208446 ⎘
Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof; Multistep manufacturing processes therefor; Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched; Bipolar devices Thyristor-type devices, e.g. having four-zone regenerative action
Sub-classes:MEMORY DEVICE BASED ON THYRISTORS
#2HIGH PERFORMANCE SILICON CONTROLLED RECTIFIER DEVICES
#3UNINTERRUPTIBLE POWER SUPPLY DEVICE AND CONTROL MODULE FOR UNINTERRUPTIBLE POWER SUPPLY DEVICE
#4POWER DEVICES WITH IMPROVED ON-RESISTANCE
#5SEMICONDUCTOR DEVICE WITH A SIDE SURFACE HAVING DIFFERENT PARTIAL REGIONS
#6THYRISTOR AND METHOD FOR MANUFACTURING THE SAME
#7POWER SEMICONDUCTOR DEVICE
#8Semiconductor device
#9SEMICONDUCTOR TRIODE
#10Thyristor semiconductor device and corresponding manufacturing method
#11SCR having selective well contacts
#12Thyristor assembly
#13SIC EPITAXIAL WAFER, MANUFACTURING APPARATUS OF A SIC EPITAXIAL WAFER, FABRICATION METHOD OF A SIC EPITAXIAL WAFER, AND SEMICONDUCTOR DEVICE
#14Electronic device
#15Thyristor assembly
#16Semiconductor memory device
#17Short-circuit semiconductor component and method for operating it
#18Motor starter and method for starting an electric motor
#19Two-terminal device and lighting device using the same
#20Multi-layer random access memory and methods of manufacture
#21Die stack assembly using an edge separation structure for connectivity through a die of the stack
#22Electric field shielding in silicon carbide metal-oxide-semiconductor (MOS) device cells using body region extensions
#23Thyristor semiconductor device and corresponding manufacturing method
#243D stacked high-density memory cell arrays and methods of manufacture
#25THYRISTORS
#26Electronic device
#27Silicon controlled rectifier
#28Bypass thyristor device with gas expansion cavity within a contact plate
#29ADVANCED FIELD STOP THYRISTOR STRUCTURE AND MANUFACTURE METHODS
#30Electronic device for ESD protection
#31LIGHT-EMITTING APPARATUS, OPTICAL MEASURING INSTRUMENT, IMAGE FORMING APPARATUS, AND LIGHT-EMITTING DEVICE
#32Switching Device for Switching High Voltages for Cable Testing via the Application of High Voltage to a Test Cable and Discharge of the Test Cable
#33Multi-layer random access memory and methods of manufacture
#34ESD protection silicon controlled rectifier device
#35Semiconductor triode
#36Process for fabricating circuit components in matrix batches
#37Method of forming a photodiode
#38Memory array comprising memory cells of Z2-FET type
#39Methods of forming a thyristor-based random access memory using fin structures and elevated layers
#40Thrysitor and thermal switch device and assembly techniques therefor
#413D stacked high-density memory cell arrays and methods of manufacture
#42Methods of reading and writing data in a thyristor random access memory
#43Thyristor Memory Cell with Assist Device
#44Light emitting component, print head and image forming apparatus
#45Methods of reading and writing data in a thyristor random access memory
#46Electronic device for ESD protection
#47Protection device
#48Power semiconductor device termination structure
#49Method for manufacturing an electronic device and electronic device
#50Thyristor with improved plasma spreading
#51Sensor and heater for stimulus-initiated fracture of a substrate
#52Epitaxial wafer manufacturing method, epitaxial wafer, semiconductor device manufacturing method, and semiconductor device
#53Semiconductor switch control device
#54Methods of reading and writing data in a thyristor random access memory
#55Thyristor memory cell with assist device
#56Semiconductor device, manufacturing method therefor and semiconductor module
#57Electric field shielding in silicon carbide metal-oxide-semiconductor (MOS) device cells using body region extensions
#58Electric field shielding in silicon carbide metal-oxide-semiconductor (MOS) device cells
#59Electric field shielding in silicon carbide metal-oxide-semiconductor (MOS) devices having an optimization layer
#60Electric field shielding in silicon carbide metal-oxide-semiconductor (MOS) device cells using channel region extensions
#61Method and system for a semiconductor device with integrated transient voltage suppression
#62Semiconductor device and semiconductor apparatus
#63Die stack assembly using an edge separation structure for connectivity through a die of the stack
#64Light emitting component, print head, and image forming apparatus
#65Phase control thyristor
#66Methods and systems for reducing electrical disturb effects between thyristor memory cells using heterostructured cathodes
#67Vertical thyristor memory with minority carrier lifetime reduction
#68Split-electrode vertical cavity optical device
#69Dual wavelength hybrid device
#70Trench separation diffusion for high voltage device
#71Silicon-controlled rectifier and an ESD clamp circuit
#72Semiconductor devices
#73Method of forming a semiconductor device termination and structure therefor
#74Thyristor random access memory device and method
#75Methods of retaining and refreshing data in a thyristor random access memory
#76Fin-based semiconductor devices and methods
#77Semiconductor device that facilitates a reduction in the occurrences of cracking in a semiconductor layer accompanying thermal stress
#78Method of fabricating a semiconductor device and semiconductor product
#79Method and power semiconductor device having an insulating region arranged in an edge termination region
