Sunnyvale, California
United States
13
2017-09-07
The entities that hold a legal rights for patent applications filed by inventor Widmann Amir:
Amir Widmann from Sunnyvale, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers
#2 | 2014-07-17Method and system for universal target based inspection and metrology
#3 | 2014-02-06Inspecting a wafer and/or predicting one or more characteristics of a device being formed on a wafer
#4 | 2012-08-16Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers
#5 | 2012-04-19Feedforward/feedback litho process control of stress and overlay
#6 | 2012-01-26Advanced process control optimization
#7 | 2011-03-03Unique mark and method to determine critical dimension uniformity and registration of reticles combined with wafer overlay capability
#8 | 2009-07-14Techniques for determining overlay and critical dimension using a single metrology tool
#9 | 2008-12-25Feedforward/feedback litho process control of stress and overlay
#10 | 2008-11-20Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers
#11 | 2008-04-24Waferless recipe optimization
#12 | 2008-03-27Method and system for optimizing alignment performance in a fleet of exposure tools
#13 | 2007-11-29Computer-implemented methods, carrier media, and systems for creating a metrology target structure design for a reticle layout
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