor
#2118Semiconductor component and methods for producing a semiconductor component
#2119Integrated circuit with a thin body field effect transistor and capacitor
#2120Semiconductor device
#2121Integrated circuit (IC) structure
#2122Recessed gate field effect transistor
#2123On-chip diode with fully depleted semiconductor devices
#2124Structure and method to form passive devices in ETSOI process flow
#2125Semiconductor device having diffusion barrier to reduce back channel leakage
#2126Method and structure for forming on-chip high quality capacitors with ETSOI transistors
#2127Integrated circuit arrangement comprising a field effect transistor, especially a tunnel field effect transistor
#2128Deep isolation trench structure and deep trench capacitor on a semiconductor-on-insulator substrate
#2129Self-Aligned Silicide Bottom Plate for EDRAM Applications by Self-Diffusing Metal in CVD/ALD Metal Process
#2130Self-aligned silicide bottom plate for eDRAM applications by self-diffusing metal in CVD/ALD metal process
#2131Layout schemes for cascade MOS transistors
#2132Impedance matching network with improved quality factor and method for matching an impedance
#2133Silicon device on SI:C-OI and SGOI and method of manufacture
#2134Thin film transistor and fabricating method
#2135Silicon on nothing devices and methods of formation thereof
#2136Semiconductor device and driving method thereof
#2137SEMICONDUCTOR DEVICE, SEMICONDUCTOR WAFER, METHOD FOR PRODUCING SEMICONDUCTOR WAFER, AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE
#2138SEMICONDUCTOR DEVICE, SEMICONDUCTOR WAFER, METHOD FOR PRODUCING SEMICONDUCTOR WAFER, AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE
#2139Methods of containing defects for non-silicon device engineering
#2140Non-volatile memory device employing semiconductor nanoparticles
#2141Lateral epitaxial grown SOI in deep trench structures and methods of manufacture
#2142Semiconductor structure with integrated passive structures
#2143Semiconductor-on-insulator (SOI) deep trench capacitor
#2144Method of fabricating isolated capacitors and structure thereof
#2145Circuit for providing a voltage or a current
#2146Self-contained integrated circuit including adjacent cells of different types
#2147Strained semiconductor device and method of making the same
#2148Recessed single crystalline source and drain for semiconductor-on-insulator devices
#2149SOI device with embedded liner in box layer to limit STI recess
#2150Deep trench capacitor
#2151DRAM with dual level word lines
#2152Electrical isolation structures for ultra-thin semiconductor-on-insulator devices
#2153Semiconductor device including an active region and two layers having different stress characteristics
#2154Dynamic random access memory unit and method for fabricating the same
#2155DISPOSABLE CARBON-BASED TEMPLATE LAYER FOR FORMATION OF BORDERLESS CONTACT STRUCTURES
#2156Methods for forming semiconductor device structures
#2157Techniques for gate workfunction engineering to reduce short channel effects in planar CMOS devices
#2158Floating body field-effect transistors, and methods of forming floating body field-effect transistors
#2159CMOS-compatible gold-free contacts
#2160Semiconductor device and method of manufacturing the same
#2161DISPOSABLE CARBON-BASED TEMPLATE LAYER FOR FORMATION OF BORDERLESS CONTACT STRUCTURES
#2162Techniques for gate workfunction engineering to reduce short channel effects in planar CMOS devices
#2163Solid-state image pick-up device and manufacturing method thereof, image-pickup apparatus, semiconductor device and manufacturing method thereof, and semiconductor substrate
#2164Semiconductor-on-insulator device with asymmetric structure
#2165Embedded silicon germanium N-type filed effect transistor for reduced floating body effect
#2166Method and structure for integrating capacitor-less memory cell with logic
#2167Thin integrated circuit chip-on-board assembly and method of making
#2168Power device integration on a common substrate
#2169Radio frequency isolation for SOI transistors
#2170Embedded silicon germanium N-type field effect transistor for reduced floating body effect
#2171Apparatus relating to a memory cell having a floating body
