Lambert Danner

City:

Wetzlar

Country:

Germany

Published Applications:

Last publication date:

2010-11-25

Top Assignees for applications by Lambert Danner

The entities that hold a legal rights for patent applications filed by inventor Danner Lambert:

Lambert Danner from Wetzlar, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

Apparatus for the optical inspection of wafers

DEVICE AND METHOD FOR THE INSPECTION OF DEFECTS ON THE EDGE REGION OF A WAFER

Apparatus for illuminating and inspecting a surface

Method and device for reducing systematic measuring errors in the examination of objects

Measuring instrument and method for operating a measuring instrument for optical inspection of an object

InventorID:

3698823 ⎘