#80Electronic device for ESD protection
#81Bipolar non-punch-through power semiconductor device
#82Semiconductor device
#83Semiconductor device with a semiconductor body containing hydrogen-related donors
#84Injection control in semiconductor power devices
#85Semiconductor device
#86Coherent optical receiver
#87Vertical semiconductor pillar device
#88Method for postdoping a semiconductor wafer
#89Methods of reading and writing data in a thyristor random access memory
#90Silicon carbide power bipolar devices with deep acceptor doping
#91Field plate structure for power semiconductor device and manufacturing method thereof
#92Injection control in semiconductor power devices
#93Controller
#94Semiconductor device
#95THYRISTOR RANDOM ACCESS MEMORY
#96Method of manufacturing super junction for semiconductor device
#97Semiconductor device with a field ring edge termination structure and a separation trench arranged between different field rings
#98ESD protection thyristor adapted to electro-optical devices
#99Optical waveguide to be carried by a semiconductor material including a plurality of parallel strips of alternating conductivity types and related methods
#100Ultra-fast breakover diode
#101Semiconductor device including at least one type of deep-level dopant
#102Device and method for controlling the turn-off of a solid state switch (SGTO)
#103Semiconductor device including a diode and guard ring
#104Optoelectronic integrated circuit
#105Silicon carbide epitaxy
#106Semiconductor ESD device and method of making same
#107Packaged semiconductor device, a semiconductor device and a method of manufacturing a packaged semiconductor device
#108Power semiconductor device having reduced gate-collector capacitance
#109Two-dimensional (2D) material element with in-plane metal chalcogenide-based heterojunctions and devices including said element
#110Methods of manufacturing superjunction devices
#111Semiconductor device having a patterned gate dielectric
#112Semiconductor devices in SiC using vias through N-type substrate for backside contact to P-type layer
#113Triode
#114SCR component with temperature-stable characteristics
#115Superjunction structures for power devices and methods of manufacture
#116Method and system for a semiconductor device with integrated transient voltage suppression
#117Semiconductor devices and methods of manufacture
#118Ultra-fast breakover diode
#119Semiconductor electrostatic protection circuit device
#120Floating bond pad for power semiconductor devices
#121Electrostatic discharge protection device and electronic apparatus thereof
#122Methods and apparatus for ESD protection circuits
#123Methods and apparatus for ESD structures
#124Super junction for semiconductor device and method for manufacturing the same
#125CASCODE CIRCUIT DEVICE WITH IMPROVED REVERSE RECOVERY CHARACTERISTIC
#126Semiconductor devices and fabrication methods
#127Silicon controlled rectifier structure with improved junction breakdown and leakage control
#128Systems and methods for terminating junctions in wide bandgap semiconductor devices
#129Electrostatic discharge (ESD) silicon controlled rectifier (SCR) structure
#130Memory cells, memory arrays, methods of forming memory cells, and methods of forming a shared doped semiconductor region of a vertically oriented thyristor and a vertically oriented access transistor
#131Semiconductor device with laterally varying doping concentrations
#132Method of forming a semiconductor device having a patterned gate dielectric and structure therefor
#133Thyristor-based, dual-polarity blocking photo-conductive semiconductor switch (PCSS) for short pulse switching and methods
#134Thyristor random access memory device and method
#1353C-SiC transistor
#136High-voltage vertical power component
#137Thyristor component
#138Semiconductor device including first and second semiconductor materials
#139Superjunction devices having narrow surface layout of terminal structures, buried contact regions and trench gates
#140Semiconductor electrostatic protection circuit device
#141Bipolar non-punch-through power semiconductor device
#142Vertical BJT and SCR for ESD
#143Buried gate static induction thyristor
#144Optically triggered semiconductor device and method for making the same
#145Recessed channel negative differential resistance-based memory cell
#146Phase control thyristor with improved pattern of local emitter shorts dots
#147Electrostatic discharge (ESD) silicon controlled rectifier (SCR) structure
#148Silicon controlled rectifier structure with improved junction breakdown and leakage control
#149SiC devices with high blocking voltage terminated by a negative bevel
#150High density thyristor random access memory device and method
#151Vertical NPNP structure in a triple well CMOS process
#152Integrated circuit and method of forming sealed trench junction termination
#153Power semiconductor device
#154SiC devices with high blocking voltage terminated by a negative bevel
#155Semiconductor component with improved softness
#156Cascode circuit device with improved reverse recovery characteristic
#157Superjunction Structures for Power Devices and Methods of Manufacture
#158SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
#159Semiconductor ESD device and method of making same
#160Memory cells, memory arrays, methods of forming memory cells, and methods of forming a shared doped semiconductor region of a vertically oriented thyristor and a vertically oriented access transistor
