Oded Cohen

City:

Gedera

Country:

Israel

Published Applications:

Last publication date:

2022-03-31

Top Assignees for applications by Oded Cohen

The entities that hold a legal rights for patent applications filed by inventor Cohen Oded:

NOVA MEASURING INSTRUMENTS LTD. 3 Rehovot, Israel
INTEL CORPORATION 2 Santa Clara, CA United States
NOVA LTD. 1 Rehovot, Israel

Recent patent applications by Cohen Oded

Oded Cohen from Gedera, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2022-03-31

US20220099596A1

Physics

Test structure design for metrology measurements in patterned samples

#2 | 2020-02-20

US20200057005A1

Physics

Test structure design for metrology measurements in patterned samples

#3 | 2017-12-21

US20170363970A1

Physics

Test structure for use in metrology measurements of patterns

#4 | 2017-08-10

US20170227474A1

Physics

Metrology test structure design and measurement scheme for measuring in patterned structures

#5 | 2017-05-25

US20170146465A1

Physics

TEST STRUCTURE DESIGN FOR METROLOGY MEASUREMENTS IN PATTERNED SAMPLES

#6 | 2013-08-01

US20130195137A1

Electricity

Method for electrically pumped semiconductor evanescent laser

#7 | 2008-01-03

US20080002929A1

Electricity

Electrically pumped semiconductor evanescent laser

#8 | 2007-06-21

US20070140619A1

Physics

Dual core corrugated Bragg grating

#9 | 2005-10-06

US20050220406A1

Physics

Athermal bragg grating

InventorID:

363591 ⎘