209066 ⎘
Solid state devices adapted for rectifying, amplifying, oscillating or switching without a potential-jump barrier or surface barrier, e.g. dielectric triodes; Ovshinsky-effect devices; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Bistable or multistable switching devices, e.g. for resistance switching non-volatile memory; Selection of switching materials; Compounds of sulfur, selenium or tellurium, e.g. chalcogenides Tellurides, e.g. GeSbTe
Phase changeable memory cell array region and method of forming the same
#2102I-shaped phase change memory cell
#2103Apparatus and methods for forming phase change layer and method of manufacturing phase change memory device
#2104Process for fabricating piezoelectrically actuated ultrananocrystalline diamond tip array integrated with ferroelectric or phase change media for high-density memory
#2105Phase change memory materials
#2106Concentric phase change memory element
#2107Phase change material and methods of forming the phase change material
#2108Device for storing data with optical addressing
#2109Plasma treating methods of fabricating phase change memory devices, and memory devices so fabricated
#2110Combinatorial screening method and apparatus
#2111Nanoscale electrodes for phase change memory devices
#2112Method of fabricating a phase-change memory
#2113Semiconductor memory having both volatile and non-volatile functionality including resistance change material and method of operating
#2114Multiple phase change materials in an integrated circuit for system on a chip application
#2115Semiconductor memory
#2116Integrated circuit including memory cell having cup-shaped electrode interface
#2117Semiconductor devices having a planarized insulating layer
#2118Electronic component, and a method of manufacturing an electronic component
#2119Memory devices and methods of forming the same
#2120Method and apparatus for non-volatile multi-bit memory
#2121Four-terminal reconfigurable devices
#2122Methods of forming a phase change material
#2123Phase change memory structures and methods
#2124Nonvolatile memory device and method of manufacturing the same
#2125METHOD FOR FORMING CHALCOGENIDE FILM AND METHOD FOR MANUFACTURING RECORDING ELEMENT
#2126Programmable resistive memory cell with self-forming gap
#2127Memory cell device with coplanar electrode surface and method
#2128Vertical string phase change random access memory device
#2129Memory device
#2130Fully self-aligned pore-type memory cell having diode access device
#2131Phase change random access memory device, method of fabricating the same, and method of operating the same
#2132Phase-change memory device and method of fabricating the same
#2133Multi-layer phase-changeable memory devices
#2134MUSHROOM TYPE MEMORY CELL HAVING SELF-ALIGNED BOTTOM ELECTRODE AND DIODE ACCESS DEVICE
#2135Method of forming a seam-free tungsten plug
#2136Bridge resistance random access memory device and method with a singular contact structure
#2137MANUFACTURING METHOD OF SEMICONDUCTOR MEMORY DEVICE
#2138Write-once memory array including phase-change elements and threshold switch isolation
#2139Semiconductor device
#2140Phase change memory
#2141Phase-change memory device and method of fabricating the same
#2142Method for forming chalcogenide switch with crystallized thin film diode isolation
#2143Synthesis and use of precursors for ALD of tellurium and selenium thin films
#2144Memory architecture and cell design employing two access transistors
#2145Resistance memory element, phase change memory element, resistance random access memory device, information reading method thereof, phase change random access memory device, and information reading method thereof
#2146Memory device and method for making same
#2147Self-aligned vertical bipolar junction transistor for phase change memories
#2148PHASE CHANGE MEMORY AND RECORDING MATERIAL FOR PHASE CHANGE MEMORY
#2149Phase-change memory element
#2150Phase change memory element with a peripheral connection to a thin film electrode
#2151Phase change memory device in which a distance between a lower electrode and a ground line is increased to secure the sensing margin of a cell and method for manufacturing the same
#2152Variable resistance memory device with an interfacial adhesion heating layer, systems using the same and methods forming the same
#2153Phase-change memory cell with a patterned layer
