H01J2237/2805 - CPC Classification Index

ClassID:

206552 ⎘

H01J2237/2805 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Electron or ion microscopes; Scanning microscopes characterised by the imaging method; Scattered primary beam Elastic scattering

Recent Application in this class:

20250239431

2025-07-24

ELECTRON MICROSCOPE DETECTOR AND RELATED METHODS

20200243299

2020-07-30

Detection of buried features by backscattered particles

20190204245

2019-07-04

Scanning electron microscope and method for determining crystal orientations

20190115187

2019-04-18

Electron microscope and specimen tilt angle adjustment method

20180166253

2018-06-14

Image capture assembly and method for electron back scatter diffraction

20180076005

2018-03-15

Method of determining the deflection of an electron beam resulting from an electric field and/or a magnetic field

20170084421

2017-03-23

Backscattered electrons (BSE) imaging using multi-beam tools

20150060666

2015-03-05

Specimen observation method and device using secondary emission electron and mirror electron detection

20130248706

2013-09-26

Sample analyzing apparatus and sample analyzing method

#10

20110304724

2011-12-15

Physical properties measuring method and apparatus

#11

20110155905

2011-06-30

Specimen observation method and device using secondary emission electron and mirror electron detection

#12

20100237242

2010-09-23

DEVICE AND METHOD FOR CRYSTAL ORIENTATION MEASUREMENT BY MEANS OF AN ION BLOCKING PATTERN AND A FOCUSED ION PROBE

#13

20090194691

2009-08-06

Electronic microscope apparatus