Hsinchu
Taiwan
55
2026-05-14
The entities that hold a legal rights for patent applications filed by inventor Chen Chih Hung:
Chih Hung Chen from Hsinchu, TW has applied for patents for these inventions. The list has both pending applications and granted patents:
FACET-DEPENDENT ADSORPTION FOR PLANARIZATION OF POLYCRYSTALLINE MATERIALS
#2 | 2026-05-14CAPACITIVE SENSOR SYSTEM FOR CHEMICAL MECHANICAL POLISHING SYSTEM AND METHOD
#3 | 2026-05-07PLANARIZATION PROCESS WITH LASER TREATMENT
#4 | 2026-05-07CHEMICAL MECHANICAL PLANARIZATION TOOL
#5 | 2026-05-07FOAM NOZZLE CLEANING APPARATUS AND METHOD FOR CLEANING WAFER SURFACE
#6 | 2026-04-09SEMICONDUCTOR DEVICE FABRICATION METHODS AND DEVICES FOR FORMING THE SAME
#7 | 2025-11-13Polishing Pad for Chemical Mechanical Polishing and Method
#8 | 2024-12-12SYSTEM AND METHOD FOR REMOVING IMPURITIES DURING CHEMICAL MECHANICAL PLANARIZATION
#9 | 2024-11-21APPARATUS AND METHODS FOR CHEMICAL MECHANICAL POLISHING
#10 | 2024-11-14HOTSPOT AVOIDANCE METHOD OF MANUFACTURING INTEGRATED CIRCUITS
#11 | 2024-10-31SEMICONDUCTOR DEVICE FABRICATION METHODS AND DEVICES FOR FORMING THE SAME
#12 | 2024-08-15CMP System and Method of Use
#13 | 2024-05-09Temperature control in chemical mechanical polish
#14 | 2023-12-21APPARATUS AND METHODS FOR CHEMICAL MECHANICAL POLISHING
#15 | 2023-12-14Polishing Pad for Chemical Mechanical Polishing and Method
#16 | 2023-11-23Thin film metrology
#17 | 2023-11-16Chemical Mechanical Polishing Apparatus Including a Multi-Zone Platen
#18 | 2023-08-31Chemical mechanical planarization tool
#19 | 2023-08-24Hotspot avoidance method of manufacturing integrated circuits
#20 | 2023-03-30WET CHEMICAL HEATING SYSTEM AND A METHOD OF CHEMICAL MECHANICAL POLISHING
#21 | 2023-03-02Method for wafer backside polishing
#22 | 2023-01-19CHEMICAL-MECHANICAL PLANARIZATION PAD AND METHODS OF USE
#23 | 2022-12-29System and method for removing impurities during chemical mechanical planarization
#24 | 2022-12-01Hotspot avoidance method of manufacturing integrated circuits
#25 | 2022-10-06Thin film metrology
#26 | 2022-09-29Semiconductor processing tool and methods of operation
#27 | 2022-01-13Hotspot avoidance method for manufacturing integrated circuits
#28 | 2021-11-25Thin film metrology
#29 | 2021-11-11MAGNETIC POLISHING SLURRY AND METHOD FOR POLISHING A WORKPIECE
#30 | 2021-11-04CMP system and method of use
#31 | 2021-07-22Chemical mechanical polishing apparatus including a multi-zone platen
#32 | 2021-04-29Thickness sensor for conductive features
#33 | 2021-02-25Chemical mechanical planarization tool
#34 | 2021-02-04Semiconductor device, method, and tool of manufacture
#35 | 2021-01-21CMP system and method of use
#36 | 2020-09-17POST CMP CLEANING APPARATUS AND POST CMP CLEANING METHODS
#37 | 2020-03-05Wet chemical heating system and a method of chemical mechanical polishing
#38 | 2019-12-26Thickness sensor for conductive features
#39 | 2019-11-07Temperature control in chemical mechanical polish
#40 | 2019-10-03Semiconductor structure with doped contact plug and method for forming the same
#41 | 2019-07-25Polishing pad for chemical mechanical planarization
#42 | 2019-01-31Temperature control in chemical mechanical polish
#43 | 2018-10-04Apparatus and method for timed dispensing various slurry components
#44 | 2018-10-04Polishing pad having grooves on bottom surface of top layer
#45 | 2018-09-20Semiconductor device, method, and tool of manufacture
#46 | 2018-08-28Method for controlling chemical mechanical polishing process
#47 | 2012-11-22Equalizer and communication system
#48 | 2012-03-15Methods for generating device layouts by combining an automated device layout generator with a script
#49 | 2009-04-30Low-noise amplifier circuit including band-stop filter
#50 | 2009-04-30Low noise amplifier
#51 | 2009-04-30Variable gain amplifier including series-coupled cascode amplifiers
#52 | 2008-03-13Method for soldering charge coupled device and tooling thereof
#53 | 2006-07-18Wafer level burn-in of SRAM
#54 | 2006-06-15Method for preparing 2- (2-pyridylmethylsulphinyl) benzimidazoles
#55 | 2006-05-18Frequency synthesizing device with automatic calibration
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