#2172Trap rich layer with through-silicon-vias in semiconductor devices
#2173Photonic modulator with a semiconductor contact
#2174Techniques for providing a semiconductor memory device
#2175Body contacts for FET in SOI SRAM array
#2176Semiconductor structure having NFET extension last implants
#2177Semiconductor structures and devices
#2178Transistor structures and integrated circuitry comprising an array of transistor structures
#2179Semiconductor-on-insulator (SOI) structure with selectivity placed sub-insulator layer void(s) and method of forming the SOI structure
#2180Integrated circuit including transistor structure on depleted silicon-on-insulator, related method and design structure
#2181DRAM with dual level word lines
#2182Integrated circuit having memory cell array including barriers, and method of manufacturing same
#2183On-SOI integrated circuit comprising a lateral diode for protection against electrostatic discharges
#2184Charge breakdown avoidance for MIM elements in SOI base technology and method
#2185Self-protected metal-oxide-semiconductor field-effect transistor
#2186ON-SOI integrated circuit comprising a thyristor (SCR) for protection against electrostatic discharges
#2187Semiconductor device and manufacturing method thereof
#2188Floating body memory cell having gates favoring different conductivity type regions
#2189MOS transistor on SOI protected against overvoltages
#2190Radio-frequency switch system having improved intermodulation distortion performance
#2191Strained silicon and strained silicon germanium on insulator
#2192Circuits, devices, methods and applications related to silicon-on-insulator based radio-frequency switches
#2193Radio-frequency switch having gate node voltage compensation network
#2194Switch linearization by non-linear compensation of a field-effect transistor
#2195Complementary bipolar inverter
#2196Integrated semiconductor devices with single crystalline beam, methods of manufacture and design structure
#2197Strained silicon and strained silicon germanium on insulator field-effect transistor
#2198Interposers including fluidic microchannels and related structures and methods
#2199Semiconductor structures including fluidic microchannels for cooling and related methods
#2200CMOS DEVICES HAVING STRAIN SOURCE/DRAIN REGIONS AND LOW CONTACT RESISTANCE
#2201Undercut insulating regions for silicon-on-insulator device
#2202Semiconductor device with epitaxial source/drain facetting provided at the gate edge
#2203Trap rich layer formation techniques for semiconductor devices
#2204Semiconductor device, method for manufacturing same, and nonvolatile semiconductor memory device
#2205MEMORY CELL WITH ASYMMETRIC READ PORT TRANSISTORS
#2206Ultrathin body fully depleted silicon-on-insulator integrated circuits and methods for fabricating same
#2207Manufacturing process for zero-capacitor random access memory circuits
#2208Compound for forming organic film, and organic film composition using the same, process for forming organic film, and patterning process
#2209SOI semiconductor device comprising a substrate diode and a film diode formed by using a common well implantation mask
#2210Semiconductor structure and method for manufacturing the same
#2211Strained thin body CMOS device having vertically raised source/drain stressors with single spacer
#2212IMPLEMENTING ISOLATED SILICON REGIONS IN SILICON-ON-INSULATOR (SOI) WAFERS USING BONDED-WAFER TECHNIQUE
#2213Spacer isolation in deep trench
#2214Gated diode structure for eliminating RIE damage from cap removal
#2215DRAM with a nanowire access transistor
#2216Process for fabricating an integrated circuit having trench isolations with different depths
#2217Integrated circuit comprising at least one digital output port having an adjustable impedance, and corresponding adjustment method
#2218Semiconductor device
#2219Semiconductor device with isolated body portion
#2220Mixed orientation semiconductor device and method
#2221Switching circuit
#2222Retrograde substrate for deep trench capacitors
#2223Semiconductor active matrix on buried insulator
#2224Semiconductor device with electrically floating body