#2154Non-volatile memory device
#2155Three-terminal cascade switch for controlling static power consumption in integrated circuits
#2156Phase change memory device having protective layer and method for manufacturing the same
#2157PHASE CHANGE MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
#2158Memory cells, memory cell arrays, methods of using and methods of making
#2159Integrated circuit including vertical diode
#2160Isolation trenches with conductive plates
#2161Three-terminal cascade switch for controlling static power consumption in integrated circuits
#2162Programmable via structure and method of fabricating same
#2163Phase change memory cell having top and bottom sidewall contacts
#2164Integrated circuit with upstanding stylus
#2165Programmable via devices with air gap isolation
#2166Antimony and germanium complexes useful for CVD/ALD of metal thin films
#2167SWITCH ARRAY CIRCUIT AND SYSTEM USING PROGRAMMABLE VIA STRUCTURES WITH PHASE CHANGE MATERIALS
#2168Asymmetric-threshold three-terminal switching device
#2169Thin film input/output
#2170Standalone thin film memory
#2171Thin film logic circuitry
#2172Integrated circuit including an array of diodes coupled to a layer of resistance changing material
#2173Thin-film memory system having thin-film peripheral circuit and memory controller for interfacing with a standalone thin-film memory
#2174Phase change memory device having decreased contact resistance of heater and method for manufacturing the same
#2175Phase change memory devices and their methods of fabrication
#2176Multi-bit phase-change memory device
#2177Semiconductor device
#2178Memory and access device and method therefor
#2179Self-aligned in-contact phase change memory device
#2180Method for manufacturing Chalcogenide devices
#2181Phase change random access memory and methods of manufacturing and operating same
#2182Highly integrated phase change memory device having micro-sized diodes and method for manufacturing the same
#2183Method for manufacturing a nonvolatile storage device
#2184Phase change memory devices and methods for fabricating the same
#2185Chemical mechanical polishing slurry composition for polishing phase-change memory device and method for polishing phase-change memory device using the same
#2186Phase change memory cell with reduced switchable volume
#2187Programmable via devices
#2188Nonvolatile memory device and method for manufacturing same
#2189Short bridge phase change memory cells
#2190Phase change memory with tapered heater
#2191Phase change memory devices and fabrication methods thereof
#2192Process for PCM integration with poly-emitter BJT as access device
#2193Information recording medium, target and method for manufacturing of information recording medium using the same
#2194Phase-change memory device including biasing circuit
#2195METHOD OF FORMING A PHASE CHANGEABLE STRUCTURE
#2196Optimized solid electrolyte for programmable metallization cell devices and structures
#2197Nonvolatile storage device and method for manufacturing same
#2198PHASE CHANGE MEMORY DEVICE AND METHOD OF FABRICATION
#2199Storage nodes, phase change memories including a doped phase change layer, and methods of operating and fabricating the same
#2200Phase change device having two or more substantial amorphous regions in high resistance state
#2201Resistive changing device
#2202Phase change memory device having phase change material layer containing phase change nano particles
#2203Phase change memory device
#2204Slurry for polishing phase change material and method for patterning polishing phase change material using the same
#2205BICYCLIC GUANIDINATES AND BRIDGING DIAMIDES AS CVD/ALD PRECURSORS
#2206Methods for forming arrays of small, closely spaced features
#2207Method for manufacturing phase change memory device
#2208Phase change memory device and method of manufacture
#2209SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF
#2210PHASE CHANGE MEMORY DEVICE HAVING HEATERS AND METHOD FOR MANUFACTURING THE SAME
#2211METHODS OF FORMING CHALCOGENIDE FILMS AND METHODS OF MANUFACTURING MEMORY DEVICES USING THE SAME
#2212Multilayer storage class memory using externally heated phase change material
#2213Enhanced memory density resistance variable memory cells, arrays, devices and systems including the same, and methods of fabrication
#2214Non-volatile memory device and method of fabricating the same
