San Jose, California
United States
6
2017-05-09
The entities that hold a legal rights for patent applications filed by inventor Kirk Michael D.:
Michael D. Kirk from San Jose, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Detection of selected defects in relatively noisy inspection data
#2 | 2016-05-31Detection of selected defects in relatively noisy inspection data
#3 | 2013-02-07Methods and systems for determining a characteristic of a wafer
#4 | 2010-05-04Methods and systems for detection of selected defects particularly in relatively noisy inspection data
#5 | 2008-05-13Methods and systems for detection of selected defects particularly in relatively noisy inspection data
#6 | 2008-01-17Methods and systems for determining a characteristic of a wafer
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