#2225Silicon-on-insulator high power amplifiers
#2226Retrograde substrate for deep trench capacitors
#2227Epitaxial semiconductor resistor with semiconductor structures on same substrate
#2228Semiconductor active matrix on buried insulator
#2229Inverted thin channel mosfet with self-aligned expanded source/drain
#2230Buried channel field-effect transistors
#2231Buried-channel field-effect transistors
#2232Inverted thin channel mosfet with self-aligned expanded source/drain
#2233On-chip capacitors in combination with CMOS devices on extremely thin semiconductor on insulator (ETSOI) substrates
#2234Semiconductor substrate with transistors having different threshold voltages
#2235Amplification circuit comprising input signal limiting network
#2236Semiconductor device
#2237Complementary metal-oxide-semiconductor (CMOS) device and method
#2238SEMICONDUCTOR SUBSTRATE WITH TRANSISTORS HAVING DIFFERENT THRESHOLD VOLTAGES
#2239Metal-insulator-metal (MIM) capacitor with deep trench (DT) structure and method in a silicon-on-insulator (SOI)
#2240Formation of multi-height MUGFET
#2241JFET device structures and methods for fabricating the same
#2242CMOS WITH SiGe CHANNEL PFETs AND METHOD OF FABRICATION
#2243CMOS WITH SiGe CHANNEL PFETs AND METHOD OF FABRICATION
#2244Diode-triggered silicon controlled rectifier with an integrated diode
#2245Capacitorless DRAM on bulk silicon
#2246BICMOS DEVICES ON ETSOI
#2247TRANSISTOR HAVING A STRESSED BODY
#2248SOI transistors with improved source/drain structures with enhanced strain
#2249MOS having a sic/sige alloy stack
#2250BIPOLAR TRANSISTOR MANUFACTURING METHOD
#2251Pseudo butted junction structure for back plane connection
#2252SOI substrate with acceptor-doped layer
#2253Isolator circuit and semiconductor device
#2254Structure and method of high-performance extremely thin silicon on insulator complementary metal—oxide—semiconductor transistors with dual stress buried insulators
#2255Semiconductor device and manufacturing method of the same
#2256Robust isolation for thin-box ETSOI MOSFETS
#2257Asymmetric FET formed through use of variable pitch gate for use as logic device and test structure
#2258Solar-powered energy-autonomous silicon-on-insulator device
#2259Element array with a plurality of electromechanical conversion devices
#2260SOI devices for plasma display panel driver chip
#2261Asymmetric FET formed through use of variable pitch gate for use as logic device and test structure
#2262Passive devices for FinFET integrated circuit technologies
#2263Nonvolatile memory device and method of fabricating the same
#2264Semiconductor device and structure
#2265Integrated circuit diode
#2266Lateral MOSFET with dielectric isolation trench
#2267Single poly electrically erasable programmable read only memory (single poly EEPROM) device
#2268Nickelide source/drain structures for CMOS transistors
#2269Embedded DRAM for extremely thin semiconductor-on-insulator
#2270Fin field effect transistor and fabrication method
#2271Embedded DRAM memory cell with additional patterning layer for improved strap formation
#2272Nonvolatile latch circuit and logic circuit, and semiconductor device using the same
#2273Semiconductor device
#2274REPLACEMENT GATE ELECTRODE WITH A TANTALUM ALLOY METAL LAYER
#2275Low external resistance ETSOI transistors
#2276Method of forming substrate contact for semiconductor on insulator (SOI) substrate
#2277REPLACEMENT GATE ELECTRODE WITH A TANTALUM ALLOY METAL LAYER
#2278Manufacturing method for a device with transistors strained by silicidation of source and drain zones
#2279LOW EXTERNAL RESISTANCE ETSOI TRANSISTORS
#2280MOSFET with work function adjusted metal backgate
#2281Semiconductor devices having stressor regions and related fabrication methods
#2282Integrated circuit having raised source drains devices with reduced silicide contact resistance and methods to fabricate same
#2283Junction butting on SOI by raised epitaxial structure and method
#2284Flash memory and method for fabricating the same
#2285SOI bipolar junction transistor with substrate bias voltages
#2286Extremely thin semiconductor-on-insulator (ETSOI) layer
#2287Semiconductor substrate for manufacturing transistors having back-gates thereon