#2215Memory cell having a buried phase change region and method for fabricating the same
#2216Methods of forming phase-change memory units, and methods of manufacturing phase-change memory devices using the same
#2217Memory cell having improved mechanical stability
#2218Phase change memory element and method for forming the same
#2219PHASE CHANGE MEMORY DEVICE
#2220Semiconductor integrated circuit device
#2221Phase-change memory device
#2222Reducing drift in chalcogenide devices
#2223Information recording medium and method for producing the same
#2224Etching process for phase-change films
#2225Contact structure, a semiconductor device employing the same, and methods of manufacturing the same
#2226Thermally stabilized electrode structure
#2227PHASE CHANGE MEMORY DEVICE HAVING PROTECTIVE LAYER FOR PROTECTING PHASE CHANGE MATERIAL AND METHOD FOR MANUFACTURING THE SAME
#2228Phase change memory device
#2229Memory device manufacturing method
#2230ELECTRODE FORMED IN APERTURE DEFINED BY A COPOLYMER MASK
#2231Semiconductor device and its fabrication method
#2232Integrated circuit including memory element doped with dielectric material
#2233Method of fabricating a phase change memory and phase change memory
#2234Phase-change ram and method for fabricating the same
#2235Methods of fabricating semiconductor device including phase change layer
#2236Phase change memory cell with constriction structure
#2237Non-volatile memory with resistive access component
#2238Self-aligned memory cells and method for forming
#2239RESISTIVE MEMORY DEVICES
#2240Resistive memory device
#2241Phase Change Memory Device
#2242Temperature and pressure control methods to fill features with programmable resistance and switching devices
#2243Method of forming ring electrode
#2244Pressure extrusion method for filling features in the fabrication of electronic devices
#2245Memory device
#2246Integrated Circuit, Memory Module, and Method of Manufacturing an Integrated Circuit
#2247Nonvolatile memory device and manufacturing method for the same
#2248Method of making a vertical phase change memory (PCM) and a PCM device
#2249Integrated circuit including an electrode having an outer portion with greater resistivity
#2250Phase change memory
#2251Memory Cell Layout
#2252Semiconductor device and method of forming the same
#2253Phase change memory device and fabrication method thereof
#2254Integrated circuit fabricated using an oxidized polysilicon mask
#2255Self-converging bottom electrode ring
#2256Nonvolatile memory device and method of manufacturing the same
#2257PHASE CHANGE MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
#2258Integrated circuit including U-shaped access device
#2259Carbon diode array for resistivity changing memories
#2260Electric device with a layer of conductive material contacted by nanowires
#2261Semiconductor device and method for manufacturing the same
#2262Multi-layer storage node, resistive random access memory device including a multi-layer storage node and methods of manufacturing the same
#2263Phase change memory device
#2264Heating center PCRAM structure and methods for making
#2265Phase change element extension embedded in an electrode
#2266High density chalcogenide memory cells
#2267Memory devices, stylus-shaped structures, electronic apparatuses, and methods for fabricating the same
#2268Phase-change memory
#2269Phase change memory device with a novel electrode
#2270PHASE-CHANGE MEMORY ELEMENT
#2271Pore phase change material cell fabricated from recessed pillar
#2272Non-volatile memory device and method of manufacturing the same
#2273SEMICONDUCTOR DEVICE AND A MANUFACTURING METHOD OF THE SEMICONDUCTOR DEVICE
#2274Memory cell with memory element contacting an inverted T-shaped bottom electrode
#2275Phase change memory cell with heater and method therefor
#2276Phase change memory device and method of fabricating the same
#2277Method of making a phase change memory cell having a silicide heater in conjunction with a FinFET
#2278PHASE CHANGE MEMORY DEVICE HAVING PLUG-SHAPED PHASE CHANGE LAYERS AND METHOD FOR MANUFACTURING THE SAME
#2279Multi-level programmable PCRAM memory
#2280Chalcogenide anti-fuse
#22813-D and 3-D schottky diode for cross-point, variable-resistance material memories, processes of forming same, and methods of using same
#2282Phase change memory cells delineated by regions of modified film resistivity
