ClassID:

208450

H01L29/742 - CPC Classification

Classification description:

Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof; Multistep manufacturing processes therefor; Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched; Bipolar devices; Thyristor-type devices, e.g. having four-zone regenerative action structurally associated with at least one other device the device being a field effect transistor

Recent Application in this class:
#1
20240113209
2024-04-04

LOW VOLTAGE TRIGGERING SILICON CONTROLLED RECTIFIER

#2
20240079482
2024-03-07

GATED PROTECTION DEVICE STRUCTURES FOR AN ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT

#3
20230163757
2023-05-25

FinFET thyristors with embedded transistor control for protecting high-speed communication systems

#4
20230163132
2023-05-25

Semiconductor devices including semiconductor pattern

#5
20230115447
2023-04-13

Memory device using semiconductor element

#6
20220130984
2022-04-28

SEMICONDUCTOR DEVICE AND METHOD OF FORMING A SEMICONDUCTOR STRUCTURE

#7
20210358913
2021-11-18

Semiconductor devices including semiconductor pattern

#8
20210344336
2021-11-04

FinFET thyristors for protecting high-speed communication interfaces

#9
20210098445
2021-04-01

Embedded N-channel metal oxide semiconductor (nmos) triggered silicon controlled rectification device

#10
20190386093
2019-12-19

Power electronic arrangement

#11
20190272993
2019-09-05

Method for depositing a metal chalcogenide on a substrate by cyclical deposition

#12
20190131787
2019-05-02

Silicon controlled rectifier dynamic triggering and shutdown via control signal amplification

#13
20190123039
2019-04-25

Low capacitance transient voltage suppressor

#14
20180323185
2018-11-08

Diode-triggered Schottky silicon-controlled rectifier for Fin-FET electrostatic discharge control

#15
20180248025
2018-08-30

FinFET SCR with SCR implant under anode and cathode junctions

#16
20180219007
2018-08-02

Low trigger and holding voltage silicon controlled rectifier (SCR) for non-planar technologies

#17
20180219006
2018-08-02

Diode-triggered schottky silicon-controlled rectifier for Fin-FET electrostatic discharge control

#18
20180166445
2018-06-14

Memory circuit with thyristor

#19
20180131236
2018-05-10

Power transmission device and wireless power transfer system

#20
20180130804
2018-05-10

Vertical Thyristor Cell and Memory Array with Silicon Germanium Base Regions

#21
20180033877
2018-02-01

Electronic device including a HEMT

#22
20170256614
2017-09-07

Vertical insulated gate turn-off thyristor with intermediate p+ layer in p-base

#23
20170179106
2017-06-22

Electrostatic protection circuit, semiconductor integrated circuit device, and electronic device

#24
20170062406
2017-03-02

Electrostatic discharge protection device and electronic device having the same

#25
20170033096
2017-02-02

ESD protection device with improved bipolar gain using cutout in the body well

#26
20160322969
2016-11-03

Half-bridge HEMT circuit and an electronic package including the circuit

#27
20160322485
2016-11-03

Bidirectional HEMT and an electronic package including the bidirectional HEMT

#28
20160322351
2016-11-03

Electronic device including a bidirectional HEMT

#29
20160240644
2016-08-18

Semiconductor devices and a method for forming a semiconductor device

#30
20160163691
2016-06-09

ESD protection device with improved bipolar gain using cutout in the body well

#31
20160148940
2016-05-26

Cross-coupled thyristor SRAM semiconductor structures and methods of fabrication

#32
20160111530
2016-04-21

Structure of a trench MOS rectifier and method of forming the same

#33
20160111414
2016-04-21

SCR with fin body regions for ESD protection

#34
20160093622
2016-03-31

Cross-coupled thyristor SRAM semiconductor structures and methods of fabrication

#35
20150060939
2015-03-05

SCR with fin body regions for ESD protection

#36
20150016165
2015-01-15

Gated thyristor power device

#37
20140374790
2014-12-25

Structure of a trench MOS rectifier and method of forming the same

#38
20140054642
2014-02-27

ESD protection device with improved bipolar gain using cutout in the body well

#39
20120305984
2012-12-06

SCR/MOS clamp for ESD protection of integrated circuits

#40
20110129967
2011-06-02

Three-terminal power device with high switching speed and manufacturing process

#41
20100327343
2010-12-30

Bond pad with integrated transient over-voltage protection

#42
20100001783
2010-01-07

Three-terminal power device with high switching speed and manufacturing process

#43
20090032839
2009-02-05

Semiconductor device and its driving method

#44
20080191238
2008-08-14

Bipolar mosfet devices and methods for their use

#45
20080032463
2008-02-07

SEMICONDUCTOR MEMORY DEVICE

#46
20060227601
2006-10-12

Memory cell with trenched gated thyristor

#47
20060043411
2006-03-02

Memory cell with trenched gated thyristor

#48
20050280154
2005-12-22

Semiconductor memory device

#49
15788246
2018-11-27

Low capacitance transient voltage suppressor