#2288Trench capacitor with spacer-less fabrication process
#2289Method of making a 3D integrated circuit
#2290FIELD-EFFECT TRANSISTOR ON A SELF-ASSEMBLED SEMICONDUCTOR WELL
#2291High frequency switch
#2292High density multi-electrode array
#2293MOS field-effect transistor formed on the SOI substrate
#2294High frequency semiconductor switch
#2295High density memory cells using lateral epitaxy
#2296Selective amorphization for electrical signal isolation and linearity in SOI structures
#2297Semiconductor device and method for manufacturing the same
#2298Integrated circuit including DRAM and SRAM/logic
#2299Integrated circuit with a thin body field effect transistor and capacitor
#2300Thermally stable high-K tetragonal HFOlayer within high aspect ratio deep trenches
#2301Integrated Circuit Having Back Gating, Improved Isolation And Reduced Well Resistance And Method To Fabricate Same
#2302Structure and method for using high-K material as an etch stop layer in dual stress layer process
#2303Controlling threshold voltage in carbon based field effect transistors
#2304REDUCTION OF CONTACT RESISTANCE AND JUNCTION LEAKAGE
#2305Replacement gate structure for transistor with a high-K gate stack
#2306Integrated circuit having raised source drains devices with reduced silicide contact resistance and methods to fabricate same
#2307Electrical isolation structures for ultra-thin semiconductor-on-insulator devices
#2308SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME
#2309Integrated circuit having raised source drains devices with reduced silicide contact resistance and methods to fabricate same
#2310Integrated circuit with a thin body field effect transistor and capacitor
#2311Integrated circuit including DRAM and SRAM/logic
#2312Integrated circuit including DRAM and SRAM/logic
#2313SYSTEMS AND METHODS FOR BACKSIDE THRESHOLD VOLTAGE ADJUSTMENT
#2314Self aligned structures and design structure thereof
#2315CMOS having a SiC/SiGe alloy stack
#2316THIN FILM TRANSISTOR AND FABRICATING METHOD
#2317Structure, method and system for complementary strain fill for integrated circuit chips
#2318Isolation region fabrication for replacement gate processing
#2319REDUCTION OF THICKNESS VARIATIONS OF A THRESHOLD SEMICONDUCTOR ALLOY BY REDUCING PATTERNING NON-UNIFORMITIES PRIOR TO DEPOSITING THE SEMICONDUCTOR ALLOY
#2320Integrated circuits with components on both sides of a selected substrate and methods of fabrication
#2321Integrated Circuits on Ceramic Wafers Using Layer Transfer Technology
#2322Integrated circuit device, system, and method of fabrication
#2323Hybrid CMOS nanowire mesh device and PDSOI device
#2324Hybrid CMOS nanowire mesh device and FINFET device
#2325Silicon on insulator integrated high-current N type combined semiconductor device
#2326Transistor, method for fabricating the transistor, and semiconductor device comprising the transistor
#2327Deep isolation trench structure and deep trench capacitor on a semiconductor-on-insulator substrate
#2328SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
#2329Integrated circuits formed on strained substrates and including relaxed buffer layers and methods for the manufacture thereof
#2330Method and structure for forming on-chip high quality capacitors with ETSOI transistors
#2331Embedded dynamic random access memory device formed in an extremely thin semiconductor on insulator (ETSOI) substrate
#2332Method and structure for forming ETSOI capacitors, diodes, resistors and back gate contacts
#2333On-chip capacitors in combination with CMOS devices on extremely thin semiconductor on insulator (ETSOI) substrates
#2334Semiconductor device including an isolation film buried in a groove
#2335Method of replacing silicon with metal in integrated circuit chip fabrication
#2336Semiconductor structure and method for forming the semiconductor structure
#2337Integrated circuit assembly and method of making
#2338HIGH DENSITY MULTI-ELECTRODE ARRAY
#2339Structure and method to fabricate a body contact
#2340Noble gas implantation region in top silicon layer of semiconductor-on-insulator substrate
#2341Borderless contact for ultra-thin body devices