#2283Vertical spacer electrodes for variable-resistance material memories and vertical spacer variable-resistance material memory cells
#2284Phase-change memory device and method of manufacturing the same
#2285Polysilicon emitter BJT access device for PCRAM
#2286Storage node, phase change memory device and methods of manufacturing and operating the same
#2287Phase change memory elements using self-aligned phase change material layers
#2288Phase-change memory device capable of improving contact resistance and reset current and method of manufacturing the same
#2289Non-volatile programmable variable resistance element
#2290Phase change memory and method of fabricating the same
#2291NON-VOLATILE MEMORY AND METHOD FOR FABRICATING THE SAME
#2292Phase change memory with layered insulator
#2293Integrated circuit including diode memory cells
#2294Memory devices having contact features
#2295Methods of forming a phase-change material layer pattern, methods of manufacturing a phase-change memory device and related slurry compositions
#2296Method for forming self-aligned thermal isolation cell for a variable resistance memory array
#2297METHOD FOR FORMING PHASE-CHANGE MEMORY ELEMENT
#2298Phase change magnetic material
#2299Phase change memory cell having interface structures with essentially equal thermal impedances and manufacturing methods
#2300Nitrogenated carbon electrode for chalcogenide device and method of making same
#2301Electrical device using phase change material, phase change memory device using solid state reaction and method for fabricating the same
#2302PHASE CHANGE MEMORY
#2303Fabricating sub-lithographic contacts
#2304Tellurium (Te) precursors for making phase change memory materials
#2305Non-volatile memory devices having data storage layer
#2306Semiconductor device and method of manufacturing the same
#2307NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
#2308Memory cell device with circumferentially-extending memory element
#2309Active material devices with containment layer
#2310Phase change RAM device and method for manufacturing the same
#2311Phase change memory device and method for manufacturing the same
#2312Phase-change nonvolatile memory and manufacturing method therefor
#2313Phase change alloy etch
#2314Methods of forming phase-changeable memory devices using growth-enhancing and growth-inhibiting layers for phase-changeable materials
#2315Integrated circuit having memory cells and method of manufacture
#2316Phase-changeable memory devices having reduced susceptibility to thermal interference
#2317Integrated circuit having dielectric layer including nanocrystals
#2318Phase change memory element
#2319Phase change memory cell including a thermal protect bottom electrode and manufacturing methods
#2320Small electrode for phase change memories
#2321METHOD FOR MANUFACTURING A PHASE CHANGE MEMORY DEVICE CAPABLE OF IMPROVING THERMAL EFFICIENCY OF PHASE CHANGE MATERIAL
#2322Phase change memory device capable of increasing sensing margin and method for manufacturing the same
#2323Amorphous Ge/Te deposition process
#2324Method of Forming Programmable Via Devices
#2325Self aligned ring electrodes
#2326Modulation of electromagnetic radiation with electrically controllable composite material
#2327Phase Change Memory with Diodes Embedded in Substrate
#2328Memory device
#2329Method of producing phase change memory device
#2330Method for making a self-converged void and bottom electrode for memory cell
#2331Method of producing phase change memory device
#2332Phase change memory devices and methods for fabricating the same
#2333Method for manufacturing a resistor random access memory with a self-aligned air gap insulator
#2334Programmable via devices
#2335Semiconductor devices having phase change memory cells, electronic systems employing the same and methods of fabricating the same
#2336PHASE CHANGE MEMORY DEVICES AND METHODS FOR FABRICATING THE SAME
#2337Method for making self aligning pillar memory cell device
#2338Method for making a self-converged memory material element for memory cell
#2339Vacuum jacketed electrode for phase change memory element
#2340Method of forming phase change material layer using Ge(II) source, and method of fabrication phase change memory device
#2341Phase change materials and associated memory devices
#2342Storage node, phase change memory device and methods of operating and fabricating the same
