ClassID:

208394

H01L29/66204 - CPC Classification

Classification description:

Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof; Multistep manufacturing processes therefor; Types of semiconductor device ; Multistep manufacturing processes therefor; Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by variation of the electric current supplied or the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched, e.g. two-terminal devices with an active layer made of a group 13/15 material Diodes

Recent Application in this class:
#1
20250048713
2025-02-06

NITRIDE-BASED SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

#2
20240047201
2024-02-08

METHOD FOR PRODUCING III-N MATERIAL-BASED VERTICAL COMPONENTS

#3
20220393036
2022-12-08

Semiconductor by-pass switch

#4
20220285504
2022-09-08

Method for manufacturing nitride semiconductor device and nitride semiconductor device

#5
20220254939
2022-08-11

Epitaxial wafer, method of manufacturing the epitaxial wafer, diode, and current rectifier

#6
20220254937
2022-08-11

Stacked III-V semiconductor diode

#7
20210376067
2021-12-02

FABRICATION OF LATERAL SUPERJUNCTION DEVICES USING SELECTIVE EPITAXY

#8
20210358795
2021-11-18

Integrated circuit devices with an engineered substrate

#9
20210296509
2021-09-23

STACKED HIGH-BLOCKING INGAAS SEMICONDUCTOR POWER DIODE

#10
20210242281
2021-08-05

GaN-based threshold switching device and memory diode

#11
20210202257
2021-07-01

Plasma-based edge terminations for gallium nitride power devices

#12
20210126591
2021-04-29

Semiconductor device and power amplifier module

#13
20210111021
2021-04-15

Method of forming a semiconductor device structure

#14
20210090972
2021-03-25

Semiconductor chip contact structure, device assembly, and method of fabrication

#15
20210036103
2021-02-04

Fabrication of lateral superjunction devices using selective epitaxy

#16
20200400578
2020-12-24

Mapping and evaluating GaN wafers for vertical device applications

#17
20200273965
2020-08-27

High power gallium nitride electronics using miscut substrates

#18
20200177140
2020-06-04

Semiconductor device and power amplifier module

#19
20200144328
2020-05-07

GaN-based threshold switching device and memory diode

#20
20200111698
2020-04-09

Methods of manufacturing vertical semiconductor diodes using an engineered substrate

#21
20200066849
2020-02-27

P-I-N diode and connected group III-N device and their methods of fabrication

#22
20190355622
2019-11-21

Method for fabricating a semiconductor device and a semiconductor device

#23
20190348522
2019-11-14

High power gallium nitride electronics using miscut substrates

#24
20190326446
2019-10-24

III-V semiconductor diode

#25
20190326148
2019-10-24

Electronic power devices integrated with an engineered substrate

#26
20190312151
2019-10-10

Stacked III-V semiconductor component

#27
20190296699
2019-09-26

Semiconductor device and power amplifier module

#28
20190221676
2019-07-18

Stacked III-V semiconductor diode

#29
20190198625
2019-06-27

Stacked III-V semiconductor component

#30
20190181010
2019-06-13

Semiconductor device

#31
20190122916
2019-04-25

Methods of forming a vertical semiconductor diode using an engineered substrate

#32
20190096879
2019-03-28

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

#33
20180374846
2018-12-27

Dual-series varactor EPI

#34
20180309417
2018-10-25

Semiconductor device and power amplifier module

#35
20180308835
2018-10-25

Tight integrated vertical transistor dual diode structure for electrostatic discharge circuit protector

#36
20180286684
2018-10-04

Method of manufacturing semiconductor device including implanting impurities into an implanted region of a semiconductor layer and annealing the implanted region

#37
20180277687
2018-09-27

III-V semiconductor diode

#38
20180277686
2018-09-27

III-V semiconductor diode

#39
20180261667
2018-09-13

Semiconductor device

#40
20180182882
2018-06-28

Electronic device using group III nitride semiconductor and its fabrication method

#41
20180182881
2018-06-28

Electronic device using group III nitride semiconductor and its fabrication method

#42
20180182873
2018-06-28

Electronic device using group III nitride semiconductor and its fabrication method

#43
20180182872
2018-06-28

Electronic device using group III nitride semiconductor and its fabrication method

#44
20180175215
2018-06-21

Semiconductor device including zener diode and method of manufacturing thereof

#45
20180166556
2018-06-14

High power gallium nitride electronics using miscut substrates

#46
20180138320
2018-05-17

III-V semiconductor diode

#47
20180138043
2018-05-17

III-V semiconductor diode

#48
20180061694
2018-03-01

Electronic power devices integrated with an engineered substrate

#49
20180061630
2018-03-01

Vertical semiconductor diode manufactured with an engineered substrate

#50
20180025950
2018-01-25

Top contact resistance measurement in vertical FETS

#51
20170372905
2017-12-28

Manufacturing method of semiconductor device

#52
20170263701
2017-09-14

Semiconductor device including insulating film that includes negatively charged microcrystal