#2342Polysilicon/metal contact resistance in deep trench
#2343Method, structure and design structure for customizing history effects of SOI circuits
#2344Radio-frequency switches having silicon-on-insulator field-effect transistors with reduced linear region resistance
#2345Semiconductor-on-insulator with back side body connection
#2346CMOS integrated circuit and amplifying circuit
#2347Semiconductor architecture having field-effect transistors especially suitable for analog applications
#2348Integrated semiconductor devices with single crystalline beam, methods of manufacture and design structure
#2349Silicon-on-insulator high power amplifiers
#2350Method for developing a custom device
#2351Integrated semiconductor devices with amorphous silicon beam, methods of manufacture and design structure
#2352Methods of manufacturing integrated semiconductor devices with single crystalline beam
#2353Semiconductor device and method of manufacturing the same
#2354Semiconductor device
#2355Semiconductor device including an oxide semiconductor layer
#2356Integrated circuit having a MOM capacitor and method of making same
#2357Radiation hardened memory cell and design structures
#2358SRAM cell with individual electrical device threshold control
#2359Recessed single crystalline source and drain for semiconductor-on-insulator devices
#2360CMOS compatible BioFET
#2361Dynamic memory cell provided with a field-effect transistor having zero swing
#2362Post-gate shallow trench isolation structure formation
#2363Reducing performance variation of narrow channel devices
#2364Method for fabrication of a semiconductor device and structure
#2365Shallow trench isolation structure having a nitride plug
#2366High-k dielectric and silicon nitride box region
#2367Carbon implant for workfunction adjustment in replacement gate transistor
#2368MOSFET formed on an SOI wafer with a back gate
#2369Carbon implant for workfunction adjustment in replacement gate transistor
#2370Semiconductor device and method for manufacturing semiconductor device
#2371Transistor having reduced channel length
#2372Integrated circuit using FDSOI technology, with well sharing and means for biasing oppositely doped ground planes present in a same well
#2373Semiconductor device
#2374Electric charge flow circuit for a time measurement
#2375Semiconductor integrated circuit device and manufacturing method for semiconductor integrated circuit device
#2376Restricted stress regions formed in the contact level of a semiconductor device
#2377Silicon-on-insulator chip having multiple crystal orientations
#2378Structure and method to form passive devices in ETSOI process flow
#2379Enhancement of charge carrier mobility in transistors
#2380Enhancement of charge carrier mobility in transistors
#2381METHOD FOR FABRICATING JUNCTIONLESS TRANSISTOR
#2382Junctionless transistor
#2383Gettering method for dielectrically isolated devices
#2384Method for producing semiconductor device and semiconductor device having pillar-shaped semiconductor
#2385SENSOR ELEMENT WITH ENGINEERED SILICIDE
#2386SOI integrated circuit comprising adjacent cells of different types
#2387Self-aligned bottom plate for metal high-K dielectric metal insulator metal (MIM) embedded dynamic random access memory
#2388Manufacturing method of oxide semiconductor device
#2389METHOD FOR RADIATION HARDENING AN INTEGRATED CIRCUIT
#2390Non-volatile latch circuit and logic circuit, and semiconductor device using the same
#2391Insulation wall between transistors on SOI
#2392Semiconductor device with work function adjusting layer having varied thickness in a gate width direction and methods of making same
#2393On-chip radiation dosimeter
#2394Semiconductor device with a common back gate isolation region and method for manufacturing the same
#2395Semiconductor device with back gate isolation regions and method for manufacturing the same
#2396Integrated circuits that include deep trench capacitors and methods for their fabrication
#2397Semiconductor device and method for manufacturing semiconductor device
#2398Isolation region fabrication for replacement gate processing
#2399Raised source/drain field effect transistor
#2400High linearity hybrid transistor device