#2343Low area contact phase-change memory
#2344Programmable resistive memory with diode structure
#2345Method of depositing chalcogenide film for phase-change memory
#2346Semiconductor phase change memory using multiple phase change layers
#2347Phase change memory device and method of manufacturing the same
#2348Phase change memory cell with roundless micro-trenches
#2349Phase change memory structures
#2350Phase change memory structures including pillars
#2351Phase change memory device and fabricating method
#2352Method of fabricating structures based on nanoparticles
#2353Phase change memory device and fabrication method thereof
#2354Phase change memory with various grain sizes
#2355METHOD OF FORMING CHALCOGENIDE LAYER INCLUDING TE AND METHOD OF FABRICATING PHASE-CHANGE MEMORY DEVICE
#2356Tellurium precursors for GST deposition
#2357Buried low-resistance metal word lines for cross-point variable-resistance material memories
#2358Higher threshold voltage phase change memory
#2359Phase change memory cell array with self-converged bottom electrode and method for manufacturing
#2360Phase change memory cell in via array with self-aligned, self-converged bottom electrode and method for manufacturing
#2361Phase-change memory cell and method of fabricating the phase-change memory cell
#2362Programmable via structure for three dimensional integration technology
#2363Method of electrodepositing germanium compound materials on a substrate
#2364Phase change memory device, manufacturing method thereof and operating method thereof
#2365Programmable fuse/non-volatile memory structures in BEOL regions using externally heated phase change material
#2366Phase change memory array and fabrication thereof
#2367Method for chemical mechanical planarization of chalcogenide materials
#2368Memory element with improved contacts
#2369Phase-change memory units, methods of forming the phase-change memory units, phase-change memory devices having the phase-change memory units and methods of manufacturung the phase-change memory devices
#2370Phase change memory device and fabrication method thereof
#2371Memory device
#2372Phase change memory cell with first and second transition temperature portions
#2373PHASE-CHANGE MEMORY ELEMENT
#2374High density chalcogenide memory cells
#2375Phase-change random access memory device and semiconductor memory device
#2376Method for fabricating an integrated circuit including memory element with spatially stable material
#2377System Including Memory with Resistivity Changing Material and Method of Making the Same
#2378Process for manufacturing a copper compatible chalcogenide phase change memory element and corresponding phase change memory element
#2379Semiconductor device with fluorine-containing interlayer dielectric film to prevent chalcogenide material layer from exfoliating from the interlayer dielectric film and process for producing the same
#2380Integrated circuit including memory element with spatially stable material
#2381Phase-change random access memory and method of manufacturing the same
#2382Phase change material structure and related method
#2383Phase-change memory element
#2384Integrated circuit including memory element with high speed low current phase change material
#2385Vertical side wall active pin structures in a phase change memory and manufacturing methods
#2386Phase change memory devices and fabrication methods thereof
#2387SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
#2388PHASE CHANGE MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
#2389PHASE CHANGE MATERIAL STRUCTURES
#2390Integrated circuit having a cell with a resistivity changing layer
#2391Phase change memory device and method of fabricating the same
#2392INTEGRATED CIRCUIT INCLUDING MEMORY CELLS WITH TUNNEL FET AS SELECTION TRANSISTOR
#2393Phase change memory with dual word lines and source lines and method of operating same
#2394Phase change memory device having Schottky diode and method of fabricating the same
#2395Programmable via devices with air gap isolation
#2396Programmable via devices in back end of line level
#2397Phase change memory bridge cell
#2398Resistor random access memory structure having a defined small area of electrical contact
#2399Liquid phase deposition of contacts in programmable resistance and switching devices
#2400Methods for forming electrodes in phase change memory devices