208383 ⎘
Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof; Multistep manufacturing processes therefor; Types of semiconductor device ; Multistep manufacturing processes therefor; Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by variation of the electric current supplied or the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched, e.g. two-terminal devices; Diodes Multilayer diodes, e.g. PNPN diodes
DIODE AND METHOD OF MAKING THE SAME
#2Semiconductor Structure and Method of Fabricating the Same
#3Method of Fabricating a Semiconductor Structure
#4METHOD OF MAKING HIGH POWER TVS WITH ENHANCED REPETITIVE SURGE PERFORMANCE
#5Integration of Nanosheets with Bottom Dielectric Isolation and Ideal Diode
#6Silicon-controlled rectifiers for electrostatic discharge protection
#7Merged PiN Schottky (MPS) diode with plasma spreading layer and manufacturing method thereof
#8Diode and method of making the same
#9Semiconductor structure and method of fabricating the same
#10Electrostatic discharge protection devices for bi-directional current protection
#11Stacked diode with side passivation and method of making the same
#12Bi-directional bi-polar device for ESD protection
#13Gallium nitride power device and manufacturing method thereof
#14Merged PiN Schottky (MPS) diode with plasma spreading layer and manufacturing method thereof
#15ESD protection
#16Emissive display device comprising LEDs
#17Method of forming a semiconductor device structure
#18Edge cell signal line antenna diodes
#19Semiconductor device having termination region with insulator films having different coefficients of moisture absorption
#20Semiconductor device and manufacturing method thereof
#21Semiconductor element, semiconductor device, and method for manufacturing same
#22Semiconductor device having termination region with insulator having low coefficient of moisture absorption
#23Semiconductor device
#24Protection device and method for fabricating the protection device
#25Semiconductor device
#26Method and system for in-situ etch and regrowth in gallium nitride based devices
#27Transient overvoltage protection device
#28Electrostatic discharge protection structure, method for manufacturing an electrostatic discharge protection structure, and vertical thyristor structure
#29Semiconductor device and method of forming the same
#30Semiconductor device and semiconductor device manufacturing method
#31Semiconductor device including a resonant tunneling diode structure with electron mean free path control layers
#32Method for making a semiconductor device including a resonant tunneling diode structure having a superlattice
#33Semiconductor device including resonant tunneling diode structure having a superlattice
#34Method for making a semiconductor device including a resonant tunneling diode with electron mean free path control layers
#35Semiconductor device
#36Semiconductor element, semiconductor device, and method for manufacturing same
#37Reducing antenna effects in SOI devices
#38Semiconductor structure and method for manufacturing the same
#39Fabricating high-power devices
#40Metal-semiconductor-metal (MSM) heterojunction diode
#41COMPACT MEMORY STRUCTURE INCLUDING TUNNELING DIODE
#42Tunable voltage margin access diodes
#43Compound varactor
#44Tunable voltage margin access diodes
#45Transient overvoltage protection device
#46Tunable voltage margin access diodes
#47Tunable voltage margin access diodes
#48Ultra high voltage electrostatic discharge protection device with current gain
#49METHOD AND SYSTEM FOR IN-SITU ETCH AND REGROWTH IN GALLIUM NITRIDE BASED DEVICES
#50Electrostatic discharge protection structure and fabrication method thereof
#51Diode
#52SCR with fin body regions for ESD protection
#53Structure and method for transient voltage suppression devices with a two-region base
#54Compound varactor
#55Semiconductor device including high-voltage diode
#56Semiconductor device including a super junction MOSFET
#57Method of fabricating a merged P-N junction and schottky diode with regrown gallium nitride layer
#58Methods of fabricating diodes with multiple junctions
#59METHOD OF MANUFACTURING HIGH POWER VERTICAL GaN-PIN DIODE
#60Method of manufacturing a vertical semiconductor device
#61Compact memory structure including tunneling diode
#62Bi-directional ESD diode structure with ultra-low capacitance that consumes a small amount of silicon real estate
#63Method of fabricating a gallium nitride merged P-I-N schottky (MPS) diode by regrowth and etch back
#64Fabrication method of semiconductor memory device
#65Silicon-controlled rectifier electrostatic discharge protection device and method for forming the same
#66Protective structure and method for producing a protective structure
#67Ultra high voltage electrostatic discharge protection device with current gain
#68Diodes with multiple junctions and fabrication methods therefor
#69PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS
#70Ultrahigh-voltage semiconductor structure and method for manufacturing the same
#71Vertical semiconductor device and method of manufacturing thereof
#72SCR with fin body regions for ESD protection
#73Bi-directional silicon controlled rectifier structure
#74Semiconductor device and method for manufacturing semiconductor device
#75Dual-tub junction-isolated voltage clamp devices for protecting low voltage circuitry connected between high voltage interface pins and methods of forming the same
#76Method of fabricating a merged P-N junction and schottky diode with regrown gallium nitride layer
#77Method for producing a protective structure
#78High voltage electrostatic discharge protection device
#79Electrostatic discharge resistant diodes
#80Electrostatic discharge resistant diodes
#81Electrostatic discharge protection structure and fabrication method thereof
#82Semiconductor device including ESD protection device
#83Access device having counter doping layer and semiconductor memory device having the same
#84Method of fabricating a gallium nitride merged P-i-N Schottky (MPS) diode by regrowth and etch back
#85Method and system for in-situ etch and regrowth in gallium nitride based devices
#86Protective structure
#87Low voltage PNPN protection device
#88Gate protection diode for high-frequency power amplifier
#89Protective structure having a semiconductor substrate
#90Low voltage PNPN protection device
#91Methods of forming voltage limiting devices
#92Semiconductor device and method of manufacturing the same
#93Double-groove bidirectional vertical component
#94Punch-through diode
#95Low triggering voltage DIAC structure
#96Quasi-vertical gated NPN-PNP ESD protection device
#97Shockley diode having a low turn-on voltage
#98Method for producing a protective structure
#99Gate protection diode for high-frequency power amplifier
#100Voltage limiting devices
#101ESD protecting circuit and manufacturing method thereof
#102Quasi-vertical gated NPN-PNP ESD protection device
#103Gate protection diode for high-frequency power amplifier
#104Epitaxial surge protection device
#105Method for producing a protective structure
#106Robust ESD cell
#107Electrostatic discharge protection device
#108Low capacitance SCR with trigger element
#109ESD protecting circuit and manufacturing method thereof
#110Transient voltage suppressor (TVS) with reduced breakdown voltage