KLA-Tencor Technologies

City:

Milpitas, California

Country:

United States

Published Applications:

Last publication date:

2005-12-08

Patent Grants:

Last grant date:

2007-12-04

Top Inventors for applications by KLA-Tencor Technologies

These are the the leading inventors for applications assigned to KLA-Tencor Technologies:

Haiguang Chen 1 Millbrae, CA United States
Dan Wack 1 Los Altos, CA United States
David Y. Wang 1 Fremont, CA United States
Ingrid B. Peterson 1 Menlo Park, CA United States

Ching-Ling MENG 1 Fremont, CA United States
Anantha Sethuraman 1 Palo Alto, CA United States
Charles Chen 1 Sunnyvale, CA United States
John Fielden 1 Los Altos, CA United States

Ronald L. Allen 1 San Jose, CA United States
Joseph J. Danko 1 Shrewsbury, MA United States
Thanassis Trikas 1 Redwood City, CA United States
Kurt Lehman 1 Menlo Park, CA United States

Steven W. Meeks 1 San Jose, CA United States
Steven W. Meeks 1 Fremont, CA United States
Rusmin Kudinar 1 Union City, CA United States
Alireza Shahdoost Moghaddam 1 San Jose, CA United States

Christopher F. Bevis 1 Los Gatos, CA United States
Mehrdad Nikoonahad 1 Menlo Park, CA United States
Kyle A. Brown 1 Irvine, CA United States
Adam E. Norton 1 Palo Alto, CA United States

Robert Shinagawa 1 Cupertino, CA United States
Mike Von Den Hoff 1 Muenchen, Germany
John A. Notte, IV 1 Windham, NH United States
Ady Levy 1 Sunnyvale, CA United States

Hung P. Nguyen 1 Santa Clara, CA United States
James L. Hendrix 1 Livermore, CA United States
Gary Bultman 1 Los Altos, CA United States
Hung Phi Nguyen 1 Santa Clara, CA United States

Recent patent applications by KLA-Tencor Technologies

KLA-Tencor Technologies based in Milpitas, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2005-12-08 ✅ Patent 7,304,735 granted on 2007-12-04

US20050270524A1

Physics

Broadband wavelength selective filter

#2 | 2005-10-18 ✅ Patent 6,956,660 granted on 2005-10-18

US10782267

System and method for measuring properties of an object using a phase difference between two reflected light signals

#3 | 2005-09-20 ✅ Patent 6,946,394 granted on 2005-09-20

US9956840

Methods and systems for determining a characteristic of a layer formed on a specimen by a deposition process

#4 | 2005-08-16 ✅ Patent 6,930,765 granted on 2005-08-16

US10126154

Multiple spot size optical profilometer, ellipsometer, reflectometer and scatterometer

#5 | 2005-06-07 ✅ Patent 6,902,855 granted on 2005-06-07

US10211156

Qualifying patterns, patterning processes, or patterning apparatus in the fabrication of microlithographic patterns

#6 | 2005-05-10 ✅ Patent 6,891,167 granted on 2005-05-10

US9882818

Apparatus and method for applying feedback control to a magnetic lens

#7 | 2005-04-19 ✅ Patent 6,882,437 granted on 2005-04-19

US10208379

Method of detecting the thickness of thin film disks or wafers

#8 | 2005-04-12 ✅ Patent 6,879,391 granted on 2005-04-12

US9579620

Particle detection method and apparatus

#9 | 2005-03-15 ✅ Patent 6,866,559 granted on 2005-03-15

US10358107

Windows configurable to be coupled to a process tool or to be disposed within an opening in a polishing pad

AssigneeID:

401255 ⎘