Assignee profile:

ASML MaskTools B.V.

City:

AH Veldhoven

Country:

Netherlands

Published Applications:

10

Last publication date:

2011-12-29

Patent Grants:

10

Last grant date:

2013-12-24

Top Inventors for applications by ASML MaskTools B.V.

These are the the leading inventors for applications assigned to ASML MaskTools B.V.:

Recent patent applications by ASML MaskTools B.V.

ASML MaskTools B.V. based in AH Veldhoven, NL has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2011-12-29 ✅ Patent 8,615,126 granted on 2013-12-24
US20110317908A1
Physics

Method for performing pattern decomposition based on feature pitch

#2 | 2009-09-17 ✅ Patent 7,892,707 granted on 2011-02-22
US20090233186A1
Physics

Scattering bar OPC application method for sub-half wavelength lithography patterning

#3 | 2008-08-28 ✅ Patent 7,485,396 granted on 2009-02-03
US20080206656A1
Physics

Scattering bar OPC application method for sub-half wavelength lithography patterning

#4 | 2007-07-12 ✅ Patent 7,774,736 granted on 2010-08-10
US20070162889A1
Physics

Method and apparatus for providing optical proximity features to a reticle pattern for deep sub-wavelength optical lithography

#5 | 2007-07-05 ✅ Patent 7,493,589 granted on 2009-02-17
US20070157154A1
Physics

Method, program product and apparatus for model based geometry decomposition for use in a multiple exposure process

#6 | 2007-03-22 ✅ Patent 7,892,703 granted on 2011-02-22
US20070065733A1
Physics

CPL mask and a method and program product for generating the same

#7 | 2006-09-21 ✅ Patent 7,494,753 granted on 2009-02-24
US20060208205A1
Physics

Method, program product and apparatus for improving calibration of resist models used in critical dimension calculation

#8 | 2005-09-08 ✅ Patent 7,514,183 granted on 2009-04-07
US20050196682A1
Physics

Method for performing transmission tuning of a mask pattern to improve process latitude

#9 | 2005-08-25 ✅ Patent 7,523,438 granted on 2009-04-21
US20050186491A1
Physics

Method for improved lithographic patterning utilizing optimized illumination conditions and high transmission attenuated PSM

#10 | 2005-06-30 ✅ Patent 7,550,235 granted on 2009-06-23
US20050142449A1
Physics

Method and apparatus for performing model based placement of phase-balanced scattering bars for sub-wavelength optical lithography

AssigneeID:

210614 ⎘