Soquel, California
United States
10
2022-02-10
The entities that hold a legal rights for patent applications filed by inventor Young Scott A.:
Scott A. Young from Soquel, US has applied for patents for these inventions. The list has both pending applications and granted patents:
3D structure inspection or metrology using deep learning
#2 | 2019-06-06Method and system for focus adjustment of a multi-beam scanning electron microscopy system
#3 | 2018-11-15Learning based approach for aligning images acquired with different modalities
#4 | 2018-01-04Apparatus and methods for combined brightfield, darkfield, and photothermal inspection
#5 | 2017-03-23Method and system for focus adjustment of a multi-beam scanning electron microscopy system
#6 | 2017-01-24Combined semiconductor metrology system
#7 | 2015-08-13Apparatus and methods for combined brightfield, darkfield, and photothermal inspection
#8 | 2012-01-12Active planar autofocus
#9 | 2008-12-11Alignment correction prio to image sampling in inspection systems
#10 | 2005-11-17Alignment correction prior to image sampling in inspection systems
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