#161Method of forming a semiconductor device termination and structure therefor
#162Discrete semiconductor device and method of forming sealed trench junction termination
#163Four-quadrant triac
#164Vertical NPNP structure in a triple well CMOS process
#165Integrated circuit having an edge passivation and oxidation resistant layer and method
#166High density thyristor random access memory device and method
#167Thyristor random access memory device and method
#168Electrostatic discharge (ESD) silicon controlled rectifier (SCR) structure
#169Bipolar punch-through semiconductor device and method for manufacturing such a semiconductor device
#170Semiconductor component with a trench edge termination
#171Recessed channel negative differential resistance-based memory cell
#172SEMICONDUCTOR DEVICE
#173Semiconductor ESD device and method of making same
#174Structure and method for an electrostatic discharge (ESD) silicon controlled rectifier (SCR) structure
#175Recessed channel negative differential resistance-based memory cell
#176Active semiconductor component with a reduced surface area
#177Integrated Circuit and Method of Forming Sealed Trench Junction Termination
#178Discrete semiconductor device and method of forming sealed trench junction termination
#179Electronic device and manufacturing method thereof
#180Semiconductor ESD device and method of making same
#181SEMICONDUCTOR DEVICE
#182Low capacitance over-voltage protection thyristor device
#183SCR controlled by the power bias
#184Isolated vertical power device structure with both N-doped and P-doped trenches
#185ELECTRONIC DEVICES AND METHODS FOR FORMING THE SAME
#186SEMICONDUCTOR DIVICE
#187Soft switching semiconductor component with high robustness and low switching losses
#188Semiconductor device with Cu metal-base and manufacturing method thereof
#189Integrated circuit having an edge passivation and oxidation resistant layer and method
#190Tuneable semiconductor device with discontinuous portions in the sub-collector
#191Electronic devices formed of high-purity molybdenum oxide
#192Thyristor and method of manufacture
#193Contact method for thin silicon carbide epitaxial layer and semiconductor devices formed by those methods
#194Isolated vertical power device structure with both N-doped and P-doped trenches
#195Recessed channel negative differential resistance-based memory cell
#196Electronic devices and methods for forming the same
#197Reduced leakage power devices by inversion layer surface passivation
#198Environmentally robust passivation structures for high-voltage silicon carbide semiconductor devices
#199Power devices and methods of manufacture
#200High voltage silicon carbide devices having bi-directional blocking capabilities and methods of fabricating the same
#201High voltage silicon carbide devices having bi-directional blocking capabilities
#202Increasing breakdown voltage in semiconductor devices with vertical series capacitive structures
#203Active semiconductor component with a reduced surface area
#204METHOD FOR MAKING A SEMICONDUCTOR DEVICE INCLUDING A MEMORY CELL WITH A NEGATIVE DIFFERENTIAL RESISTANCE (NDR) DEVICE
#205Semiconductor device having field stabilization film and method
#206Semiconductor device including a memory cell with a negative differential resistance (NDR) device
#207Bipolar-based SCR for electrostatic discharge protection
#208Vertical thyristor for ESD protection and a method of fabricating a vertical thyristor for ESD protection
#209Electronic devices formed on substrates and their fabrication methods
#210Power semiconductor device
#211Method of fabricating semiconductor devices employing at least one modulation doped quantum well structure and one or more etch stop layers for accurate contact formation
#212Method of fabricating semiconductor devices employing at least one modulation doped quantum well structure and one or more etch stop layers for accurate contact formation
#213Low capacitance over-voltage protection thyristor device
#214Compact SCR device and method for integrated circuits
#215Method for fabricating a semiconductor having a field zone
#216Pressed-contact type semiconductor device
#217Pressed-contact type semiconductor device
#218Thyristor-type memory device
#219Two-dimensional silicon controlled rectifier
#220Thyristor component with improved blocking capabilities in the reverse direction
#221High voltage power device with low diffusion pipe resistance
#222Thz detection employing modulation doped quantum well device structures
#223Semiconductor component comprising areas with a high platinum concentration
#224Peripheral circuits of three-dimensional mask-programmable memory
#225Active semiconductor component with an optimized surface area
#226Active semiconductor component with a reduced surface area
#227Electrically Programmable Three-Dimensional Memory Structures and Cells
#228Silicon-controlled rectifiers for an electrostatic discharge protection device
#229Transient voltage suppression device
#230Trench separation diffusion for high voltage device
#231Silicon-controlled rectifier and an ESD clamp circuit
#232Electrostatic discharge protection structure and electrostatic discharge protection circuit
#233Apparatus and method for allowing avalanche photodiode based single-photon detectors to be driven by the same electrical circuit in gated and in free-running modes