Los Altos, California
United States
15
2020-03-05
The entities that hold a legal rights for patent applications filed by inventor Hess Carl:
Carl Hess from Los Altos, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Methods and systems for inspection of wafers and reticles using designer intent data
#2 | 2018-08-30Methods and systems for inspection of wafers and reticles using designer intent data
#3 | 2015-06-25Methods and Systems for Inspection of Wafers and Reticles Using Designer Intent Data
#4 | 2013-10-24Method and system for hybrid reticle inspection
#5 | 2013-05-02Database-driven cell-to-cell reticle inspection
#6 | 2012-06-19Methods and systems for classifying defects detected on a reticle
#7 | 2012-04-12Focus offset contamination inspection
#8 | 2011-11-10System and method for detecting design and process defects on a wafer using process monitoring features
#9 | 2009-02-17Process window optical proximity correction
#10 | 2008-04-03METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DESIGNER INTENT DATA
#11 | 2008-03-20Computer-implemented methods and systems for determining different process windows for a wafer printing process for different reticle designs
#12 | 2006-10-19Computer-implemented methods for detecting defects in reticle design data
#13 | 2006-07-20Computer-implemented methods, processors, and systems for creating a wafer fabrication process
#14 | 2006-03-09Methods for simulating reticle layout data, inspecting reticle layout data, and generating a process for inspecting reticle layout data
#15 | 2005-01-06Methods and systems for inspection of wafers and reticles using designer intent data
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