🔗 Permalink

Inventor profile of:

Andrzej Buczkowski

City:

Bend, Oregon

Country:

United States

Published Applications:

10

Last publication date:

2016-10-06

Top Assignees for applications by Andrzej Buczkowski

The entities that hold a legal rights for patent applications filed by inventor Buczkowski Andrzej:

Nanometrics Incorporated 4 Milpitas, CA United States
SUMCO CORPORATION 3 Tokyo, Japan
Sumco Phoenix Corporation 2 Phoenix, AZ United States
ACCENT OPTICAL TECHNOLOGIES, INC. 1 Bend, OR United States

Recent patent applications by Buczkowski Andrzej

Andrzej Buczkowski from Bend, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2016-10-06

US20160290927A1

Optical metrology system for spectral imaging of a sample

#2 | 2016-04-28

US20160116411A1

OPTICAL METROLOGY SYSTEM FOR SPECTRAL IMAGING OF A SAMPLE

#3 | 2015-05-28

US20150146193A1

Optical metrology system for spectral imaging of a sample

#4 | 2012-07-26

US20120186512A1

Chemistry; metallurgy

Procedure for in-situ determination of thermal gradients at the crystal growth front

#5 | 2011-06-16

US20110141460A1

Silicon filter for photoluminescence metrology

#6 | 2010-02-04

US20100024718A1

Chemistry; metallurgy

Procedure for in-situ determination of thermal gradients at the crystal growth front

#7 | 2008-05-22

US20080116909A1

Method for determining a minority carrier diffusion length using surface photo voltage measurements

#8 | 2007-01-11

US20070008526A1

Apparatus and method for non-contact assessment of a constituent in semiconductor workpieces

#9 | 2007-01-11

US20070007466A1

Differential wavelength photoluminescence for non-contact measuring of contaminants and defects located below the surface of a wafer or other workpiece

#10 | 2007-01-04

US20070000434A1

Apparatuses and methods for detecting defects in semiconductor workpieces

InventorID:

1174121 ⎘