#53
20170243963
2017-08-24

Producing a semiconductor device by epitaxial growth

#54
20170194456
2017-07-06

Fabricating high-power devices

#55
20170133481
2017-05-11

HIGH POWER GALLIUM NITRIDE ELECTRONICS USING MISCUT SUBSTRATES

#56
20160336408
2016-11-17

Reduction of defect induced leakage in III-V semiconductor devices

#57
20160247800
2016-08-25

Dual-series varactor EPI

#58
20160211385
2016-07-21

Manufacturing method for semiconductor device with point defect region doped with transition metal

#59
20160163792
2016-06-09

Semiconductor device including an insulating layer which includes negatively charged microcrystal

#60
20150364612
2015-12-17

Method of fabricating a GaN P-i-N diode using implantation

#61
20150255290
2015-09-10

Method for manufacturing semiconductor device

#62
20150243736
2015-08-27

High voltage gallium nitride based semiconductor device and manufacturing method of the same

#63
20150236008
2015-08-20

III-nitride based ESD protection device

#64
20150228713
2015-08-13

High voltage diode

#65
20150137137
2015-05-21

Current aperture vertical electron transistors with ammonia molecular beam epitaxy grown p-type gallium nitride as a current blocking layer

#66
20150123138
2015-05-07

High power gallium nitride electronics using miscut substrates

#67
20140346590
2014-11-27

Semiconductor device comprising a gate electrode connected to a source terminal

#68
20140346527
2014-11-27

Method of fabricating a gallium nitride P-i-N diode using implantation

#69
20140206179
2014-07-24

Method and system for junction termination in GaN materials using conductivity modulation

#70
20140124791
2014-05-08

HEMT with compensation structure

#71
20140120703
2014-05-01

Method for manufacturing nitride semiconductor device

#72
20140110815
2014-04-24

High voltage diode

#73
20140091312
2014-04-03

Power switching device and method of manufacturing the same

#74
20140070369
2014-03-13

Semiconductor device with point defect region doped with transition metal

#75
20140061876
2014-03-06

Method of manufacturing vertical pin diodes

#76
20140061846
2014-03-06

Diode and method of manufacturing diode

#77
20140042447
2014-02-13

Method and system for gallium nitride electronic devices using engineered substrates

#78
20130161780
2013-06-27

Method of fabricating a GaN P-i-N diode using implantation

#79
20130161633
2013-06-27

Method and system for junction termination in GaN materials using conductivity modulation

#80
20130134439
2013-05-30

Epitaxial substrate for semiconductor element, semiconductor element, PN junction diode, and method for manufacturing an epitaxial substrate for semiconductor element

#81
20130087879
2013-04-11

Schottky diode with buried layer in GaN materials

#82
20130087835
2013-04-11

Method and system for floating guard rings in gallium nitride materials

#83
20130043484
2013-02-21

HEMT with integrated low forward bias diode

#84
20130032814
2013-02-07

Method and system for formation of P-N junctions in gallium nitride based electronics

#85
20120319127
2012-12-20

Current aperture vertical electron transistors with ammonia molecular beam epitaxy grown P-type gallium nitride as a current blocking layer

#86
20120288083
2012-11-15

Systems and methods for forming isolated devices in a handle wafer

#87
20120091514
2012-04-19

Semiconductor Junction Diode Device And Method For Manufacturing The Same

#88
20120001305
2012-01-05

Method of manufacturing vertical pin diodes

#89
20110140175
2011-06-16

Monolithic microwave integrated circuit device and method of forming the same

#90
20110076811
2011-03-31

Method of manufacturing a semiconductor device

#91
20100323489
2010-12-23

Method of forming a vertical diode and method of manufacturing a semiconductor device using the same

#92
20100224952
2010-09-09

SCHOTTKY BARRIER DIODE AND METHOD OF PRODUCING THE SAME

#93
20100193766
2010-08-05

Process for producing a PN homojunction in a nanostructure

#94
20090291520
2009-11-26

Method for manufacturing semiconductor apparatus

#95
20090057836
2009-03-05

Semiconductor device having electrode film in which film thickness of periphery is thinner than film thickness of center

#96
20080200014
2008-08-21

Method of forming a vertical diode and method of manufacturing a semiconductor device using the same

#97
20070295985
2007-12-27

GALLIUM NITRIDE MATERIAL DEVICES AND METHODS OF FORMING THE SAME

#98
20070096239
2007-05-03

Semiconductor devices and methods of manufacture

#99
18045071
2024-08-20

Method for implant and anneal for high voltage field effect transistors

#100
14709044
2016-07-26

Reduction of defect induced leakage in III-V semiconductor devices