JUNCTION BETWEEN HEXABORIDE-CONTAINING AND TANTALUM-CONTAINING COMPONENTS

CHARGED PARTICLE BEAM DEVICE

PHOTO-ASSISTED ELECTRON BEAM EMITTER

IN-LINE ELECTRON BEAM INSPECTION METHOD FOR SEMICONDUCTOR PROCESSES AND COLD FIELD EMITTER WITH NANOMETER-SCALE PROTRUSION STRUCTURE FOR IN-LINE ELECTRON BEAM INSPECTION EQUIPMENT APPLIED TO SEMICONDUCTOR PROCESSES AND MANUFACTURE METHOD THEREOF

CHARGED PARTICLE BEAM DEVICE

Emitter, electron gun in which same is used, electronic device in which same is used, and method for manufacturing same

Electron Source, Method of Manufacturing the Same, And Electron Beam Apparatus Using the Same

ELECTRON SOURCE BASED ON FIELD EMISSION AND PRODUCTION PROCESS FOR SAME

Particle beam device having a deflection unit

Mechanically-stable electron source

Electron emitter and method of fabricating same

Electron emitter and method of fabricating same

Metal protective layer for electron emitters with a diffusion barrier

Electron microscope

Methods and devices for producing an electron beam

Electron beam apparatus

Electron emitter and method of fabricating same

Cold cathode field-emission electron gun, adjustment method for cold cathode field-emission electron gun, sharpening method for emitter, and electron microscope

Field emission electron source, method for manufacturing same, and electron beam device

Gun lens design in a charged particle microscope

Electron microscope electron gun for facilitating position adjustment and electron microscope including same

Electron microscope and method of operating same

Scanning electron microscope

High voltage feedthrough assembly, time-resolved transmission electron microscope and method of electrode manipulation in a vacuum environment

System and method for providing a clean environment in an electron-optical system

Array of carbon nanotube micro-tip structures

Micro-electron column having an electron emitter improving the density of an electron beam emitted from a nano structure tip

Nanoparticle-templated lithographic patterning of nanoscale electronic components

Electron gun, charged particle gun, and charged particle beam apparatus using electron gun and charged particle gun

Method for manufacturing electron source

Charged particle beam apparatus

Device and method for electron emission and device including such an electron emission system

Particle sources and methods for manufacturing the same

Electron microscope and method of operating the same

Electron microscope and method of adjusting the same

Charged particle beam apparatus with cleaning photo-irradiation apparatus

Electron gun emitting under high voltage, in particular for electron microscopy

Carbon nanotube based micro-tip structure and method for making the same

Compact high-voltage electron gun

Fabrication of super ion—electron source and nanoprobe by local electron bombardment

Ion beam irradiation device and method for suppressing ion beam divergence

Electron gun

EVAPORATION SYSTEM

Cold field emitter

Method and apparatus of pretreatment of an electron gun chamber

MANUFACTURING METHOD OF ELECTRON SOURCE

Gas field ion source with coated tip

Electron gun used in particle beam device

Tip-sharpened carbon nanotubes and electron source using thereof

ELECTRON EMITTER HAVING NANO-STRUCTURE TIP AND ELECTRON COLUMN USING THE SAME

Field emission type electron gun comprising single fibrous carbon electron emitter and operating method for the same

IMPROVED PARTICLE BEAM GENERATOR

ELECTRON COLUMN USING CNT-TIP AND METHOD FOR ALIGNMENT OF CNT-TIP

Electron beam apparatus

Device for the field emission of particles and production method

Field emission electron source having carbon nanotube and manufacturing method thereof

METHOD OF PREPARING AN ULTRA SHARP TIP, APPARATUS FOR PREPARING AN ULTRA SHARP TIP, AND USE OF AN APPARATUS

Method and device for producing an image

Charged particle beam apparatus

Method and system for ultrafast photoelectron microscope

COLD CATHODE FIELD EMISSION ELECTRON GUN AND ITS APPLICATION TO ELECTRON BEAM INSTRUMENTS

Diamond electron radiation cathode, electron source, electron microscope, and electron beam exposer

DIAMOND ELECTRON SOURCE AND METHOD FOR MANUFACTURING THE SAME

Electron beam heating system having carbon nanotubes

Charged particle source with automated tip formation

Energy filter for cold field emission electron beam apparatus

Arrangement and method for compensating emitter tip vibrations

Electron gun, electron beam exposure apparatus, and exposure method

GUN CHAMBER, CHARGED PARTICLE BEAM APPARATUS AND METHOD OF OPERATING SAME

EMITTER CHAMBER, CHARGED PARTICAL APPARATUS AND METHOD FOR OPERATING SAME

Charged particle beam apparatus

Systems and methods for a gas field ionization source

Cold field emitter

Charged beam gun

Conductive probe and method for producing the same

Field emission electron gun and electron beam applied device using the same

Method and system for ultrafast photoelectron microscope

Method of fabricating nanodevices

Nano tip and fabrication method of the same

Electron beam source having an extraction electrode provided with a magnetic disk element

Apparatus and method for controlling the beam current of a charged particle beam

CONTINUOUSLY CLEANING OF THE EMISSION SURFACE OF A COLD FIELD EMISSION GUN USING UV OR LASER BEAMS

Charged particle beam apparatus

Method for manufacturing an electron emitter

Electron source, and charged-particle apparatus comprising such an electron source

Single-atom tip and preparation method thereof

Method and system for ultrafast photoelectron microscope

Sample surface inspection method and inspection system

Integrated sub-nanometer-scale electron beam systems

Low power schottky emitter

Electrode and filament coupled by adapter

Method of producing microrods for electron emitters, and associated microrods and electron emitters

High performance inspection scanning electron microscope device and method of operating the same

Thermal field emitter tip, electron beam device including a thermal field emitter tip and method for operating an electron beam device

Emitter for an electron beam, electron beam device and method for producing and operating an electron emitter